JPS63111402A - Position measuring instrument - Google Patents

Position measuring instrument

Info

Publication number
JPS63111402A
JPS63111402A JP25590786A JP25590786A JPS63111402A JP S63111402 A JPS63111402 A JP S63111402A JP 25590786 A JP25590786 A JP 25590786A JP 25590786 A JP25590786 A JP 25590786A JP S63111402 A JPS63111402 A JP S63111402A
Authority
JP
Japan
Prior art keywords
measured
circuit
light
position measuring
processor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP25590786A
Other languages
Japanese (ja)
Inventor
Hiroaki Majima
宏明 真島
Atsuo Takeda
武田 淳男
Naoyuki Motomura
元村 直行
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yaskawa Electric Corp
Original Assignee
Yaskawa Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yaskawa Electric Manufacturing Co Ltd filed Critical Yaskawa Electric Manufacturing Co Ltd
Priority to JP25590786A priority Critical patent/JPS63111402A/en
Publication of JPS63111402A publication Critical patent/JPS63111402A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To identify a target body to be measured by detecting information for identifying the body to be measured from a light beam which is incident from the body to be measured. CONSTITUTION:A semiconductor optical position detection element (PSD) 1 supplies a light beam emitted by a spot light source on the body to be measured to a current-voltage converting circuit 2, which converts it into voltage signals x1 and x2, and y1 and y2. An adding circuit 31 and a subtracter circuit 41 calculate x1+x2 and x1-x2 and an adder circuit 32 and a subtracter circuit 42 output y1+y2 and y1-y2, whose amplitudes are extracted by an AC processing circuit 5. The dividing circuits 61 and 62 perform subtraction between them and outputs a subtraction signal. A multiplexer 8, a sample/hold circuit 9, and an A/D converter 10 are controlled by a processor 11. The processor 11 outputs position coordinates (x) and (y) inputted from the A/D converter 10 to an output circuit 2 together with discrimination data on the body to be measured when the discrimination data inputted from a frequency detecting circuit 7 matches with one of set modulation frequencies.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は位置計測装置に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to a position measuring device.

(従来の技術〕 第4図はこの種の光学式位置計測装置の従来例を示すブ
ロック図である。
(Prior Art) FIG. 4 is a block diagram showing a conventional example of this type of optical position measuring device.

被計測物体の有する点光源41から光源系42を通して
PSD(半導体装置検出素″f−)43の検出面上に光
が照射され、光点を結像すると、PSD43の電極から
電流信号X目+ xi、 y+++ Vr2が出力され
、電流信号X目〜yt2は電流−電圧変換回路44+ 
、 442 、443 、444によりそれぞれに比例
する電圧信号xi、X21 y++ y2に変換される
。電圧信号xl+ x7. yt+ y2はさらに信号
処理部45へ入力されて位置計測のための演算が行われ
る。
Light is irradiated from a point light source 41 of the object to be measured through a light source system 42 onto the detection surface of a PSD (semiconductor device sensing element "f-") 43, and when a light spot is imaged, a current signal xi, y+++ Vr2 are output, and current signals Xth to yt2 are sent to the current-voltage conversion circuit 44+
, 442, 443, and 444, the signals are converted into proportional voltage signals xi, X21 y++ y2, respectively. Voltage signal xl+ x7. yt+y2 is further input to the signal processing unit 45, where calculations for position measurement are performed.

この場合、PSD43の検出面上における光点の位置座
標x、yは次式により得られる。
In this case, the positional coordinates x and y of the light spot on the detection surface of the PSD 43 are obtained by the following equation.

但し、 −1≦X≦1.−1≦y≦1 これらの座標x、yに光学系42の倍率を乗することに
より、被計測物体の仔する点光源41の座標を得ること
ができる(特願昭60−267279 r光学式位置検
出器」参照)。
However, -1≦X≦1. −1≦y≦1 By multiplying these coordinates x and y by the magnification of the optical system 42, the coordinates of the point light source 41 where the object to be measured is located can be obtained (Patent Application No. 60-267279 r optical system (See “Position Detector”).

(発明が解決しようとする問題点〕 上述した従来の位置計測装置は、posの検出面上に結
像された光点の位置座標から光源の位置を求めるもので
、対象とする被計測物体は1個に限られるものがほとん
どであり、第2図に示すように被計測物体が複数個存在
する場合は、それらを同時に計測して識別することがで
きないという欠点がある。
(Problems to be Solved by the Invention) The conventional position measuring device described above determines the position of the light source from the position coordinates of the light spot imaged on the detection surface of the POS, and the target object to be measured is In most cases, the number of objects to be measured is limited to one, and when there are a plurality of objects to be measured as shown in FIG. 2, there is a drawback that they cannot be measured and identified at the same time.

(問題点を解決するための手段) 本発明の位置計測装置は、複数の被計測物体の有する光
源から放射される光線に、それぞれを同定するための情
報を付与する光変調手段と、被計測物体から入射された
光線から前記情報を検出することにより、該被計測物体
を同定する被計測物体識別手段を有している。
(Means for Solving the Problems) The position measuring device of the present invention includes a light modulating means for imparting information for identifying each of the light rays emitted from the light sources of a plurality of objects to be measured, and a position measuring device to be measured. It has a measured object identifying means that identifies the measured object by detecting the information from the light beam incident from the object.

〔作 用〕[For production]

したがって、本発明の位置計測装置は、複数点在する被
計測物体が放射する光線に光変調手段を用いてそれぞれ
を同定するための情報を付与し、位置計測装置は、その
有する被計測物体識別手段を用いて対象とする被計測物
体からの入射光線中から前記情報を検出することにより
、該被計測物体の識別をすることができる。
Therefore, the position measuring device of the present invention uses a light modulation means to add information for identifying each of the light beams emitted by a plurality of scattered objects to be measured, and the position measuring device can identify the objects to be measured that it has. By detecting the information from the incident light beam from the object to be measured using the means, the object to be measured can be identified.

〔実施例〕〔Example〕

本発明の実施例を図面を参照して説明する。 Embodiments of the present invention will be described with reference to the drawings.

第1図は本発明の位置計測装置の一実施例の要部構成を
示すブロック図、第2図は複数の被計測物体A、B、C
,Dが点在している場合に本実施例により被計測物体A
を計測している状況を示す図、第3図は本実施例の識別
動作を示すフローチャートである。
FIG. 1 is a block diagram showing the main part configuration of an embodiment of the position measuring device of the present invention, and FIG. 2 shows a plurality of measured objects A, B, C.
, D are scattered, this embodiment uses the measured object A
FIG. 3 is a flowchart showing the identification operation of this embodiment.

4個の被計測物体A、B、C,Dが点在しており、それ
らの有する点光源から放射される光線は、予め、光変調
装置(不図示)によりそれぞれ異なる周波数f^、f、
、fc、fDで変調されている。pso tは、被計測
物体A、B、C,Dの任意の1個を計測するものとし、
光学系(不図示)を通してその点光源から放射された光
線を検出面−トに光点として結像させる。電流−電圧変
換回路2は、pso tから出力された光点の座標に対
応する電流信号X目+ xi2+ yil+ yi2を
それぞれ対応する電圧信号X+ 、X2 、 yl、 
y2に変換する。加算回路3Iは、電圧信号Xiと電圧
信号x2の和を、また、減算回路42はそれらの差を、
それぞれ計算し、加算回路32は電圧信号y、と電圧信
号y2の和を、また減算回路42はそれらの差を、それ
ぞれ計算する。交流処理回路5は、これらの交流の和信
号Xl +x2 、’jI+y2、および差信号XI 
 X21 yI  Y2を処理して、それらの振幅を取
り出し、出力する。除算回路6..6.は、これらの出
力を用いて除算を行い、除信号 として出力する。マルチプレクサ8、サンプルアンドホ
ールド回路9.へ/DコンバータlOはいずれもプロセ
ッサ+1により制御されて、これらの座標x、yをプロ
セッサ11に伝達する。周波数検出回路7は、加算回路
31から和信号Xl +X、を分岐入力して該信号の変
調周波数を検出し、対応する識別データをプロセッサ口
に出力する。プロセッサ11は、予め変調周波数fa、
fB、f(。
Four measurement objects A, B, C, and D are scattered, and the light rays emitted from their point light sources are preset to different frequencies f^, f, f, respectively by a light modulation device (not shown).
, fc, and fD. pso t shall measure any one of the objects to be measured A, B, C, D,
The light rays emitted from the point light source are imaged as a light spot on the detection surface through an optical system (not shown). The current-voltage conversion circuit 2 converts current signals X+xi2+yil+yi2 corresponding to the coordinates of the light spot output from pso t into voltage signals X+, X2, yl, respectively.
Convert to y2. The addition circuit 3I calculates the sum of the voltage signal Xi and the voltage signal x2, and the subtraction circuit 42 calculates the difference between them.
The addition circuit 32 calculates the sum of the voltage signal y and the voltage signal y2, and the subtraction circuit 42 calculates the difference between them. The AC processing circuit 5 generates these AC sum signals Xl +x2, 'jI+y2, and the difference signal XI
Process X21 yI Y2 to extract and output their amplitudes. Division circuit 6. .. 6. performs division using these outputs and outputs it as a division signal. Multiplexer 8, sample and hold circuit 9. Both to/D converters lO are controlled by processor +1 and transmit these coordinates x, y to processor 11. The frequency detection circuit 7 branches the sum signal Xl +X from the addition circuit 31, detects the modulation frequency of this signal, and outputs the corresponding identification data to the processor port. The processor 11 presets the modulation frequency fa,
fB, f(.

foに対応する識別データを設定されていて、周波数検
出回路7から入力された識別データが設定されている変
調周波数f^、fB、fc、f、の一つと一致したとき
、A/Dコンバータ10から入力された位置座標x、y
を一致した被計測物体の識別データとともに出力回路1
2に出力する。出力回路12は、被計測物体の位置座標
と識別データを必要個所に伝達する。
When the identification data corresponding to fo is set and the identification data input from the frequency detection circuit 7 matches one of the set modulation frequencies f^, fB, fc, f, the A/D converter 10 Position coordinates x, y input from
Output circuit 1 along with the identification data of the object to be measured that match the
Output to 2. The output circuit 12 transmits the position coordinates and identification data of the object to be measured to necessary locations.

次に、本実施例の動作のうち被計測物体の識別動作を第
3図を参照して説明する。位置座標の計測動作は、上述
した従来例に全く同様であるので省略する。
Next, among the operations of this embodiment, the operation of identifying the object to be measured will be explained with reference to FIG. The position coordinate measurement operation is completely similar to the conventional example described above, and therefore will be omitted.

加算回路3Iから和信号XI +X2が出力され(ステ
ップS1)、周波数検出回路7が入力された和信号の変
調周波数を検出し、プロセッサ11に識別データとして
伝送する(ステップS2)。プロセッサ11は、入力さ
れた識別データを、予め、設定されている各変調周波数
f^、fB、fc・fnのデータと順次比較して(ステ
ップS3゜S4 * SS 、56)s一致したときそ
の識別信号A、B、C,Dを出力する(ステップS7 
)。
A sum signal XI +X2 is output from the adder circuit 3I (step S1), and the frequency detection circuit 7 detects the modulation frequency of the input sum signal and transmits it to the processor 11 as identification data (step S2). The processor 11 sequentially compares the input identification data with the data of each modulation frequency f^, fB, fc/fn set in advance (step S3゜S4*SS, 56), and when they match, the Output identification signals A, B, C, and D (step S7
).

同様の動作をプログラムが終了するまで繰返してプログ
ラムが終ったとき終了する(ステップSa)。
Similar operations are repeated until the program ends, and the process ends when the program ends (step Sa).

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、複数の被計測物体の有す
る光源から放射される光線に、それぞれを同定するため
の情報を付与する光変調手段と、目的とする被計測物体
から入射された光線から前記情報を検出することにより
、該被計測物体を同定する被計測物体識別手段を存して
おり、任意の被計測物体から入射された光線に含まれて
いる情報を検出して、これを予め設定されている各被計
測物体を識別するための情報と比較することにより、当
該の被計測物体を識別することができるという効果があ
り、広範囲に活動する自律型の自走車やロボットなどの
外界センサとして用いることができる。
As explained above, the present invention provides light modulation means for imparting information for identifying each of the light rays emitted from the light sources of a plurality of objects to be measured, and a light beam incident from the target object to be measured. The object to be measured identification means identifies the object to be measured by detecting the information from the object to be measured. It has the effect of being able to identify the measured object by comparing it with pre-set information for identifying each measured object, and it is useful for autonomous self-propelled cars and robots that operate over a wide range. It can be used as an external sensor.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の位置計測装置の一実施例の要部構成を
示すブロック図、第2図は複数の被計測物体が点在して
いる場合に本実施例により被計測物体Aを計測している
状況を示す図、第3図は本実施例の識別動作を示すフロ
ーチャート、第4図は従来例の構成を示すブロック図で
ある。 1−PSD、    2・・・電流−電圧変換回路、3
、.32−・・加算回路、 4、.42−・・減算回路、 5・・・交流処理回路、 61+ 62・・・除算回路、 7・・・周波数検出回路、 8・・・マルチプレクサ、 9・・・サンプルアンドホールド回路、lO・−A/D
コンバータ、 11−・・プロセッサ、 12・・・出力回路、 X yll X i2+ yil+ y12”’電流信
号、Xll X2. yll y2・・・電圧信号、x
、y・・・座標、 A、B、C,D・・・被計測物体、 21−・・位置計測装置、 S宜〜S8・・・各ステップ。
Fig. 1 is a block diagram showing the main part configuration of one embodiment of the position measuring device of the present invention, and Fig. 2 shows the measurement of the measured object A by this embodiment when a plurality of measured objects are scattered. FIG. 3 is a flowchart showing the identification operation of this embodiment, and FIG. 4 is a block diagram showing the configuration of a conventional example. 1-PSD, 2... current-voltage conversion circuit, 3
,.. 32--Addition circuit, 4, . 42-... Subtraction circuit, 5... AC processing circuit, 61+ 62... Division circuit, 7... Frequency detection circuit, 8... Multiplexer, 9... Sample-and-hold circuit, lO・-A /D
Converter, 11-... Processor, 12... Output circuit, X yll X i2+ yil+ y12"' current signal, Xll X2. yll y2... Voltage signal, x
, y...coordinates, A, B, C, D... object to be measured, 21-... position measuring device, S~S8... each step.

Claims (1)

【特許請求の範囲】 光源から入射された光線を半導体装置検出素子の受光面
上に結像させ、その出力信号を測定することにより得ら
れた測定値から光源の位置を検出する位置計測装置にお
いて、 複数の被計測物体の有する光源から放射される光線に、
それぞれを同定するための情報を付与する光変調手段と
、 被計測物体から入射された光線から前記情報を検出する
ことにより、該被計測物体を同定する被計測物体識別手
段を有することを特徴とする位置計測装置。
[Claims] In a position measuring device that detects the position of a light source from a measurement value obtained by focusing a light beam incident from a light source on a light receiving surface of a semiconductor device detection element and measuring the output signal. , in the light rays emitted from the light sources of multiple objects to be measured,
It is characterized by having a light modulation means for providing information for identifying each object, and a measured object identification means for identifying the measured object by detecting the information from the light beam incident from the measured object. position measuring device.
JP25590786A 1986-10-29 1986-10-29 Position measuring instrument Pending JPS63111402A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25590786A JPS63111402A (en) 1986-10-29 1986-10-29 Position measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25590786A JPS63111402A (en) 1986-10-29 1986-10-29 Position measuring instrument

Publications (1)

Publication Number Publication Date
JPS63111402A true JPS63111402A (en) 1988-05-16

Family

ID=17285227

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25590786A Pending JPS63111402A (en) 1986-10-29 1986-10-29 Position measuring instrument

Country Status (1)

Country Link
JP (1) JPS63111402A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0290005A (en) * 1988-09-28 1990-03-29 Komatsu Denshi Kinzoku Kk Two-dimensional position sensor
WO2002023122A1 (en) * 2000-09-11 2002-03-21 Kunikatsu Takase Mobile body position detecting system
JP2008209189A (en) * 2007-02-26 2008-09-11 Hitachi Ltd Position determination system for underwater moving apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0290005A (en) * 1988-09-28 1990-03-29 Komatsu Denshi Kinzoku Kk Two-dimensional position sensor
WO2002023122A1 (en) * 2000-09-11 2002-03-21 Kunikatsu Takase Mobile body position detecting system
JP2008209189A (en) * 2007-02-26 2008-09-11 Hitachi Ltd Position determination system for underwater moving apparatus

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