JPS6316684B2 - - Google Patents

Info

Publication number
JPS6316684B2
JPS6316684B2 JP20473881A JP20473881A JPS6316684B2 JP S6316684 B2 JPS6316684 B2 JP S6316684B2 JP 20473881 A JP20473881 A JP 20473881A JP 20473881 A JP20473881 A JP 20473881A JP S6316684 B2 JPS6316684 B2 JP S6316684B2
Authority
JP
Japan
Prior art keywords
antenna
wave
measured
circulator
thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP20473881A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58105009A (ja
Inventor
Shunji Myahara
Sumio Kobayashi
Toshihiko Murakami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Industries Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP20473881A priority Critical patent/JPS58105009A/ja
Publication of JPS58105009A publication Critical patent/JPS58105009A/ja
Publication of JPS6316684B2 publication Critical patent/JPS6316684B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
JP20473881A 1981-12-17 1981-12-17 Ｆｍ電波による厚み測定方法及び厚み計 Granted JPS58105009A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20473881A JPS58105009A (ja) 1981-12-17 1981-12-17 Ｆｍ電波による厚み測定方法及び厚み計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20473881A JPS58105009A (ja) 1981-12-17 1981-12-17 Ｆｍ電波による厚み測定方法及び厚み計

Publications (2)

Publication Number Publication Date
JPS58105009A JPS58105009A (ja) 1983-06-22
JPS6316684B2 true JPS6316684B2 (esLanguage) 1988-04-11

Family

ID=16495491

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20473881A Granted JPS58105009A (ja) 1981-12-17 1981-12-17 Ｆｍ電波による厚み測定方法及び厚み計

Country Status (1)

Country Link
JP (1) JPS58105009A (esLanguage)

Also Published As

Publication number Publication date
JPS58105009A (ja) 1983-06-22

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