JPS63139567U - - Google Patents
Info
- Publication number
- JPS63139567U JPS63139567U JP3220287U JP3220287U JPS63139567U JP S63139567 U JPS63139567 U JP S63139567U JP 3220287 U JP3220287 U JP 3220287U JP 3220287 U JP3220287 U JP 3220287U JP S63139567 U JPS63139567 U JP S63139567U
- Authority
- JP
- Japan
- Prior art keywords
- board
- probe
- measurement points
- brought
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 6
- 238000005259 measurement Methods 0.000 claims 3
- 239000000284 extract Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3220287U JPS63139567U (it) | 1987-03-05 | 1987-03-05 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3220287U JPS63139567U (it) | 1987-03-05 | 1987-03-05 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63139567U true JPS63139567U (it) | 1988-09-14 |
Family
ID=30838655
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3220287U Pending JPS63139567U (it) | 1987-03-05 | 1987-03-05 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63139567U (it) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001264398A (ja) * | 1999-11-22 | 2001-09-26 | Fujitsu Ten Ltd | 電子部品検査装置及び検査方法 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS495670A (it) * | 1972-05-02 | 1974-01-18 |
-
1987
- 1987-03-05 JP JP3220287U patent/JPS63139567U/ja active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS495670A (it) * | 1972-05-02 | 1974-01-18 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001264398A (ja) * | 1999-11-22 | 2001-09-26 | Fujitsu Ten Ltd | 電子部品検査装置及び検査方法 |