JPS63183546U - - Google Patents

Info

Publication number
JPS63183546U
JPS63183546U JP1022887U JP1022887U JPS63183546U JP S63183546 U JPS63183546 U JP S63183546U JP 1022887 U JP1022887 U JP 1022887U JP 1022887 U JP1022887 U JP 1022887U JP S63183546 U JPS63183546 U JP S63183546U
Authority
JP
Japan
Prior art keywords
sample
holder
storage means
sample holder
information
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1022887U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1022887U priority Critical patent/JPS63183546U/ja
Publication of JPS63183546U publication Critical patent/JPS63183546U/ja
Pending legal-status Critical Current

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Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP1022887U 1987-01-27 1987-01-27 Pending JPS63183546U (ru)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1022887U JPS63183546U (ru) 1987-01-27 1987-01-27

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1022887U JPS63183546U (ru) 1987-01-27 1987-01-27

Publications (1)

Publication Number Publication Date
JPS63183546U true JPS63183546U (ru) 1988-11-25

Family

ID=30796331

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1022887U Pending JPS63183546U (ru) 1987-01-27 1987-01-27

Country Status (1)

Country Link
JP (1) JPS63183546U (ru)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105259196A (zh) * 2014-07-08 2016-01-20 日本株式会社日立高新技术科学 X射线分析用试样板以及荧光x射线分析装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105259196A (zh) * 2014-07-08 2016-01-20 日本株式会社日立高新技术科学 X射线分析用试样板以及荧光x射线分析装置
JP2016017823A (ja) * 2014-07-08 2016-02-01 株式会社日立ハイテクサイエンス X線分析用試料板及び蛍光x線分析装置
TWI655424B (zh) * 2014-07-08 2019-04-01 日商日立高新技術科學股份有限公司 X-ray analysis test plate and fluorescent X-ray analysis device

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