JPS62245104A - 寸法測定装置 - Google Patents
寸法測定装置Info
- Publication number
- JPS62245104A JPS62245104A JP8605686A JP8605686A JPS62245104A JP S62245104 A JPS62245104 A JP S62245104A JP 8605686 A JP8605686 A JP 8605686A JP 8605686 A JP8605686 A JP 8605686A JP S62245104 A JPS62245104 A JP S62245104A
- Authority
- JP
- Japan
- Prior art keywords
- mirror
- measured
- along
- lens
- deflector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims abstract description 18
- 239000000758 substrate Substances 0.000 claims abstract description 8
- 230000001678 irradiating effect Effects 0.000 claims description 2
- 238000005259 measurement Methods 0.000 abstract description 10
- 238000010586 diagram Methods 0.000 description 3
- 230000007423 decrease Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003365 glass fiber Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Mechanical Optical Scanning Systems (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8605686A JPS62245104A (ja) | 1986-04-16 | 1986-04-16 | 寸法測定装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8605686A JPS62245104A (ja) | 1986-04-16 | 1986-04-16 | 寸法測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62245104A true JPS62245104A (ja) | 1987-10-26 |
JPH0412802B2 JPH0412802B2 (enrdf_load_stackoverflow) | 1992-03-05 |
Family
ID=13876031
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8605686A Granted JPS62245104A (ja) | 1986-04-16 | 1986-04-16 | 寸法測定装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62245104A (enrdf_load_stackoverflow) |
-
1986
- 1986-04-16 JP JP8605686A patent/JPS62245104A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPH0412802B2 (enrdf_load_stackoverflow) | 1992-03-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4983043A (en) | High accuracy structured light profiler | |
US3866038A (en) | Apparatus for measuring surface flatness | |
US4636626A (en) | Apparatus for aligning mask and wafer used in semiconductor circuit element fabrication | |
US6320665B1 (en) | Acousto optic scanning laser vibrometer for determining the dynamic properties of an object | |
US5696383A (en) | Method and apparatus for measuring the curvature of wafers with beams of different wavelengths | |
US5444537A (en) | Method for shape detection and apparatus therefor | |
US5166820A (en) | Light beam scanning apparatus | |
US4776699A (en) | Optical measuring device | |
US4502785A (en) | Surface profiling technique | |
US4227813A (en) | Process for determining a dimension of an object | |
JPH07190714A (ja) | 干渉計 | |
US3506839A (en) | Contactless probe system | |
JP2002340538A (ja) | 薄板材の平坦度測定装置および方法 | |
JPS62245104A (ja) | 寸法測定装置 | |
JP2020148632A (ja) | 内径測定装置 | |
GB2203833A (en) | High accuracy structured light profiler | |
JPH0566114A (ja) | 透明物体の厚み測定装置 | |
JP2943498B2 (ja) | 走査型レーザ変位計 | |
JPH0124242B2 (enrdf_load_stackoverflow) | ||
JPH0735988B2 (ja) | 動的面出入り測定装置 | |
JPH05215526A (ja) | 表面形状測定装置 | |
JPH06137827A (ja) | 光学的段差測定器 | |
JPH0425611Y2 (enrdf_load_stackoverflow) | ||
JPH0411124Y2 (enrdf_load_stackoverflow) | ||
JP2502741Y2 (ja) | 光学測定機のオ―トフオ―カス装置 |