JPS63109668U - - Google Patents
Info
- Publication number
- JPS63109668U JPS63109668U JP77287U JP77287U JPS63109668U JP S63109668 U JPS63109668 U JP S63109668U JP 77287 U JP77287 U JP 77287U JP 77287 U JP77287 U JP 77287U JP S63109668 U JPS63109668 U JP S63109668U
- Authority
- JP
- Japan
- Prior art keywords
- output terminals
- insulation deterioration
- induced voltage
- diagnosing
- induced
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000006866 deterioration Effects 0.000 claims description 3
- 238000009413 insulation Methods 0.000 claims description 3
- 238000001514 detection method Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 5
- 229910052754 neon Inorganic materials 0.000 description 2
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 2
- 238000010276 construction Methods 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Relating To Insulation (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
Description
第１図はこの考案による絶縁劣化診断装置の一
例を示すブロツク図、第２図は対地誘導電圧波形
を示す図、第３図は誘導電圧検出手段の例を示す
正面図、第４図はこの考案の他の実施例を示すブ
ロツク図、第５図はネオン変圧器の施工例を示す
側面図、第６図はネオン変圧器の等価回路図であ
る。
Fig. 1 is a block diagram showing an example of the insulation deterioration diagnosis device according to this invention, Fig. 2 is a diagram showing the waveform of the induced voltage to ground, Fig. 3 is a front view showing an example of the induced voltage detection means, and Fig. 4 is a diagram showing this example. FIG. 5 is a block diagram showing another embodiment of the invention, FIG. 5 is a side view showing an example of construction of a neon transformer, and FIG. 6 is an equivalent circuit diagram of the neon transformer.
Claims (1)
圧電源に対する絶縁劣化を診断する装置において
、 上記各出力端子の対地誘導電圧をそれぞれ検出
する誘導電圧検出手段と、 これら検出された誘導電圧の大きさを相互に比
較する比較手段とを具備する絶縁劣化診断装置。[Scope of Claim for Utility Model Registration] A device for diagnosing insulation deterioration of an ungrounded high voltage power supply having at least two output terminals, including an induced voltage detection means for detecting the induced voltage to ground of each of the output terminals; An insulation deterioration diagnosing device comprising comparison means for mutually comparing the magnitudes of detected induced voltages.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP77287U JPH0537257Y2 (en) | 1987-01-06 | 1987-01-06 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP77287U JPH0537257Y2 (en) | 1987-01-06 | 1987-01-06 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63109668U true JPS63109668U (en) | 1988-07-14 |
| JPH0537257Y2 JPH0537257Y2 (en) | 1993-09-21 |
Family
ID=30778055
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP77287U Expired - Lifetime JPH0537257Y2 (en) | 1987-01-06 | 1987-01-06 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0537257Y2 (en) |
-
1987
- 1987-01-06 JP JP77287U patent/JPH0537257Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0537257Y2 (en) | 1993-09-21 |