JPS63181978U - - Google Patents

Info

Publication number
JPS63181978U
JPS63181978U JP7194887U JP7194887U JPS63181978U JP S63181978 U JPS63181978 U JP S63181978U JP 7194887 U JP7194887 U JP 7194887U JP 7194887 U JP7194887 U JP 7194887U JP S63181978 U JPS63181978 U JP S63181978U
Authority
JP
Japan
Prior art keywords
output signal
circuit
frequency synthesizer
under test
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7194887U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0639349Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7194887U priority Critical patent/JPH0639349Y2/ja
Publication of JPS63181978U publication Critical patent/JPS63181978U/ja
Application granted granted Critical
Publication of JPH0639349Y2 publication Critical patent/JPH0639349Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP7194887U 1987-05-14 1987-05-14 誤り率測定器 Expired - Lifetime JPH0639349Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7194887U JPH0639349Y2 (ja) 1987-05-14 1987-05-14 誤り率測定器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7194887U JPH0639349Y2 (ja) 1987-05-14 1987-05-14 誤り率測定器

Publications (2)

Publication Number Publication Date
JPS63181978U true JPS63181978U (en:Method) 1988-11-24
JPH0639349Y2 JPH0639349Y2 (ja) 1994-10-12

Family

ID=30914957

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7194887U Expired - Lifetime JPH0639349Y2 (ja) 1987-05-14 1987-05-14 誤り率測定器

Country Status (1)

Country Link
JP (1) JPH0639349Y2 (en:Method)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018037843A (ja) * 2016-08-31 2018-03-08 アンリツ株式会社 判定帰還型等化器及び判定帰還型等化方法と誤り率測定装置及び誤り率測定方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
MY180992A (en) 2013-03-13 2020-12-15 Intel Corp Memory latency management

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018037843A (ja) * 2016-08-31 2018-03-08 アンリツ株式会社 判定帰還型等化器及び判定帰還型等化方法と誤り率測定装置及び誤り率測定方法

Also Published As

Publication number Publication date
JPH0639349Y2 (ja) 1994-10-12

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