JPS63163467U - - Google Patents
Info
- Publication number
- JPS63163467U JPS63163467U JP5710987U JP5710987U JPS63163467U JP S63163467 U JPS63163467 U JP S63163467U JP 5710987 U JP5710987 U JP 5710987U JP 5710987 U JP5710987 U JP 5710987U JP S63163467 U JPS63163467 U JP S63163467U
- Authority
- JP
- Japan
- Prior art keywords
- measuring device
- depression
- probe
- reliably
- come
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5710987U JPS63163467U (zh) | 1987-04-15 | 1987-04-15 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5710987U JPS63163467U (zh) | 1987-04-15 | 1987-04-15 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63163467U true JPS63163467U (zh) | 1988-10-25 |
Family
ID=30886516
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5710987U Pending JPS63163467U (zh) | 1987-04-15 | 1987-04-15 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63163467U (zh) |
-
1987
- 1987-04-15 JP JP5710987U patent/JPS63163467U/ja active Pending