JPS63183546U - - Google Patents
Info
- Publication number
- JPS63183546U JPS63183546U JP1022887U JP1022887U JPS63183546U JP S63183546 U JPS63183546 U JP S63183546U JP 1022887 U JP1022887 U JP 1022887U JP 1022887 U JP1022887 U JP 1022887U JP S63183546 U JPS63183546 U JP S63183546U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- holder
- storage means
- sample holder
- information
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1022887U JPS63183546U (ru) | 1987-01-27 | 1987-01-27 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1022887U JPS63183546U (ru) | 1987-01-27 | 1987-01-27 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63183546U true JPS63183546U (ru) | 1988-11-25 |
Family
ID=30796331
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1022887U Pending JPS63183546U (ru) | 1987-01-27 | 1987-01-27 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63183546U (ru) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105259196A (zh) * | 2014-07-08 | 2016-01-20 | 日本株式会社日立高新技术科学 | X射线分析用试样板以及荧光x射线分析装置 |
-
1987
- 1987-01-27 JP JP1022887U patent/JPS63183546U/ja active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105259196A (zh) * | 2014-07-08 | 2016-01-20 | 日本株式会社日立高新技术科学 | X射线分析用试样板以及荧光x射线分析装置 |
JP2016017823A (ja) * | 2014-07-08 | 2016-02-01 | 株式会社日立ハイテクサイエンス | X線分析用試料板及び蛍光x線分析装置 |
TWI655424B (zh) * | 2014-07-08 | 2019-04-01 | 日商日立高新技術科學股份有限公司 | X-ray analysis test plate and fluorescent X-ray analysis device |