JPS63156084U - - Google Patents
Info
- Publication number
- JPS63156084U JPS63156084U JP4887487U JP4887487U JPS63156084U JP S63156084 U JPS63156084 U JP S63156084U JP 4887487 U JP4887487 U JP 4887487U JP 4887487 U JP4887487 U JP 4887487U JP S63156084 U JPS63156084 U JP S63156084U
- Authority
- JP
- Japan
- Prior art keywords
- terminal
- test
- selector
- shift mode
- switching
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000002457 bidirectional effect Effects 0.000 claims description 3
- 206010048669 Terminal state Diseases 0.000 description 3
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4887487U JPH0725723Y2 (ja) | 1987-03-31 | 1987-03-31 | 試験回路内蔵型ｌｓｉ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4887487U JPH0725723Y2 (ja) | 1987-03-31 | 1987-03-31 | 試験回路内蔵型ｌｓｉ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63156084U true JPS63156084U ( ) | 1988-10-13 |
| JPH0725723Y2 JPH0725723Y2 (ja) | 1995-06-07 |
Family
ID=30870815
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4887487U Expired - Lifetime JPH0725723Y2 (ja) | 1987-03-31 | 1987-03-31 | 試験回路内蔵型ｌｓｉ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0725723Y2 ( ) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0862298A (ja) * | 1994-08-26 | 1996-03-08 | Nec Corp | 半導体集積回路および検査方法 |
-
1987
- 1987-03-31 JP JP4887487U patent/JPH0725723Y2/ja not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0862298A (ja) * | 1994-08-26 | 1996-03-08 | Nec Corp | 半導体集積回路および検査方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0725723Y2 (ja) | 1995-06-07 |