JPS63152141U - - Google Patents
Info
- Publication number
- JPS63152141U JPS63152141U JP4533987U JP4533987U JPS63152141U JP S63152141 U JPS63152141 U JP S63152141U JP 4533987 U JP4533987 U JP 4533987U JP 4533987 U JP4533987 U JP 4533987U JP S63152141 U JPS63152141 U JP S63152141U
- Authority
- JP
- Japan
- Prior art keywords
- display element
- lead terminal
- symbols
- power supply
- supply line
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000011521 glass Substances 0.000 description 3
- 238000005530 etching Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Landscapes
- Vessels, Lead-In Wires, Accessory Apparatuses For Cathode-Ray Tubes (AREA)
- Cathode-Ray Tubes And Fluorescent Screens For Display (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4533987U JPS63152141U (enrdf_load_stackoverflow) | 1987-03-26 | 1987-03-26 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4533987U JPS63152141U (enrdf_load_stackoverflow) | 1987-03-26 | 1987-03-26 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63152141U true JPS63152141U (enrdf_load_stackoverflow) | 1988-10-06 |
Family
ID=30863988
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4533987U Pending JPS63152141U (enrdf_load_stackoverflow) | 1987-03-26 | 1987-03-26 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63152141U (enrdf_load_stackoverflow) |
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7403028B2 (en) | 2006-06-12 | 2008-07-22 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
| US7417446B2 (en) | 2002-11-13 | 2008-08-26 | Cascade Microtech, Inc. | Probe for combined signals |
| US7420381B2 (en) | 2004-09-13 | 2008-09-02 | Cascade Microtech, Inc. | Double sided probing structures |
| US7427868B2 (en) | 2003-12-24 | 2008-09-23 | Cascade Microtech, Inc. | Active wafer probe |
| US7436194B2 (en) | 2002-05-23 | 2008-10-14 | Cascade Microtech, Inc. | Shielded probe with low contact resistance for testing a device under test |
| US7443186B2 (en) | 2006-06-12 | 2008-10-28 | Cascade Microtech, Inc. | On-wafer test structures for differential signals |
| US7449899B2 (en) | 2005-06-08 | 2008-11-11 | Cascade Microtech, Inc. | Probe for high frequency signals |
| US7456646B2 (en) | 2000-12-04 | 2008-11-25 | Cascade Microtech, Inc. | Wafer probe |
| US7498829B2 (en) | 2003-05-23 | 2009-03-03 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7504842B2 (en) | 1997-05-28 | 2009-03-17 | Cascade Microtech, Inc. | Probe holder for testing of a test device |
| US7609077B2 (en) | 2006-06-09 | 2009-10-27 | Cascade Microtech, Inc. | Differential signal probe with integral balun |
| US7619419B2 (en) | 2005-06-13 | 2009-11-17 | Cascade Microtech, Inc. | Wideband active-passive differential signal probe |
-
1987
- 1987-03-26 JP JP4533987U patent/JPS63152141U/ja active Pending
Cited By (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7504842B2 (en) | 1997-05-28 | 2009-03-17 | Cascade Microtech, Inc. | Probe holder for testing of a test device |
| US7456646B2 (en) | 2000-12-04 | 2008-11-25 | Cascade Microtech, Inc. | Wafer probe |
| US7495461B2 (en) | 2000-12-04 | 2009-02-24 | Cascade Microtech, Inc. | Wafer probe |
| US7436194B2 (en) | 2002-05-23 | 2008-10-14 | Cascade Microtech, Inc. | Shielded probe with low contact resistance for testing a device under test |
| US7482823B2 (en) | 2002-05-23 | 2009-01-27 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7518387B2 (en) | 2002-05-23 | 2009-04-14 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7489149B2 (en) | 2002-05-23 | 2009-02-10 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7453276B2 (en) | 2002-11-13 | 2008-11-18 | Cascade Microtech, Inc. | Probe for combined signals |
| US7417446B2 (en) | 2002-11-13 | 2008-08-26 | Cascade Microtech, Inc. | Probe for combined signals |
| US7498829B2 (en) | 2003-05-23 | 2009-03-03 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7501842B2 (en) | 2003-05-23 | 2009-03-10 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7427868B2 (en) | 2003-12-24 | 2008-09-23 | Cascade Microtech, Inc. | Active wafer probe |
| US7420381B2 (en) | 2004-09-13 | 2008-09-02 | Cascade Microtech, Inc. | Double sided probing structures |
| US8013623B2 (en) | 2004-09-13 | 2011-09-06 | Cascade Microtech, Inc. | Double sided probing structures |
| US7449899B2 (en) | 2005-06-08 | 2008-11-11 | Cascade Microtech, Inc. | Probe for high frequency signals |
| US7619419B2 (en) | 2005-06-13 | 2009-11-17 | Cascade Microtech, Inc. | Wideband active-passive differential signal probe |
| US7609077B2 (en) | 2006-06-09 | 2009-10-27 | Cascade Microtech, Inc. | Differential signal probe with integral balun |
| US7403028B2 (en) | 2006-06-12 | 2008-07-22 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
| US7443186B2 (en) | 2006-06-12 | 2008-10-28 | Cascade Microtech, Inc. | On-wafer test structures for differential signals |