JPS631536B2 - - Google Patents

Info

Publication number
JPS631536B2
JPS631536B2 JP54088634A JP8863479A JPS631536B2 JP S631536 B2 JPS631536 B2 JP S631536B2 JP 54088634 A JP54088634 A JP 54088634A JP 8863479 A JP8863479 A JP 8863479A JP S631536 B2 JPS631536 B2 JP S631536B2
Authority
JP
Japan
Prior art keywords
detection element
detection
object detection
time
power supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54088634A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5612569A (en
Inventor
Takeshi Aoki
Shigeru Yoneda
Takashi Ando
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Priority to JP8863479A priority Critical patent/JPS5612569A/ja
Publication of JPS5612569A publication Critical patent/JPS5612569A/ja
Publication of JPS631536B2 publication Critical patent/JPS631536B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Geophysics And Detection Of Objects (AREA)
JP8863479A 1979-07-11 1979-07-11 Body detecting device Granted JPS5612569A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8863479A JPS5612569A (en) 1979-07-11 1979-07-11 Body detecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8863479A JPS5612569A (en) 1979-07-11 1979-07-11 Body detecting device

Publications (2)

Publication Number Publication Date
JPS5612569A JPS5612569A (en) 1981-02-06
JPS631536B2 true JPS631536B2 (US07943777-20110517-C00090.png) 1988-01-13

Family

ID=13948235

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8863479A Granted JPS5612569A (en) 1979-07-11 1979-07-11 Body detecting device

Country Status (1)

Country Link
JP (1) JPS5612569A (US07943777-20110517-C00090.png)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH087862Y2 (ja) * 1993-09-10 1996-03-06 シオン化学工業株式会社 芳香具
CN100386170C (zh) * 2006-06-09 2008-05-07 清华大学 一种电火花线切割加工电极丝温度检测装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50941A (US07943777-20110517-C00090.png) * 1973-05-08 1975-01-08

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50941A (US07943777-20110517-C00090.png) * 1973-05-08 1975-01-08

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH087862Y2 (ja) * 1993-09-10 1996-03-06 シオン化学工業株式会社 芳香具
CN100386170C (zh) * 2006-06-09 2008-05-07 清华大学 一种电火花线切割加工电极丝温度检测装置

Also Published As

Publication number Publication date
JPS5612569A (en) 1981-02-06

Similar Documents

Publication Publication Date Title
US7274867B2 (en) System and method for determining the temperature of a semiconductor wafer
CN103105506B (zh) 检测传感器的热时间常数的风速计
US20190377023A1 (en) Real-time online prediction method for dynamic junction temperature of semiconductor power device
US10109551B2 (en) Methods and apparatuses for determining a parameter of a die
US7645071B2 (en) On chip temperature measuring and monitoring method
US3309881A (en) Black body radiation source
Corbellini et al. In-process temperature mapping system for industrial freeze dryers
US20130049454A1 (en) Prediction of transistor temperature in an inverter power module of a vehicle, and related operating methods
CN112218509B (zh) 结温估算方法及电机控制器
US7333904B2 (en) Method of determining FET junction temperature
CN104933308B (zh) 面向国产军用igbt模块的可靠性评估方法
Ghimire et al. Online chip temperature monitoring using υ ce-load current and IR thermography
CN105823971A (zh) 芯片运行状态监测系统及监测方法
JPS631536B2 (US07943777-20110517-C00090.png)
JPS631535B2 (US07943777-20110517-C00090.png)
EP0680590B1 (en) Conditioning sensing system for controlling working fluids
US5335513A (en) Apparatus and method for detecting characteristics of a working fluid
CN111812164A (zh) 附着水分检测装置、附着水分检测方法、电气设备及日志输出系统
Boyle et al. A CMOS circuit for real-time chip temperature measurement
Hernando et al. Thermal characterization of multichip power module
US3854034A (en) Systems incorporating apparatus and methods for simulating timed related temperatures
US11397047B2 (en) Moisture detector, moisture detection method, electronic device, and log output system
WO2019079956A1 (zh) 机器人的温升检测装置、机器人的温升检测方法
Koch et al. Automated calorimetric measurement with a peltier element for switching loss characterization
Utermöhlen et al. Model and measurement technique for temperature dependent electrothermal parameters of microbolometer structures