JPS62229140A - Photosensitive composition - Google Patents
Photosensitive compositionInfo
- Publication number
- JPS62229140A JPS62229140A JP7110886A JP7110886A JPS62229140A JP S62229140 A JPS62229140 A JP S62229140A JP 7110886 A JP7110886 A JP 7110886A JP 7110886 A JP7110886 A JP 7110886A JP S62229140 A JPS62229140 A JP S62229140A
- Authority
- JP
- Japan
- Prior art keywords
- group
- soluble resin
- repeating unit
- formula
- alkali
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000203 mixture Substances 0.000 title claims description 15
- 229920005989 resin Polymers 0.000 claims abstract description 19
- 239000011347 resin Substances 0.000 claims abstract description 19
- 229920001577 copolymer Polymers 0.000 claims abstract description 14
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims abstract description 5
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 claims abstract description 4
- 125000004029 hydroxymethyl group Chemical group [H]OC([H])([H])* 0.000 claims abstract description 4
- 125000003545 alkoxy group Chemical group 0.000 claims abstract description 3
- 125000000217 alkyl group Chemical group 0.000 claims abstract description 3
- 125000004218 chloromethyl group Chemical group [H]C([H])(Cl)* 0.000 claims abstract description 3
- 125000004093 cyano group Chemical group *C#N 0.000 claims abstract description 3
- 125000005843 halogen group Chemical group 0.000 claims abstract description 3
- 229910052739 hydrogen Inorganic materials 0.000 claims abstract description 3
- 239000001257 hydrogen Substances 0.000 claims abstract description 3
- 125000004435 hydrogen atom Chemical class [H]* 0.000 claims abstract description 3
- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 claims abstract 2
- 150000001875 compounds Chemical class 0.000 claims description 8
- 239000003504 photosensitizing agent Substances 0.000 claims description 8
- 125000004432 carbon atom Chemical group C* 0.000 claims description 4
- 239000000126 substance Substances 0.000 claims 2
- 239000003513 alkali Substances 0.000 abstract description 9
- 239000003795 chemical substances by application Substances 0.000 abstract description 4
- 230000001235 sensitizing effect Effects 0.000 abstract 2
- -1 azide compounds Chemical class 0.000 description 16
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 8
- 239000000758 substrate Substances 0.000 description 8
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 6
- 239000002904 solvent Substances 0.000 description 6
- 150000001735 carboxylic acids Chemical class 0.000 description 5
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N phenol group Chemical group C1(=CC=CC=C1)O ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 5
- 229920002120 photoresistant polymer Polymers 0.000 description 5
- 229920001665 Poly-4-vinylphenol Polymers 0.000 description 4
- 238000001312 dry etching Methods 0.000 description 4
- 238000001035 drying Methods 0.000 description 4
- 150000002148 esters Chemical class 0.000 description 4
- 229920003986 novolac Polymers 0.000 description 4
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 3
- JAGRUUPXPPLSRX-UHFFFAOYSA-N 4-prop-1-en-2-ylphenol Chemical compound CC(=C)C1=CC=C(O)C=C1 JAGRUUPXPPLSRX-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 239000007864 aqueous solution Substances 0.000 description 3
- 230000032050 esterification Effects 0.000 description 3
- 238000005886 esterification reaction Methods 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- LVHBHZANLOWSRM-UHFFFAOYSA-N methylenebutanedioic acid Natural products OC(=O)CC(=C)C(O)=O LVHBHZANLOWSRM-UHFFFAOYSA-N 0.000 description 3
- 238000006116 polymerization reaction Methods 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- SMZOUWXMTYCWNB-UHFFFAOYSA-N 2-(2-methoxy-5-methylphenyl)ethanamine Chemical compound COC1=CC=C(C)C=C1CCN SMZOUWXMTYCWNB-UHFFFAOYSA-N 0.000 description 2
- JAHNSTQSQJOJLO-UHFFFAOYSA-N 2-(3-fluorophenyl)-1h-imidazole Chemical compound FC1=CC=CC(C=2NC=CN=2)=C1 JAHNSTQSQJOJLO-UHFFFAOYSA-N 0.000 description 2
- NIXOWILDQLNWCW-UHFFFAOYSA-N 2-Propenoic acid Natural products OC(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 2
- PUZOZFCUZDDRLB-UHFFFAOYSA-N 2-[4-(4-azidophenyl)buta-1,3-dienyl]furan Chemical compound C1=CC(N=[N+]=[N-])=CC=C1C=CC=CC1=CC=CO1 PUZOZFCUZDDRLB-UHFFFAOYSA-N 0.000 description 2
- VISOTGQYFFULBK-UHFFFAOYSA-N 3-hydroxy-4-phenylpyrrole-2,5-dione Chemical group O=C1C(=O)NC(O)=C1C1=CC=CC=C1 VISOTGQYFFULBK-UHFFFAOYSA-N 0.000 description 2
- SOGAXMICEFXMKE-UHFFFAOYSA-N Butylmethacrylate Chemical compound CCCCOC(=O)C(C)=C SOGAXMICEFXMKE-UHFFFAOYSA-N 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
- QIGBRXMKCJKVMJ-UHFFFAOYSA-N Hydroquinone Chemical compound OC1=CC=C(O)C=C1 QIGBRXMKCJKVMJ-UHFFFAOYSA-N 0.000 description 2
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 description 2
- BAPJBEWLBFYGME-UHFFFAOYSA-N Methyl acrylate Chemical compound COC(=O)C=C BAPJBEWLBFYGME-UHFFFAOYSA-N 0.000 description 2
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 2
- REFJWTPEDVJJIY-UHFFFAOYSA-N Quercetin Chemical compound C=1C(O)=CC(O)=C(C(C=2O)=O)C=1OC=2C1=CC=C(O)C(O)=C1 REFJWTPEDVJJIY-UHFFFAOYSA-N 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- RGCKGOZRHPZPFP-UHFFFAOYSA-N alizarin Chemical compound C1=CC=C2C(=O)C3=C(O)C(O)=CC=C3C(=O)C2=C1 RGCKGOZRHPZPFP-UHFFFAOYSA-N 0.000 description 2
- YCIMNLLNPGFGHC-UHFFFAOYSA-N catechol Chemical compound OC1=CC=CC=C1O YCIMNLLNPGFGHC-UHFFFAOYSA-N 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- LDHQCZJRKDOVOX-NSCUHMNNSA-N crotonic acid Chemical compound C\C=C\C(O)=O LDHQCZJRKDOVOX-NSCUHMNNSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 2
- 229910052753 mercury Inorganic materials 0.000 description 2
- MMSLOZQEMPDGPI-UHFFFAOYSA-N p-Mentha-1,3,5,8-tetraene Chemical compound CC(=C)C1=CC=C(C)C=C1 MMSLOZQEMPDGPI-UHFFFAOYSA-N 0.000 description 2
- 235000013824 polyphenols Nutrition 0.000 description 2
- BBNQQADTFFCFGB-UHFFFAOYSA-N purpurin Chemical compound C1=CC=C2C(=O)C3=C(O)C(O)=CC(O)=C3C(=O)C2=C1 BBNQQADTFFCFGB-UHFFFAOYSA-N 0.000 description 2
- WQGWDDDVZFFDIG-UHFFFAOYSA-N pyrogallol Chemical compound OC1=CC=CC(O)=C1O WQGWDDDVZFFDIG-UHFFFAOYSA-N 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- GUEIZVNYDFNHJU-UHFFFAOYSA-N quinizarin Chemical compound O=C1C2=CC=CC=C2C(=O)C2=C1C(O)=CC=C2O GUEIZVNYDFNHJU-UHFFFAOYSA-N 0.000 description 2
- GHMLBKRAJCXXBS-UHFFFAOYSA-N resorcinol Chemical compound OC1=CC=CC(O)=C1 GHMLBKRAJCXXBS-UHFFFAOYSA-N 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000000243 solution Substances 0.000 description 2
- 150000003440 styrenes Chemical class 0.000 description 2
- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 description 2
- LDHQCZJRKDOVOX-UHFFFAOYSA-N trans-crotonic acid Natural products CC=CC(O)=O LDHQCZJRKDOVOX-UHFFFAOYSA-N 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- SSGLEMWHDJHHNH-UHFFFAOYSA-N (2-ethylphenyl) 2-methylprop-2-enoate Chemical compound CCC1=CC=CC=C1OC(=O)C(C)=C SSGLEMWHDJHHNH-UHFFFAOYSA-N 0.000 description 1
- OUOHOJDXEPUCDT-UHFFFAOYSA-N (2-ethylphenyl) prop-2-enoate Chemical compound CCC1=CC=CC=C1OC(=O)C=C OUOHOJDXEPUCDT-UHFFFAOYSA-N 0.000 description 1
- HEXDQNXIVJEYLG-UHFFFAOYSA-N (2-methylphenyl) 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OC1=CC=CC=C1C HEXDQNXIVJEYLG-UHFFFAOYSA-N 0.000 description 1
- GCIHZDWTJCGMDK-UHFFFAOYSA-N (2-methylphenyl) prop-2-enoate Chemical compound CC1=CC=CC=C1OC(=O)C=C GCIHZDWTJCGMDK-UHFFFAOYSA-N 0.000 description 1
- XKMDZVINHIFHLY-UHFFFAOYSA-N 1-ethenyl-3,5-dimethylbenzene Chemical compound CC1=CC(C)=CC(C=C)=C1 XKMDZVINHIFHLY-UHFFFAOYSA-N 0.000 description 1
- XHUZSRRCICJJCN-UHFFFAOYSA-N 1-ethenyl-3-ethylbenzene Chemical compound CCC1=CC=CC(C=C)=C1 XHUZSRRCICJJCN-UHFFFAOYSA-N 0.000 description 1
- JZHGRUMIRATHIU-UHFFFAOYSA-N 1-ethenyl-3-methylbenzene Chemical compound CC1=CC=CC(C=C)=C1 JZHGRUMIRATHIU-UHFFFAOYSA-N 0.000 description 1
- WHFHDVDXYKOSKI-UHFFFAOYSA-N 1-ethenyl-4-ethylbenzene Chemical compound CCC1=CC=C(C=C)C=C1 WHFHDVDXYKOSKI-UHFFFAOYSA-N 0.000 description 1
- HTQNYBBTZSBWKL-UHFFFAOYSA-N 2,3,4-trihydroxbenzophenone Chemical compound OC1=C(O)C(O)=CC=C1C(=O)C1=CC=CC=C1 HTQNYBBTZSBWKL-UHFFFAOYSA-N 0.000 description 1
- SZSWKGVWJBZNIH-UHFFFAOYSA-N 2-chloro-1-ethenyl-4-methylbenzene Chemical compound CC1=CC=C(C=C)C(Cl)=C1 SZSWKGVWJBZNIH-UHFFFAOYSA-N 0.000 description 1
- VJKZIQFVKMUTID-UHFFFAOYSA-N 2-diazonio-5-sulfonaphthalen-1-olate Chemical compound N#[N+]C1=CC=C2C(S(=O)(=O)O)=CC=CC2=C1[O-] VJKZIQFVKMUTID-UHFFFAOYSA-N 0.000 description 1
- SVONRAPFKPVNKG-UHFFFAOYSA-N 2-ethoxyethyl acetate Chemical compound CCOCCOC(C)=O SVONRAPFKPVNKG-UHFFFAOYSA-N 0.000 description 1
- UITUMGKYHZMNKN-UHFFFAOYSA-N 2-methyl-4-prop-1-en-2-ylphenol Chemical compound CC(=C)C1=CC=C(O)C(C)=C1 UITUMGKYHZMNKN-UHFFFAOYSA-N 0.000 description 1
- IZFHMLDRUVYBGK-UHFFFAOYSA-N 2-methylene-3-methylsuccinic acid Chemical compound OC(=O)C(C)C(=C)C(O)=O IZFHMLDRUVYBGK-UHFFFAOYSA-N 0.000 description 1
- QTWJRLJHJPIABL-UHFFFAOYSA-N 2-methylphenol;3-methylphenol;4-methylphenol Chemical compound CC1=CC=C(O)C=C1.CC1=CC=CC(O)=C1.CC1=CC=CC=C1O QTWJRLJHJPIABL-UHFFFAOYSA-N 0.000 description 1
- MKHXOKALQIHXPI-UHFFFAOYSA-N 2-phenylprop-1-en-1-ol Chemical group OC=C(C)C1=CC=CC=C1 MKHXOKALQIHXPI-UHFFFAOYSA-N 0.000 description 1
- MZXIKGMZSVMKJX-UHFFFAOYSA-N 3-(2-hydroxyphenyl)pyrrole-2,5-dione Chemical compound OC1=CC=CC=C1C1=CC(=O)NC1=O MZXIKGMZSVMKJX-UHFFFAOYSA-N 0.000 description 1
- RKGHVIBNRQCMDP-UHFFFAOYSA-N 3-(3-hydroxyphenyl)pyrrole-2,5-dione Chemical compound OC1=CC=CC(C=2C(NC(=O)C=2)=O)=C1 RKGHVIBNRQCMDP-UHFFFAOYSA-N 0.000 description 1
- DFTMXXFMFLAQHR-UHFFFAOYSA-N 3-(4-hydroxy-3-methoxyphenyl)pyrrole-2,5-dione Chemical compound OC1=C(C=C(C=C1)C=1C(=O)NC(C1)=O)OC DFTMXXFMFLAQHR-UHFFFAOYSA-N 0.000 description 1
- SXPVZPQNFIDDPP-UHFFFAOYSA-N 3-(4-hydroxyphenyl)pyrrole-2,5-dione Chemical compound C1=CC(O)=CC=C1C1=CC(=O)NC1=O SXPVZPQNFIDDPP-UHFFFAOYSA-N 0.000 description 1
- GGLBOGJDDIJGCW-UHFFFAOYSA-N 3-[(2-methylpropan-2-yl)oxycarbonyl]but-3-enoic acid Chemical compound CC(C)(C)OC(=O)C(=C)CC(O)=O GGLBOGJDDIJGCW-UHFFFAOYSA-N 0.000 description 1
- DYYFCJRYZVHEKQ-UHFFFAOYSA-N 3-butoxycarbonylbut-3-enoic acid Chemical compound CCCCOC(=O)C(=C)CC(O)=O DYYFCJRYZVHEKQ-UHFFFAOYSA-N 0.000 description 1
- RUNKZEUIIVCMSA-UHFFFAOYSA-N 3-chloro-4-prop-1-en-2-ylphenol Chemical compound CC(=C)C1=CC=C(O)C=C1Cl RUNKZEUIIVCMSA-UHFFFAOYSA-N 0.000 description 1
- PGZYFKWYHCLTIX-UHFFFAOYSA-N 3-phenoxycarbonylbut-3-enoic acid Chemical compound OC(=O)CC(=C)C(=O)OC1=CC=CC=C1 PGZYFKWYHCLTIX-UHFFFAOYSA-N 0.000 description 1
- REWLXMVGEZMKSG-UHFFFAOYSA-N 3-prop-1-en-2-ylphenol Chemical compound CC(=C)C1=CC=CC(O)=C1 REWLXMVGEZMKSG-UHFFFAOYSA-N 0.000 description 1
- NEAHVGRDHLQWPP-UHFFFAOYSA-N 3-propoxycarbonylbut-3-enoic acid Chemical compound CCCOC(=O)C(=C)CC(O)=O NEAHVGRDHLQWPP-UHFFFAOYSA-N 0.000 description 1
- JLBJTVDPSNHSKJ-UHFFFAOYSA-N 4-Methylstyrene Chemical compound CC1=CC=C(C=C)C=C1 JLBJTVDPSNHSKJ-UHFFFAOYSA-N 0.000 description 1
- RTTAGBVNSDJDTE-UHFFFAOYSA-N 4-ethoxy-2-methylidene-4-oxobutanoic acid Chemical compound CCOC(=O)CC(=C)C(O)=O RTTAGBVNSDJDTE-UHFFFAOYSA-N 0.000 description 1
- NLHHRLWOUZZQLW-UHFFFAOYSA-N Acrylonitrile Chemical compound C=CC#N NLHHRLWOUZZQLW-UHFFFAOYSA-N 0.000 description 1
- JIGUQPWFLRLWPJ-UHFFFAOYSA-N Ethyl acrylate Chemical compound CCOC(=O)C=C JIGUQPWFLRLWPJ-UHFFFAOYSA-N 0.000 description 1
- VVQNEPGJFQJSBK-UHFFFAOYSA-N Methyl methacrylate Chemical compound COC(=O)C(C)=C VVQNEPGJFQJSBK-UHFFFAOYSA-N 0.000 description 1
- YXOLAZRVSSWPPT-UHFFFAOYSA-N Morin Chemical compound OC1=CC(O)=CC=C1C1=C(O)C(=O)C2=C(O)C=C(O)C=C2O1 YXOLAZRVSSWPPT-UHFFFAOYSA-N 0.000 description 1
- HXRKYVHGSJTPKV-UHFFFAOYSA-N OC1=C(C=C(C=C1)C=1C(=O)NC(C1)=O)C Chemical compound OC1=C(C=C(C=C1)C=1C(=O)NC(C1)=O)C HXRKYVHGSJTPKV-UHFFFAOYSA-N 0.000 description 1
- JPYHHZQJCSQRJY-UHFFFAOYSA-N Phloroglucinol Natural products CCC=CCC=CCC=CCC=CCCCCC(=O)C1=C(O)C=C(O)C=C1O JPYHHZQJCSQRJY-UHFFFAOYSA-N 0.000 description 1
- OFOBLEOULBTSOW-UHFFFAOYSA-N Propanedioic acid Natural products OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 description 1
- QOSMNYMQXIVWKY-UHFFFAOYSA-N Propyl levulinate Chemical compound CCCOC(=O)CCC(C)=O QOSMNYMQXIVWKY-UHFFFAOYSA-N 0.000 description 1
- ZVOLCUVKHLEPEV-UHFFFAOYSA-N Quercetagetin Natural products C1=C(O)C(O)=CC=C1C1=C(O)C(=O)C2=C(O)C(O)=C(O)C=C2O1 ZVOLCUVKHLEPEV-UHFFFAOYSA-N 0.000 description 1
- HWTZYBCRDDUBJY-UHFFFAOYSA-N Rhynchosin Natural products C1=C(O)C(O)=CC=C1C1=C(O)C(=O)C2=CC(O)=C(O)C=C2O1 HWTZYBCRDDUBJY-UHFFFAOYSA-N 0.000 description 1
- LEEBETSNAGEFCY-UHFFFAOYSA-N [N-]=[N+]=[N-].[N-]=[N+]=[N-].O=C1C=CC(=O)C=C1 Chemical group [N-]=[N+]=[N-].[N-]=[N+]=[N-].O=C1C=CC(=O)C=C1 LEEBETSNAGEFCY-UHFFFAOYSA-N 0.000 description 1
- 125000002777 acetyl group Chemical group [H]C([H])([H])C(*)=O 0.000 description 1
- 239000003377 acid catalyst Substances 0.000 description 1
- ATMLPEJAVWINOF-UHFFFAOYSA-N acrylic acid acrylic acid Chemical class OC(=O)C=C.OC(=O)C=C ATMLPEJAVWINOF-UHFFFAOYSA-N 0.000 description 1
- 239000012670 alkaline solution Substances 0.000 description 1
- XYLMUPLGERFSHI-UHFFFAOYSA-N alpha-Methylstyrene Chemical compound CC(=C)C1=CC=CC=C1 XYLMUPLGERFSHI-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229920001400 block copolymer Polymers 0.000 description 1
- GWCTUKHUBWMAMI-GQCTYLIASA-N butyl (e)-but-2-enoate Chemical compound CCCCOC(=O)\C=C\C GWCTUKHUBWMAMI-GQCTYLIASA-N 0.000 description 1
- CQEYYJKEWSMYFG-UHFFFAOYSA-N butyl acrylate Chemical compound CCCCOC(=O)C=C CQEYYJKEWSMYFG-UHFFFAOYSA-N 0.000 description 1
- 238000010538 cationic polymerization reaction Methods 0.000 description 1
- 125000001309 chloro group Chemical group Cl* 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 229930003836 cresol Natural products 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- SUPCQIBBMFXVTL-UHFFFAOYSA-N ethyl 2-methylprop-2-enoate Chemical compound CCOC(=O)C(C)=C SUPCQIBBMFXVTL-UHFFFAOYSA-N 0.000 description 1
- 125000004494 ethyl ester group Chemical group 0.000 description 1
- ZZUFCTLCJUWOSV-UHFFFAOYSA-N furosemide Chemical compound C1=C(Cl)C(S(=O)(=O)N)=CC(C(O)=O)=C1NCC1=CC=CO1 ZZUFCTLCJUWOSV-UHFFFAOYSA-N 0.000 description 1
- 230000009477 glass transition Effects 0.000 description 1
- LDHQCZJRKDOVOX-IHWYPQMZSA-N isocrotonic acid Chemical compound C\C=C/C(O)=O LDHQCZJRKDOVOX-IHWYPQMZSA-N 0.000 description 1
- MWDZOUNAPSSOEL-UHFFFAOYSA-N kaempferol Natural products OC1=C(C(=O)c2cc(O)cc(O)c2O1)c3ccc(O)cc3 MWDZOUNAPSSOEL-UHFFFAOYSA-N 0.000 description 1
- VZCYOOQTPOCHFL-UPHRSURJSA-N maleic acid Chemical compound OC(=O)\C=C/C(O)=O VZCYOOQTPOCHFL-UPHRSURJSA-N 0.000 description 1
- 239000011976 maleic acid Substances 0.000 description 1
- 238000005272 metallurgy Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- UXOUKMQIEVGVLY-UHFFFAOYSA-N morin Natural products OC1=CC(O)=CC(C2=C(C(=O)C3=C(O)C=C(O)C=C3O2)O)=C1 UXOUKMQIEVGVLY-UHFFFAOYSA-N 0.000 description 1
- 235000007708 morin Nutrition 0.000 description 1
- YXKZOOQDQQINBJ-UHFFFAOYSA-N naphthalene-1,4-dione;azide Chemical class [N-]=[N+]=[N-].C1=CC=C2C(=O)C=CC(=O)C2=C1 YXKZOOQDQQINBJ-UHFFFAOYSA-N 0.000 description 1
- QVEIBLDXZNGPHR-UHFFFAOYSA-N naphthalene-1,4-dione;diazide Chemical compound [N-]=[N+]=[N-].[N-]=[N+]=[N-].C1=CC=C2C(=O)C=CC(=O)C2=C1 QVEIBLDXZNGPHR-UHFFFAOYSA-N 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- TXSXJLMEOQAASX-QHHAFSJGSA-N phenyl (e)-but-2-enoate Chemical compound C\C=C\C(=O)OC1=CC=CC=C1 TXSXJLMEOQAASX-QHHAFSJGSA-N 0.000 description 1
- QIWKUEJZZCOPFV-UHFFFAOYSA-N phenyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OC1=CC=CC=C1 QIWKUEJZZCOPFV-UHFFFAOYSA-N 0.000 description 1
- WRAQQYDMVSCOTE-UHFFFAOYSA-N phenyl prop-2-enoate Chemical compound C=CC(=O)OC1=CC=CC=C1 WRAQQYDMVSCOTE-UHFFFAOYSA-N 0.000 description 1
- QCDYQQDYXPDABM-UHFFFAOYSA-N phloroglucinol Chemical compound OC1=CC(O)=CC(O)=C1 QCDYQQDYXPDABM-UHFFFAOYSA-N 0.000 description 1
- 229960001553 phloroglucinol Drugs 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- PNXMTCDJUBJHQJ-UHFFFAOYSA-N propyl prop-2-enoate Chemical compound CCCOC(=O)C=C PNXMTCDJUBJHQJ-UHFFFAOYSA-N 0.000 description 1
- 229940079877 pyrogallol Drugs 0.000 description 1
- 235000005875 quercetin Nutrition 0.000 description 1
- 229960001285 quercetin Drugs 0.000 description 1
- 229920005604 random copolymer Polymers 0.000 description 1
- 229960001755 resorcinol Drugs 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 125000001424 substituent group Chemical group 0.000 description 1
- 150000003459 sulfonic acid esters Chemical class 0.000 description 1
- QHSPZGZEUDEIQM-AATRIKPKSA-N tert-butyl (e)-but-2-enoate Chemical compound C\C=C\C(=O)OC(C)(C)C QHSPZGZEUDEIQM-AATRIKPKSA-N 0.000 description 1
- SJMYWORNLPSJQO-UHFFFAOYSA-N tert-butyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OC(C)(C)C SJMYWORNLPSJQO-UHFFFAOYSA-N 0.000 description 1
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- QEMXHQIAXOOASZ-UHFFFAOYSA-N tetramethylammonium Chemical compound C[N+](C)(C)C QEMXHQIAXOOASZ-UHFFFAOYSA-N 0.000 description 1
- 125000003944 tolyl group Chemical group 0.000 description 1
- VZCYOOQTPOCHFL-UHFFFAOYSA-N trans-butenedioic acid Natural products OC(=O)C=CC(O)=O VZCYOOQTPOCHFL-UHFFFAOYSA-N 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03C—PHOTOSENSITIVE MATERIALS FOR PHOTOGRAPHIC PURPOSES; PHOTOGRAPHIC PROCESSES, e.g. CINE, X-RAY, COLOUR, STEREO-PHOTOGRAPHIC PROCESSES; AUXILIARY PROCESSES IN PHOTOGRAPHY
- G03C1/00—Photosensitive materials
- G03C1/72—Photosensitive compositions not covered by the groups G03C1/005 - G03C1/705
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Compositions Of Macromolecular Compounds (AREA)
Abstract
Description
【発明の詳細な説明】
[発明の目的]
(産業上の利用分野)
本発明は感光性組成物に関し、更に詳しくは、アルカリ
現像が可能で、かつ耐熱性に優れた感光性組成物に関す
る。DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention] (Industrial Field of Application) The present invention relates to a photosensitive composition, and more particularly to a photosensitive composition that can be developed with alkali and has excellent heat resistance.
(従来の技術)
アルカリ現像可能な感光性組成物の代表的なものとして
は、フェノール骨格を有する樹脂例えばノボラック樹脂
あるいはポリビニルフェノールとアジド化合物との組み
合わせによる露光部がアルカリ不溶になるネガタイプ及
びナフトキノンジアジド基やベンゾキノンジアジド基を
有する化合物との組み合わせによる露光部がアルカリ可
溶になるポジタイプがあり、これらは、例えば、フォト
レジストやPS版用として用いられている。(Prior Art) Typical photosensitive compositions that can be developed with alkali include resins having a phenol skeleton, such as novolac resins, negative types in which exposed areas are insoluble in alkali due to a combination of polyvinylphenol and azide compounds, and naphthoquinone diazide. There is a positive type in which the exposed area becomes alkali-soluble when combined with a compound having a group or a benzoquinonediazide group, and these are used, for example, for photoresists and PS plates.
近年、半導体素子の高密度化が進展して来ており、それ
に伴ない、半導体用フォトレジストする要求も、微細加
工が出来るよう解像力,耐ドライエツチング性,耐熱性
等の多項目にわたって出されている。そしてアルミニウ
ム、Si02等の被加工物を加工する方法として最近ド
ライエツチングが微細化のために用いられて来ており、
このドライエツチングの際に加熱乾燥の温度条件により
、レジストの耐性が大きく影響され、高い温度で乾燥を
行なうほど耐ドライエツチング性が良いことが、知られ
ている。しかしながら、従来のノボラック樹脂あるいは
ポリビニルフェノールな用いたポジ型レジスト及びポリ
ビニルフェノールを用いたネガ型レジストは、露光、現
像後、加熱乾燥する際に高温にすると、パターンの流れ
を生じるという欠点がある。耐熱性は、樹脂と感光剤の
組み合わせによって決定し、樹脂に関しては、樹脂自体
の流れ温度あるいは軟化点が高いほど、パターンの流れ
を生じにくいことが従来より知られている。しかしなが
ら、ノボラック樹脂の軟化点を高めるため分子量を大き
くすると、溶剤に溶解しなくなったり、又アルカリ現像
されにくくなったりする不都合を生じる。y、、ポリビ
ニルフェノールに関しては、パターンの流れを生じない
程度に分子量を高めたものは解像性等の問題がある。In recent years, the density of semiconductor devices has been increasing, and along with this, requirements for photoresists for semiconductors have been raised in many areas such as resolution, dry etching resistance, and heat resistance to enable microfabrication. There is. Dry etching has recently been used as a method for processing workpieces such as aluminum and Si02 for miniaturization.
It is known that during this dry etching, the resistance of the resist is greatly influenced by the temperature conditions of heating and drying, and that the higher the drying temperature, the better the dry etching resistance. However, conventional positive resists using novolak resin or polyvinylphenol, and negative resists using polyvinylphenol, have the disadvantage that patterns flow when heated to high temperatures during heating and drying after exposure and development. Heat resistance is determined by the combination of resin and photosensitive agent, and it has been known that the higher the flow temperature or softening point of the resin itself, the less likely pattern flow will occur. However, if the molecular weight of the novolac resin is increased in order to raise its softening point, it may become insoluble in solvents or difficult to be developed with alkali. Regarding polyvinylphenol, those whose molecular weight is increased to such an extent that pattern flow does not occur have problems such as resolution.
(発明が解決しようとする問題点)
本発明は、」二記問題点を解決し、アルカリ現像が可能
で、かつ耐熱性も優れた感光性組成物を提供することを
目的とする。(Problems to be Solved by the Invention) An object of the present invention is to solve the problems described in item 2 and to provide a photosensitive composition that is capable of alkaline development and has excellent heat resistance.
[発明の構成]
(問題点を解決するための手段と作用)本発明の感光性
組成物において、該感光性組成物がアルカリ可溶性樹脂
と感光剤を主成分としており、アルカリ可溶性樹脂が、
式:
で示される繰り返し単位。[Structure of the invention] (Means and effects for solving the problems) In the photosensitive composition of the present invention, the photosensitive composition mainly contains an alkali-soluble resin and a photosensitizer, and the alkali-soluble resin has the formula: : A repeating unit indicated by .
で示される繰り返し単位および
エチレン性不飽和基を有する化合物から成る繰り返し単
位
(ただし、式中、R2〜R,およびR6〜R。A repeating unit consisting of a repeating unit represented by the formula and a compound having an ethylenically unsaturated group (wherein, R2 to R, and R6 to R.
のそれぞれにおいて、R1〜R 5 + R6〜Ri
Oの少なくとも1つがOH基であり、残りの基が水素,
炭素数1〜5のアルキル基,ハロゲン基,二)・ロ基,
シアノ基,炭素数1〜5のアルコキシル基,アリル基,
ヒドロキシメチル基,クロロメチル基,ジアルキルアミ
ノメチル基のいずれかを表わす。)
の」二記3種の繰り返し中位を含む共重合体から成るこ
とを特徴とする。In each of R1 to R 5 + R6 to Ri
At least one of O is an OH group, and the remaining groups are hydrogen,
Alkyl group having 1 to 5 carbon atoms, halogen group, 2) and 2) group,
cyano group, alkoxyl group having 1 to 5 carbon atoms, allyl group,
Represents a hydroxymethyl group, chloromethyl group, or dialkylaminomethyl group. ) is characterized in that it consists of a copolymer containing three types of repeating centers.
本発明の感光性組成物は、アルカリ可溶性樹脂と感光剤
とを主成分として構成されるが、そのうちのアルカリ可
溶性樹脂は、後述する3つの繰り返し単位を含む共重合
体であり、ランダム共重合体、ブロック共重合体であっ
てもよい。The photosensitive composition of the present invention is composed mainly of an alkali-soluble resin and a photosensitizer, of which the alkali-soluble resin is a copolymer containing three repeating units described below, and a random copolymer. , or a block copolymer.
まず、第1の繰り返し単位は式(I)で示されるヒドロ
キシ−α−メチルスチレン誘導体である。この誘導体の
具体例としては、4−ヒドロキシ−α−メチルスチレン
、3−ヒドロキシ−α−メチルスチレン、3−メチル−
4−ヒドロキシ−α−メチルスチレン、2−クロロ−4
−ヒドロキシーα−メチルスチレン等を挙げることがで
きる。First, the first repeating unit is a hydroxy-α-methylstyrene derivative represented by formula (I). Specific examples of this derivative include 4-hydroxy-α-methylstyrene, 3-hydroxy-α-methylstyrene, 3-methyl-
4-hydroxy-α-methylstyrene, 2-chloro-4
-Hydroxy-α-methylstyrene and the like.
次に第2の繰り返し単位は式(TI)で示されるヒドロ
キシフェニルマレイミド誘導体である。この誘導体の具
体例としては、4−ヒドロキシフェニルマレイミド、3
−ヒドロキシフェニルマレイミド、2−ヒドロキシフェ
ニルマレイミド、3−メチル−4−ヒドロキシフェニル
マレイミド、3−メトキシ−4−ヒドロキシフェニルマ
レイミド等を挙げることができる。Next, the second repeating unit is a hydroxyphenylmaleimide derivative represented by formula (TI). Specific examples of this derivative include 4-hydroxyphenylmaleimide, 3
-hydroxyphenylmaleimide, 2-hydroxyphenylmaleimide, 3-methyl-4-hydroxyphenylmaleimide, 3-methoxy-4-hydroxyphenylmaleimide, and the like.
第1の繰り返し単位中R1〜R5および第2の繰り返し
単位中R6〜RIIl+のそれぞれにおいて、置換基は
重合の後導入することも可能であり、例えばアセチル基
、アリル基、クロロ基、ヒドロキシメチル等を重合後導
入することを可能である。In each of R1 to R5 in the first repeating unit and R6 to RII1+ in the second repeating unit, substituents can be introduced after polymerization, such as an acetyl group, an allyl group, a chloro group, a hydroxymethyl group, etc. can be introduced after polymerization.
この重合は、熱あるいは酸触媒を用いるカチオン重合等
で行なう。This polymerization is carried out by cationic polymerization using heat or an acid catalyst.
更に、第3の繰り返し単位は、エチレン性不飽和基を有
する化合物である。この化合物の具体例としては、スチ
レン及びスチレン誘導体;不飽和カルボン酸;不飽和カ
ルボン酸と、脂肪族ヒドロキシ化合物又は芳香族ヒドロ
キシ化合物とのエステル等を挙げることができる。Furthermore, the third repeating unit is a compound having an ethylenically unsaturated group. Specific examples of this compound include styrene and styrene derivatives; unsaturated carboxylic acids; and esters of unsaturated carboxylic acids and aliphatic hydroxy compounds or aromatic hydroxy compounds.
スチレン誘導体としては、例えば、4−メチルスチレン
、3−メチルスチレン、3.5−ジメチルスチレン、2
−クロロ−4−メチルスチレン、4−エチルスチレン、
3−エチルスチレン、α−メチルスチレン、4−メチル
−α−メチルスチレン等を挙げることができる。Examples of styrene derivatives include 4-methylstyrene, 3-methylstyrene, 3,5-dimethylstyrene, 2
-chloro-4-methylstyrene, 4-ethylstyrene,
Examples include 3-ethylstyrene, α-methylstyrene, 4-methyl-α-methylstyrene, and the like.
不飽和カルボン酸としては、例えば、アクリル酸、メタ
クリル酸、イタコン酸、クロトン酸、イソクロトン酸お
よびマレイン酸を挙げることができる。As unsaturated carboxylic acids, mention may be made, for example, of acrylic acid, methacrylic acid, itaconic acid, crotonic acid, isocrotonic acid and maleic acid.
脂肪族ヒドロキシ化合物としては、例えば、メタノール
、エタノール、プロパツールおよびブタノールを挙げる
ことができる。As aliphatic hydroxy compounds, mention may be made, for example, of methanol, ethanol, propatool and butanol.
芳香族ヒドロキシ化合物としては、例えば、フェノール
、ヒドロキノン、カテコール、レゾルシノール、フロロ
グルシノールおよびピロガロールを挙げることができる
。As aromatic hydroxy compounds, mention may be made, for example, of phenol, hydroquinone, catechol, resorcinol, phloroglucinol and pyrogallol.
不飽和カルボン酸と脂肪族ヒドロキシ化合物とのエステ
ルとしては、例えば、アクリル酸メチルエステル、アク
リル酸エチルエステル、アクリル酸n−プロピルエステ
ル、アクリル酸1so−プロピルエステル、アクリル酸
n−ブチルエステル、アクリル酸tert−ブチルエス
テル等のアクリル酸エステル類;メタクリル酸メチルエ
ステル、メタクリル酸エチルエステル、メタクリル酸n
−プロピルエステル、メタクリル酸1so−プロピルエ
ステル、メタクリル酸n−ブチルエステル、メタクリル
酸tert−ブチルエステル等のメタクリル酸エステル
類;イタコン酸メチルエステル、イタコン酸エチルエス
テル、イタコン酸n−プロピルエステル、イタコン酸1
so−プロピルエステル、イタコン酸n−ブチルエステ
ル、イタコン酸tert−ブチルエステル等のイタコン
酸エステル類;並びにクロトン酸メチルエステル、クロ
トン酸エチルエステル、クロトン酸n−プロピルエステ
ル、クロトン酸1so−プロピルエステル、クロトン酸
n−ブチルエステル、クロトン酸tert−ブチルエス
テル等のクロトン酸エステル類を挙げることができる。Examples of esters of unsaturated carboxylic acids and aliphatic hydroxy compounds include acrylic acid methyl ester, acrylic acid ethyl ester, acrylic acid n-propyl ester, acrylic acid 1so-propyl ester, acrylic acid n-butyl ester, acrylic acid Acrylic acid esters such as tert-butyl ester; methacrylic acid methyl ester, methacrylic acid ethyl ester, methacrylic acid n
-Methacrylic acid esters such as propyl ester, 1so-propyl methacrylate, n-butyl methacrylate, tert-butyl methacrylate; methyl itaconate, ethyl itaconate, n-propyl itaconate, itaconic acid 1
itaconic acid esters such as so-propyl ester, itaconic acid n-butyl ester, itaconic acid tert-butyl ester; Examples include crotonic acid esters such as crotonic acid n-butyl ester and crotonic acid tert-butyl ester.
不飽和カルボン酸と芳香族ヒドロキシ化合物とのエステ
ルとしては、例えば、アクリル酸フェニル、アクリル酸
メチルフェニル、アクリル酸エチルフェニル、メタクリ
ル酸フェニル、メタクリル酸メチルフェニル、メタクリ
ル酸エチルフェニル、イタコン酸フェニル、イタコン酸
メチルフェニル、イタコン酸ブチルフェニル、クロトン
酸フェニル、クロトン酸メチルフェニル、クロトン酸ブ
チルフェニルを挙げることができる。Examples of esters of unsaturated carboxylic acids and aromatic hydroxy compounds include phenyl acrylate, methylphenyl acrylate, ethylphenyl acrylate, phenyl methacrylate, methylphenyl methacrylate, ethylphenyl methacrylate, phenyl itaconate, and itacon. Mention may be made of methylphenyl acid, butylphenyl itaconate, phenyl crotonate, methylphenyl crotonate, and butylphenyl crotonate.
本発明の感光性組成物において、主成分の1つのアルカ
リ可溶性樹脂である共重合体は、繰り返し単位数の比で
表わすと、共重合体を構成する繰り返し単位の全数を1
00とした時に、繰り返し単位(I)、繰り返し単位(
II)、繰り返し単位(m)のそれぞれを5以上含む共
重合体であり、この共重合体の重量平均分子量は、50
0〜500.000であり、特にアルカリに対する溶解
度の点からすると10,000〜60,000が好まし
く、この共重合体は、高いガラス転移点を有するためパ
ターンの流れを生じにくい。In the photosensitive composition of the present invention, the copolymer which is one of the main components is an alkali-soluble resin, when expressed as a ratio of the number of repeating units, the total number of repeating units constituting the copolymer is 1
00, repeating unit (I), repeating unit (
II) is a copolymer containing 5 or more of each of repeating units (m), and the weight average molecular weight of this copolymer is 50
The copolymer has a molecular weight of 0 to 500,000, preferably 10,000 to 60,000, especially from the viewpoint of solubility in alkali.This copolymer has a high glass transition point and is therefore unlikely to cause pattern flow.
本発明に使用される感光剤は、一般に感光剤として知ら
れているものであれば格別限定されない。この感光剤と
しては、例えば、ナフトキノンアジド化合物、アジド化
合物が挙げられる。このナフトキノンアジド化合物とし
ては、例えば、1.2−す7トキノンー2−ジアジド−
5−スルホン酸クロリドとフェノール性の水酸基を有す
る化合物とから合成されるスルホン酸エステルがあげら
れ、フェノール性水酸基を有する化合物として例えば、
3,4.5−)リヒドロキシ安息香酸エチルエステル、
2,3.4−トリヒドロキシベンゾフェノン、2,4,
2°、4′−テトラヒドロキシベンゾフェノン、ケルセ
チン、モリンアリザリン、キニザリン、プルプリンが挙
げられる。また、アジド化合物としては、3,3°−ジ
アジドジフェニルスルホン、2−メトキシ−4°−アジ
ドカルコン、1−(p−アジドフェニル)−4−(2−
フリル)−1,3−ブタジェンが挙げられる。これらの
中でも、溶剤に対する溶解性が必要であり、露光装置の
光源の波長に対して感度を有する必要がある。現在広く
用いられているステッパーでは436nmの光源が用い
られているため、436nm対応としては、ビス(l、
2−ナフトキノン−2−ジアジド−5−スルホン酸)−
2,3,4−)リヒドロキシベンゾフェノンエステル、
1−(p−アジドフェニル)−4−(2−フリル)−1
,3−ブタジェンなどが好ましい。The photosensitizer used in the present invention is not particularly limited as long as it is generally known as a photosensitizer. Examples of the photosensitizer include naphthoquinone azide compounds and azide compounds. Examples of the naphthoquinone azide compound include 1,2-su7toquinone-2-diazide-
Examples of sulfonic acid esters synthesized from 5-sulfonic acid chloride and a compound having a phenolic hydroxyl group include, for example, the compound having a phenolic hydroxyl group.
3,4.5-)rihydroxybenzoic acid ethyl ester,
2,3.4-trihydroxybenzophenone, 2,4,
Examples include 2°,4'-tetrahydroxybenzophenone, quercetin, morin alizarin, quinizarin, and purpurin. In addition, examples of azide compounds include 3,3°-diazidiphenylsulfone, 2-methoxy-4°-azidochalcone, 1-(p-azidophenyl)-4-(2-
furyl)-1,3-butadiene. Among these, it is necessary to have solubility in a solvent and sensitivity to the wavelength of the light source of the exposure apparatus. Currently, widely used steppers use a 436 nm light source, so bis(l,
2-naphthoquinone-2-diazide-5-sulfonic acid)-
2,3,4-)lyhydroxybenzophenone ester,
1-(p-azidophenyl)-4-(2-furyl)-1
, 3-butadiene and the like are preferred.
これらのアジド化合物は1種もしくは2挿具−1−の混
合系で使用される。These azide compounds may be used singly or in a mixed system of two inserts.
本発明の感光性組成物は、上記のアルカリ可溶性樹脂で
ある共重合体100重量部に対して」二記感光剤5〜5
0重量部を混合することによって構成されている。The photosensitive composition of the present invention contains 5 to 5 parts by weight of the above-mentioned photosensitive agent per 100 parts by weight of the copolymer which is the alkali-soluble resin.
0 parts by weight.
本発明の感光性組成物の使用例を具体的に説明すると、
感光性組成物を溶剤、例えば、シクロヘキサノン、エチ
ルセロソルブアセテ−1・、メチルエチルケトンに溶か
し支持体、例えば、シリコンウェハなどの」−に、例え
ば、回転塗布し、乾燥(50℃〜180℃、好ましくは
70℃〜120’C、30秒間〜90分間、好ましくは
1分〜60分間)後、常法に従い紫外線露光し、例えば
マスクを通して適正波長領域の光を露光させる。ついで
適正アルカリ溶液により現像が行なわれる。その後io
o’c〜200℃、好ましくは120℃〜180’Ct
、30秒間〜120分間、好ましくは1分〜90分間の
条件下で乾燥する。支持体例えばシリコンウェハは、エ
ツチング及びメタルなどの通常の方法により処理される
。A specific example of the use of the photosensitive composition of the present invention is as follows:
The photosensitive composition is dissolved in a solvent such as cyclohexanone, ethyl cellosolve acetate, or methyl ethyl ketone, and then applied by spin coating onto a support such as a silicon wafer, and dried (50°C to 180°C, preferably). After 30 seconds to 90 minutes (preferably 1 minute to 60 minutes) at 70 DEG C. to 120 DEG C. to 120 DEG C., exposure to ultraviolet rays is carried out in accordance with a conventional method, for example, by exposing light in an appropriate wavelength range through a mask. Development is then carried out using a suitable alkaline solution. then io
o'c~200°C, preferably 120°C~180'Ct
, 30 seconds to 120 minutes, preferably 1 minute to 90 minutes. The support, for example a silicon wafer, is processed by conventional methods such as etching and metallurgy.
(実施例)
実施例=1
アルカリ可溶性樹脂として、
4−ヒドロキシ−α−メチルスチレン 40重量部4
−ヒドロキシフェニルマレイミド 20重1it部
スチレン 40重量部から成る共重
合体(重量平均分子量60,000)16g、感光剤と
して2,3.4−)リヒドロキシベンゾフェノンの1.
2−ナフトキノン−2−ジアジド−5−スルホン酸エス
テル(エステル化率=:2%)4gおよび溶剤としてシ
クロヘキサノン70gから成る感光液を調製し、シリコ
ンウェハの基板上にスピナーで塗布した。これをホット
プレート上で乾燥(90℃、5分間)して膜厚1.5I
unの感光膜を形成し、次に、この基板に石英マスクを
用いて250Wを超高圧水銀灯により90秒間露光した
。更に、0.4%のテトラメチルアンモニウムハイドロ
オキサイド水溶液により現像を行った後、水で洗浄し、
ホットプレート上で乾燥(140℃、5分間)したとこ
ろ、1戸のラインとスペースから成るパターンが形成さ
れた。(Example) Example = 1 As an alkali-soluble resin, 4-hydroxy-α-methylstyrene 40 parts by weight 4
16 g of a copolymer (weight average molecular weight 60,000) consisting of 20 parts by weight of 1 liter of hydroxyphenylmaleimide and 40 parts by weight of styrene; 1.
A photosensitive solution consisting of 4 g of 2-naphthoquinone-2-diazide-5-sulfonic acid ester (esterification rate = 2%) and 70 g of cyclohexanone as a solvent was prepared and applied onto a silicon wafer substrate using a spinner. This was dried on a hot plate (90°C, 5 minutes) to a film thickness of 1.5I.
A photoresist film was formed on the substrate, and then the substrate was exposed to light of 250 W for 90 seconds using an ultra-high pressure mercury lamp using a quartz mask. Furthermore, after developing with a 0.4% tetramethylammonium hydroxide aqueous solution, washing with water,
When dried on a hot plate (140° C., 5 minutes), a pattern consisting of one line and a space was formed.
パターンが形成ごれた基板をホットプレートで加熱(1
60’0130分間)してもパターン形状に変化がなか
った。Heating the substrate with the pattern formed on it on a hot plate (1
There was no change in the pattern shape even after 60'0130 minutes).
実施例2
アルカリ可溶性樹脂として、
4−ヒドロキシ−α−メチルスチレン 40tt
M4−ヒドロキシフェニルマレイミド 10重
量部スチレン 35重量部アクリ
ロニトル 15重都部から成る共重合体
(重量平均分子量20,000)16g、溶剤としてシ
クロへキサノン55g現像液として、1.1%テトラメ
チルアンモニウムハイドロオキサイド水溶液を用いたこ
とを除いては、実施例1と同様にして感光剤を調製し、
更にパターン形成を行なったところ、1μmのラインと
スペースから成るパターンが形成された。パターンが形
成された基板をホットプレートI−で加熱(160’C
! 30分間)してもパターン形状に変化がなかった
。Example 2 4-hydroxy-α-methylstyrene 40tt as alkali-soluble resin
M4-Hydroxyphenylmaleimide 10 parts by weight Styrene 35 parts by weight Acrylonitrile 16 g of a copolymer (weight average molecular weight 20,000) consisting of 15 parts by weight, 55 g of cyclohexanone as a solvent, 1.1% tetramethylammonium hydro as a developer A photosensitizer was prepared in the same manner as in Example 1 except that an oxide aqueous solution was used,
When further patterning was performed, a pattern consisting of 1 μm lines and spaces was formed. The patterned substrate was heated on a hot plate I- (160'C).
! There was no change in the pattern shape even after 30 minutes).
比較例
アルカリ可溶性樹脂として、クレゾールノボラック樹脂
(重量平均分子量5,000)16g、感光剤として2
,3.4−)リヒドロキシベンゾフェノンの1,2−ナ
フトキノン−2−ジアジド−5−スルホン酸エステル(
エステル化率2%)を4gおよび溶剤としてシクロヘキ
サノンを20gから成る感光液を調製し、シリコンウニ
への基板−1−にスピナーを用いてこれを塗布した。Comparative Example 16 g of cresol novolac resin (weight average molecular weight 5,000) was used as an alkali-soluble resin, and 2 g was used as a photosensitizer.
, 3.4-) 1,2-naphthoquinone-2-diazide-5-sulfonic acid ester of lyhydroxybenzophenone (
A photosensitive solution was prepared consisting of 4 g of esterification rate (2% esterification) and 20 g of cyclohexanone as a solvent, and this was applied to the silicone substrate -1- using a spinner.
次いで、ホットプレート 間)して、膜厚1.5μmの感光膜を形成した。Then hot plate A photoresist film having a film thickness of 1.5 μm was formed.
次にこの基板」二に石英マスクを用いて250Wの超高
圧水銀灯により、90秒間露光した。更に2、3%のコ
ソン水溶液で現像を行なった後、水で洗浄し、ホットプ
レート−1−で乾燥(100′0。Next, this substrate was exposed to light for 90 seconds using a 250 W ultra-high pressure mercury lamp using a quartz mask. After further developing with a 2 to 3% cosone aqueous solution, it was washed with water and dried on a hot plate-1 (100'0).
5分間)したところ、2−のラインとスペースから成る
パターンが形成された。パターンが形成された基板をホ
ットプレー1・で加熱(110’0。After 5 minutes), a pattern consisting of 2- lines and spaces was formed. The substrate on which the pattern has been formed is heated with hot plate 1 (110'0).
5分間)したところパターンの形状に変化が認められた
。5 minutes), a change in the shape of the pattern was observed.
(発明の効果)
以」−の説明から明らかなように、本発明の感光性組成
物は,露光、現像および加熱乾燥時において、高温処理
を受けても形成されたパターンの流れが生じないので、
耐熱性にすぐれ、その工業的価値は大である。(Effects of the Invention) As is clear from the explanation below, the photosensitive composition of the present invention does not cause the formed pattern to flow during exposure, development, and heat drying even when subjected to high temperature treatment. ,
It has excellent heat resistance and is of great industrial value.
Claims (1)
組成物において、アルカリ可溶性樹脂が、 式: ▲数式、化学式、表等があります▼・・・( I ) で示される繰り返し単位、 式: ▲数式、化学式、表等があります▼・・・(II) で示される繰り返し単位およびエチレン性不飽和基を有
する化合物から成る繰り返し単位 (ただし式中、R_1〜R_5およびR_6〜R_1_
0のそれぞれにおいて、R_1〜R_5、R_6〜R_
1_0は、少なくとも1つがOH基であり、残りの基が
水素、炭素数1〜5のアルキル基、ハロゲン基、ニトロ
基、シアノ基、炭素数1〜5のアルコキシル基、アリル
基、ヒドロキシメチル基、クロロメチル基、ジアルキル
アミノメチル基のいずれかを表わす。) の上記3種の繰り返し単位からなる共重合体であること
を特徴とする感光性組成物。[Scope of Claims] In a photosensitive composition containing an alkali-soluble resin and a photosensitizer as main components, the alkali-soluble resin is a repeating compound represented by the formula: ▲There are mathematical formulas, chemical formulas, tables, etc.▼...(I) Unit, formula: ▲There are mathematical formulas, chemical formulas, tables, etc.▼... (II) A repeating unit consisting of a repeating unit represented by and a compound having an ethylenically unsaturated group (however, in the formula, R_1 to R_5 and R_6 to R_1_
0, R_1 to R_5, R_6 to R_
At least one of 1_0 is an OH group, and the remaining groups are hydrogen, an alkyl group having 1 to 5 carbon atoms, a halogen group, a nitro group, a cyano group, an alkoxyl group having 1 to 5 carbon atoms, an allyl group, and a hydroxymethyl group. , chloromethyl group, or dialkylaminomethyl group. ) A photosensitive composition characterized in that it is a copolymer consisting of the above three types of repeating units.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7110886A JPS62229140A (en) | 1986-03-31 | 1986-03-31 | Photosensitive composition |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7110886A JPS62229140A (en) | 1986-03-31 | 1986-03-31 | Photosensitive composition |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS62229140A true JPS62229140A (en) | 1987-10-07 |
Family
ID=13451028
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7110886A Pending JPS62229140A (en) | 1986-03-31 | 1986-03-31 | Photosensitive composition |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62229140A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02267558A (en) * | 1989-04-10 | 1990-11-01 | Toyo Gosei Kogyo Kk | Photoresist composition for far ultraviolet light |
EP0410794A2 (en) * | 1989-07-28 | 1991-01-30 | Hoechst Celanese Corporation | Maleimide containing, negative working deep UV photoresist |
US5712022A (en) * | 1992-09-14 | 1998-01-27 | Yoshino Kogyosho Co., Ltd. | Printed thermoplastic resin products and method for printing such products |
-
1986
- 1986-03-31 JP JP7110886A patent/JPS62229140A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02267558A (en) * | 1989-04-10 | 1990-11-01 | Toyo Gosei Kogyo Kk | Photoresist composition for far ultraviolet light |
EP0410794A2 (en) * | 1989-07-28 | 1991-01-30 | Hoechst Celanese Corporation | Maleimide containing, negative working deep UV photoresist |
US5712022A (en) * | 1992-09-14 | 1998-01-27 | Yoshino Kogyosho Co., Ltd. | Printed thermoplastic resin products and method for printing such products |
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