JPS6230163U - - Google Patents
Info
- Publication number
- JPS6230163U JPS6230163U JP12137185U JP12137185U JPS6230163U JP S6230163 U JPS6230163 U JP S6230163U JP 12137185 U JP12137185 U JP 12137185U JP 12137185 U JP12137185 U JP 12137185U JP S6230163 U JPS6230163 U JP S6230163U
- Authority
- JP
- Japan
- Prior art keywords
- heater
- width
- component
- wider
- utility
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010438 heat treatment Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985121371U JPH051830Y2 (pl) | 1985-08-07 | 1985-08-07 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985121371U JPH051830Y2 (pl) | 1985-08-07 | 1985-08-07 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6230163U true JPS6230163U (pl) | 1987-02-23 |
| JPH051830Y2 JPH051830Y2 (pl) | 1993-01-18 |
Family
ID=31010579
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985121371U Expired - Lifetime JPH051830Y2 (pl) | 1985-08-07 | 1985-08-07 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH051830Y2 (pl) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6034031A (ja) * | 1983-08-05 | 1985-02-21 | Tokyo Seimitsu Co Ltd | 半導体素子の測定装置 |
-
1985
- 1985-08-07 JP JP1985121371U patent/JPH051830Y2/ja not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6034031A (ja) * | 1983-08-05 | 1985-02-21 | Tokyo Seimitsu Co Ltd | 半導体素子の測定装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH051830Y2 (pl) | 1993-01-18 |