JPS63115762U - - Google Patents

Info

Publication number
JPS63115762U
JPS63115762U JP815487U JP815487U JPS63115762U JP S63115762 U JPS63115762 U JP S63115762U JP 815487 U JP815487 U JP 815487U JP 815487 U JP815487 U JP 815487U JP S63115762 U JPS63115762 U JP S63115762U
Authority
JP
Japan
Prior art keywords
probe
measured
comes
ground
contacts
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP815487U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP815487U priority Critical patent/JPS63115762U/ja
Publication of JPS63115762U publication Critical patent/JPS63115762U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP815487U 1987-01-23 1987-01-23 Pending JPS63115762U (bg)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP815487U JPS63115762U (bg) 1987-01-23 1987-01-23

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP815487U JPS63115762U (bg) 1987-01-23 1987-01-23

Publications (1)

Publication Number Publication Date
JPS63115762U true JPS63115762U (bg) 1988-07-26

Family

ID=30792271

Family Applications (1)

Application Number Title Priority Date Filing Date
JP815487U Pending JPS63115762U (bg) 1987-01-23 1987-01-23

Country Status (1)

Country Link
JP (1) JPS63115762U (bg)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001079866A1 (fr) * 2000-04-14 2001-10-25 Oht Inc. Unite de sonde et instrument de mesure
CN104142412A (zh) * 2013-05-08 2014-11-12 本田技研工业株式会社 电流施加方法和电流施加装置

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001079866A1 (fr) * 2000-04-14 2001-10-25 Oht Inc. Unite de sonde et instrument de mesure
JP2001296320A (ja) * 2000-04-14 2001-10-26 Oht Inc プローブユニット及び計測装置
CN104142412A (zh) * 2013-05-08 2014-11-12 本田技研工业株式会社 电流施加方法和电流施加装置
JP2014219273A (ja) * 2013-05-08 2014-11-20 本田技研工業株式会社 電流印加方法および電流印加装置
CN104142412B (zh) * 2013-05-08 2017-04-12 本田技研工业株式会社 电流施加方法和电流施加装置
US9664727B2 (en) 2013-05-08 2017-05-30 Honda Motor Co., Ltd. Electric current application method and electric current applying device

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