JPS6296526A - Alkali-soluble polyorganosilsesquioxane polymer - Google Patents

Alkali-soluble polyorganosilsesquioxane polymer

Info

Publication number
JPS6296526A
JPS6296526A JP23634485A JP23634485A JPS6296526A JP S6296526 A JPS6296526 A JP S6296526A JP 23634485 A JP23634485 A JP 23634485A JP 23634485 A JP23634485 A JP 23634485A JP S6296526 A JPS6296526 A JP S6296526A
Authority
JP
Japan
Prior art keywords
polymer
alkali
soluble
polyorganosilsesquioxane
groups
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP23634485A
Other languages
Japanese (ja)
Other versions
JPH0558446B2 (en
Inventor
Hisashi Sugiyama
寿 杉山
Kazuo Nate
和男 名手
Takashi Inoue
隆史 井上
Akiko Mizushima
明子 水島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP23634485A priority Critical patent/JPS6296526A/en
Priority to US06/859,370 priority patent/US4745169A/en
Priority to EP86106238A priority patent/EP0204963B1/en
Priority to DE8686106238T priority patent/DE3687479T2/en
Publication of JPS6296526A publication Critical patent/JPS6296526A/en
Priority to US07/893,946 priority patent/US5264319A/en
Publication of JPH0558446B2 publication Critical patent/JPH0558446B2/ja
Granted legal-status Critical Current

Links

Abstract

PURPOSE:To obtain an alkali-soluble polymer excellent in oxygen resistance and extremely useful as a functional polymeric material such as photosensitive or radiation-sensitive material, by using a specified polyorganosilsesquioxane polymer as a component. CONSTITUTION:An alkali-soluble polyorganosiloxane polymer which is a polyorganosilsesquioxane of formula I (wherein R1 and R2 are each an organic group and n is a degree of polymerization) and at least 40% of R1's and R2's are organic groups having a phenolic hydroxyl group. n is usually 8-200. Examples of R1 and R2 include 1-6C (the carbonations of a substituent are excluded) alkyls having phenol or cresol as a substituent, such as formulas II and III. Said polymer can be synthesized by first synthesizing a polyorganosilsesquioxane in which the hydroxyl groups are protected from the corresponding trichlorosilane or trialkoxysilane and removing the protective groups.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明は、光および放射線感応性材料等の機能性高分子
材料として極めて有用な新規な重合体に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to a novel polymer that is extremely useful as a functional polymer material such as a light- and radiation-sensitive material.

更に詳しくは、一般式(1)で表わされるアルカリ可溶
性ポリオルガノシルセスキオキサン重合体に関する。
More specifically, the present invention relates to an alkali-soluble polyorganosilsesquioxane polymer represented by general formula (1).

〔発明の背景〕[Background of the invention]

半導体素子や集積回路等の電子部品の製作には、光およ
び放射線を利用したエツチングによる微細加工技術が用
いられ、現在そのレジスト材としては解像度に優れてい
ることから、フェノール樹脂やポリビニルフェノールの
ようなアルカリ可?容性重合体を基本重合体として含む
アルカリ現像型のレジスト材料が主流を占めている。例
えば、ノボラック樹脂と1.2−ナフトキノンジアミド
類との組成物はポジ型フォトレジストであり、ポリビニ
ルフェノールとビスアジド類との組成物はネガ型フォト
レジストになる。また、ノボラック樹脂とポリオレフィ
ンスルホンとの組成物は放射線感応性ポジ型レジストで
あることは、広く知られている。一方、半導体素子等の
配線の微細化に伴ない、レジスト層をパターニングした
後の下地のエツチングは、従来の湿式エツチングに代っ
て、ドライエツチングが採用されつつある。
Microfabrication technology by etching using light and radiation is used to manufacture electronic components such as semiconductor elements and integrated circuits, and currently resist materials such as phenolic resin and polyvinyl phenol are used because they have excellent resolution. Can alkaline be used? Alkaline-developable resist materials containing a soluble polymer as a basic polymer are the mainstream. For example, a composition of novolac resin and 1,2-naphthoquinone diamides is a positive photoresist, and a composition of polyvinylphenol and bisazides is a negative photoresist. Furthermore, it is widely known that a composition of novolak resin and polyolefin sulfone is a radiation-sensitive positive resist. On the other hand, as the wiring of semiconductor devices and the like becomes finer, dry etching is increasingly being used instead of the conventional wet etching for etching the underlying layer after patterning the resist layer.

従って、レジスト材料に対しては、ドライエツチングに
対する強い耐性が要求されることになる。
Therefore, resist materials are required to have strong resistance to dry etching.

従来のアルカリ現像型レジスト材料は下地が金属や金属
酸化膜等(例えばアルミニウム、シリコン。
Conventional alkali-developable resist materials have metal or metal oxide films as bases (e.g. aluminum, silicon).

シリコン酸化膜等)の場合に使用されるハロゲン系プラ
ズマには強い耐性を示すが、下地が有機物(例えば二層
レジスト法における下層平坦化膜やポリイミド等の眉間
絶縁膜等)の場合に用いられる酸素プラズマに対する耐
性は充分ではなく、その特性向上が強く望まれていた。
It exhibits strong resistance to halogen-based plasma used when the underlying material is an organic material (e.g., a lower flattening film in a two-layer resist method, an insulating film between the eyebrows such as polyimide, etc.). The resistance to oxygen plasma was not sufficient, and there was a strong desire to improve its properties.

なお、アルカリ現像型レジストの文献としては、J、C
,5trieter著:コダソク・マイクロエレクトロ
ニクス・セミナー・プロシーディング(Kodak M
icroelectronicsSen+1nor P
roceeding) 116 (1976)等が挙げ
られる。
Note that the literature on alkali-developable resists includes J.C.
, 5trieter: Kodak Microelectronics Seminar Proceedings (Kodak M
icroelectronicsSen+1nor P
116 (1976), etc.

〔発明の目的〕[Purpose of the invention]

本発明の目的は上記した従来の酸素プラズマ耐性の低い
アルカリ現像型レジストの基本重合体に変わる、酸素耐
性の優れたアルカリ可溶性重合体を提供することにある
An object of the present invention is to provide an alkali-soluble polymer with excellent oxygen resistance, which can be used as an alternative to the basic polymer of the conventional alkali-developable resist, which has low oxygen plasma resistance.

〔発明の概要〕[Summary of the invention]

酸素プラズマ耐性の優れた重合体としては、有機ケイ素
系重合体が良く知られている。これは、有機ケイ素系重
合体が酸素プラズマにより効率よくケイ素酸化膜になり
、このケイ素酸化膜が、酸素プラズマ耐性膜として働く
ためである。一方、アルカリ可溶性の重合体としては、
ノポラ・ツク樹脂やポリビニルフェノールのようなフェ
ノール性水酸基を有する重合体が知られている。
Organosilicon polymers are well known as polymers with excellent oxygen plasma resistance. This is because the organosilicon polymer efficiently turns into a silicon oxide film by oxygen plasma, and this silicon oxide film functions as an oxygen plasma resistant film. On the other hand, as an alkali-soluble polymer,
Polymers having phenolic hydroxyl groups, such as Nopola-Tsuku resin and polyvinylphenol, are known.

そこで上記目的を達成するために主鎖がケイ素酸化物の
構造に最も近いポリシルセスキオキサンで側鎖にフェノ
ール性水酸基を有する重合体を種々合成した結果、下記
一般式(11で表わされるポリオルガノシルセスキオキ
サン重合体であって、(但し、一般式fil中R,,R
2は同−又は異なる有機基、nは重合度である)。
Therefore, in order to achieve the above objective, we synthesized various polymers whose main chain is polysilsesquioxane which is closest to the structure of silicon oxide and which has a phenolic hydroxyl group in the side chain. An organosilsesquioxane polymer (provided that R,,R in the general formula fil
2 are the same or different organic groups, n is the degree of polymerization).

かつR+、Rzとしてフェノール性水酸基を有する有機
基を40%以上含有しているポリオルガノシルセスキオ
キサン重合体がよいことがわがった。
It has also been found that a polyorganosilsesquioxane polymer containing 40% or more of organic groups having phenolic hydroxyl groups as R+ and Rz is good.

なお、nは8〜200でありR,、R,は具体的には、
例えば 等フェノールやりし・プールを置換基として有する炭素
数1〜6(置換基の炭素を除く)のアルキル基等が挙げ
られる。
In addition, n is 8 to 200, and R,, R, specifically,
For example, an alkyl group having 1 to 6 carbon atoms (excluding the substituent carbon) having a phenol or the like as a substituent, and the like.

一方、これ以外の側鎖は、上述したフェノール性水酸基
を有する有機基の水酸基をアルコキシ基。
On the other hand, other side chains include the hydroxyl group of the organic group having the phenolic hydroxyl group mentioned above and the alkoxy group.

L−ブチルジメチルシロキシ基、あるいはメチレンアセ
タール等の形で保護した基等が挙げられる。
Examples include L-butyldimethylsiloxy groups, groups protected in the form of methylene acetal, and the like.

また、アルカリ可を容性にするためには、フェノール性
水酸基を有する有機基が全体の側鎖の40%以上存在し
なければ充分なアルカリ可溶性は得られない。
Further, in order to make the material soluble in alkali, sufficient alkali solubility cannot be obtained unless organic groups having a phenolic hydroxyl group are present in 40% or more of the total side chains.

本発明の重合体は、初め水酸基を保護した形のポリオル
ガノシルセスキオキサンを対応するトリクロロシランあ
るいはトリアルコキシシランから合成し、次いで保!!
基をはずすことにより合成される。対応するトリクロロ
シランあるいはトリアルコキシシランは、種々の手法、
例えばグリニヤール反応やハロゲン化物(塩化ベンジル
誘導体など)とHS i CI!3を第三級アミンと銅
塩を用いて縮合させる方法あるいはスチレン誘導体に白
金触媒を用いてH5iCj!、を付加する方法等を使う
ことができる。
The polymer of the present invention is obtained by first synthesizing a polyorganosilsesquioxane with a protected hydroxyl group from the corresponding trichlorosilane or trialkoxysilane, and then preserving the polyorganosilsesquioxane. !
Synthesized by removing the group. The corresponding trichlorosilane or trialkoxysilane can be prepared by various methods,
For example, the Grignard reaction, halides (benzyl chloride derivatives, etc.) and HS i CI! 3 using a tertiary amine and a copper salt, or H5iCj! using a platinum catalyst on a styrene derivative. , etc. can be used.

水酸基を保護した形のポリオルガノシルセスキオキサン
の合成はジャーナル・オブ・アメリカン・ケミカル・ソ
サイティ(J、 Am、・Chew、 5oc−)+浜
、6194 (1960)、  ジャーナル・オブ・ア
メリカン・ケミカル・ソサイティ(J、^−,Chea
p、 Soc、)+釘、 4317 (1965)、 
 特公昭40−15989.特開昭53−88099.
特開昭59−66422等の方法およびこれらを改良し
た方法を検討したが、いずれの方法においても重合度(
n)は8〜200の範囲であり、その合成法は限定され
るものではない、また、保護基のはずし方も種々の方法
がある0例えばアルコキシ基から水酸基へはトリメチル
シリルヨードを用いる方法、t−ブチルジメチルシロキ
シ基からはテトラ−n−ブチルアンモニウムフルオライ
ドを用いる方法−メチレンアセタールからは五塩化リン
を用いる方法等があり、いずれも本重合体の合成に適用
できた。したがって本発明の重合体を合成するにあたり
、保護基をはずす方法も限定されるものではない。
The synthesis of polyorganosilsesquioxanes with protected hydroxyl groups is described in Journal of the American Chemical Society (J, Am, Chew, 5oc-) + Hama, 6194 (1960), Journal of American Chemical・Society (J, ^-, Chea
p, Soc, ) + Nail, 4317 (1965),
Special Publication Showa 40-15989. Japanese Patent Publication No. 53-88099.
Methods such as JP-A-59-66422 and improved methods have been investigated, but in all methods, the degree of polymerization (
n) is in the range of 8 to 200, and the synthesis method is not limited, and there are various methods for removing the protecting group. For example, from an alkoxy group to a hydroxyl group, use trimethylsilyl iodo, - A method using tetra-n-butylammonium fluoride from a butyldimethylsiloxy group, A method using phosphorus pentachloride from a methylene acetal, etc., and all of these methods were applicable to the synthesis of this polymer. Therefore, in synthesizing the polymer of the present invention, the method for removing the protecting group is not limited.

本発明の重合体はアルカリ性の水に可溶である一方、汎
用有機溶剤、例えばアルコール系1エーテル系、アミド
系、ケトン系、エステル系、セロソルブ系等の有機溶剤
にも容易に溶解し、これらの溶液を用いて成膜すること
ができる。
While the polymer of the present invention is soluble in alkaline water, it is also easily soluble in general-purpose organic solvents, such as alcohol-based, ether-based, amide-based, ketone-based, ester-based, and cellosolve-based organic solvents. The film can be formed using a solution of

したがって、従来のアルカリ現像レジストと同様に本重
合体を基本重合体とし、種々の感光性溶解阻害剤あるい
は感放射線性溶解阻害剤を選べば、本重合体はそれらに
対応した光あるいは放射線用のレジスト材料にすること
ができる。
Therefore, like conventional alkaline development resists, if this polymer is used as a basic polymer and various photosensitive dissolution inhibitors or radiation-sensitive dissolution inhibitors are selected, this polymer can be used as a base polymer for light or radiation. It can be made into a resist material.

一方、本発明の重合体の膜は酸素プラズマ中で全く膜ペ
リせず、極めて高いドライエツチング耐性を示した。し
たがって、上記レジストは、下地の有機物を酸素プラズ
マによりドライエツチングする場合の酸素プラズマ耐性
膜として、すなわち二層レジスト法の上層レジストとし
て使用することができる。
On the other hand, the film of the polymer of the present invention showed extremely high dry etching resistance without peeling at all in oxygen plasma. Therefore, the resist described above can be used as an oxygen plasma resistant film when dry etching the underlying organic substance using oxygen plasma, that is, as an upper layer resist in a two-layer resist method.

〔発明の実施例〕[Embodiments of the invention]

以下、本発明を実施例によって具体的に説明するが、本
発明はこの実施例に限定されるものではない。
EXAMPLES Hereinafter, the present invention will be specifically explained with reference to Examples, but the present invention is not limited to these Examples.

実施例1 ポリ (p−ヒドロキシベンジルシルセスキオキサン−
Co−p−メトキシベンジルシルセスキオキサン) 1.1p−メトキシベンジルトリクロロシランの合成 攪拌機、還流管1滴下ロートおよび温度計を備えた2I
!三フロフラスコに、マグネシウム粉末30g(1,2
gatom) 、四塩化ケイ素170g (1,00m
oj2 )およびジエチルエーテル500++/!を入
れる。フラスコを10℃以下に冷却した後、滴下ロート
より、塩化p−メトキシベンジル100g (0,63
9moJ ) とジエチルエーテル200mj!の混合
物を4時間かけて滴下する。室温でさらに1時間熟成し
た後、過剰のマグネシウムおよび塩化マグネシウムを吸
引濾過により除く。濾液を薫留することにより目的物を
44.0g(0,172moji! )得た。収率26
.9% 沸点117.5〜119.5℃/ 3.0++
unHg N M Rスペクトル(60MHz。
Example 1 Poly(p-hydroxybenzylsilsesquioxane-
Co-p-methoxybenzylsilsesquioxane) 1.1 Synthesis of p-methoxybenzyltrichlorosilane 2I equipped with a stirrer, a reflux tube, a dropping funnel and a thermometer.
! In a three flask, add 30g of magnesium powder (1,2
gatom), silicon tetrachloride 170g (1,00m
oj2) and diethyl ether 500++/! Put in. After cooling the flask to below 10°C, add 100 g of p-methoxybenzyl chloride (0,63
9moJ) and diethyl ether 200mJ! dropwise over 4 hours. After aging for a further 1 hour at room temperature, excess magnesium and magnesium chloride are removed by suction filtration. The filtrate was vaporized to obtain 44.0 g (0,172 moji!) of the desired product. Yield 26
.. 9% Boiling point 117.5-119.5℃/3.0++
unHg NMR spectrum (60MHz.

CC1a 、CHxClz δ5.33)  62.9
1 (2H,s)。
CC1a, CHxClz δ5.33) 62.9
1 (2H, s).

3.90 (3H,s)、6.91  (2H,d、 
 J=8Hz )。
3.90 (3H, s), 6.91 (2H, d,
J=8Hz).

7.20 (2H,d、  J−8Hz  )。7.20 (2H, d, J-8Hz).

1.2  ポリ (p−メトキシベンジルシルセスキオ
キサン)の合成 磁石棒1滴下ロートおよび還流管を備えた、100mj
!三ツロフラスコに、炭酸水素ナトリウムl1g(0,
13++v+offi )と水40mj!を入れる0滴
下ロートより、p−メトキシベンジルトリクロロシラン
10.23g(40,00+nIIIoj! )とジエ
チルエーテル10mj!の混合物を30分で滴下し、さ
らに30分間熟成する0反応終了後、反応混合物をエー
テル抽出し、硫酸ナトリウムで乾燥する。ジエチルエー
テルを減圧上留去して加水分解生成物5.10gを得た
。NMRスペクトル(60MHz、CDCll5.CH
zCIlzδ5.33)δ2.03 (2H,br、s
) 、 3.80 (3H,br、s) 。
1.2 Synthesis of poly(p-methoxybenzylsilsesquioxane) 100mj equipped with 1 magnetic bar, dropping funnel and reflux tube
! In a Mitsuro flask, add 1 g of sodium hydrogen carbonate (0,
13++v+offi) and water 40mj! 10.23g (40,00+nIIIoj!) of p-methoxybenzyltrichlorosilane and 10mj! of diethyl ether were added to the zero dropping funnel. After the completion of the reaction, the reaction mixture was extracted with ether and dried over sodium sulfate. Diethyl ether was distilled off under reduced pressure to obtain 5.10 g of a hydrolysis product. NMR spectrum (60MHz, CDCll5.CH
zCIlzδ5.33)δ2.03 (2H,br,s
), 3.80 (3H, br, s).

6.80(4H,br、s)  IRスペクトル(!/
C1−’)3400、2950.2B50.1610.
1510.1460.1300゜1250、1180.
1090.1035.890.835.790.760
゜重量平均分子量2,000゜ 上で得られた加水分解生成物4.80gと水酸化カリウ
ムのLoHt%メタノール溶液49I1gを25tal
ナスフラスコに入れ、200℃で2時間加熱する0反応
終了後、反応混合物をベンゼンに溶かし、メタノール中
に滴下することにより固体を析出させる。
6.80 (4H, br, s) IR spectrum (!/
C1-') 3400, 2950.2B50.1610.
1510.1460.1300゜1250, 1180.
1090.1035.890.835.790.760
4.80 g of the hydrolyzed product obtained above with a weight average molecular weight of 2,000° and 1 g of LoHt% methanol solution of potassium hydroxide 49I were added to 25 tal
After the reaction is completed, the reaction mixture is placed in an eggplant flask and heated at 200° C. for 2 hours, and the reaction mixture is dissolved in benzene and dropped into methanol to precipitate a solid.

濾過後減圧下乾燥して4.00gのポリ (p−メトキ
シベンジルシルセスキオキサン)を得た。NMRスペク
トル(60MHz 、CDCl1z 、CHtCIlt
δ5.33)  δ1.91 (2H,br、 s )
 、 3.78 (3H。
After filtration, it was dried under reduced pressure to obtain 4.00 g of poly(p-methoxybenzylsilsesquioxane). NMR spectrum (60 MHz, CDCl1z, CHtCIlt
δ5.33) δ1.91 (2H, br, s)
, 3.78 (3H.

br、s)、6.73(4H,br、s)   IRス
ペクトル(シcm−’) 2950.2850.161
5.1515.1465゜1305、1250.119
5.1120.1040.840.800.770゜重
量平均分子量3,300゜ 1.3  ポリ (p−ヒドロキシベンジルシルセスキ
オキサン−〇〇−p−メトキシベンジルシルセスキオキ
サン)の合成 還流管を備えた100aj2ナス型フラスコに、ポリ(
p−メトキシベンジルシルセスキオキサン)3.73g
 (MeOCaHsCHzS 1Osit単位で21.
6ma+onとクロロホルム20mj!およびトリメチ
ルシリルヨード6.92g (34,6snoj! )
を入れ、70℃においてマグネット棒で22時間攪拌す
る。室温において、メタノール20mJを入れ、さらに
30分攪拌した後減圧下低沸点物を留去し、残渣をジエ
チルエーテルとテトラヒドロフランの混合溶媒で抽出す
る。抽出溶液を亜硫酸水素す) IJウム水溶液、炭酸
水素ナトリウム水溶液1食塩水で洗い、次いで、溶媒を
減圧上留去する。得られた重合体を、アセトン/ヘキサ
ンで再沈し、減圧上加熱乾燥して目的物を2.71g得
た0重量平均分子量4,000.水酸基含有量85%、
NMRスペクトル(60M Hz 、  D M S 
O−d、、δ5.68)  δ1.75 (2H,br
、 s ) 、 3.63 (−OCHz 、 br、
s) 、 6.58 <4H,br、s) 、 8.8
8(−OH,br、s)、I Rスペクトル(ycm−
’)3350、1620.1515.1450.124
0.11B5.1120゜1040、840.805.
760゜ 水酸基含有量はトリメチルシリルヨードの量あるいは反
応時間により制御することができる。例えば、1.6当
量のトリメチルシリルヨードを用いて、反応時間4時間
では39%、7時間で54%12時間で75%、48時
間で95%、72時間でほぼ定量的にメトキシ基を水酸
基に変換できた。なお、水酸基含有量は、反応を重クロ
ロホルム中で行ない、メトキシ基がトリメチルシロキシ
基に変換される過程をNMRスペクトルにより追跡して
決定した。
br, s), 6.73 (4H, br, s) IR spectrum (cm-') 2950.2850.161
5.1515.1465°1305, 1250.119
5.1120.1040.840.800.770゜Weight average molecular weight 3,300゜1.3 Synthesis of poly(p-hydroxybenzylsilsesquioxane-〇〇-p-methoxybenzylsilsesquioxane) Reflux tube Add poly(
p-methoxybenzylsilsesquioxane) 3.73g
(MeOCaHsCHzS 21.
6ma+on and chloroform 20mj! and trimethylsilyl iodide 6.92g (34,6snoj!)
and stirred with a magnetic rod at 70°C for 22 hours. At room temperature, 20 mJ of methanol was added, and after further stirring for 30 minutes, low-boiling substances were distilled off under reduced pressure, and the residue was extracted with a mixed solvent of diethyl ether and tetrahydrofuran. The extracted solution is washed with an aqueous solution of hydrogen sulfite, an aqueous solution of sodium bicarbonate, and a saline solution, and then the solvent is distilled off under reduced pressure. The obtained polymer was reprecipitated with acetone/hexane and dried under reduced pressure under heat to obtain 2.71 g of the desired product, which had a weight average molecular weight of 4,000. Hydroxyl group content 85%,
NMR spectrum (60MHz, DMS
O-d,, δ5.68) δ1.75 (2H, br
, s), 3.63 (-OCHz, br,
s), 6.58 <4H,br,s), 8.8
8 (-OH, br, s), IR spectrum (ycm-
') 3350, 1620.1515.1450.124
0.11B5.1120°1040, 840.805.
The 760° hydroxyl group content can be controlled by the amount of trimethylsilyl iodide or reaction time. For example, using 1.6 equivalents of trimethylsilyl iodide, methoxy groups were converted to hydroxyl groups in a reaction time of 39% at 4 hours, 54% at 7 hours, 75% at 12 hours, 95% at 48 hours, and almost quantitatively at 72 hours. I was able to convert it. The hydroxyl group content was determined by conducting the reaction in deuterated chloroform and tracking the process of converting methoxy groups into trimethylsiloxy groups using NMR spectroscopy.

1.4  溶解性 本発明の重合体の溶解性に関して、代表的な汎用有機溶
剤で調べた結果、水酸基含有量50%以上の本重合体は
、メタノール、テトラヒドロフラン、N、N−ジメチル
アセトアミド、2−メチルシクロヘキサノン、酢酸イソ
アミル、エチルセロソルブ、ジメチルスルホキシドには
溶解したが、トルエン、ヘキサン四塩化炭素には不溶で
あった。一方、水溶液では、水酸化テトラメチルアンモ
ニウム水溶液に溶解した。
1.4 Solubility As a result of examining the solubility of the polymer of the present invention using typical general-purpose organic solvents, it was found that the present polymer having a hydroxyl group content of 50% or more was dissolved in methanol, tetrahydrofuran, N,N-dimethylacetamide, 2 - It dissolved in methylcyclohexanone, isoamyl acetate, ethyl cellosolve, and dimethyl sulfoxide, but was insoluble in toluene and hexane carbon tetrachloride. On the other hand, in the aqueous solution, it was dissolved in an aqueous tetramethylammonium hydroxide solution.

1.5  酸素プラズマ耐性 本発明の重合体の8重量%2−メチルシクロヘキサノン
溶液を、シリコン基板上に、スピンコーテング法により
塗布し、100℃で30分間ベークすることにより、0
.2μm厚の塗膜を形成した。続いて、酸素プラズマ(
条件:0□圧 0.5Torr。
1.5 Oxygen plasma resistance An 8% by weight 2-methylcyclohexanone solution of the polymer of the present invention was applied onto a silicon substrate by a spin coating method, and baked at 100°C for 30 minutes.
.. A coating film with a thickness of 2 μm was formed. Next, oxygen plasma (
Conditions: 0□pressure 0.5 Torr.

RF300W、バレル形アッシャ−)に20分間さらし
たが、本重合体は全く膜ベリしなかった。
Although exposed to RF300W (barrel type asher) for 20 minutes, this polymer did not peel off at all.

〔発明の効果〕〔Effect of the invention〕

本発明の重合体は、汎用有機溶剤に可溶であるので成膜
することができ、また、アルカリ性水溶液にも溶解する
ので本重合体を基本重合体とした種々の感光性溶解阻害
剤あるいは感放射線性溶解阻害剤との組成物は、それら
に対応した光あるいは放射線用のレジスト材料として使
用できる。一方、本重合体は酸素プラズマ耐性に優れて
いるので、これらレジストを二層レジスト法の上層レジ
ストとして使用することができる。以上、述べたように
、本発明の重合体は、光および放射線感応性材料等の機
能性高分子材料として、極めて効用の大なるものである
The polymer of the present invention is soluble in general-purpose organic solvents, so it can be formed into a film, and it is also soluble in alkaline aqueous solutions, so it can be used as a base polymer for various photosensitive dissolution inhibitors or photosensitive dissolution inhibitors. A composition with a radioactive dissolution inhibitor can be used as a resist material for light or radiation corresponding thereto. On the other hand, since this polymer has excellent oxygen plasma resistance, these resists can be used as an upper layer resist in a two-layer resist method. As described above, the polymer of the present invention is extremely useful as a functional polymer material such as a light- and radiation-sensitive material.

代理人 弁理士  秋 本  正 実 手続補正書(自発) 昭和61年5月12日Agent Patent Attorney Masami Akimoto Procedural amendment (voluntary) May 12, 1986

Claims (1)

【特許請求の範囲】 1、下記一般式(1)で表わされるポリオルガノシルセ
スキオキサン重合体であって、 ▲数式、化学式、表等があります▼(1) (但し、一般式(1)中R_1、R_2は同一又は異な
る有機基、nは重合度である)。 かつR_1、R_2としてフェノール性水酸基を有する
有機基を40%以上含有していることを特徴とするアル
カリ可溶性ポリオルガノシルセスキオキサン重合体。 2、上記一般式(1)のR_1、R_2が、p−ヒドロ
キシベンジル基およびp−メトキシベンジル基であり、
nは8〜200であることを特徴とする特許請求の範囲
第1項記載のアルカリ可溶性ポリオルガノシルセスキオ
キサン重合体。
[Claims] 1. A polyorganosilsesquioxane polymer represented by the following general formula (1), which has ▲a numerical formula, a chemical formula, a table, etc.▼(1) (However, general formula (1) (R_1 and R_2 are the same or different organic groups, and n is the degree of polymerization). An alkali-soluble polyorganosilsesquioxane polymer characterized by containing 40% or more of an organic group having a phenolic hydroxyl group as R_1 and R_2. 2. R_1 and R_2 in the above general formula (1) are p-hydroxybenzyl group and p-methoxybenzyl group,
The alkali-soluble polyorganosilsesquioxane polymer according to claim 1, wherein n is 8 to 200.
JP23634485A 1985-05-10 1985-10-24 Alkali-soluble polyorganosilsesquioxane polymer Granted JPS6296526A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP23634485A JPS6296526A (en) 1985-10-24 1985-10-24 Alkali-soluble polyorganosilsesquioxane polymer
US06/859,370 US4745169A (en) 1985-05-10 1986-05-05 Alkali-soluble siloxane polymer, silmethylene polymer, and polyorganosilsesquioxane polymer
EP86106238A EP0204963B1 (en) 1985-05-10 1986-05-07 Use of Alkali-Soluble Polyorganosilsesquioxane Polymers in a resist for preparing electronics parts.
DE8686106238T DE3687479T2 (en) 1985-05-10 1986-05-07 USE OF SILSESQUIOXANE POLYMERS SOLUBLE IN ALKALINE MILIEU IN A RESIST FOR THE PRODUCTION OF ELECTRONIC PARTS.
US07/893,946 US5264319A (en) 1985-05-10 1992-06-04 Photosensitive resin composition having high resistance to oxygen plasma, containing alkali-soluble organosilicon polymer and photosensitive dissolution inhibitor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23634485A JPS6296526A (en) 1985-10-24 1985-10-24 Alkali-soluble polyorganosilsesquioxane polymer

Publications (2)

Publication Number Publication Date
JPS6296526A true JPS6296526A (en) 1987-05-06
JPH0558446B2 JPH0558446B2 (en) 1993-08-26

Family

ID=16999418

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23634485A Granted JPS6296526A (en) 1985-05-10 1985-10-24 Alkali-soluble polyorganosilsesquioxane polymer

Country Status (1)

Country Link
JP (1) JPS6296526A (en)

Cited By (7)

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Publication number Priority date Publication date Assignee Title
US4946921A (en) * 1988-05-18 1990-08-07 Toray Silicone Company Limited Alkali-soluble organopolysiloxane
JPH0436322A (en) * 1990-06-01 1992-02-06 Fuji Photo Film Co Ltd Preparation of siloxane polymer
JPH04130324A (en) * 1990-09-21 1992-05-01 Tokyo Ohka Kogyo Co Ltd Positive type resist composition
WO2004111734A1 (en) * 2003-06-11 2004-12-23 Tokyo Ohka Kogyo Co., Ltd. Positive resist composition, resist laminates and process for the formation of resist patterns
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US8082803B2 (en) 2008-05-28 2011-12-27 Kabushiki Kaisha Toshiba Electromagnetic flow meter having a cut groove formed in the flange for holding the liner in position
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Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4946921A (en) * 1988-05-18 1990-08-07 Toray Silicone Company Limited Alkali-soluble organopolysiloxane
JPH0436322A (en) * 1990-06-01 1992-02-06 Fuji Photo Film Co Ltd Preparation of siloxane polymer
JPH04130324A (en) * 1990-09-21 1992-05-01 Tokyo Ohka Kogyo Co Ltd Positive type resist composition
WO2004111734A1 (en) * 2003-06-11 2004-12-23 Tokyo Ohka Kogyo Co., Ltd. Positive resist composition, resist laminates and process for the formation of resist patterns
EP1650250A4 (en) * 2003-07-29 2009-08-12 Toagosei Co Ltd Silicon-containing polymer, process for rpoducing the same, heat-resistant resin composition, and heat-resistant film
JPWO2005010077A1 (en) * 2003-07-29 2006-11-30 東亞合成株式会社 SILICON-CONTAINING POLYMER COMPOUND, PROCESS FOR PRODUCING THE SAME, HEAT-RESISTANT RESIN COMPOSITION AND HEAT-RESISTANT FILM
EP1650250A1 (en) * 2003-07-29 2006-04-26 Toagosei Co., Ltd. Silicon-containing polymer, process for rpoducing the same, heat-resistant resin composition, and heat-resistant film
US7811637B2 (en) 2003-07-29 2010-10-12 Toagosei Co., Ltd. Silicon-containing polymer, process for producing the same, heat-resistant resin composition, and heat-resistant film
JP2011102399A (en) * 2003-07-29 2011-05-26 Toagosei Co Ltd Silicon-containing polymer compound, manufacturing method of the same, heat-resistant resin composition, and heat-resistant coating
JP4702055B2 (en) * 2003-07-29 2011-06-15 東亞合成株式会社 Silicon-containing polymer compound and method for producing the same
US8329815B2 (en) 2003-07-29 2012-12-11 Toagosei Co., Ltd. Silicone-containing polymer and a heat-resistant resin composition comprising the silicon-containing polymer
US8082803B2 (en) 2008-05-28 2011-12-27 Kabushiki Kaisha Toshiba Electromagnetic flow meter having a cut groove formed in the flange for holding the liner in position
WO2016111112A1 (en) * 2015-01-05 2016-07-14 東レ・ファインケミカル株式会社 Silicone copolymer and method for producing same

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