JPS6282473A - Contour line drawing system for two-dimensional intensity data - Google Patents

Abstract

PURPOSE:To convert various processings for contour line drawing into a pattern by drawing a contour line in every cell consisting of a set of data of 4 points on a rectangle and synthesizing contours. CONSTITUTION:Two-dimensional intensity data from an analyzer 1 is stored in a data memory 2. A display part coordinate operator 3 reads out cells consisting of sets of data of 4 points on the rectangle from the data memory 2 successively and compares respective data with the height of a contour line to recognize a side of the rectangle, which the contour traverses, and calculates positions on this side. A segment generator 4 generates a segment between these calculated positions. This segment is written on a graphic memory 5, and the contour is displayed out on a graphic display device.

Description

[Detailed Description of the Invention] [Industrial Application Field] The present invention is suitable for drawing contour lines by sequentially reading matrix-shaped two-dimensional intensity data in units of cells each consisting of a data set of four points on a rectangle. This invention relates to a contour line drawing method for two-dimensional intensity data.

[Conventional technology]

The matrix-shaped two-dimensional intensity data obtained by the analyzer includes two-dimensional NMR (nuclear magnetic resonance) data, temperature distribution data obtained by two-dimensional scanning, and various other data. When analyzing such data, expressing it as a contour map may be extremely effective depending on the content of the analysis. In such cases, generally, two-dimensional data obtained by the analyzer is once stored in a storage device and then sequentially read out to draw contour lines.

This contour line can be drawn by, for example, comparing the height of the contour line with individual data read from the storage device, selecting the data with the value closest to the height, and connecting the data positions. method is adopted.

[Problem that the invention seeks to solve]

However, in the conventional method described above, even if the contour line actually passes through a position between two data points, it is drawn at one of the data positions, which distorts the contour line and reduces its precision. It will be missing. This means that
As a result, analysis accuracy will be adversely affected. Also,
Various types of processing, such as comparison processing that sequentially reads individual data and compares it with the height of a contour line, processing that determines and selects the data with the value closest to that height, processing that connects the positions of selected data with line segments, etc. As a result, the processing becomes difficult and complicated, which increases the overall load on the data processing device, making it difficult to improve the processing speed.

The present invention solves the above problems, and provides a contour line drawing method for two-dimensional intensity data that can draw contour lines more accurately and improve processing speed through simple processing. The purpose is to

[Means for solving problems]

To this end, the contour line drawing method for two-dimensional intensity data of the present invention sequentially reads out cells each consisting of a set of data at four points in a rectangular shape, compares the height of the contour line with each piece of data, and then This method is characterized by calculating positions on the sides and drawing contour lines by connecting the calculated positions within a rectangle.

[Effect]

In the contour line drawing method of two-dimensional intensity data of the present invention, cells consisting of a data group on a rectangle are sequentially read out and the height of the contour line is compared with each data, so whether or not each data exceeds the height of the contour line is It is possible to easily recognize and identify whether or not the contour line crosses the rectangle, and if so, which side it is on, and also calculate the crossing position on that side. Therefore, by generating line segments between the transverse positions based on these calculations, contour lines can be drawn not only at data positions but also at arbitrary positions.

〔Example〕

Examples will be described below with reference to the drawings.

FIG. 1 is a diagram for explaining one embodiment of the contour line drawing method for two-dimensional intensity data according to the present invention, FIG. 2 is a diagram for explaining the reading process of two-dimensional intensity data, and FIG. 3 is a diagram for explaining a cell FIG. 4 is a diagram for explaining the drawing pattern of contour lines in a cell.

In FIG. 1, 1 is an analyzer, 2 is a data memory, and 3 is a data memory.
4 is a line segment generator, 5 is a graphic memory, and 6 is a graph ink display. The analyzer 1 is a device such as a nuclear magnetic resonance apparatus that obtains two-dimensional intensity data, and the data memory 2 stores this two-dimensional intensity data. The display line segment coordinate calculator 3 sequentially reads cells consisting of a set of rectangular data of four points from the data memory 2, compares each data with the height of the contour line, and recognizes the side of the rectangle that the contour line crosses. The line segment generator 4 generates line segments between the calculated positions.

For example, as shown in FIG. 2(a), two-dimensional coordinates (x).

, yo), (xIl yo), ......, (xn,
y.

), (xo, y+), (X+ + 'l+),...
Two-dimensional data D stored in the data memory 2 corresponding to . . ,D,,,=・==・・D,l
o,,Do5,D,1,...,Dfi4,...
・・・・・・・・・D. ,,,Dl,,,...D
If there is a line segment coordinate calculator 3, the display line segment coordinate calculator 3 calculates data DII, D1□, D21 . Data is read from the data memory 2 for each cell consisting of a set of D2 degrees, and each data is compared with the height of the contour line. If the comparison result shows that all the data exceeds the height of the contour line, or vice versa, no contour line will be drawn in that cell.
If there are data that exceed the height of the contour line and data that does not exceed the height of the contour line among the four data points, the contour line will be drawn within that cell. Therefore, when a contour line is drawn, the display line segment coordinate calculator 3 determines the position on the side crossed by the contour line. In other words, the position where the contour line crosses is on the side of the rectangle connecting the data lower and higher than the height of the contour line, and as shown in Figure 2(b), data D
If 2□ exceeds the height of the contour line (H) and other data is lower than the height of the contour line (L), the edge that includes the position of this data as shown in the corresponding cell part of Figure 2 (a. The contour lines will cross.

In this way, all the data shown in FIG.
It is possible to output and display the contour lines, ,h,.

By the way, as shown in FIG. 3, there are 16 patterns obtained by comparing each cell data and the height of the contour line. Among them, a pattern (0) in which all data are lower than the height of the contour line, or a pattern (F) in which all the data is higher than the height of the contour line is a case where no contour line is drawn as described above. and the remaining 1
As for the pattern No. 4, each has its own contour line drawing pattern as shown in FIG. Therefore, by performing such Bakun recognition in the display line segment coordinate calculator 3 and the line segment generator 4, it is possible to simplify the determination of the side on which the coordinate calculation is to be performed and the recognition process of line segment generation.

For example, the coordinates (x+□, y2) of the position P2 crossed by the contour line on the side connecting the respective positions of the data DI2 and D22 shown in FIG. 4 are calculated by D22 D+2. In this way, data DI□ and D2
Transverse position P2 (X12
1"lz) and the position P+ (xz,)'+z) on the side connecting data DZI and D22, the line segment generator 4 generates a line segment between this position Pt and position P2. In this case, the contour lines are generally curved, so
As shown in Figure 4, the contour line crossing position P on the side of the cell is simply
, and P2 is a high line ρ.

A contour line with a higher degree of approximation can be obtained by connecting by curve 12 or ρ3 than by connecting by . In this case, the line segment j! generally passes through the point far from the higher point, for example, in the case of the cell shown in FIG. 4, the line segment j! passes through the point far from the position of the data D2□, that is, the point close to the data DI+. 2 or ρ3. The curvature of the higher line is
The contour lines shown in FIG. 2(a) are higher as h2 is higher. Therefore, whether the line segment 7!2 is drawn using a polygonal line as shown in Figure 4 or the line segment β3 is drawn using a circular arc, adjusting the degree of bulge by the height of the contour line will improve the approximation. It is possible to obtain high contour lines.

〔Effect of the invention〕

As is clear from the above description, according to the present invention, contour lines are drawn and synthesized in each cell consisting of a set of data at four points on a rectangle, so various processes for drawing contour lines are performed. It can be patterned, and contour lines passing through any position other than the data position can be drawn. Furthermore, by drawing contour lines within cells using curved lines such as polygonal lines or circular arcs (elliptical arcs), contour lines with a higher degree of approximation can be drawn. Furthermore, since the process of reading out the intensity data group in units of cells, finding contour crossing points, and generating line segments can be performed sequentially, the process can be simplified and the processing speed can be improved.

[Brief explanation of drawings]

FIG. 1 is a diagram for explaining one embodiment of the contour line drawing method for two-dimensional intensity data according to the present invention, FIG. 2 is a diagram for explaining the reading process of two-dimensional intensity data, and FIG. 3 is a diagram for explaining a cell FIG. 4 is a diagram for explaining the drawing pattern of contour lines in a cell. DESCRIPTION OF SYMBOLS 1... Analyzer, 2... Data memory, 3... Display line segment coordinate calculator, 4... Line segment generator, 5... Graphic memory, 6... Graphic display. Applicant JEOL Co., Ltd. Representative Patent Attorney Yoshiji Ryu Abe: = 1,000 F I 1 Yoyo Shi 2 ↓ Jin (b) No. 3
Figure 4

Claims (3)

[Claims] (1) A contour line drawing method for two-dimensional intensity data that sequentially reads out matrix-shaped two-dimensional intensity data and draws contour lines, in which cells consisting of data sets of four points on a rectangle are sequentially read out and the height of the contour line is A contour line drawing method for two-dimensional intensity data, characterized in that the positions on the sides of the rectangle crossed by the contour lines are calculated by comparing each data, and the calculated positions are connected within the rectangle and a contour line is drawn. (2) The contour line drawing method for two-dimensional intensity data according to claim 1, characterized in that the calculated points are connected within a rectangle according to a curvature set according to the height. (3) A contour line drawing method for two-dimensional intensity data according to claim 1, characterized in that the drawing pattern of contour lines within a rectangle is created based on the position of the data exceeding the height of the contour line.