JPS6273250U - - Google Patents
Info
- Publication number
- JPS6273250U JPS6273250U JP16534985U JP16534985U JPS6273250U JP S6273250 U JPS6273250 U JP S6273250U JP 16534985 U JP16534985 U JP 16534985U JP 16534985 U JP16534985 U JP 16534985U JP S6273250 U JPS6273250 U JP S6273250U
- Authority
- JP
- Japan
- Prior art keywords
- plasma
- frequency
- light source
- sample
- spectral lines
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000013307 optical fiber Substances 0.000 claims description 3
- 230000003595 spectral effect Effects 0.000 claims 2
- 238000009616 inductively coupled plasma Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
- 239000010453 quartz Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Description
第１図は本考案実施例の構成説明図、第２図は
従来例の構成説明図である。
１……石英管、２……高周波コイル、３……プ
ラズマ、４，４′，１５……集光レンズ、５，５
′……回転ミラー、１０，１０′……光電子増倍
管、１１，１３……校正用光源、１２，１２′…
…分光器、１４……電源、１６，１６′……光フ
アイバー。
FIG. 1 is an explanatory diagram of the configuration of an embodiment of the present invention, and FIG. 2 is an explanatory diagram of the configuration of a conventional example. 1... Quartz tube, 2... High frequency coil, 3... Plasma, 4, 4', 15... Condensing lens, 5, 5
'... Rotating mirror, 10, 10'... Photomultiplier tube, 11, 13... Calibration light source, 12, 12'...
...Spectrometer, 14...Power supply, 16,16'...Optical fiber.
Claims (1)
起させ該プラズマから照射されるスペクトル線を
複数個の分光器に導びて測定波長毎に試料中の被
測定元素を分析する装置において、校正用の１個
の光源と、該光源から照射されるスペクトル線を
夫々前記複数個の分光器内に導びく複数個の光フ
アイバーとを具備することを特徴とする誘導結合
型高周波プラズマ発光分光装置。 (2) 前記分光器および光フアイバーは夫々２個
である実用新案登録請求の範囲第(1)項記載の誘
導結合型高周波プラズマ発光分光装置。[Claims for Utility Model Registration] (1) A sample is excited using high-frequency inductively coupled plasma, and the spectral lines irradiated from the plasma are guided to multiple spectrometers to identify the elements to be measured in the sample for each measurement wavelength. An apparatus for analyzing a ray, comprising one light source for calibration, and a plurality of optical fibers each guiding spectral lines emitted from the light source into the plurality of spectrometers. Coupled high-frequency plasma emission spectrometer. (2) The inductively coupled high-frequency plasma emission spectrometer according to claim (1), wherein the spectrometer and the optical fiber are each two in number.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16534985U JPS6273250U (en) | 1985-10-28 | 1985-10-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16534985U JPS6273250U (en) | 1985-10-28 | 1985-10-28 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6273250U true JPS6273250U (en) | 1987-05-11 |
Family
ID=31095310
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16534985U Pending JPS6273250U (en) | 1985-10-28 | 1985-10-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6273250U (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6039533A (en) * | 1983-08-12 | 1985-03-01 | Japan Spectroscopic Co | Spectrochemical analysis device with microplate |
-
1985
- 1985-10-28 JP JP16534985U patent/JPS6273250U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6039533A (en) * | 1983-08-12 | 1985-03-01 | Japan Spectroscopic Co | Spectrochemical analysis device with microplate |
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