JPS6291475U - - Google Patents

Info

Publication number
JPS6291475U
JPS6291475U JP18381585U JP18381585U JPS6291475U JP S6291475 U JPS6291475 U JP S6291475U JP 18381585 U JP18381585 U JP 18381585U JP 18381585 U JP18381585 U JP 18381585U JP S6291475 U JPS6291475 U JP S6291475U
Authority
JP
Japan
Prior art keywords
thick film
film circuit
circuit pattern
resistor
resistance value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18381585U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP18381585U priority Critical patent/JPS6291475U/ja
Publication of JPS6291475U publication Critical patent/JPS6291475U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本考案の実施例を示す平面図、第2
図は、従来の厚膜回路パターンの平面図、第3図
は可動プローブ型レーザトリミング装置の可動プ
ローブ部分の部分斜視図、第4図は固定プローブ
型レーザトリミング装置の固定プローブ部分の部
分斜視図である。 1a,1b……抵抗体、2……導体パターン、
3a,3b,3c,3d……抵抗値測定用端子、
4a,4b,4c……電気部品接続用電極、5a
,5b……可動プローブ、6……プローブ固定枠
、7……プローブ。
FIG. 1 is a plan view showing an embodiment of the present invention, and FIG.
The figure is a plan view of a conventional thick film circuit pattern, Figure 3 is a partial perspective view of the movable probe portion of a movable probe type laser trimming device, and Figure 4 is a partial perspective view of the fixed probe portion of a fixed probe type laser trimming device. It is. 1a, 1b...Resistor, 2...Conductor pattern,
3a, 3b, 3c, 3d...terminals for resistance value measurement,
4a, 4b, 4c...Electrode for electrical component connection, 5a
, 5b...movable probe, 6... probe fixed frame, 7... probe.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 厚膜回路が所要の性能を得るべく、抵抗値調整
がなされる厚膜抵抗体を含む厚膜回路パターンに
おいて、前記厚膜抵抗体の抵抗値測定端子となる
一対の導体パターンを、前記厚膜抵抗体の端部に
接する定位置に設けたことを特徴とする厚膜回路
パターン。
In a thick film circuit pattern including a thick film resistor whose resistance value is adjusted in order for the thick film circuit to obtain the required performance, a pair of conductor patterns that serve as resistance value measurement terminals of the thick film resistor are connected to the thick film circuit pattern. A thick film circuit pattern characterized by being provided at a fixed position in contact with the end of a resistor.
JP18381585U 1985-11-28 1985-11-28 Pending JPS6291475U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18381585U JPS6291475U (en) 1985-11-28 1985-11-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18381585U JPS6291475U (en) 1985-11-28 1985-11-28

Publications (1)

Publication Number Publication Date
JPS6291475U true JPS6291475U (en) 1987-06-11

Family

ID=31130895

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18381585U Pending JPS6291475U (en) 1985-11-28 1985-11-28

Country Status (1)

Country Link
JP (1) JPS6291475U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017045848A (en) * 2015-08-26 2017-03-02 株式会社村田製作所 Aggregate substrate for resistive element

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017045848A (en) * 2015-08-26 2017-03-02 株式会社村田製作所 Aggregate substrate for resistive element

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