JPS627254A - Collective terminal test system - Google Patents

Abstract

PURPOSE:To accomplish collective testing of terminal equipments of an integrated communication network by providing an attached testing machine to plural digital exchanges and providing a collective terminal testing machine to a collective testing center installed in common for the respective digital exchanges. CONSTITUTION:All the information channels B and the control channels D on a digital subscriber's line 3 are connected to the collective testing center 17 via a digital link 20. Therefore, the said channels B and D on the line 3 that are accommodated by the digital exchange 1 are connected to the collective terminal testing machine 18 via a speaking network 8, attached testing machine 16, digital terminal 24, digital link 20 which are in the exchange 1, and a connection circuit 19 in the center 17. Therefore, a terminal equipment connected to the digital subscriber's line 3 can be tested by the center 17 using the collective terminal testing machine 18.

Description

[Detailed Description of the Invention] [Summary] In a digital integrated communication network that connects multiple types of terminal devices to subscriber lines, all information channels and control channels on the subscriber line to be tested are connected to a centralized test center. It connects to terminal testing equipment and centrally tests various terminal devices connected to digital subscriber lines.

[Industrial application field]

The present invention relates to a centralized terminal testing method that enables economical and easy testing of various terminal devices accommodated in a digital integrated communication network.

The subscriber lines accommodated in each digital exchange making up the digital integrated communication network include, for example, digital telephone terminal equipment, facsimile terminal equipment, data terminal equipment, etc.
A plurality of types of terminal devices are connected and can communicate simultaneously via a plurality of information channels and control signal channels provided on the subscriber line.

It is desirable to be able to test such terminal devices as economically and rationally as possible.

[Conventional technology]

FIG. 3 is a diagram showing an example of a conventional terminal testing method in this type of digital exchange, and FIG. 4 is a diagram showing an example of the digital subscriber circuit in FIG. 3.

In FIG. 3, a digital subscriber line 3 accommodated in a digital subscriber circuit (DLC) 2 of a digital exchange 1
A plurality of types of terminal devices 5 are connected to the terminal device 5 via a line termination device (NT) 4.

On the digital subscriber line 3, there are a plurality of (for example, two channels) information channels B that transmit and receive information at a rate of, for example, 64 kilobits per second, which are transmitted and received by each terminal device 5, and a plurality of information channels B for controlling communication via each information channel B. A control channel D is provided for transmitting various control signals at, for example, 16 kilobits per second between the digital exchange 1 and the terminal equipment 5. Note that the control channel D is also used to perform bucket communication and the like between the terminal devices 5.

The information channel B and control channel D used for communication between the terminal devices 5 are connected to the digital subscriber circuit housed in the own digital exchange 1 via a communication path network 8 constituted by a line concentrator 6 and a distribution device 7. 2, or to a digital terminal (DT) 10 housing a digital link 9 to another digital exchange.

The digital exchange 1 is provided with a terminal testing device 11 for testing each terminal device 5 housed therein.

In FIG. 4, the digital subscriber circuit 2 includes a line termination device (4 in FIG. 3) that passes through the digital subscriber line 3.
a circuit termination unit 12 that controls the transmission and reception of signals between the line termination unit 12, a circuit termination unit 13 that scrambles or descrambles the signals sent and received between the line termination unit 12, and information provided on the digital subscriber line 3. Interface unit 14 that separates or combines channel B and control channel D
In addition to this, a switching relay 15 is provided to switch and connect the digital subscriber line 3 to the terminal testing device 11.

When testing the terminal device 5 via the digital subscriber line 3, the switching relay 15 in the digital subscriber circuit 2
The terminal test equipment 11 operates the digital subscriber line 3.
The performance of the terminal device 5 is tested by transmitting and receiving various information and control signals between the terminal device 5 to be tested and the terminal testing device 11 via the information channel B and the control channel D.

[Problem to be Solved by the Invention 9] As is clear from the above explanation, in a conventional terminal testing method, each digital exchange 1 is provided with a terminal testing device 11, and a digital subscriber line 3 that accommodates the digital subscriber line 3 to be tested is The switching relay 15 in the subscriber circuit 2 is operated to connect the digital subscriber line 3 to the terminal testing device 11, and each terminal device 5 is tested from the terminal testing device 11.

In a digital integrated communication network, there are multiple types of terminal devices 5 connected to the digital subscriber line 3, and each transmits and receives different control signals and information. The test equipment is far more complex than the test equipment used for testing equipment, and there is a risk that the economic efficiency of the digital integrated communication network will be impaired.

[Means for solving problems]

FIG. 1 is a diagram showing the principle of the present invention.

In FIG. 1, a test addition device 16 is provided in a plurality of digital exchanges 1 provided in a digital integrated communication network,
In addition, a centralized terminal testing device 18 is provided in a centralized testing center 17 provided in common to each digital exchange 1.

The test addition device 16 connects all the information channels B and control channels D provided on the subscriber line 3 to the centralized test center 17 via the communication path network 8 .

The centralized terminal testing device 18 tests each type of terminal device 5.

[Effect]

That is, according to the present invention, all the information channels and control channels provided on the digital subscriber line to be tested are connected to the centralized terminal testing device installed in the centralized testing center via the test addition device, and the information By transmitting and receiving various information and control signals between each terminal device connected to the digital subscriber line and the centralized terminal testing equipment via channels and control channels, the centralized testing center can be integrated into the digital integrated communication network. It becomes possible to centrally test all the terminal devices currently being used, improving the economic efficiency of the digital integrated communication network and streamlining the testing work.

〔Example〕

An embodiment of the present invention will be described below with reference to the drawings.

FIG. 2 is a diagram showing a centralized terminal testing method according to an embodiment of the present invention. Note that the same reference numerals refer to the same objects throughout the plan. In addition, in FIG. 2, the digital subscriber line 3
The line termination device 4 and the terminal device 5 connected to are omitted.

In FIG. 2, in the digital exchange 1, a test addition device 16 is connected to the distribution device 7 constituting the communication path network 8, and in the centralized test center 17, A centralized terminal testing device 18 for testing various terminal devices (not shown) connected to each digital subscriber line 3 is connected to the connection circuit 19.

In FIG. 2, when testing a terminal device connected to the digital subscriber line 3, the centralized terminal testing equipment 18 in the centralized testing center 17 is a digital exchange that accommodates the digital subscriber line 3 to be tested. 1, control commands are transmitted to the call processor 21 and line processor 22 in the digital exchange 1, and all information channels B on the digital subscriber line 3 are connected to the communication path network. 8 to the test add-on device 16 and control channel D separated by the digital subscriber circuit 3 and connected to the line processor 22 via the selector (SEL) 23 and the channel network 8 to the test add-on device. 16, and all information channels B and control channels D of the digital subscriber line 3 connected to the test add-on device I6, and a digital link 20 leading to the central test center 17 via the distribution device 7. Connect to digital terminal (DT) 24.

As a result, all information channels B and control channels D on digital subscriber line 3 are connected via digital link 20 to central test center 17 .

At the centralized test center 17, the digital link 20
All information channels B and control channels D connected via the terminal are connected to the centralized terminal testing device 18 via the connection circuit 19.

The centralized terminal testing device 18 communicates with each terminal device connected to the digital subscriber line 3 to be tested via the connected information channel B and control channel D.
Tests the performance of the terminal device by transmitting and receiving various information and control signals.

As is clear from the above description, according to this embodiment, the DigiMall subscriber yA accommodated in the digital exchange 1
All information channels B and control channels D on U are
Communication path network 8 in digital exchange 1, test addition device 16
, digital terminal 24, digital link 20,
It is also connected to a centralized terminal testing device 18 via a connection circuit 19 within the centralized testing center 17 . Therefore, the terminal devices connected to the digital subscriber line 3 can be tested at the centralized test center 17 using the centralized terminal testing device I8.

It should be noted that FIG. 2 is merely one embodiment of the present invention, and for example, the configurations of the digital exchange 1 and the centralized testing center 17 are not limited to those shown, and many other modifications may be considered. However, the effects of the present invention remain the same in either case.

〔Effect of the invention〕

As described above, according to the present invention, in the digital integrated communication network, the centralized &:ij terminal testing equipment is installed only in the centralized testing center, and the testing additional equipment is installed in each digital exchange. It becomes possible to centrally test all the terminal devices accommodated in the digital integrated communication network from the center, improving the economic efficiency of the digital integrated communication network and streamlining the testing work.

[Brief explanation of the drawing]

FIG. 1 is a diagram showing the principle of the present invention, FIG. 2 is a diagram showing a centralized terminal test method according to an embodiment of the present invention, FIG. 3 is a diagram showing an example of a conventional terminal test method, and FIG. The figure is a diagram showing an example of the digital subscriber circuit in FIG. 3. In the figure, 1 is a digital exchange, 2 is a digital subscriber circuit (DLC), 3 is a digital subscriber line, 4 is a line termination device (NT), 5 is a terminal device, 6 is a line concentrator, 7 is a distribution device, 8 9 and 20 are digital links, and 10 and 24 are digital terminals (
DT), 11 is a terminal testing device, 12 is a line termination section, 1
3 is a circuit termination part, 14 is an interface part, 15 is a switching relay, 16 is a test addition device, 17 is a centralized test center,
18 is a centralized terminal test device, 19 is a connection circuit, 21 is a call processor, 22 is a line processor, 23 is a selector (SEL) 1. B indicates an information channel, and D indicates a control channel.

Claims (1)

[Claims] A plurality of digital exchanges (1) accommodating digital subscriber lines (3) connecting a plurality of types of terminal devices (5);
In a digital integrated communication network having a centralized test center (17) provided in common with said digital exchange (1), all information channels (B) provided on said digital subscriber line (3) and control A test additional device (16) that connects the channel (D) to the centralized test center (17) via the communication path network (8) is connected to each of the digital exchanges (1).
a centralized terminal testing device (18) provided at
A centralized terminal testing method characterized in that: is provided in the centralized testing center (17).