JPS63168949A - Electron microscope - Google Patents
Electron microscopeInfo
- Publication number
- JPS63168949A JPS63168949A JP61310249A JP31024986A JPS63168949A JP S63168949 A JPS63168949 A JP S63168949A JP 61310249 A JP61310249 A JP 61310249A JP 31024986 A JP31024986 A JP 31024986A JP S63168949 A JPS63168949 A JP S63168949A
- Authority
- JP
- Japan
- Prior art keywords
- electron microscope
- camera
- gas
- room
- camera room
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010894 electron beam technology Methods 0.000 claims abstract description 23
- 150000002500 ions Chemical class 0.000 claims abstract description 11
- 238000001000 micrograph Methods 0.000 claims description 21
- 230000001678 irradiating effect Effects 0.000 claims description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 abstract description 20
- 239000007789 gas Substances 0.000 abstract description 16
- 229910001873 dinitrogen Inorganic materials 0.000 abstract description 15
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 26
- 239000000428 dust Substances 0.000 description 13
- 238000004020 luminiscence type Methods 0.000 description 6
- 230000005284 excitation Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- -1 silver halide Chemical class 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000005355 lead glass Substances 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000001454 recorded image Methods 0.000 description 1
- 230000029058 respiratory gaseous exchange Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Abstract
Description
【発明の詳細な説明】
(産業上の利用分野)
本発明は電子顕微鏡、特に詳細にはカメラ室に配置され
る電子顕微鏡像記録媒体に静電引力によってゴミ、ホコ
リ等が付着することを防止できるようにした電子顕微鏡
に関するものである。Detailed Description of the Invention (Industrial Application Field) The present invention prevents dirt, dust, etc. from adhering to an electron microscope image recording medium placed in an electron microscope, particularly in a camera room, due to electrostatic attraction. This relates to an electron microscope that has been made possible.
(従来の技術)
従来より、試料を透過させた電子線を電界あるいは磁界
によって屈折させて、試料の拡大像を得る電子顕微鏡が
公知となっている。多くの場合この電子顕微鏡において
はカメラ室が設けられ、このカメラ室内に配置した写真
フィルム等の記録媒体に試料を透過した電子線を照射さ
せることにより、試料の電子顕微鏡像を該記録媒体に記
S(撮影)できるようになっている。上記記録媒体の出
し入れは、カメラ室に設けられた扉を通して行なわれる
。なお周知の通り、電子顕微鏡像の記録に際して、電子
線が投射される上記カメラ室内は真空状態に維持される
。(Prior Art) Conventionally, an electron microscope has been known that obtains an enlarged image of a sample by refracting an electron beam transmitted through a sample using an electric field or a magnetic field. In many cases, this electron microscope is equipped with a camera room, and an electron microscope image of the sample is recorded on the recording medium such as photographic film placed in the camera room by irradiating the electron beam that has passed through the sample. S (shooting) is now possible. The recording medium is taken in and taken out through a door provided in the camera room. As is well known, when recording an electron microscope image, the camera chamber onto which the electron beam is projected is maintained in a vacuum state.
(発明が解決しようとする問題点)
ところで、特に上記記録媒体として、本出願人による特
開昭61−51738号等に示される蓄積性蛍光体シー
ト等の2次元センサが用いられる場合、電子顕微鏡像記
録(撮影)時にこの記録媒体に電子線が照射されるので
、該媒体が負価に帯電することがある。このように帯電
した記録媒体は、カメラ室外に取り出された際に、静電
引力によって空気中のゴミやホコリ等を吸着しやすくな
る。記録媒体にゴミ、ホコリ等が付着すると、記録画像
にノイズとなって表われてしまう。また上記2次元セン
サは画像消去を繰り返して何回も使用可能であるので、
このようにゴミ等を吸着した状態になっていると、次回
の使用時にカメラ室内にこのゴミ等を持ち込むことにな
る。このゴミ、ホコリ等は、カメラ室を真空状態にする
ために該カメラ室内から排気がなされる際に、排気通路
のバルブ等に付着しやすい。このようなことが度量なる
と、この付着したゴミ、ホコリ等によってバルブ等が作
動不良を起こし、カメラ室内の真空生成に異常をきたす
ことがある。(Problems to be Solved by the Invention) By the way, especially when a two-dimensional sensor such as a stimulable phosphor sheet disclosed in Japanese Patent Application Laid-Open No. 61-51738 by the present applicant is used as the recording medium, Since this recording medium is irradiated with an electron beam during image recording (photography), the medium may be negatively charged. When the recording medium charged in this manner is taken out of the camera room, it tends to attract dirt and dust in the air due to electrostatic attraction. If dirt, dust, etc. adhere to the recording medium, it will appear as noise in the recorded image. In addition, the two-dimensional sensor mentioned above can be used many times by repeatedly erasing the image, so
If the camera absorbs dust or the like in this way, the dust or the like will be brought into the camera chamber the next time it is used. This dirt, dust, etc. tend to adhere to the valves and the like of the exhaust passage when the camera chamber is evacuated to bring the camera chamber into a vacuum state. If this happens to a large extent, the attached dirt, dust, etc. may cause valves to malfunction, causing abnormal vacuum generation within the camera chamber.
また上記2次元センサは、何枚かまとめて電子顕微鏡像
読取りにかけられることが多いが、この2次元センサが
上述のように帯電していると互いが静電引力によって吸
着することがあり、そうなると読取り時に2枚搬送がな
されてセンサ搬送系において搬送トラブルを起こしたり
、読取エラーを招くことになる。In addition, the two-dimensional sensors described above are often subjected to electron microscope image reading in batches, but if these two-dimensional sensors are charged as described above, they may attract each other due to electrostatic attraction. Two sheets are transported during reading, which may cause transport troubles in the sensor transport system or lead to reading errors.
なお、以上述べた記録媒体の帯電は、電子線照射によっ
てのみならず、特にそれが前述の2次元センサである場
合には、センサどうしあるいはセンサ搬送系とセンサが
擦れ合うことによっても生じる。Note that the above-mentioned charging of the recording medium is caused not only by the electron beam irradiation, but also by the sensors rubbing against each other or the sensor transport system, particularly when the two-dimensional sensor is used.
また、以上電子顕微鏡像記録媒体として蓄積性蛍光体シ
ート等の2次元センサが用いられる場合について主に説
明したが、この電子顕微鏡像記録媒体として従来から広
く用いられてきた銀塩写真フィルムを用いる場合でも、
フィルムが裸の状態で取り扱われたり、あるいは多数枚
積み重ねた状態から自動的に1枚ずつ枚葉して電子顕微
鏡像記録部に搬送される等の場合には、同様に帯電の問
−3問
題が生じる。Furthermore, although we have mainly explained the case where a two-dimensional sensor such as a stimulable phosphor sheet is used as the electron microscope image recording medium, silver halide photographic film, which has been widely used in the past, is used as the electron microscope image recording medium. Even if
If the film is handled in a bare state, or if it is automatically fed one by one from a stack of many films and transported to the electron microscope image recording section, the problem of charge-3 is also applied. occurs.
そこで本発明は、前記2次元センサや写真フィルム等の
記録媒体に静電引力でゴミ、ホコリ等が吸着したり、あ
るいは記録媒体どうしが吸着することを防止できる電子
顕微鏡を提供することを目的とするものである。SUMMARY OF THE INVENTION Therefore, an object of the present invention is to provide an electron microscope that can prevent dirt, dust, etc. from adhering to the two-dimensional sensor or a recording medium such as a photographic film due to electrostatic attraction, or from adhering recording media to each other. It is something to do.
(問題点を解決するための手段)
本発明の電子顕微鏡は、前述のようなカメラ室を備えた
電子顕微鏡において、
カメラ室の真空状態を破壊するとき該室内に気体を導入
する気体導入系に、上記気体中に正価および/または負
価のイオンを混入させるイオン生成手段を接続したこと
を特徴とするものである。(Means for Solving the Problems) The electron microscope of the present invention is an electron microscope equipped with a camera chamber as described above, and has a gas introduction system that introduces gas into the chamber when breaking the vacuum state of the camera chamber. , is characterized in that an ion generating means for mixing positive and/or negative ions into the gas is connected.
(作 用)
上記のようにしてカメラ室内に正価および/または負価
のイオンを送り込めば、該室内において帯電していた記
録媒体の電荷が中和され、その帯電が除去される。(Function) When positively charged and/or negatively charged ions are sent into the camera chamber as described above, the charge on the recording medium that has been charged in the chamber is neutralized and the charge is removed.
(実 施 例)
以下、図面に示す実施例に基づいて本発明を詳細に説明
する。(Example) Hereinafter, the present invention will be described in detail based on an example shown in the drawings.
第1図は本発明の一実施例による電子顕微鏡を示すもの
である。−例としてこの電子顕微鏡は、本出願人による
特開昭61−517.38号に示されるように、電子線
エネルギーを蓄積する2次元センサに電子顕微鏡像を記
録(撮影)するように構成されたものである。電子顕微
鏡の鏡体部1は、一様の速度の電子線2を射出する電子
銃3と、電子線2を試料面に絞り込む磁気レンズ、静電
レンズ等からなる少なくとも1コの集束レンズ4と、試
料台5と、上記集束レンズ4と同様の対物レンズ6と、
投影レンズ7とを有してなる。試料台5上に載置された
試料8を透過した電子線2は上記対物レンズ6により屈
折され、該試料8の拡大散乱像8aを形成する。この拡
大散乱像8aは投影レンズ7により、結像画9に結像投
影される(図中の8b)。FIG. 1 shows an electron microscope according to an embodiment of the present invention. - For example, this electron microscope is configured to record (photograph) an electron microscope image on a two-dimensional sensor that accumulates electron beam energy, as shown in Japanese Patent Application Laid-Open No. 61-517.38 by the present applicant. It is something that The mirror body 1 of the electron microscope includes an electron gun 3 that emits an electron beam 2 at a uniform velocity, and at least one focusing lens 4 consisting of a magnetic lens, an electrostatic lens, etc. that narrows the electron beam 2 to a sample surface. , a sample stage 5, an objective lens 6 similar to the focusing lens 4,
and a projection lens 7. The electron beam 2 transmitted through the sample 8 placed on the sample stage 5 is refracted by the objective lens 6 to form an enlarged scattered image 8a of the sample 8. This enlarged scattered image 8a is projected onto a formed image 9 by the projection lens 7 (8b in the figure).
上記電子顕微鏡の鏡体部1の下方には、電子顕微鏡像記
録装置10が配置されている。この電子顕微鏡像記録装
置10は、2次元センサとしての蓄積性愛光体シート1
2を多数枚収めた供給用マガジン14が収納されるセン
サ供給部16と、前記結像面9を含むように形成された
記録部18と、上記供給用マガジン14と同様の受納用
マガジン20が収納されるセンサ受納部22とを有して
いる。これらセンサ供給部16と記録部18とセンサ受
納部22は、電子顕微鏡の稼動中真空状態に維持される
カメラ室19内に設けられたものである。上記供給用マ
ガジン14の出し入れ、および受納用マガジン20の出
し入れはそれぞれ、カメラ室19の扉2).23を開け
て行なわれる。なお上記蓄積性蛍光体シート12はそこ
に照射された電子線のエネルギーを蓄積記録し、その後
励起光が照射されると上記電子線エネルギーに対応した
強度の輝尽発光光を発するものであり、具体的な構成に
ついては例えば前記特開昭61−51738号に詳しい
開示がなされている。一方、上記センサ供給部16と記
録部18との間には消去光源24が配設されている。そ
して上記センサ供給部16と記録部18との間に差し渡
して、水平方向に移動可能なシート供給テーブル26が
設けられている。An electron microscope image recording device 10 is arranged below the mirror body 1 of the electron microscope. This electron microscope image recording device 10 includes a stimulable photosensitive sheet 1 as a two-dimensional sensor.
a sensor supply section 16 in which a supply magazine 14 containing a large number of 2 sheets, a recording section 18 formed to include the image forming surface 9, and a receiving magazine 20 similar to the supply magazine 14 described above. It has a sensor accommodating part 22 in which is housed. These sensor supply section 16, recording section 18, and sensor receiving section 22 are provided in a camera chamber 19 that is maintained in a vacuum state during operation of the electron microscope. The supply magazine 14 and the receiving magazine 20 can be taken in and out through the door 2) of the camera room 19, respectively. 23 will be opened. The stimulable phosphor sheet 12 stores and records the energy of the electron beam irradiated thereon, and when it is subsequently irradiated with excitation light, it emits stimulated luminescence light with an intensity corresponding to the energy of the electron beam. The specific structure is disclosed in detail in, for example, the aforementioned Japanese Patent Laid-Open No. 61-51738. On the other hand, an erasing light source 24 is provided between the sensor supply section 16 and the recording section 18. A horizontally movable sheet supply table 26 is provided across the sensor supply section 16 and the recording section 18.
該シート供給テーブル2θには歯車28に噛合するラッ
ク30が固定され、歯車28が回転されると、シート供
給テーブル26は図中左右方向に移動するようになって
いる。またセンサ受納部22には、前記記録部18内の
蓄積性蛍光体シート12を保持して受納用マガジン20
内に落とし込むシート送出しアーム32が設けられてい
る。なお鏡体部1と電子顕微鏡像記録装置10との間に
は、それぞれ図中矢印六方向に揺動可能なシャッター3
4と、蛍光スクリーン36とが設けられ、これらシャッ
ター34とスクリーン36は各々図示しないレバーによ
って操作されるようになっている。また上記シャッター
34の上方において、鏡体部1の周壁には例えば鉛ガラ
スからなる観察窓38が設けられている。A rack 30 that meshes with a gear 28 is fixed to the sheet supply table 2θ, and when the gear 28 is rotated, the sheet supply table 26 moves in the left-right direction in the figure. Further, the sensor receiving section 22 holds the stimulable phosphor sheet 12 in the recording section 18, and a receiving magazine 20 is provided.
A sheet delivery arm 32 is provided which is dropped into the container. Note that between the mirror body 1 and the electron microscope image recording device 10, there are shutters 3 that are movable in the six directions of arrows in the figure.
4 and a fluorescent screen 36 are provided, and these shutter 34 and screen 36 are each operated by a lever (not shown). Further, above the shutter 34, an observation window 38 made of lead glass, for example, is provided on the peripheral wall of the mirror body 1.
上記鏡体部1の内部と、カメラ室19の内部は、電子顕
微鏡の稼働中、公知の排気装置によって真空状態に維持
されるが、鏡体部1とカメラ室19との間には公知の遮
断部材(図示甘ず)が設けられ、該遮断部材によって鏡
体部1内部とカメラ室19の内部とを互いに遮断するこ
とにより、供給用マガジン14の装着および受納用マガ
ジン20の取出しの際に、カメラ室19内の真空を破壊
しても、鏡体部1内は真空状態に維持できるようになっ
ている。While the electron microscope is in operation, the interior of the mirror body 1 and the camera chamber 19 are maintained in a vacuum state by a known exhaust system. A blocking member (not shown) is provided, and by blocking the inside of the mirror body 1 and the inside of the camera chamber 19 from each other, it is possible to install the supply magazine 14 and take out the receiving magazine 20. Furthermore, even if the vacuum in the camera chamber 19 is destroyed, the interior of the mirror body 1 can be maintained in a vacuum state.
電子顕微鏡像の記録を行なう際には扉2).23が開か
れ、センサ供給部16内には蓄積性蛍光体シート12を
多数枚収めた供給用マガジン14が収納され、またセン
サ受納部22内には空の受納用マガジン20が収納され
る。そして前記シャッター34と蛍光スクリーン36は
、電子線2を遮る位置(図中水平位置)に設定される。When recording electron microscope images, close the door 2). 23 is opened, a supply magazine 14 containing a large number of stimulable phosphor sheets 12 is stored in the sensor supply section 16, and an empty storage magazine 20 is stored in the sensor receiving section 22. Ru. The shutter 34 and the fluorescent screen 36 are set at a position where they block the electron beam 2 (horizontal position in the figure).
また前記歯車28が図中時計方向に回転されてシート供
給テーブル26が図中右方に移動され、供給用マガジン
14の最下位の蓄積性蛍光体シート12が記録部18に
送られる。こうして蓄積性蛍光体シート12が送られる
とき、前記消去光源24が点灯されて消去光58がシー
ト12に照射され、該シート12は残存放射線エネルギ
ーの消去を受ける。シート供給テーブル26はシート1
2が前記結像面9に位置すると停止される。前記電子線
2は蛍光スクリーン36に当たって蛍光を発生させるの
で、該電子線2が担持する拡大散乱像8aが、観察窓3
8を通して観察される。このように蛍光スクリーン36
を観察して拡大散乱像8aのピント、倍率および視野範
囲が決定された後、シャッター34と蛍光スクリーン3
6は、前述のレバーを操作することにより、電子線2を
遮らない位置まで跳ね上げられる。こうすると電子線2
は、記録部18にセットされている蓄積性蛍光体シート
12に到達し、拡大散乱像8bを担持する電子線エネル
ギーが該シート12に蓄積記録される。Further, the gear 28 is rotated clockwise in the figure, the sheet supply table 26 is moved to the right in the figure, and the lowest stimulable phosphor sheet 12 in the supply magazine 14 is sent to the recording section 18. When the stimulable phosphor sheet 12 is fed in this way, the erasing light source 24 is turned on and the erasing light 58 is irradiated onto the sheet 12, so that the sheet 12 undergoes erasure of residual radiation energy. Sheet supply table 26 supplies sheet 1
2 is located on the imaging plane 9, it is stopped. The electron beam 2 hits the fluorescent screen 36 and generates fluorescence, so that the enlarged scattered image 8a carried by the electron beam 2 appears on the observation window 3.
Observed through 8. In this way, the fluorescent screen 36
After the focus, magnification and viewing range of the enlarged scattered image 8a are determined by observing the image, the shutter 34 and the fluorescent screen 3
6 is flipped up to a position where it does not block the electron beam 2 by operating the aforementioned lever. In this way, electron beam 2
reaches the stimulable phosphor sheet 12 set in the recording section 18, and the electron beam energy carrying the enlarged scattered image 8b is accumulated and recorded on the sheet 12.
上記のようにシャッター34を開いて電子線露光を行な
った後、シャッター34が閉じられる。そして拡大散乱
像8bを蓄積記録した蓄積性蛍光体シート12は、シー
ト送出しアーム32によって受納用マガジン20内に落
とし込まれる。そしてシート供給テーブル26は、歯車
28を逆転することによってセンサ供給部16に戻され
、次回の電子顕微鏡像記録に備えて、前述と同様にして
供給用マガジン14内の蓄積性蛍光体シート12を1枚
記録部18に供給する。After opening the shutter 34 and performing electron beam exposure as described above, the shutter 34 is closed. The stimulable phosphor sheet 12 on which the enlarged scattered image 8b has been stored and recorded is then dropped into the receiving magazine 20 by the sheet delivery arm 32. Then, the sheet supply table 26 is returned to the sensor supply unit 16 by reversing the gear 28, and the stimulable phosphor sheet 12 in the supply magazine 14 is loaded in the same manner as described above in preparation for the next electron microscope image recording. One sheet is supplied to the recording section 18.
上記の操作が繰り返されると、受納用マガジン20内に
は、電子顕微鏡像記録済みの蓄積性蛍光体シート12が
まとめて収納される。そこで一連の電子顕微鏡像記録が
終了したならば、扉23を開けてこの受納用マガジン2
0をセンサ受納部22から取り出し、蓄積性蛍光体シー
ト12を電子顕微鏡像読取りにかける。第2図はこの電
子顕微鏡像読取りを行なう画像読取装置の一例を示すも
のである。この装置において蓄積性蛍光体シート12は
、例えばエンドレスベルトからなるシート搬送手段40
上に載置される。そしてHe−Neレーザ管等の励起光
源42から射出される励起光ビーム44を、ガルバノメ
ータミラー等の光偏向器46によって偏向し、蓄積性蛍
光体シート12を該ビーム44により矢印X方向に走査
する(主走査)。それとともに上記シート搬送手段40
により、蓄積性蛍光体シート12を上記主走査方向と略
直角なY方向に移動させる(副走査)。それにより蓄積
性蛍光体シート12は、その全面に亘って励起光ビーム
44の照射を受ける。When the above operation is repeated, the stimulable phosphor sheets 12 on which electron microscope images have been recorded are collectively stored in the receiving magazine 20. When the series of electron microscope image recording is completed, open the door 23 and open the receiving magazine 2.
0 from the sensor receiving section 22, and the stimulable phosphor sheet 12 is subjected to electron microscope image reading. FIG. 2 shows an example of an image reading device for reading the electron microscope image. In this device, the stimulable phosphor sheet 12 is transported by a sheet conveying means 40 consisting of, for example, an endless belt.
placed on top. Then, an excitation light beam 44 emitted from an excitation light source 42 such as a He-Ne laser tube is deflected by an optical deflector 46 such as a galvanometer mirror, and the stimulable phosphor sheet 12 is scanned in the direction of arrow X by the beam 44. (main scan). At the same time, the sheet conveying means 40
As a result, the stimulable phosphor sheet 12 is moved in the Y direction substantially perpendicular to the main scanning direction (sub-scanning). As a result, the entire surface of the stimulable phosphor sheet 12 is irradiated with the excitation light beam 44.
この励起光照射により蓄積性蛍光体シート12は、蓄積
記録した電子線エネルギーに応じたレベルの輝尽発光光
48を故山する。この輝尽発光光48は集光体50の入
射端面50aから該集光体50内に入射し、該集光体5
0内を全反射を繰り返して進んで射出端面50bから射
出し、この射出端面50bに接続されたフォトマル等の
光検出器52に受光され、上記輝尽発光光量が光電的に
読み取られる。光検出器52から出力される電気信号は
前記電子線エネルギーのレベルを示すものとなり、この
電気信号は画像処理回路54に送られて必要な画像処理
が施された上、画像再生装置56に入力される。この画
像再生装置56は、CRTなどのディスプレイでもよい
し、また感光フィルムに光走査記録を行なう記録装置で
あってもよい。このように前記輝尽発光光量に対応した
電気信号を用いて画像を出力することにより、上記輝尽
発光光48が担持する前記拡大散乱像8bが再生される
。By this excitation light irradiation, the stimulable phosphor sheet 12 emits stimulated luminescence light 48 at a level corresponding to the accumulated and recorded electron beam energy. This stimulated luminescence light 48 enters into the light collecting body 50 from the incident end surface 50a of the light collecting body 50.
The emitted light travels through the zero through repeated total reflection and exits from the exit end face 50b, is received by a photodetector 52 such as a photomultiplier connected to the exit end face 50b, and the amount of stimulated luminescence light is read photoelectrically. The electrical signal output from the photodetector 52 indicates the level of the electron beam energy, and this electrical signal is sent to the image processing circuit 54 where necessary image processing is performed, and then input to the image reproduction device 56. be done. This image reproducing device 56 may be a display such as a CRT, or may be a recording device that performs optical scanning recording on a photosensitive film. By outputting an image using the electric signal corresponding to the amount of stimulated luminescence light in this manner, the enlarged scattered image 8b carried by the stimulated luminescence light 48 is reproduced.
次に、カメラ室19内に空気中のゴミ、ホコリ等が侵入
することを防止する機構について説明する。Next, a mechanism for preventing dirt, dust, etc. in the air from entering the camera room 19 will be explained.
カメラ室19内には気体供給管25が開口され、該気体
供給管25は2本の支管すなわち窒素ガス供給管27と
空気供給管29とに接続されている。窒素ガス供給管2
7、空気供給管29はそれぞれ、−例としてM磁弁から
なる開閉弁31.33を介して窒素ガスボンベ35、圧
縮空気タンク37に接続されている。なお開閉弁31と
窒素ガスボンベ35との間には、後に詳述するイオン化
装置51が介設されている。上記窒素ガスボンベ35内
には、圧縮された乾燥窒素ガス39が充填されている。A gas supply pipe 25 is opened in the camera room 19, and the gas supply pipe 25 is connected to two branch pipes, namely a nitrogen gas supply pipe 27 and an air supply pipe 29. Nitrogen gas supply pipe 2
7. The air supply pipe 29 is connected to a nitrogen gas cylinder 35 and a compressed air tank 37, respectively, via on-off valves 31 and 33, which are M magnetic valves, for example. Note that an ionization device 51, which will be described in detail later, is interposed between the on-off valve 31 and the nitrogen gas cylinder 35. The nitrogen gas cylinder 35 is filled with compressed dry nitrogen gas 39 .
一方乾燥圧・縮空気タンク37には、コンプレッサ41
により乾燥圧縮空気43が送り込まれるようになってい
る。上記窒素ガス39は減圧弁40で大気圧に減圧され
ており、また乾燥圧縮空気43は、例えば圧縮空気タン
ク37内の圧力低下検出によってコンプレッサ41が自
動運転される等により、大気圧以上に加圧されている。On the other hand, a compressor 41 is installed in the dry pressure/compressed air tank 37.
Dry compressed air 43 is fed in by. The nitrogen gas 39 is reduced to atmospheric pressure by a pressure reducing valve 40, and the dry compressed air 43 is increased to above atmospheric pressure by, for example, automatically operating the compressor 41 upon detection of a pressure drop in the compressed air tank 37. I'm under pressure.
一方カメラ室19の扉2).23の開閉状態を検出する
例えばリミットスイッチ等の開閉センサ45.47が設
けられ、これらの開閉センサ45.47から出力される
信号S1、S2は気体供給制御回路49に入力されるよ
うになっている。On the other hand, door 2) of camera room 19. Opening/closing sensors 45.47 such as limit switches are provided to detect the open/closed states of the gas supply valve 23, and signals S1 and S2 outputted from these opening/closing sensors 45.47 are input to the gas supply control circuit 49. There is.
供給用マガジン14あるいは受納用マガジン20の出し
入れのためにまず、カメラ室19の真空リークを行なう
。その時は弁開信号S3を開閉弁31に送って弁31を
開け、乾燥窒素ガス39をカメラ室19に送り込む。そ
してリーク完了後扉2)あるいは扉23が開かれると、
開閉センサ45あるいは開閉センサ47は扉開状態を示
す信号を気体供給制御回路49に送る。気体供給制御回
路49はこの扉開状態を示す信号が開閉センサ45.4
7の少なくとも一方から入力されると、弁開信号S4を
開閉弁33に送ってこの開閉弁33を開かせる。それに
より、扉2)あるいは扉23が開かれると同時に、圧縮
空気タンク37から大気圧以上の乾燥空気43がカメラ
室19内に送り込まれる。ここで乾燥窒素ガス39およ
び乾燥空気43はいずれもイオン化装置51を通り、一
部が正価または負価のイオンとなってカメラ室19内に
送り込まれる。In order to take in and out the supply magazine 14 or the receiving magazine 20, first, the camera chamber 19 is vacuum leaked. At that time, the valve opening signal S3 is sent to the on-off valve 31 to open the valve 31, and dry nitrogen gas 39 is sent into the camera room 19. Then, when door 2) or door 23 is opened after the leak is completed,
The opening/closing sensor 45 or the opening/closing sensor 47 sends a signal indicating the door open state to the gas supply control circuit 49. The gas supply control circuit 49 receives a signal indicating this door open state from the open/close sensor 45.4.
7, the valve opening signal S4 is sent to the on-off valve 33 to open the on-off valve 33. As a result, when the door 2) or the door 23 is opened, dry air 43 at atmospheric pressure or higher is sent into the camera room 19 from the compressed air tank 37. Here, both the dry nitrogen gas 39 and the dry air 43 pass through the ionization device 51, and some of them become positive or negative ions and are sent into the camera chamber 19.
上記のように乾燥空気43をカメラ室19に送れば、開
かれたm2)あるいは扉23からカメラ室19外に乾燥
空気43が流出するので、カメラ室19外の空気がカメ
ラ室19内に流れ込むことがない。したがって、カメラ
室19外から例えゴミ、ホコリ等がカメラ室19内に侵
入することがなく、また、湿った空気が入り込むことも
ない。If the dry air 43 is sent to the camera room 19 as described above, the dry air 43 will flow out of the camera room 19 from the opened m2) or door 23, so the air outside the camera room 19 will flow into the camera room 19. Never. Therefore, dirt, dust, etc. do not enter the camera room 19 from outside the camera room 19, and humid air does not enter the camera room 19.
また先に述べた通り、蓄積性蛍光体シート12が電子顕
微鏡他記録(撮影)に際して電子線2の照射を受けるこ
とにより、あるいはシート12どうしあるいは搬送手段
40とシート12が擦れ合うことにより、該シート12
は負に帯電することがあるが、この場合は正価のイオン
により電荷が中和され、シート12は除電される。した
がって、蓄積性蛍光体シート12がカメラ室19外に取
り出された際に静電引力によって該シート12に空気中
のゴミ、ホコリ等が吸着することがない。また受納用マ
ガジン20に集積されたシート12とうしが静電引力に
よって互いに吸着することもないので、第2図図示の画
像読取装置によって前述の画像読取りを行なう際に、2
枚吸着のままシート12が搬送されてシート搬送トラブ
ルを生じたり、読取りエラーを招くことが防止される。Furthermore, as described above, when the stimulable phosphor sheet 12 is irradiated with the electron beam 2 during recording (photography) using an electron microscope, or when the sheets 12 rub against each other or against the conveyance means 40, the stimulable phosphor sheet 12 12
may be negatively charged, but in this case, the charge is neutralized by positively charged ions, and the sheet 12 is neutralized. Therefore, when the stimulable phosphor sheet 12 is taken out of the camera room 19, dirt, dust, etc. in the air will not be attracted to the sheet 12 due to electrostatic attraction. Further, since the sheets 12 accumulated in the receiving magazine 20 are not attracted to each other by electrostatic attraction, when the above-mentioned image reading is performed by the image reading device shown in FIG.
This prevents sheet 12 from being conveyed while being adsorbed, causing sheet conveyance troubles or reading errors.
ここでイオン化装置51は、シート12の除電が完了す
ると自動的にイオン化を中止するようになっていること
が好ましい。It is preferable that the ionization device 51 is configured to automatically stop ionization when static elimination of the sheet 12 is completed.
またカメラ室のリークが完了し、大気圧になった時に乾
燥窒素ガス39から乾燥圧縮空気43に切換えるため、
カメラ室19内から流出した乾燥窒素ガス39が電子顕
微鏡設置室内に大量に充満して電子顕微鏡操作者の呼吸
困難を招くようなことはない。In addition, when the leak in the camera room is completed and the pressure reaches atmospheric pressure, the dry nitrogen gas 39 is switched to dry compressed air 43.
There is no possibility that a large amount of the dry nitrogen gas 39 flowing out from the camera room 19 will fill the electron microscope installation room and cause difficulty in breathing for the electron microscope operator.
また上述のように最初に乾燥窒素ガス39をカメラ室1
9内に流入させているので、カメラ室19の内壁には窒
素分子が吸着するようになる。このような窒素分子は、
次にカメラ室19内を排気する際に容易にカメラ室19
内壁から離脱しつるが、酸素分子や水の分子がカメラ室
19内壁に吸着すると排気に際してなかなか上記内壁か
ら離脱しない。したがって、本例におけるようにまず窒
素ガス39をカメラ室19に送り込めば、次にカメラ室
19内を真空にする際に、真空状態生成が容易かつ短時
間に行なわれうるようになる。Also, as mentioned above, first dry nitrogen gas 39 is applied to the camera room 1.
Since the nitrogen molecules are allowed to flow into the interior of the camera chamber 19, nitrogen molecules become adsorbed on the inner wall of the camera chamber 19. Such a nitrogen molecule is
Next, when the inside of the camera room 19 is evacuated, the camera room 19 can be easily removed.
However, if oxygen molecules or water molecules are adsorbed to the inner wall of the camera chamber 19, they will not easily detach from the inner wall when exhausting air. Therefore, if the nitrogen gas 39 is first sent into the camera room 19 as in this example, then when the inside of the camera room 19 is evacuated, the vacuum state can be created easily and in a short time.
なお本発明においては、上記のように2種類の気体を切
り換えてカメラ室19に送ることは必ずしも必要ではな
く、例えば、真空リーク手段と気体供給手段を兼用する
こともできる。またカメラ室19に送る気体として空気
以外には、上記窒素ガスの他、例えばアルゴンガス等の
不活性ガスが好適に用いられつる。In the present invention, it is not necessarily necessary to switch between two types of gas and send them to the camera room 19 as described above, and for example, the vacuum leak means and the gas supply means may be used both. In addition to the nitrogen gas mentioned above, an inert gas such as argon gas is preferably used as the gas to be sent to the camera room 19 other than air.
また以上、蓄積性蛍光体シート12に電子顕微鏡他記録
を行なう電子顕微鏡に本発明を適用した実施例について
説明したが、本発明はこのような電子顕微鏡に限らず、
銀塩写真フィルムに電子顕微鏡像を記録するように構成
された電子顕微鏡に対しても勿論適用可能である。Further, although an embodiment in which the present invention is applied to an electron microscope that performs recording on the stimulable phosphor sheet 12 has been described above, the present invention is not limited to such an electron microscope.
Of course, the present invention can also be applied to an electron microscope configured to record an electron microscope image on a silver halide photographic film.
(発明の効果)
以上詳細に説明した通り本発明によれば、帯電した蓄積
性蛍光体シート等の記録媒体にゴミ、ホコリ等が付着し
て、それらが電子顕微鏡のカメラ室内に侵入することを
確実に防止できるので、記録画僚にゴミ、ホコリ等の影
響によるノイズが生ずることもなくなる。また、カメラ
室排気系のバルブ動作不良等の不具合発生を回避し、電
子顕微鏡の信頼性を大いに高めることができる。また本
発明によれば、蓄積性蛍光体シート、写真フィルム等の
記録媒体どうしが静電引力によって吸着し合うことも確
実に防止できるので、該記録媒体を画像読取り処理にか
けたり現像処理にかけたりする際に、記録媒体どうしの
吸着によるトラブル発生を回避でき、上記読取り処理等
の信頼性を高めることもできる。さらに、湿った空気が
カメラ室に浸入することも防止できるので真空に引く時
間を短縮化できる。(Effects of the Invention) As described above in detail, according to the present invention, dirt, dust, etc. are prevented from adhering to a recording medium such as a charged stimulable phosphor sheet and entering the camera chamber of an electron microscope. Since this can be reliably prevented, noise caused by the influence of dirt, dust, etc. will not be generated on the recording staff. Furthermore, it is possible to avoid problems such as malfunctioning valves in the camera chamber exhaust system, and to greatly improve the reliability of the electron microscope. Furthermore, according to the present invention, since it is possible to reliably prevent recording media such as stimulable phosphor sheets and photographic films from adhering to each other due to electrostatic attraction, it is possible to reliably prevent recording media such as stimulable phosphor sheets and photographic films from being attracted to each other by electrostatic attraction, so that it is possible to reliably prevent recording media such as stimulable phosphor sheets and photographic films from being attracted to each other by electrostatic attraction. At the same time, it is possible to avoid troubles caused by adhesion of recording media to each other, and it is also possible to improve the reliability of the reading process, etc. Furthermore, since it is possible to prevent moist air from entering the camera room, the time required to create a vacuum can be shortened.
第1図は本発明の一実施例による電子顕微鏡を示す概略
図、
第2図は上記実施例の電子顕微鏡において電子顕微鏡像
記録がなされた蓄積性蛍光体シートから電子顕微鏡像を
読み取り、再生する装置を示す概略図である。FIG. 1 is a schematic diagram showing an electron microscope according to an embodiment of the present invention, and FIG. 2 is a diagram showing how an electron microscope image is read and reproduced from a stimulable phosphor sheet on which an electron microscope image has been recorded using the electron microscope according to the above embodiment. FIG. 2 is a schematic diagram showing the device.
Claims (2)
置し、この記録媒体に試料を透過した電子線を照射させ
て該試料の電子顕微鏡像を記録するように構成された電
子顕微鏡において、 前記カメラ室の真空状態を破壊するとき該室内に気体を
導入する気体導入系に、前記気体中に正価および/また
は負価のイオンを混入させるイオン生成手段が接続され
たことを特徴とする電子顕微鏡。(1) In an electron microscope configured to place a recording medium in a camera chamber maintained in a vacuum state, and record an electron microscope image of the sample by irradiating the recording medium with an electron beam that has passed through the sample, An electronic device characterized in that ion generation means for mixing positive and/or negative ions into the gas is connected to a gas introduction system that introduces gas into the camera room when breaking the vacuum state of the camera room. microscope.
込む気体供給源と、 前記カメラ室の扉の開閉に連動して、該扉が開かれたと
きカメラ室に前記気体を供給させ、該扉が閉じられたと
きこの気体供給を停止させる気体供給制御手段とを有す
ることを特徴とする特許請求の範囲第1項記載の電子顕
微鏡。(2) The gas introduction system includes a gas supply source that sends gas into the camera room, and a gas supply source that supplies the gas to the camera room when the door is opened in conjunction with the opening and closing of the door of the camera room. 2. The electron microscope according to claim 1, further comprising gas supply control means for stopping the gas supply when the door is closed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61310249A JPS63168949A (en) | 1986-12-29 | 1986-12-29 | Electron microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61310249A JPS63168949A (en) | 1986-12-29 | 1986-12-29 | Electron microscope |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63168949A true JPS63168949A (en) | 1988-07-12 |
Family
ID=18002972
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP61310249A Pending JPS63168949A (en) | 1986-12-29 | 1986-12-29 | Electron microscope |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63168949A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0359938A (en) * | 1989-07-27 | 1991-03-14 | Fuji Photo Film Co Ltd | Recording and reading method for electron microscopic image |
US5492862A (en) * | 1993-01-12 | 1996-02-20 | Tokyo Electron Limited | Vacuum change neutralization method |
US6207006B1 (en) | 1997-09-18 | 2001-03-27 | Tokyo Electron Limited | Vacuum processing apparatus |
-
1986
- 1986-12-29 JP JP61310249A patent/JPS63168949A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0359938A (en) * | 1989-07-27 | 1991-03-14 | Fuji Photo Film Co Ltd | Recording and reading method for electron microscopic image |
US5492862A (en) * | 1993-01-12 | 1996-02-20 | Tokyo Electron Limited | Vacuum change neutralization method |
US6207006B1 (en) | 1997-09-18 | 2001-03-27 | Tokyo Electron Limited | Vacuum processing apparatus |
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