JPS6262265U - - Google Patents
Info
- Publication number
- JPS6262265U JPS6262265U JP15322485U JP15322485U JPS6262265U JP S6262265 U JPS6262265 U JP S6262265U JP 15322485 U JP15322485 U JP 15322485U JP 15322485 U JP15322485 U JP 15322485U JP S6262265 U JPS6262265 U JP S6262265U
- Authority
- JP
- Japan
- Prior art keywords
- contact
- view
- pointed
- contact probe
- sleeve
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 7
- 238000007689 inspection Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Description
第１図乃至第５図は本考案に係り、第１図ａ，
ｂは夫々、コンタクトプローブの平面図、そのＡ
―Ａ′断面図、第２図ａ，ｂは夫々、スリーブの
平面図、そのＢ―Ｂ′断面図、第３図ａ，ｂは夫
々、尖頭接触子の平面図、そのＣ―Ｃ′断面図、
第４図は上記コンタクトプローブを用いた検査装
置の側断面図、第５図は他の実施例のコンタクト
プローブの側断面図である。第６図及び第７図は
夫々、従来のコンタクトプローブの異る動作態様
の側断面図である。
８……スリーブ、１１……案内面、１３……取
付面、１４……尖頭接触子、２０……ねじ、２１
……コンタクトプローブ。
Figures 1 to 5 relate to the present invention, and Figure 1a,
b is a plan view of the contact probe, and A is a plan view of the contact probe, respectively.
-A' sectional view, Figure 2 a and b are respectively a plan view of the sleeve and its B-B' sectional view, and Figures 3 a and b are respectively a plan view of the pointed contact and its C-C' cross section,
FIG. 4 is a side sectional view of an inspection apparatus using the above-mentioned contact probe, and FIG. 5 is a side sectional view of a contact probe of another embodiment. FIGS. 6 and 7 are side sectional views of different operating modes of a conventional contact probe, respectively. 8... Sleeve, 11... Guide surface, 13... Mounting surface, 14... Pointed contact, 20... Screw, 21
……Contact probe.
Claims (1)
るスリーブを、前記尖頭接触子に着脱自在に取付
けたことを特徴とするコンタクトプローブ。 A contact probe characterized in that a sleeve having a guide surface that widens toward the end and surrounds the pointed contact is detachably attached to the pointed contact.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15322485U JPS6262265U (en) | 1985-10-07 | 1985-10-07 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15322485U JPS6262265U (en) | 1985-10-07 | 1985-10-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6262265U true JPS6262265U (en) | 1987-04-17 |
Family
ID=31071913
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15322485U Pending JPS6262265U (en) | 1985-10-07 | 1985-10-07 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6262265U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012141159A (en) * | 2010-12-28 | 2012-07-26 | Hioki Ee Corp | Substrate receiving pin, pin board unit, and substrate inspecting device |
-
1985
- 1985-10-07 JP JP15322485U patent/JPS6262265U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012141159A (en) * | 2010-12-28 | 2012-07-26 | Hioki Ee Corp | Substrate receiving pin, pin board unit, and substrate inspecting device |