JPS6310474U - - Google Patents

Info

Publication number
JPS6310474U
JPS6310474U JP10473686U JP10473686U JPS6310474U JP S6310474 U JPS6310474 U JP S6310474U JP 10473686 U JP10473686 U JP 10473686U JP 10473686 U JP10473686 U JP 10473686U JP S6310474 U JPS6310474 U JP S6310474U
Authority
JP
Japan
Prior art keywords
semiconductor device
measuring device
under test
measurement terminals
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10473686U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10473686U priority Critical patent/JPS6310474U/ja
Publication of JPS6310474U publication Critical patent/JPS6310474U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP10473686U 1986-07-08 1986-07-08 Pending JPS6310474U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10473686U JPS6310474U (enrdf_load_stackoverflow) 1986-07-08 1986-07-08

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10473686U JPS6310474U (enrdf_load_stackoverflow) 1986-07-08 1986-07-08

Publications (1)

Publication Number Publication Date
JPS6310474U true JPS6310474U (enrdf_load_stackoverflow) 1988-01-23

Family

ID=30978511

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10473686U Pending JPS6310474U (enrdf_load_stackoverflow) 1986-07-08 1986-07-08

Country Status (1)

Country Link
JP (1) JPS6310474U (enrdf_load_stackoverflow)

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