JPS63116248A - Program testing device - Google Patents

Abstract

PURPOSE:To select a test case having high importance and to efficiently test a program by providing the titled device with a test case selection supporting device for supporting the selection respective test cases in all test cases in the order of importance. CONSTITUTION:The test case selection supporting device 1 supports the selection of respective test cases in all the test cases in the order of importance in the whole functions of a program inputted from a user based on the information relating to the program. A test data generator 2 generates test data for the selected test case. An objective program executing device 3 inputs the test data and tests the objective program. The result of the test is evaluated by a result evaluating device 4 and the evaluated result is outputted from an evaluated result output device 5. While observing the evaluated result outputted from the device 5, the user can detect a bug having the highest importance for the whole functions of the program.

Description

DETAILED DESCRIPTION OF THE INVENTION (Objective of the Invention) (Industrial Application Field) The present invention relates to a program testing device for testing whether or not a total of n programs function correctly.

(Prior Art) With advances in computer technology, the proportion of computers used in industry and social life is rapidly increasing. Along with this, n
At the same time, the importance of computer programs for giving instructions to i-processors to perform various functions is also increasing.

In particular, programs that are concerned with safety must be thoroughly tested to ensure that they function correctly as the creator intended before putting them into practical use. However, programs are not concrete visible objects like hardware, and have complex contents corresponding to the functions to be executed.

Therefore, this program testing is extremely labor-intensive and time-consuming, and it is generally said that the cost required for program testing accounts for about 40% of the total program development cost. Under these circumstances, various test methods and devices have been proposed for conducting efficient and reliable tests.

Generally, in a program larger than a certain scale, it is practically impossible to test all cases in terms of machine capacity, human cost, etc. That is, for example, if there are n 1141 parameters with binary inputs of 1 or 0, there are 2 possible combinations of inputs, and when n = 50, 2 =: 1.1X
It becomes 1015. Therefore, in general programs where n is much greater than 50, it is virtually impossible to test all cases.

Therefore, conventionally, test cases are selected.

The criterion for selecting test cases is the number of defects (bugs) that exist in the program. In other words, tests are performed in order of test cases that can discover the most bugs, and by finding and removing as many bugs as possible, the reliability of the program is improved.

<Problems to be solved by the invention> Conventionally, the problem was simply the number of bugs, and the problem was that the bugs would affect the entire program. I wasn't there. Even a single bug can have a huge impact on the entire program, or it can be just a minor bug, and if the former bug is not removed, the entire system containing that program will not function properly. A situation arises where it is not possible.

Particularly in the case of a program that performs safety protection operations in a nuclear power plant, etc., one bug may be related to the safety of the nuclear power plant itself, and
When selecting Case 2, safety must be considered as the first criterion.

An object of the present invention is to provide an apparatus for efficiently testing a program by supporting the selection of test cases that are highly important for the functionality of the program as a whole. shall be.

[Structure of the invention]

(Means for Solving the Problems) The present invention provides a test case selection support device that supports selecting each death case from all test cases in order of importance in the function of the entire program, and A test data generator that generates test data corresponding to a test case, and its test] - A target program execution device that executes a desist anti-contamination program using data, and its test] - Test result evaluation that evaluates the results (lffi
ff, and an evaluation result output device that outputs the evaluation results.

(Function) The test case selection support device d selects each test case from among all test cases based on the information about the program input by the user.
This will help you select items in order of importance.

The D1 to D9 generation devices generate test data for the selected test case, and the target program execution device that inputs this test data tests the target program. The results of this test are evaluated by a test result evaluation device, and the evaluation results are outputted by an evaluation result output device. The user looks at the evaluation results output to the evaluation result output device and discovers bugs that are highly important to the overall functionality of the program.

(Example) An example of the present invention will be described with reference to FIGS. 1 and 2.

As shown in FIG. 1, the program test load according to the present invention includes a case selection support system 1 for supporting the selection of test cases in order of importance for the overall function of the program; A test data generation device 2 that generates test data corresponding to a test case that has been performed, a target program execution device 3 that inputs the test data and executes a test of a target program, and a test result evaluation that evaluates the results of the test. It includes a device 4 and an evaluation result output device 5 that outputs the evaluation results.

The test case selection support device 1 creates a fault tree based on the information about the programmed program and analyzes the fault tree.
Helps select test cases that are important to the overall functionality of the program.

Here, the operation of the test case selection support device 1 will be explained using symbols, taking as an example a program that performs a safety protection operation to protect the safety of the system.

This program is safe! ! Parameter D for determining function activation
By calculating L and comparing it with a certain set value DLSET, if DL>DLSET, it has the function of generating a signal for activating the system's safety protection function.

Here, DL is DL=FXNK * AMNF (
1) is given.

FXNK and AMNF are each subroutine SU,
Calculated in BFX and SUBAM.

FXNK is basically obtained by the method shown by the following formula.

FXNK=max (FX, NK)---(2
>Here, FX is calculated in subroutine 5UBF1.

Furthermore, NK is basically calculated using the following formula.

NK=NHK ・・・・・・(3)
Here, Ntj and K are each subroutine 5UBN
and 5tJBK.

Further, K is basically given by the following equation.

K=max (K, F) ・-= (4)
1 and F are calculated in subroutines 5UBK1113 and 5UBF2, respectively.

The AMNF in equation (1) is basically determined by the following equation.

AMNF=max (AM, NF) − (5) where A
M and NF are subroutines SUBAM and 5I, respectively.
Calculated by JBNF.

Here, NF is determined by the following formula.

NF=N*F ・・・・・・(6)
N is the same as N in equation (3) and is given by 5UBN, and F is calculated by 5UBF2.

Based on the information regarding these programs, the test case selection support device creates a fault tree as shown in FIG. The top event in this fault tree is that the calculated value of the parameter DL for determining the activation of the protection function was smaller than the actual value DL, which means that there is some kind of defect (bug) in the program, and the value is smaller than the correct value. This represents an event in which . This is an error that can lead to serious failures in that the activation signal is not generated when the safety protection function should be activated.

Events that cause this top event to occur are sequentially expanded toward the bottom of the tree. For example, in order for DL to be smaller than the actual value, taking into account equation (1), FXNK(7)
Either the total a value FXNK, is smaller than the required value FXNKa, or the total n value AMNF of AMNF is the required value AMNFa.
It is possible that it is smaller. Similarly, the relationship between the calculated value (with subscript C) of each parameter and the desired value (with subscript a) is sequentially shown below.

Therefore, due to this falloli, DL < DLa
Finding the minimum combination of events that causes the top event, ((FXC<FXa), (Nc<N8))...Song (7)
((K, c<K1.), (FXo<FX,), (FC<
Fa))・-Song (8) ((AMo<AMa), (FC<
F8)) -・Song (9) ((△Mc<
AM8), (No<Na>) -----
- There are four ways (10).

From this, it can be seen that when conducting a combination test of subroutines, it is important to select a combination of subroutines that corresponds to the above combination of events and write the test. For example, for the combination (7), it is important to test the combination of subroutines 5UBF1 and 5UBN, and for the combination (8), it is important to test the combination of subroutines 5tJBK1.5tJBF1 and 5UBF2. be. The same can be said for combinations (9) and (10).

Next, the structural importance 5(i) of Faurtollie's fundamental event (encircled in Figure 2) is generally given by the following equation.

5(i) m(i) --・-<11)
n-1 Here, i is the identification number of the basic event, n is the number of Gi basic events, m(1) is iJ when the top event occurs when basic event 1 occurs: J, It represents the number of combinations of basic events.

In the case of FIG. 2, the number of different elementary events is 5, so n=5.

If the event number of AM<AM8 is 1, then

Moreover, KlC<K1. If the event number of is 2, then No<
If the event number of N is written as 3, then it becomes.

Also, if you go to the event number of FX < FX, F
If the event number of <F8 is 5, then .

The importance of these basic events can be thought of as giving the importance of the subroutine corresponding to each basic event when performing a unit test of the subroutine. For example, subroutine SU13AM corresponding to event 1 is considered to have higher safety importance than subroutine 5UBK corresponding to event 2.

In this way, the importance of each subroutine becomes clear.

As detailed above, the test case selection support device 1 determines the important subroutine combination J3 and the important subroutines and provides them as selection materials.
The user selects important test cases based on the selected material.

With this selection, test case selection support device 1 to test case selection support device 1
~A selection signal a is output to the data generator 2. Based on this selection signal a, the test data generation device 2 transmits the test data to the target program execution device 3, and on the other hand, the test result evaluation device 4 transmits the correct answer of the test result.

Based on the above test data, the target program execution device 3 executes the program de-i-, and the test result evaluation device 4 evaluates the test result by comparing this test result with the above-mentioned correct answer. The evaluation result of this test result is output to the user by the evaluation result output device 5. The user looks at the output evaluation results and finds bugs that are highly important in terms of the functionality of the entire program.

Although the above embodiment has been described using a program that performs a safety protection operation as an example, the present invention is not limited thereto, and can be widely applied to testing of general programs.

〔Effect of the invention〕

The present invention includes a test case selection support device that supports selecting each test case from all cases in order of importance to the function of the entire program. It is possible to efficiently test a program by selecting a high-death case, which can contribute to improving the reliability of the program.

The present invention has the advantage that when the program is large-scale and it takes a long time to execute one test case, and it is not possible to execute a large number of test cases, it is possible to select the case for the important test case and execute the test. Especially effective.

[Brief explanation of the drawing]

FIG. 1 is a diagram showing an embodiment of a program test apparatus according to the present invention, and FIG. 2 is a dimensional diagram of the A root tree of the above embodiment. DESCRIPTION OF SYMBOLS 1...Test case selection support device, 2...Test data generation device, 3...Target program execution device, 4.
...Test result evaluation device, 5...Evaluation result output device,
a...Selection signal. Applicant's agent Hisashi Hatano Figure 1

Claims (1)

[Claims] A test case selection support device that supports selecting each test case from all the test cases in order of importance in the function of the entire program, and a test data generation device that generates test data corresponding to the selected test case. A program testing device comprising: a target program execution device that executes a test target program using the test data; a test result evaluation device that evaluates the test results; and an evaluation result output device that outputs the evaluation results. .