JPS63148864U - - Google Patents

Info

Publication number
JPS63148864U
JPS63148864U JP4008787U JP4008787U JPS63148864U JP S63148864 U JPS63148864 U JP S63148864U JP 4008787 U JP4008787 U JP 4008787U JP 4008787 U JP4008787 U JP 4008787U JP S63148864 U JPS63148864 U JP S63148864U
Authority
JP
Japan
Prior art keywords
probe
imaging means
aligning
position correction
diagram showing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4008787U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4008787U priority Critical patent/JPS63148864U/ja
Publication of JPS63148864U publication Critical patent/JPS63148864U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP4008787U 1987-03-20 1987-03-20 Pending JPS63148864U (lv)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4008787U JPS63148864U (lv) 1987-03-20 1987-03-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4008787U JPS63148864U (lv) 1987-03-20 1987-03-20

Publications (1)

Publication Number Publication Date
JPS63148864U true JPS63148864U (lv) 1988-09-30

Family

ID=30853857

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4008787U Pending JPS63148864U (lv) 1987-03-20 1987-03-20

Country Status (1)

Country Link
JP (1) JPS63148864U (lv)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006085570A1 (ja) * 2005-02-14 2006-08-17 Exedy Corporation 自動超音波検査装置、その検査方法及びその検査方法を用いた製造方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57200857A (en) * 1981-06-05 1982-12-09 Olympus Optical Co Ltd Automatic focus adjusting method for ultrasonic microscope
JPS6148360B2 (lv) * 1977-07-01 1986-10-23 Nippon Electric Co

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6148360B2 (lv) * 1977-07-01 1986-10-23 Nippon Electric Co
JPS57200857A (en) * 1981-06-05 1982-12-09 Olympus Optical Co Ltd Automatic focus adjusting method for ultrasonic microscope

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006085570A1 (ja) * 2005-02-14 2006-08-17 Exedy Corporation 自動超音波検査装置、その検査方法及びその検査方法を用いた製造方法
US7798002B2 (en) 2005-02-14 2010-09-21 Exedy Corporation Automatic ultrasonic examination device, automatic ultrasonic examination method and production method using the examination method

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