JPS6292645U - - Google Patents

Info

Publication number
JPS6292645U
JPS6292645U JP18573585U JP18573585U JPS6292645U JP S6292645 U JPS6292645 U JP S6292645U JP 18573585 U JP18573585 U JP 18573585U JP 18573585 U JP18573585 U JP 18573585U JP S6292645 U JPS6292645 U JP S6292645U
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JP
Japan
Prior art keywords
light
rail
absence
ics
utility
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18573585U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP18573585U priority Critical patent/JPS6292645U/ja
Publication of JPS6292645U publication Critical patent/JPS6292645U/ja
Pending legal-status Critical Current

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Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP18573585U 1985-12-02 1985-12-02 Pending JPS6292645U (en:Method)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18573585U JPS6292645U (en:Method) 1985-12-02 1985-12-02

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18573585U JPS6292645U (en:Method) 1985-12-02 1985-12-02

Publications (1)

Publication Number Publication Date
JPS6292645U true JPS6292645U (en:Method) 1987-06-13

Family

ID=31134640

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18573585U Pending JPS6292645U (en:Method) 1985-12-02 1985-12-02

Country Status (1)

Country Link
JP (1) JPS6292645U (en:Method)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997005496A1 (fr) * 1995-07-28 1997-02-13 Advantest Corporation Testeur de dispositif a semiconducteur et systeme de test de dispositif a semiconducteur comportant plusieurs testeurs

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997005496A1 (fr) * 1995-07-28 1997-02-13 Advantest Corporation Testeur de dispositif a semiconducteur et systeme de test de dispositif a semiconducteur comportant plusieurs testeurs

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