JPS626681Y2 - - Google Patents

Info

Publication number
JPS626681Y2
JPS626681Y2 JP8853380U JP8853380U JPS626681Y2 JP S626681 Y2 JPS626681 Y2 JP S626681Y2 JP 8853380 U JP8853380 U JP 8853380U JP 8853380 U JP8853380 U JP 8853380U JP S626681 Y2 JPS626681 Y2 JP S626681Y2
Authority
JP
Japan
Prior art keywords
wafer sample
pair
wafer
cylindrical body
processing boat
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP8853380U
Other languages
Japanese (ja)
Other versions
JPS5712741U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8853380U priority Critical patent/JPS626681Y2/ja
Publication of JPS5712741U publication Critical patent/JPS5712741U/ja
Application granted granted Critical
Publication of JPS626681Y2 publication Critical patent/JPS626681Y2/ja
Expired legal-status Critical Current

Links

Description

【考案の詳細な説明】 この考案は、半導体用ウエーハ試料を例えば化
学気相成長法により処理する場合に、ウエーハ試
料を配列して保持するウエーハ試料処理ボートに
関する。
[Detailed Description of the Invention] This invention relates to a wafer sample processing boat that arranges and holds wafer samples when semiconductor wafer samples are processed by, for example, chemical vapor deposition.

ウエーハ試料を一般に化学気相成長法(CVD
法)により、シリコン酸化膜やポリシリコン膜
(多結晶シリコン膜)などを成長させる場合、ウ
エーハ試料を反応管の中心位置で保持しておくよ
うに、ウエーハ試料処理ボートが使用されてい
る。
Wafer samples are commonly processed by chemical vapor deposition (CVD).
When growing a silicon oxide film or a polysilicon film (polycrystalline silicon film) using a wafer sample processing boat, a wafer sample processing boat is used to hold the wafer sample at the center of the reaction tube.

従来、反応管の内径はウエーハ試料の直径によ
り、それに応じて決められていた。したがつて、
ある内径の反応管は、一種類の直径のウエーハ試
料の処理しか使用されず、多種類の反応管を必要
とし、利用率が低かつた。
Conventionally, the inner diameter of the reaction tube has been determined depending on the diameter of the wafer sample. Therefore,
Reaction tubes of a certain inner diameter were only used to process wafer samples of one diameter, requiring multiple types of reaction tubes and resulting in low utilization.

従来のウエーハ試料処理ボートは、第1図及び
第2図に正面図及び側面図で示すようになつてい
た。1は両側1対の支持棒で、双方が平行に水平
方向に配置され両端を連結棒2で一体に溶着結合
されている。3は各支持棒1に一体に溶着結合さ
れた両側1対の保持部材で、図では板状をなし、
上部に水平方向に対し多数のスリツト3aが配設
され、それぞれウエーハ試料4がはめ込まれ、多
数枚を一定間隔で配列保持する。なお、保持部材
として、多数本の棒材にして、それぞれ上部にス
リツトを設けたものにしたものもある。上記支持
棒1、連結棒2及び保持部材3は石英材からな
る。
A conventional wafer sample processing boat is shown in front and side views in FIGS. 1 and 2. Reference numeral 1 denotes a pair of support rods on both sides, both of which are arranged horizontally in parallel and whose ends are welded together by a connecting rod 2. Reference numeral 3 designates a pair of holding members on both sides that are integrally welded to each support rod 1, and are plate-shaped in the figure.
A large number of slits 3a are arranged in the upper part in the horizontal direction, into which wafer samples 4 are fitted, and a large number of wafer samples 4 are arranged and held at regular intervals. Note that the holding member may be made of a number of rods each having a slit at the top. The support rod 1, the connecting rod 2, and the holding member 3 are made of quartz material.

上記処理ボートにウエーハ試料4を保持し、鎖
線で示す反応管5内に搬入し、処理を行なう。こ
の従来の処理ボートにより保持し、成長させたウ
エーハ試料を第3図に示す。ウエーハ試料4内で
の膜厚分布mは大きく乱れている。
The wafer sample 4 is held in the processing boat, carried into the reaction tube 5 shown by the chain line, and processed. A wafer sample held and grown on this conventional processing boat is shown in FIG. The film thickness distribution m within the wafer sample 4 is greatly disordered.

また、ウエーハ試料4は支持棒1により反応ガ
スの流れの影響をうけ、支持棒1近傍の領域では
シリコン酸化膜及びポリシリコン膜などの膜厚が
薄くなる。さらに、ウエーハ試料4と反応管5と
の距離が最適距離でない場合にも反応ガスの流れ
の影響を受け、ウエーハ試料4内でシリコン酸化
膜及びポリシリコン膜などの膜厚分布に乱れを生
じ、チツプの品質に悪影響を及ぼしていた。
Furthermore, the wafer sample 4 is affected by the flow of reaction gas due to the support rod 1, and the silicon oxide film, polysilicon film, etc. are thinner in the region near the support rod 1. Furthermore, even when the distance between the wafer sample 4 and the reaction tube 5 is not the optimum distance, the film thickness distribution of the silicon oxide film, polysilicon film, etc. within the wafer sample 4 is disturbed due to the influence of the flow of the reaction gas. This had a negative effect on the quality of the chips.

この考案は、両側1対の支持棒にそれぞれ上向
きに保持部材を固着し、多数枚のウエーハ試料を
はめ込むスリツトを配設し、これらのスリツトに
はめられたウエーハ試料の外周から所定の距離を
おいて同心に囲う円筒体を設け、この円筒体はウ
エーハ試料に対し上部及び両側部を囲う上側部
と、下部を囲う底部とに分割してあり、それぞれ
1対の支持棒に着脱可能に装着し、ウエーハ試料
が支持棒や反応管による影響を受けず、極めて安
定した膜が得られるウエーハ試料処理ボートを提
供ることを目的としている。
This idea involves fixing holding members upward to a pair of support rods on both sides, providing slits into which a number of wafer samples are fitted, and holding members at a predetermined distance from the outer periphery of the wafer samples fitted into these slits. A cylindrical body is provided concentrically surrounding the wafer sample, and this cylindrical body is divided into an upper part that encloses the top and both sides of the wafer sample, and a bottom part that encloses the lower part, each of which is detachably attached to a pair of support rods. The purpose of the present invention is to provide a wafer sample processing boat in which wafer samples are not affected by support rods or reaction tubes, and extremely stable films can be obtained.

第4図及び第5図はこの考案の一実施例による
ウエーハ試料処理ボートの正面図及び側面図であ
り、2〜4,3aは上記従来装置と同一のもので
ある。10は石英材からなる1対の支持棒で、双
方が平行に水平方向に配置され、石英材からなる
連結棒2により一体に溶着結合されている。11
は各支持棒10に固着された引掛け片である。各
支持棒10には、保持するウエーハ試料4の中心
に向けそれぞれ保持部材3が溶着結合されてい
る。12は石英材からなる円筒体で、保持部材3
のスリツト3aにはめ込まれたウエーハ試料3の
外周から所定の距離をおいて、同心に囲つてい
る。円筒体12はウエーハ試料4の上部及び両側
を囲う上側部13と、下部を囲う底部14とに2
分割され、着脱を容易にしている。上側部13は
支持棒10の引掛け片11に引掛られて保持さ
れ、底部14は支持棒10の上部にはめられて保
持される。
FIGS. 4 and 5 are a front view and a side view of a wafer sample processing boat according to an embodiment of this invention, and 2 to 4 and 3a are the same as the conventional apparatus described above. Reference numeral 10 denotes a pair of support rods made of quartz material, both of which are arranged horizontally in parallel and welded together by a connecting rod 2 made of quartz material. 11
are hook pieces fixed to each support rod 10. A holding member 3 is welded to each support rod 10 toward the center of the wafer sample 4 to be held. 12 is a cylindrical body made of quartz material, and the holding member 3
The wafer sample 3 is surrounded concentrically at a predetermined distance from the outer periphery of the wafer sample 3 fitted into the slit 3a. The cylindrical body 12 has an upper part 13 surrounding the upper part and both sides of the wafer sample 4, and a bottom part 14 surrounding the lower part.
Divided for easy attachment and detachment. The upper part 13 is hooked and held by the hook piece 11 of the support rod 10, and the bottom part 14 is fitted and held by the upper part of the support rod 10.

上記一実施例の処理ボートによりウエーハ試料
4を保持して処理するには、次のようにする。ま
ず、上側部13を取外し、保持部材3の各スリツ
ト3aにウエーハ試料4をそれぞれはめ込み配列
保持する。上側部13をはめる。こうした処理ボ
ートを、鎖線で示す反応管15内に搬入し、処理
を行なう。反応管15の内径が一定のものでなく
ても、ウエーハ試料4は所定の距離をおいて円
筒体12により同心に囲われており、反応管15
の内径及び支持棒10による影響を受けず、極め
て安定した膜及び分布が得られる。
The wafer sample 4 is held and processed by the processing boat of the above embodiment as follows. First, the upper part 13 is removed, and the wafer samples 4 are fitted into each of the slits 3a of the holding member 3 and held in an array. Fit the upper part 13. Such a processing boat is carried into a reaction tube 15 shown by a chain line, and processing is carried out. Even if the inner diameter of the reaction tube 15 is not constant, the wafer sample 4 is concentrically surrounded by the cylindrical body 12 at a predetermined distance, and the reaction tube 15
An extremely stable film and distribution can be obtained without being affected by the inner diameter of the support rod 10 or the support rod 10.

第6図は上記一実施例の処理ボートにより成長
させたウエーハ試料4を示し、試料内での膜厚分
布mは極めて良好である。
FIG. 6 shows a wafer sample 4 grown using the processing boat of the above embodiment, and the film thickness distribution m within the sample is extremely good.

第7図及び第8図はこの考案の他の実施例によ
る処理ボートの正面図及び側面図である。保持さ
れたウエーハ試料4の外周から所定の距離をお
いて同心に囲う円筒体16は上側部17と底部1
9とに2分割され、着脱を容易にしている。上側
部16及び底部18の両端にはそれぞれフランジ
18及び20が設けられ、反応管15の内径との
すき間をふさいでいる。これにより、ウエーハ試
料4に成長されるシリコン酸化膜及びポリシリコ
ン膜などの成長速度を増大させることができる。
7 and 8 are front and side views of a processing boat according to another embodiment of this invention. A cylindrical body 16 that surrounds the held wafer sample 4 concentrically at a predetermined distance from the outer circumference has an upper part 17 and a bottom part 1.
It is divided into two parts, 9 and 9, making it easy to attach and detach. Flanges 18 and 20 are provided at both ends of the upper part 16 and the bottom part 18, respectively, and close the gap with the inner diameter of the reaction tube 15. Thereby, the growth rate of the silicon oxide film, polysilicon film, etc. grown on the wafer sample 4 can be increased.

以上のように、この考案によれば、両側1対の
保持部材に設けられた多数のスリツトにはめ込み
保持されたウエーハ試料の外周を所定の距離をお
いて同心に囲う円筒体を設け、この円筒体は上側
部と底部とに分割し、両側1対の支持棒に着脱可
能に支持してあるので、ウエーハ試料が支持棒や
反応管による影響を受けず、極めて安定した膜が
得られる。また、ウエーハ試料の直径が異なつて
も、一種類の反応管を流用することができる。
As described above, according to this invention, a cylindrical body is provided that concentrically surrounds the outer periphery of a wafer sample fitted and held in a number of slits provided in a pair of holding members on both sides, and the cylindrical body is Since the body is divided into an upper part and a bottom part, and is detachably supported by a pair of support rods on both sides, the wafer sample is not affected by the support rods or the reaction tube, and an extremely stable membrane can be obtained. Furthermore, even if the diameters of wafer samples differ, one type of reaction tube can be used.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図及び第2図は従来のウエーハ試料処理ボ
ートの正面図及び側面図、第3図は第1図の処理
ボートに保持され成長されたウエーハ試料の膜厚
分布を示す正面図、第4図及び第5図はこの考案
の一実施例によるウエーハ試料処理ボートの正面
図及び側面図、第6図は第4図の処理ボートに保
持され成長されたウエーハ試料の膜厚分布を示す
正面図、第7図及び第8図はこの考案の他の実施
例によるウエーハ試料処理ボートの正面図及び側
面図である。 2……連結棒、3……保持部材、3a……スリ
ツト、4……ウエーハ試料、10……支持棒、1
2……円筒体、13……上側部、14……底部、
15……反応管、16……円筒体、17……上側
部、18……フランジ、19……底部、20……
フランジ、なお、図中同一符号は同一又は相当部
分を示す。
1 and 2 are a front view and a side view of a conventional wafer sample processing boat, FIG. 3 is a front view showing the film thickness distribution of a wafer sample held and grown in the processing boat of FIG. 1, and FIG. 5 and 5 are front and side views of a wafer sample processing boat according to an embodiment of this invention, and FIG. 6 is a front view showing the film thickness distribution of the wafer sample held and grown in the processing boat of FIG. 4. , 7 and 8 are a front view and a side view of a wafer sample processing boat according to another embodiment of the present invention. 2... Connecting rod, 3... Holding member, 3a... Slit, 4... Wafer sample, 10... Support rod, 1
2... Cylindrical body, 13... Upper part, 14... Bottom part,
15... Reaction tube, 16... Cylindrical body, 17... Upper part, 18... Flange, 19... Bottom, 20...
Flange: The same reference numerals in the figures indicate the same or equivalent parts.

Claims (1)

【実用新案登録請求の範囲】 (1) 双方が両側に平行に水平方向に配置され、各
両端部で1対の連結棒により固着結合された1
対の支持棒と、これらの支持棒にそれぞれ上向
きに固着結合され、上部に水平方向に対し多数
のスリツトが配設された両側1対の保持部材
と、この双方の保持部材にまたがり上記各スリ
ツトにはめ込み保持されたウエーハ試料の外周
を所定の距離をおいて囲つており、着脱可能に
上側部と底部とに2分割され上記1対の支持棒
に支持されて形成された円筒体とを備えたウエ
ーハ試料処理ボート。 (2) 円筒体の上側部と底部の各両端部に外周方向
のフランジがそれぞれ設けられ、反応管の内径
とのすき間をふさぐようにしたことを特徴とす
る実用新案登録請求の範囲第1項記載のウエー
ハ試料処理ボート。
[Claims for Utility Model Registration] (1) Both sides are arranged horizontally parallel to each other and fixedly connected at each end by a pair of connecting rods.
A pair of support rods, a pair of holding members on both sides that are fixedly connected upwardly to these support rods and have a large number of slits arranged in the horizontal direction in the upper part, and each of the above-mentioned slits that spans both of the holding members. The cylindrical body surrounds the outer periphery of the wafer sample fitted and held at a predetermined distance, is removably divided into two parts, an upper part and a bottom part, and is supported by the pair of support rods. Wafer sample processing boat. (2) Utility model registration claim 1, characterized in that flanges are provided in the outer circumferential direction at both ends of the top and bottom of the cylindrical body, respectively, to close the gap with the inner diameter of the reaction tube. Wafer sample processing boat as described.
JP8853380U 1980-06-23 1980-06-23 Expired JPS626681Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8853380U JPS626681Y2 (en) 1980-06-23 1980-06-23

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8853380U JPS626681Y2 (en) 1980-06-23 1980-06-23

Publications (2)

Publication Number Publication Date
JPS5712741U JPS5712741U (en) 1982-01-22
JPS626681Y2 true JPS626681Y2 (en) 1987-02-16

Family

ID=29450608

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8853380U Expired JPS626681Y2 (en) 1980-06-23 1980-06-23

Country Status (1)

Country Link
JP (1) JPS626681Y2 (en)

Also Published As

Publication number Publication date
JPS5712741U (en) 1982-01-22

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