JPS63120177U - - Google Patents

Info

Publication number
JPS63120177U
JPS63120177U JP1143587U JP1143587U JPS63120177U JP S63120177 U JPS63120177 U JP S63120177U JP 1143587 U JP1143587 U JP 1143587U JP 1143587 U JP1143587 U JP 1143587U JP S63120177 U JPS63120177 U JP S63120177U
Authority
JP
Japan
Prior art keywords
power transistor
thyristor element
predetermined time
test device
power source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1143587U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1143587U priority Critical patent/JPS63120177U/ja
Publication of JPS63120177U publication Critical patent/JPS63120177U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP1143587U 1987-01-30 1987-01-30 Pending JPS63120177U (US20030199744A1-20031023-C00003.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1143587U JPS63120177U (US20030199744A1-20031023-C00003.png) 1987-01-30 1987-01-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1143587U JPS63120177U (US20030199744A1-20031023-C00003.png) 1987-01-30 1987-01-30

Publications (1)

Publication Number Publication Date
JPS63120177U true JPS63120177U (US20030199744A1-20031023-C00003.png) 1988-08-03

Family

ID=30798650

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1143587U Pending JPS63120177U (US20030199744A1-20031023-C00003.png) 1987-01-30 1987-01-30

Country Status (1)

Country Link
JP (1) JPS63120177U (US20030199744A1-20031023-C00003.png)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010175509A (ja) * 2009-02-02 2010-08-12 Mitsubishi Electric Corp 逆バイアス安全動作領域測定装置
JP2012032327A (ja) * 2010-08-02 2012-02-16 Advantest Corp 試験装置及び試験方法
CN102565657A (zh) * 2010-12-15 2012-07-11 爱德万测试株式会社 测试装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010175509A (ja) * 2009-02-02 2010-08-12 Mitsubishi Electric Corp 逆バイアス安全動作領域測定装置
JP2012032327A (ja) * 2010-08-02 2012-02-16 Advantest Corp 試験装置及び試験方法
CN102565657A (zh) * 2010-12-15 2012-07-11 爱德万测试株式会社 测试装置
US9057756B2 (en) 2010-12-15 2015-06-16 Advantest Corporation Test apparatus

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