JPS62221292A - Cathode-ray tube device - Google Patents

Cathode-ray tube device

Info

Publication number
JPS62221292A
JPS62221292A JP6446486A JP6446486A JPS62221292A JP S62221292 A JPS62221292 A JP S62221292A JP 6446486 A JP6446486 A JP 6446486A JP 6446486 A JP6446486 A JP 6446486A JP S62221292 A JPS62221292 A JP S62221292A
Authority
JP
Japan
Prior art keywords
deflection
horizontal
chroma
ray tube
electrostatic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6446486A
Other languages
Japanese (ja)
Inventor
Kozo Iwata
岩田 孝造
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renesas Semiconductor Manufacturing Co Ltd
Kansai Nippon Electric Co Ltd
Original Assignee
Renesas Semiconductor Manufacturing Co Ltd
Kansai Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renesas Semiconductor Manufacturing Co Ltd, Kansai Nippon Electric Co Ltd filed Critical Renesas Semiconductor Manufacturing Co Ltd
Priority to JP6446486A priority Critical patent/JPS62221292A/en
Publication of JPS62221292A publication Critical patent/JPS62221292A/en
Pending legal-status Critical Current

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  • Video Image Reproduction Devices For Color Tv Systems (AREA)

Abstract

PURPOSE:To execute an extremely precise chroma scan control with a low electric power by disposing a horizontal and vertical deflection yoke at an external part of a cathode-ray tube and an electrostatic deflection electrode which controls the chroma scan deflection of an electronic beam at an inner part. CONSTITUTION:On the outer periphery of the neck part of a bulb 1 in the cathode-ray tube, the electronic beam horizontal and vertical deflection yoke 11 is fitted, while inside the neck part of the bulb 1, a couple of the chroma scan electrostatic deflection electrodes 13 are disposed in front of an electronic gun 4. When the deflection yoke 11 horizontally deflects an electronic beam 6, a voltage is impressed at a triplet frequency from an auxiliary horizontal deflection circuit 14 to the electrostatic deflection electrode 13, whereby the electronic beam 6 is electrostatically deflected in the direction of reducing speed of the horizontal scanning and chroma-scanned. The voltage impressed on the electrostatic deflection electrode 13 at such a time can be low, and the chroma scan is controlled at high accuracy so that the induction magnetic fields of horizontal and vertical deflection yokes will not affect each other.

Description

【発明の詳細な説明】 11上皇机几充訪 本発明は、ビームインデックス型カラー陰掘線管装置に
関する。
DETAILED DESCRIPTION OF THE INVENTION 11. The present invention relates to a beam index type color shaded line tube device.

従末夏艮■ カラー陰極線管におけるカラー画像の再生方式はシャド
ーマスク方式が一般的であるが、最近はカラー陰極線管
に収納した1本の電子銃で色再生を行うビームインデッ
クス方式がシャドーマスク方式に比べ、電力低減、輝度
量上等に優れる点から注目され、実用化が進められてい
る。
Natsuyoshi Jusue ■ The shadow mask method is the common method for reproducing color images in color cathode ray tubes, but recently the shadow mask method has become a beam index method that reproduces colors using a single electron gun housed in the color cathode ray tube. It has attracted attention due to its superior power consumption and brightness compared to the previous one, and is being put into practical use.

ビームインデックス方式のカラー再生の原理を第2図及
び第3図を参照して説明すると、(1)は陰極線管のバ
ルブ、(2)はバルブ(1)のフェース部内面に形成さ
れた蛍光膜、(3)は蛍光膜(2)上に形成されたメタ
ルバンク層、(4)はバルブ(1)のネック部内に収納
された電子銃、(5)はバルブ(1)のネック部外周に
装着された水平・垂直偏向ヨークである。蛍光膜(2)
は縦縞模様で、例えば、赤、青、緑のストライプ状色蛍
光膜(R)、(B)、(G)と、紫外発光のストライプ
状インデックス蛍光IJ(UV)と、非発光のカーボン
のストライプ状遮光l11(C)とを所定の配列で並べ
た1トリブレツ) (T)を多数並列に配列、形成した
ものである。電子銃(4)から放射された電子ビーム(
6)は、蛍光膜(2)上にビームスポット(E)として
照射され、蛍光体ストライプと直交方向に水平偏向され
て走査する。
The principle of color reproduction using the beam index method is explained with reference to Figures 2 and 3. (1) shows the bulb of the cathode ray tube, and (2) shows the fluorescent film formed on the inner surface of the face of the bulb (1). , (3) is a metal bank layer formed on the fluorescent film (2), (4) is an electron gun housed in the neck of the bulb (1), and (5) is a metal bank layer formed on the outer periphery of the neck of the bulb (1). It is equipped with horizontal and vertical deflection yokes. Fluorescent film (2)
is a vertical striped pattern, for example, red, blue, and green striped colored fluorescent films (R), (B), (G), ultraviolet emitting striped index fluorescent IJ (UV), and non-emissive carbon stripes. It is formed by arranging and forming a large number of triblets (T) in a predetermined arrangement in a predetermined arrangement. The electron beam (
6) is irradiated onto the phosphor film (2) as a beam spot (E), and is horizontally deflected and scanned in a direction orthogonal to the phosphor stripes.

上記ビームスポット(E)の直径rは、色量光1f(R
)(B)(G)の幅が例えば同一とすると、この@Wの
約2倍程度のもので、色量光膜(1’?)  (I3)
  (G)はビームスポット(E)が照射された部分が
発光する。また、ビームスボッ) (E)がインデック
ス蛍光膜(1)に照射されると、インデックス蛍光1%
(1)から紫外線が放射され、外部の光センサ(図示せ
ず)に捕捉されて、電子ビーム(6)の位置が検出され
、光センサからのインデックス信号で所望のカラー再生
が行われる。
The diameter r of the beam spot (E) is the color light 1f (R
) (B) (G) are about the same width, it is about twice that of this @W, and the color amount light film (1'?) (I3)
In (G), the portion illuminated by the beam spot (E) emits light. In addition, when the index fluorescent film (1) is irradiated with Beam Subbot (E), the index fluorescence 1%
Ultraviolet light is emitted from (1), captured by an external photosensor (not shown), the position of the electron beam (6) is detected, and desired color reproduction is performed using the index signal from the photosensor.

このようなビームインデックス型カラー陰極線管装置に
おいて、電子ビーム(6)の水平偏向速度を一定にして
、ビームスポット(E)を例えば1本の赤色蛍光膜(R
)に照射すると、赤色蛍光11t(R)で発光する赤色
輝点の輝度はビームスポット(E)が赤色蛍光1!(R
)を横切る時間に比例する。従って、ビームスポット(
E)の径rを太き(すれば、赤色蛍光膜(R)をビーム
スポット(E)が横切る時間が長くなり、輝度が上げら
れるが、しかし、その反面、赤色蛍光膜(R)に隣接す
る青色蛍光膜(B)や緑色蛍光膜(G)にもビームスポ
ット(E)が同時に照射される度合が大きくなり、赤色
発光の単独発光時間が短くなって、カラー画像の色相(
色純度)が悪くなる。
In such a beam index type color cathode ray tube device, the horizontal deflection speed of the electron beam (6) is kept constant, and the beam spot (E) is aligned with, for example, one red phosphor film (R
), the brightness of the red bright spot emitted by red fluorescence 11t (R) is that the beam spot (E) is red fluorescence 1! (R
) is proportional to the time it takes to cross. Therefore, the beam spot (
Increasing the diameter r of E) will lengthen the time it takes for the beam spot (E) to cross the red fluorescent film (R), increasing the brightness. The degree to which the beam spot (E) is simultaneously irradiated on the blue phosphor film (B) and green phosphor film (G) increases, and the independent light emission time of red light becomes shorter, resulting in a change in the hue of the color image (
color purity) deteriorates.

そこで、色相を良好に保って輝度を上げる目的で、電子
ビーム(6)の水平偏向時の走査速度を変調するクロマ
スキャン偏向が行われている。このクロマスキャン偏向
は1トリプレツト(T)をビームスポット(E)が、横
切る間に、発光させたい例えば赤色蛍光膜(R)上で走
査速度を減速して、ビームスボッ) (E)を赤色蛍光
IN(R)上に見かけ上停止させ、他の部分を走査する
時は加速させて、赤色発光の輝度を上げる偏向方式であ
る。このようなりロマスキャンは、第4図に示すように
、パルプ(1)のネック部外周に、水平・垂直偏向用主
偏向ヨーク(7)から少し離してクロマスキャン用副偏
向ヨーク(8)を配置して、次のように行われている。
Therefore, in order to maintain good hue and increase brightness, chroma scan deflection is used to modulate the scanning speed during horizontal deflection of the electron beam (6). This chroma scan deflection is performed while the beam spot (E) crosses one triplet (T).For example, the scanning speed is slowed down on the red fluorescent film (R) where the beam spot (E) is to be emitted. (R) This is a deflection method in which the light is apparently stopped at the top and accelerated when scanning other areas to increase the brightness of the red light. As shown in Figure 4, in this ROMAScan, a sub-deflection yoke (8) for Chromascan is placed around the outer periphery of the neck of the pulp (1), slightly apart from the main deflection yoke (7) for horizontal and vertical deflection. The arrangement is done as follows.

主偏向ヨーク(7)に水平・垂直偏向回路(9)から水
平同期信号に基づ(のこぎり波の電流を流して、電子ビ
ーム(6)を水平方向に誘導偏向させ、ビームスボッl
−(E)が1トリブレ7)(T)の発光させたい例えば
赤色蛍光111(R)上を走査するタイミングで、副偏
向ヨーク(8)に補助水平偏向回路(1o)から、電子
ビーム(6)を主偏向ヨーク(7)と逆方向に誘導偏向
させる電流を流゛して、ビームスポット(E)を赤色蛍
光膜(R)上に見かけ上停止させる。このようなことが
インデックス信号とカラー再生信号に基づいて各トリプ
レット(T)毎に行われ、これにより色相を最良にした
状態で輝度が上げられる。
A sawtooth wave current is applied to the main deflection yoke (7) from the horizontal/vertical deflection circuit (9) based on the horizontal synchronization signal to guide and deflect the electron beam (6) in the horizontal direction, causing beam deflection.
- (E) is 1 Tribre 7) (T) At the timing when scanning, for example, the red fluorescent light 111 (R) to be emitted, an electron beam (6 ) in the direction opposite to that of the main deflection yoke (7), and the beam spot (E) is apparently stopped on the red fluorescent film (R). This is done for each triplet (T) based on the index signal and color reproduction signal, thereby increasing the brightness while optimizing the hue.

(°°と る口 占 ところで、副偏向ヨーク(8)に流す電流の周波数はビ
ームスポット(E)が1トリプレツト(T)を通過する
時間の逆数の約2.7MIIz〜4MHzと高く、この
ような高周波の電流を副偏向コーク(8)のコイルに流
して、電子ビーム(6)を誘導偏向させるに必要な磁界
強度を得るには、補助水平偏向回路(10)に大出力の
ものが必要となり、補助水平偏向回路(10)の完全I
C化が難しい、また、主偏向ヨーク(7)と副偏向ヨー
ク(8)で発生させた誘導磁界は同軸で、相互結合する
ので、この相互結合を少なくするために副偏向ヨーク(
7)(8)を少し離して配置しているが、このようにす
ると電子ビーム(6)の偏向開始点の位置が不安定にな
って、フォーカスが低下しビームスポット径が大きくな
ったり、偏向感度が変化するので、クロマスキャンを高
精度に行うことが難しい問題があった。
By the way, the frequency of the current flowing through the sub-deflection yoke (8) is as high as about 2.7 MIIz to 4 MHz, which is the reciprocal of the time it takes for the beam spot (E) to pass through one triplet (T). In order to obtain the magnetic field strength necessary to induce and deflect the electron beam (6) by passing a high-frequency current through the coil of the auxiliary deflection cork (8), the auxiliary horizontal deflection circuit (10) must have a large output. Therefore, the complete I of the auxiliary horizontal deflection circuit (10)
In addition, the induced magnetic fields generated by the main deflection yoke (7) and the sub-deflection yoke (8) are coaxial and mutually coupled, so the sub-deflection yoke (8) is used to reduce this mutual coupling.
7) (8) are placed a little apart, but if this is done, the position of the deflection start point of the electron beam (6) will become unstable, resulting in a decrease in focus, an increase in the beam spot diameter, and an increase in the deflection. There was a problem in that it was difficult to perform chroma scan with high accuracy because the sensitivity changed.

′   る    の一 本発明は上記クロマスキャン方式によるカラー再生上の
問題点に鑑み、提案されたもので、電子ビームの水平偏
向をクロマスキャン方式で行うビームインデックス型陰
極線管において、陰極線管の外部に水平および垂直偏向
ヨークを、内部に電子ビームのクロマスキャン偏向を制
御する静電偏向電極をそれぞれ配置した陰極線管装置を
提供する。
The present invention was proposed in view of the above-mentioned problems in color reproduction using the chroma scan method. A cathode ray tube device is provided in which horizontal and vertical deflection yokes are each provided with electrostatic deflection electrodes for controlling chroma scan deflection of an electron beam.

作且 電子ビームのクロマスキャン用静電偏向電極は、数ボル
トから数10ボルトの低電圧の印加で電子ビームを静電
偏向させてクロマスキャン制御し、而も、静電偏向ゆえ
に水平・垂直偏向ヨークの誘導磁界と影響し合わず、ク
ロマスキャン制御が高精度に行われる。
Electrostatic deflection electrodes for chroma scanning of electron beams perform chroma scanning control by electrostatically deflecting electron beams by applying a low voltage of several volts to several tens of volts. Chroma scan control is performed with high precision without interfering with the induced magnetic field of the yoke.

11± 本発明の一実施例を第1図の概略平面図を参照して説明
すると、図において、第2図と同一のものには同一参照
符号を付して、説明は省略する。(11)はバルブ(1
)のネック部外周に装着された電子ビーム水平・垂直偏
向用偏向ヨーク、(12)は水平・垂直偏向回路、(1
3)(13)はバルブ(1)のネック部内で電子銃(4
)の前方に配置された一対のクロマスキャン用静電偏向
電極、(14)は静電偏向電極(13)(13)間にト
リブレット周波数で電圧を印加して、電子ビーム(6)
の水平走査をクロマスキャンする補助水平偏向回路であ
る。
11± One embodiment of the present invention will be described with reference to the schematic plan view of FIG. 1. In the figure, the same parts as in FIG. 2 are designated by the same reference numerals, and the explanation will be omitted. (11) is the valve (1
) is a deflection yoke for horizontal and vertical deflection of the electron beam attached to the outer periphery of the neck, (12) is a horizontal and vertical deflection circuit, (1
3) (13) is the electron gun (4) inside the neck of the valve (1).
A pair of electrostatic deflection electrodes for chroma scan (14) are placed in front of the electron beam (6) by applying a voltage at triplet frequency between the electrostatic deflection electrodes (13) (13).
This is an auxiliary horizontal deflection circuit that performs chroma scanning of horizontal scanning.

上記静電偏向電極(13)  (13)は偏向コーク(
11)による電子ビーム(6)の水平偏向時に、第4図
の副偏向ヨーク(8)に加えられるクロマスキャン用電
圧と同じタイミングで高周波電圧が印加されて、電子ビ
ーム(6)を水平方向の走査を減速させる方向に静電偏
向させ、電子ビーム(6)をクロマスキャンさせる。こ
のような静電偏向電極(13)  (13)による電子
ビーム(6)の静電偏向は、偏向角が小さいが、電子ビ
ーム(6)が1トリプレツ) (T)を走査する間の補
助的偏向であるので、偏向角が小さいことは問題になら
ない。また、静電偏向電極(13)  (13)に印加
する電圧は、電子ビーム(6)を誘導磁界で偏向させる
偏向ヨークに比べ大幅に小さくて済み、実際、数ボルト
から数10ボルトでよい。
The electrostatic deflection electrode (13) (13) is connected to the deflection coke (
11), a high frequency voltage is applied at the same timing as the chroma scan voltage applied to the sub-deflection yoke (8) in FIG. The electron beam (6) is electrostatically deflected in a direction that decelerates scanning, causing the electron beam (6) to undergo chroma scanning. Although the electrostatic deflection of the electron beam (6) by such an electrostatic deflection electrode (13) (13) has a small deflection angle, it serves as an auxiliary beam while the electron beam (6) scans one triplet (T). Since it is a deflection, a small deflection angle is not a problem. Further, the voltage applied to the electrostatic deflection electrode (13) (13) can be much smaller than that of the deflection yoke that deflects the electron beam (6) with an induced magnetic field, and in fact may be from several volts to several tens of volts.

光五夏班来 本発明によれば、電子ビームのクロマスキャン制御を行
う静電偏向電極に加える電圧は小さいものでよく、従っ
てクロマスキャン用水平偏向回路の小電力化、IC化が
容易に実現される。また、静電偏向電極による静電偏向
は誘導偏向に比べ直線性が良く、また水平偏向ヨークで
偏向された電子ビームを静電偏向させるので、電子ビー
ムの偏向開始点が安定して、精度の良イクロマスキャン
制御が可能となり、色相・輝度共に優れた高精度のビー
ムインデックス型陰極線管装置が提供できる。
According to the present invention, a small voltage is required to be applied to the electrostatic deflection electrode that performs chroma scan control of the electron beam, and therefore it is easy to realize low power consumption and IC implementation of the horizontal deflection circuit for chroma scan. be done. In addition, electrostatic deflection by the electrostatic deflection electrode has better linearity than inductive deflection, and since the electron beam deflected by the horizontal deflection yoke is electrostatically deflected, the deflection starting point of the electron beam is stabilized and precision is improved. This enables good ichromatic scan control and provides a highly accurate beam index type cathode ray tube device with excellent hue and brightness.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明に係る陰極線管装置の一例を示す概略平
面図である。 第2図は一般的ビームインデックス型陰極線管装置の概
略平面図、第3図は第2図の装置における蛍光膜の部分
拡大正面図、第4図は従来のビームインデックス型陰極
線管装置の概略平面図である。 (6) −・電子ビーム、 (11) −・−水平・垂直偏向日−り、(13) −
静電偏向電極。 第1図 (刃ン吟平釦図つ 第2図
FIG. 1 is a schematic plan view showing an example of a cathode ray tube device according to the present invention. Fig. 2 is a schematic plan view of a general beam index type cathode ray tube device, Fig. 3 is a partially enlarged front view of a fluorescent film in the device shown in Fig. 2, and Fig. 4 is a schematic plan view of a conventional beam index type cathode ray tube device. It is a diagram. (6) −・Electron beam, (11) −・−Horizontal and vertical deflection beam, (13) −
Electrostatic deflection electrode. Figure 1 (Bane Ginpei Button Figure 2)

Claims (1)

【特許請求の範囲】[Claims] (1)電子ビームの水平偏向をクロマスキャン方式で行
うビームインデックス型陰極線管において、 陰極線管の外部に水平および垂直偏向ヨークを、内部に
電子ビームのクロマスキャン偏向を制御する静電偏向電
極をそれぞれ配置したことを特徴とする陰極線管装置。
(1) In a beam index cathode ray tube that uses the chroma scan method to horizontally deflect the electron beam, horizontal and vertical deflection yokes are installed on the outside of the cathode ray tube, and electrostatic deflection electrodes are installed inside to control the chroma scan deflection of the electron beam. A cathode ray tube device characterized in that:
JP6446486A 1986-03-22 1986-03-22 Cathode-ray tube device Pending JPS62221292A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6446486A JPS62221292A (en) 1986-03-22 1986-03-22 Cathode-ray tube device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6446486A JPS62221292A (en) 1986-03-22 1986-03-22 Cathode-ray tube device

Publications (1)

Publication Number Publication Date
JPS62221292A true JPS62221292A (en) 1987-09-29

Family

ID=13258980

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6446486A Pending JPS62221292A (en) 1986-03-22 1986-03-22 Cathode-ray tube device

Country Status (1)

Country Link
JP (1) JPS62221292A (en)

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