JPS63118603A - Ink film thickness measuring instrument - Google Patents
Ink film thickness measuring instrumentInfo
- Publication number
- JPS63118603A JPS63118603A JP26459986A JP26459986A JPS63118603A JP S63118603 A JPS63118603 A JP S63118603A JP 26459986 A JP26459986 A JP 26459986A JP 26459986 A JP26459986 A JP 26459986A JP S63118603 A JPS63118603 A JP S63118603A
- Authority
- JP
- Japan
- Prior art keywords
- spread
- detector
- ink film
- ink
- film thickness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003760 hair shine Effects 0.000 claims 1
- 239000000758 substrate Substances 0.000 abstract description 9
- 238000005259 measurement Methods 0.000 abstract description 6
- 239000006185 dispersion Substances 0.000 abstract description 3
- 239000011521 glass Substances 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- 238000007796 conventional method Methods 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は、レーザー光を使用して印刷機に、おけるイ
ンキ膜厚を計測するインキ膜厚計測装置に関するもので
ある。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to an ink film thickness measuring device that uses laser light to measure the ink film thickness in a printing press.
従来、出願人は印刷機におけるインキ膜厚を計測するこ
とができ、印刷機の性能向上および省力化を達成できる
インキ膜厚計測装置を発明し、出願済み(特願昭61−
16149.2号)である。この発明は、第1図に示す
ようにレーザー光発射装置2と検出器5および演算器6
とからなり、ローラ1表面のインキ面にレーザー光発射
装置2よりレーザー光3を当て、そのレーザー光により
生じる像を検出器5で受光し、該検出器5から送られた
データにより像の広がり、または輝度分布の形状、また
は輝度勾配を測定し、その値に基いて演算器6によりロ
ーラ表面のインキ膜厚を算出するものである。Previously, the applicant has invented an ink film thickness measuring device that can measure the ink film thickness in a printing press, thereby improving the performance of the printing machine and saving labor.
16149.2). As shown in FIG.
A laser beam 3 is applied from a laser beam emitting device 2 to the ink surface of the roller 1, an image generated by the laser beam is received by a detector 5, and the image is spread based on the data sent from the detector 5. , the shape of the brightness distribution, or the brightness gradient, and based on the measured values, the arithmetic unit 6 calculates the ink film thickness on the roller surface.
しかし、従来のものではインキ面に投射する光は1点で
あった。このため第2図に示すようにインキ面の基板7
が平坦で鏡面状態のときは、インキ膜層での光の広がり
が膜厚を忠実に反映したものとなるが、第3図に示すよ
うに基板7に細かいキズなどの凹凸があった場合には基
板面での光の反射方向がまちまちになり、インキ膜厚と
投射光の広がりの間に不確定な要素をもたらすことにな
って測定精度が低下してしまうという問題があった。However, in the conventional method, only one point of light is projected onto the ink surface. Therefore, as shown in FIG.
When the substrate 7 is flat and mirror-like, the spread of light in the ink film layer will faithfully reflect the film thickness, but as shown in Figure 3, if the substrate 7 has irregularities such as fine scratches, However, there was a problem in that the direction of light reflection on the substrate surface varied, creating an element of uncertainty between the ink film thickness and the spread of the projected light, resulting in a decrease in measurement accuracy.
この発明は以上の問題点を解決するために創案されたも
ので、インキ面の基板に凹凸があった場合でもその影響
を最小限に抑えることができ、測定精度の低下を防ぐこ
とができるインキ膜厚計測装置を提供することを目的と
する。This invention was devised to solve the above problems, and is an ink that can minimize the effect of unevenness on the substrate on the ink surface and prevent a decrease in measurement accuracy. The purpose is to provide a film thickness measuring device.
この発明のインキ膜厚計測装置は、ローラ面にレーザー
光発射装置と、そのレーザー光によりインキ面に生じる
像を受光する検出器と、該検出器から送られたデータに
より像の広がり、または輝度分布の形状、または輝度勾
配を測定し、その値に基いてインキ膜厚を算出する演算
器とからなり、前記検出器は複数の投射光の広がりを測
定することを特徴とする。The ink film thickness measuring device of the present invention includes a laser beam emitting device on a roller surface, a detector that receives an image generated on the ink surface by the laser beam, and data sent from the detector to measure the spread or brightness of the image. The detector is characterized by comprising a calculator that measures the shape of the distribution or the brightness gradient and calculates the ink film thickness based on the value, and the detector measures the spread of a plurality of projected lights.
以下、この発明を図面に示す実施例に基いて説明する。 The present invention will be explained below based on embodiments shown in the drawings.
この発明のインキ膜厚計測装置は、基本的には従来例で
述べたようにレーザー光発射装置2とレンズ4と検出器
5と演算器6とからなるが、第4図に示すように前記検
出器5は、複数の投射光の広がりを測定するものである
。The ink film thickness measuring device of the present invention basically consists of the laser beam emitting device 2, the lens 4, the detector 5, and the arithmetic unit 6 as described in the conventional example. The detector 5 measures the spread of a plurality of projected lights.
■第1実施例
第5図に示すように屈曲率分布を2方向に周期的にもつ
ガラスを、小さなレンズ(マイクロレンズ)8を多数持
つ平板(マイクロレンズプレート)9と見なし、そこに
平行光10を投射すると多数の集束光11が得られる。■First Example As shown in Fig. 5, a glass having a periodic refractive index distribution in two directions is regarded as a flat plate (microlens plate) 9 with many small lenses (microlenses) 8, and parallel light is 10, a large number of focused lights 11 are obtained.
この集束光11をインキ膜に投射し、インキ面に生じた
複数の投射光の広がりを、検出器で測定し、演算器で解
析する。This focused light 11 is projected onto the ink film, and the spread of the plurality of projected lights generated on the ink surface is measured by a detector and analyzed by a computing unit.
■第2実施例
第6図に示すようにセルホックレンズ12を多数配列し
、これに平行光10を投射して多数の集束光11を得る
。なお、第7図は第1実施例および第2実施例の投射パ
ターンを示すものである。(2) Second Embodiment As shown in FIG. 6, a large number of self-hock lenses 12 are arranged, and parallel light 10 is projected onto them to obtain a large number of focused lights 11. Note that FIG. 7 shows projection patterns of the first embodiment and the second embodiment.
■第3実施例
多数の分離した光を投射すると、ライン状の投射光でも
第1実施例、第2実施例と同様の効果を得ることができ
る。第8図では半円柱形状のレンズ13を複数並列に並
べたものを採用し、ライン状の投射光を多数投射してい
る。第9図はその投射パターンおよび輝度分布を示すも
のである。(3) Third Embodiment By projecting a large number of separated lights, the same effects as in the first and second embodiments can be obtained even with line-shaped projection light. In FIG. 8, a plurality of semi-cylindrical lenses 13 arranged in parallel are used to project a large number of line-shaped projection lights. FIG. 9 shows the projection pattern and brightness distribution.
■第4実施例
第10図に示すようにコリメータレンズ14を採用して
、第1.第2.第3実施例と同様の効果を得るものであ
る。第11図に示すようにコリメータレンズ14を通過
した光は複数のロール状のパターンを示す。■Fourth Embodiment As shown in FIG. Second. This provides the same effect as the third embodiment. As shown in FIG. 11, the light passing through the collimator lens 14 shows a plurality of roll-shaped patterns.
■実験結果
第13図〜第15図は第12図に示した各位置a、b、
cでの像の広がりを示すもので、14はコリメータレン
ズ、11は集束光、16は焦点である。また第16図〜
第17図は前記各位ia、b、cの計測結果を示すグラ
フで、縦軸は画素数、横軸はインキ厚さである。これら
の図およびグラフから明らかなように、像の広がりが大
きくなるほど相対分散が低くなり、相対分散が低いほど
グラフの傾斜が高くなって良質な解析値を得ることがで
きる。■Experimental results Fig. 13 to Fig. 15 are for each position a, b shown in Fig. 12,
It shows the spread of the image at point c, where 14 is a collimator lens, 11 is a focused beam, and 16 is a focal point. Also, Figure 16~
FIG. 17 is a graph showing the measurement results of each of the above-mentioned ia, b, and c, where the vertical axis is the number of pixels and the horizontal axis is the ink thickness. As is clear from these figures and graphs, the larger the spread of the image, the lower the relative dispersion, and the lower the relative dispersion, the higher the slope of the graph, making it possible to obtain high-quality analytical values.
この発明は以上の構成からなり、この発明によればイン
キ面の基板に凹凸があった場合でもその影響を最小限に
抑えることができ、測定精度の低下を防ぎ、しかもイン
キ膜厚を容易に計測することができる。This invention has the above-mentioned configuration. According to this invention, even if there are irregularities on the substrate on the ink surface, the influence can be minimized, preventing a decrease in measurement accuracy, and moreover, it is possible to easily adjust the ink film thickness. It can be measured.
第1図は従来例の概念図、第2図〜第4図はインキ面の
基板に当てた投射光の広がりを示す断面図、第5図は第
1実施例を示す斜視図、第6図は第2実施例を示す斜視
図、第7図は第5図、第6図の投射パターンを示す図、
第8図は第3実施例を示す斜視図、第9図は第8図の投
射パターンおよび輝度分布を示す図、第10図は第4実
施例を示す斜視図、第11図は第10図の投射パターン
および輝度分布を示す図、第12図はコリメータレンズ
による集束光を示す概念図、第13図〜第15図はそれ
ぞれ第12図におけるa、b、cの各位置における像の
広がりを示すパターン図、第16図〜第18図はそれぞ
れ第12図におけるa、b、cの各位置における像の計
測結果を示すグラフである。
1・・・・・・ローラ、2・・・・・・レーザー光発射
装置、3・・・・・・レーザー光、4・・・・・・レン
ズ、5・・・・・・検出器、6・・・・・・演算器、7
・・・・・・基板、8・・・・・・マイクロレンズ、
9・・・・・・マイクロレンズプレート、10・・・・
・・平行光、11・・・・・・集束光、12・・・・・
・セルホックレンズ、13・・・・・・レンズ、14・
・・・・・コリメータレンズ、15・・・・・・光16
・・・・・・焦点。
第 1 図
第2図 第3面
第4図
第6図 第7図
+L1
イLll
第12図
第16図 第17図
第18図Fig. 1 is a conceptual diagram of a conventional example, Figs. 2 to 4 are cross-sectional views showing the spread of the projected light applied to the substrate on the ink surface, Fig. 5 is a perspective view showing the first embodiment, and Fig. 6 is a perspective view showing the second embodiment; FIG. 7 is a diagram showing the projection pattern of FIGS. 5 and 6;
FIG. 8 is a perspective view showing the third embodiment, FIG. 9 is a diagram showing the projection pattern and brightness distribution of FIG. 8, FIG. 10 is a perspective view showing the fourth embodiment, and FIG. Figure 12 is a conceptual diagram showing focused light by a collimator lens, and Figures 13 to 15 show the spread of the image at each position a, b, and c in Figure 12. The pattern diagrams shown in FIGS. 16 to 18 are graphs showing the measurement results of images at positions a, b, and c in FIG. 12, respectively. 1...Roller, 2...Laser light emitting device, 3...Laser light, 4...Lens, 5...Detector, 6... Arithmetic unit, 7
...Substrate, 8...Microlens, 9...Microlens plate, 10...
...Parallel light, 11...Focused light, 12...
・Self-hook lens, 13...Lens, 14・
...Collimator lens, 15... Light 16
······focus. Figure 1 Figure 2 Figure 3 Figure 4 Figure 6 Figure 7 + L1 Illll Figure 12 Figure 16 Figure 17 Figure 18
Claims (1)
そのレーザー光によりインキ面に生じる像を受光する検
出器と、該検出器から送られたデータにより像の広がり
、または輝度分布の形状、または輝度勾配を測定し、そ
の値に基いてインキ膜厚を算出する演算器とからなり、
前記検出器は複数の投射光の広がりを測定することを特
徴とするインキ膜厚計測装置。a laser beam emitting device that shines a laser beam on the roller surface;
A detector receives the image formed on the ink surface by the laser beam, and the data sent from the detector measures the spread of the image, the shape of the brightness distribution, or the brightness gradient, and the ink film thickness is determined based on the measured value. It consists of a computing unit that calculates
An ink film thickness measuring device, wherein the detector measures the spread of a plurality of projected lights.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26459986A JPS63118603A (en) | 1986-11-06 | 1986-11-06 | Ink film thickness measuring instrument |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26459986A JPS63118603A (en) | 1986-11-06 | 1986-11-06 | Ink film thickness measuring instrument |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63118603A true JPS63118603A (en) | 1988-05-23 |
Family
ID=17405548
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP26459986A Pending JPS63118603A (en) | 1986-11-06 | 1986-11-06 | Ink film thickness measuring instrument |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63118603A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5543919A (en) * | 1993-05-14 | 1996-08-06 | Integrated Process Equipment Corp. | Apparatus and method for performing high spatial resolution thin film layer thickness metrology |
-
1986
- 1986-11-06 JP JP26459986A patent/JPS63118603A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5543919A (en) * | 1993-05-14 | 1996-08-06 | Integrated Process Equipment Corp. | Apparatus and method for performing high spatial resolution thin film layer thickness metrology |
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