JPS63139566U - - Google Patents
Info
- Publication number
- JPS63139566U JPS63139566U JP3220187U JP3220187U JPS63139566U JP S63139566 U JPS63139566 U JP S63139566U JP 3220187 U JP3220187 U JP 3220187U JP 3220187 U JP3220187 U JP 3220187U JP S63139566 U JPS63139566 U JP S63139566U
- Authority
- JP
- Japan
- Prior art keywords
- output data
- measurement
- test
- separates
- measurement point
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 claims 9
- 238000013459 approach Methods 0.000 claims 2
- 239000000523 sample Substances 0.000 claims 2
- 238000007689 inspection Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3220187U JPH0613502Y2 (ja) | 1987-03-05 | 1987-03-05 | フアンクシヨンテスタ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3220187U JPH0613502Y2 (ja) | 1987-03-05 | 1987-03-05 | フアンクシヨンテスタ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63139566U true JPS63139566U (enExample) | 1988-09-14 |
| JPH0613502Y2 JPH0613502Y2 (ja) | 1994-04-06 |
Family
ID=30838653
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3220187U Expired - Lifetime JPH0613502Y2 (ja) | 1987-03-05 | 1987-03-05 | フアンクシヨンテスタ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0613502Y2 (enExample) |
-
1987
- 1987-03-05 JP JP3220187U patent/JPH0613502Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0613502Y2 (ja) | 1994-04-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS63139566U (enExample) | ||
| JPS642173U (enExample) | ||
| JPH0158171U (enExample) | ||
| JPS6421355U (enExample) | ||
| JPS61199601U (enExample) | ||
| JPS63105869U (enExample) | ||
| JPH02675U (enExample) | ||
| JPS6430459U (enExample) | ||
| JPH0443248U (enExample) | ||
| JPS59176933U (ja) | 電子計量器 | |
| JPH0348726U (enExample) | ||
| JPS63118541U (enExample) | ||
| JPS62135974U (enExample) | ||
| JPS62143272U (enExample) | ||
| JPH01160558U (enExample) | ||
| JPS6339685U (enExample) | ||
| JPS62187347U (enExample) | ||
| JPS63152571U (enExample) | ||
| JPS5966158U (ja) | 試験装置 | |
| JPS63139567U (enExample) | ||
| JPH026278U (enExample) | ||
| JPS62203480U (enExample) | ||
| JPH0415075U (enExample) | ||
| CHINQUAN et al. | The development of automated eddy current equipment for use in nondestructive testing(Automatic scanning and display eddy current system for nondestructive testing of printed circuit boards) | |
| JPS6453979U (enExample) |