JPS6221935Y2 - - Google Patents

Info

Publication number
JPS6221935Y2
JPS6221935Y2 JP1981000836U JP83681U JPS6221935Y2 JP S6221935 Y2 JPS6221935 Y2 JP S6221935Y2 JP 1981000836 U JP1981000836 U JP 1981000836U JP 83681 U JP83681 U JP 83681U JP S6221935 Y2 JPS6221935 Y2 JP S6221935Y2
Authority
JP
Japan
Prior art keywords
contact
contacts
slit
brush
bare
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1981000836U
Other languages
Japanese (ja)
Other versions
JPS57114914U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1981000836U priority Critical patent/JPS6221935Y2/ja
Publication of JPS57114914U publication Critical patent/JPS57114914U/ja
Application granted granted Critical
Publication of JPS6221935Y2 publication Critical patent/JPS6221935Y2/ja
Expired legal-status Critical Current

Links

Description

【考案の詳細な説明】 本考案は測定器用接点型エンコーダ、特に低消
費電流の電池駆動などによる小型測定器に好適な
測定器用接点型エンコーダに関するものである。
[Detailed Description of the Invention] The present invention relates to a contact type encoder for a measuring instrument, and particularly to a contact type encoder for a measuring instrument that is suitable for small measuring instruments that are battery-driven with low current consumption.

測定子の機械的変位を電気的なデジタル信号と
して検出するエンコーダが周知であり、測長機あ
るいは位置検出器その他として種々の測定分野に
応用されている。この種のエンコーダは被測定物
の長さをスケールその他の変位量として電気的に
検出し、この電気的な検出手段としては電磁型、
静電型あるいは光電型など種々の形式が知られて
おり、特に光電変換型のエンコーダは装置を小型
化しまた高精度の測定が可能であるなどの利点か
らマイクロメータ、ノギスあるいは座標測定機な
どとして広く実用化されている。
2. Description of the Related Art Encoders that detect the mechanical displacement of a probe as an electrical digital signal are well known, and are applied in various measurement fields as length measuring machines, position detectors, and the like. This type of encoder electrically detects the length of the object to be measured as a scale or other displacement amount, and the electrical detection means include electromagnetic type,
Various types of encoders are known, such as electrostatic type and photoelectric type. In particular, photoelectric conversion type encoders are used as micrometers, calipers, coordinate measuring machines, etc. due to their advantages such as miniaturization and high-precision measurement. It has been widely put into practical use.

しかしながら、従来のこの種の装置は比較的高
価格であり、また消費電流が比較的大きいという
欠点を有していた。特に、近年の小型測長機その
他においては装置の駆動源として電池が用いら
れ、このために低消費電流で長寿命のものが要望
されている。そして、デジタル型変位検出装置で
はその電気的な処理がC−MOS回路から形成さ
れ、これらの電気的な処理回路部での消費電流が
著しく小さいという利点を有するが、これに対し
て従来の例えば光電型装置では光電変換のための
発光器例えば発光ダイオードなどが大きな消費電
流を有するために全体の消費電流が増加するとい
う問題を生じさせていた。
However, conventional devices of this type have the drawbacks of being relatively expensive and consuming a relatively large amount of current. In particular, batteries are used as a drive source for recent compact length measuring machines and other equipment, and for this reason, there is a demand for low current consumption and long life spans. The digital displacement detection device has the advantage that its electrical processing is formed from a C-MOS circuit, and the current consumption in these electrical processing circuits is extremely small. In photoelectric devices, a light emitting device for photoelectric conversion, such as a light emitting diode, consumes a large amount of current, resulting in a problem that the overall current consumption increases.

前述した非接触型のエンコーダに対して、従来
より接点の接触による開閉作動から電気的なデジ
タル信号を検出する接点型エンコーダが知られて
おり、簡単な構造で機械的変位を電気的に検出可
能であるという利点を有し従来よりある種の分野
においては実用化されていたが、この使用分野は
精度を必要としない位置決め機構あるいは大型駆
動機構の回転位置検出装置などとして用いられて
いたのみで小型のかつ高精度を必要とする特に測
長機などにおいては全くその利用が考慮されてい
なかつた。すなわち、この種の接点型では接点の
信頼性が低く接触状態が極めて不安定でありまた
長時間の使用によつて極めて容易に接触状態が変
化するなどの根本的な欠点を有していたため、接
触不良が直接誤差の発生原因となる測長機などで
は使用することが不可能とされていた。
In contrast to the non-contact type encoders mentioned above, contact type encoders have been known that detect electrical digital signals from opening/closing operations by contacting contacts, and can electrically detect mechanical displacement with a simple structure. It has the advantage of being highly accurate and has been put to practical use in certain fields, but it has only been used as a positioning mechanism that does not require precision or as a rotational position detection device for large drive mechanisms. Its use was not considered at all, especially in length measuring machines that require small size and high precision. In other words, this type of contact type had fundamental drawbacks such as low contact reliability, extremely unstable contact state, and extremely easy contact state change after long-term use. It was considered impossible to use it in length measuring machines, etc., where poor contact directly causes errors.

しかしながら、この装置は一面において、電圧
の印加のみで機械的変位を電気的なデジタルパル
スに変換可能であつて基本的に電流消費を必要と
しないという利点があり、本考案者はこの利点を
近年の電圧型素子である例えばC−MOSトラン
ジスタなどと組合せることにより低消費電流の電
池駆動可能な小型測長機への応用について着目し
た。
However, this device has the advantage that it can convert mechanical displacement into electrical digital pulses only by applying voltage, and basically does not require current consumption. We focused on the application of this method to a small length measuring machine that can be driven by a battery with low current consumption by combining it with a voltage type element such as a C-MOS transistor.

ところが、このような接点型エンコーダでは、
検出接点の開閉作動時にその開閉作動に伴い変化
する入力電圧に種々のノイズが混入するという欠
点があり、この結果、測定器の精度及び信頼性が
著しく損なわれるという問題があつた。この種の
ノイズは主として接点の表面状態例えば汚れある
いは高抵抗部の存在その他長期間の使用による表
面劣化などに起因し、これらのノイズ混入を完全
に防止することは不可能であつた。
However, with such a contact encoder,
There is a drawback that various noises are mixed into the input voltage that changes as the detection contact opens and closes, and as a result, the accuracy and reliability of the measuring device are significantly impaired. This type of noise is mainly caused by the surface condition of the contacts, such as dirt, the presence of high resistance parts, and other surface deterioration due to long-term use, and it has been impossible to completely prevent the incorporation of these noises.

第1図には前述した接点型エンコーダの概略構
成が示され、所定間隔で配列された複数の導電体
からなるスリツト接点群10,12と、該スリツ
ト接点群10,12に対して測定子の機械的変位
に対応してAB方向に移動する摺動接点14が設
けられ、摺動接点14に抵抗16を介して直流電
源である電池18が接続され、スリツト接点群1
0,12と摺動接点14との間に検出電圧が印加
されている。両スリツト接点群10,12は例え
ば円板の側面に蒸着などにより形成されたスリツ
ト電極から形成されあるいは直線状のスリツト電
極群から形成することができ、また摺動接点14
は測定子と連動して回転あるいは直線運動するブ
ラシ接点から形成することができる。従つて、摺
動接点14の矢印AB方向への移動に伴い、スリ
ツト接点10または12と摺動接点14間の開閉
作動に伴い、端子20,22からは摺動接点14
の移動量に対応するデジタル信号を検出すること
ができる。そして、スリツト接点群10,12を
所定の位相差、第1図においては90度の位相差で
配列することにより、両端子20,22からは正
弦波(進み)及び余弦波(遅れ)を基本波とする
方形波信号を得ることが可能となる。
FIG. 1 shows a schematic configuration of the above-mentioned contact type encoder, which includes a group of slit contacts 10 and 12 made up of a plurality of conductors arranged at a predetermined interval, and a measuring probe connected to the group of slit contacts 10 and 12. A sliding contact 14 that moves in the AB direction in response to mechanical displacement is provided, a battery 18 serving as a DC power source is connected to the sliding contact 14 via a resistor 16, and the slit contact group 1
A detection voltage is applied between 0 and 12 and the sliding contact 14. Both slit contact groups 10 and 12 can be formed, for example, from slit electrodes formed by vapor deposition on the side surface of a disk, or from linear slit electrode groups, and the sliding contact 14
can be formed from a brush contact that rotates or moves linearly in conjunction with the probe. Therefore, as the sliding contact 14 moves in the direction of the arrow AB, the opening/closing operation between the slit contact 10 or 12 and the sliding contact 14 causes the sliding contact 14 to be removed from the terminals 20 and 22.
A digital signal corresponding to the amount of movement can be detected. By arranging the slit contact groups 10 and 12 with a predetermined phase difference, 90 degrees in FIG. It becomes possible to obtain a square wave signal.

しかしながら、前述したように、単なるスリツ
ト接点10,12とブラシ接点14とから検出接
点を形成した場合、端子20,22には外乱によ
るノイズが混入しまた特に検出接点の開閉臨界状
態において接点間の不完全接触によつて無視でき
ないノイズが発生することが知られており、第2
図には所定の測定信号すなわち領域Tの前後にお
いて外乱ノイズあるいは臨界ノイズが生じている
状態が示されている。従つて、従来装置では、こ
れらのノイズ特に接点間の接触不良によるノイズ
によつてデジタル測定信号のカウントミスなどが
生じ、測定器の精度が著しく低下するという欠点
が生じていた。
However, as described above, when the detection contact is formed from the simple slit contacts 10, 12 and the brush contact 14, noise due to disturbances enters the terminals 20, 22, and especially in the critical state of opening/closing of the detection contact, the contact It is known that incomplete contact causes non-negligible noise, and
The figure shows a state in which disturbance noise or critical noise occurs before and after a predetermined measurement signal, that is, region T. Therefore, in the conventional apparatus, these noises, particularly noises caused by poor contact between the contacts, cause counting errors in digital measurement signals and the like, resulting in a drawback that the accuracy of the measuring instrument is significantly reduced.

本考案は上記従来の課題に鑑みなされたもので
あり、その目的は、接点接触不良に起因するノイ
ズ発生を効果的に除去することのできる改良され
た測定器用接点型エンコーダを提供することにあ
る。
The present invention was devised in view of the above-mentioned conventional problems, and its purpose is to provide an improved contact type encoder for measuring instruments that can effectively eliminate noise caused by contact failure. .

上記目的を達成するために、本考案は一定間隔
で整列配置された複数の導電体からなるスリツト
接点と、測定子の機械的変位に連動して前記スリ
ツト接点と相対的に摺動するブラシ接点と、両接
点間に検出電圧を印加する電源と、を含む測定器
用接点型エンコーダにおいて、前記ブラシ接点は
電気的に共通接続された複数の素ブラシ接点から
なり、各素ブラシ接点は微小接点群からなるとと
もにブラシ接点の相対的摺動方向に沿つてスリツ
ト接点の異なる導電体に対応して形成され、前記
スリツト接点はその導電体幅がスリツト幅よりも
狭く設定され、いずれかの素ブラシ接点がスリツ
ト接点の導電体と接触した時に検出信号を出力す
ることを特徴とする。
In order to achieve the above object, the present invention includes a slit contact made of a plurality of conductors arranged at regular intervals, and a brush contact that slides relative to the slit contact in conjunction with the mechanical displacement of a probe. and a power supply that applies a detection voltage between both contacts, the brush contact is composed of a plurality of electrically connected common brush contacts, and each bare brush contact is a group of minute contacts. and slit contacts are formed corresponding to different conductors along the relative sliding direction of the brush contacts, and the conductor width of the slit contacts is set narrower than the slit width, and any of the bare brush contacts It is characterized in that it outputs a detection signal when it comes into contact with the conductor of the slit contact.

以下図面に基づいて本考案の好適な実施例を説
明する。
Preferred embodiments of the present invention will be described below based on the drawings.

第3図には本考案にかかる接点型エンコーダの
好適な実施例が概略図で示され、円板あるいは直
線スケールなどに蒸着形成された複数の導電体が
一定間隔で整列配置された櫛型のスリツト接点1
0が設けられている。そして、前記スリツト接点
10に対して相対移動するようにブラシ接点14
が設けられているが、本考案において特徴的なこ
とは、ブラシ接点14がそれぞれ異なるスリツト
接点に対応して配置された複数の素ブラシ接点か
らなることであり、実施例においては、隣接する
3個のスリツトに対してそれぞれ等間隔で3本の
素ブラシ接点14a,14b,14cが設けられ
ている。そして、各素ブラシ接点14a,14
b,14cは第3図からも明らかなごとく、該ブ
ラシ接点の相対的摺動方向と略直交する方向に配
列された微小接点群からなるとともに、それぞれ
電気的に共通接続され、いずれかの素ブラシ接点
がスリツト接点10の導電体と接触した時に検出
接点から検出信号が得られることとなる。
FIG. 3 shows a schematic diagram of a preferred embodiment of the contact type encoder according to the present invention. Slit contact 1
0 is set. The brush contact 14 is moved relative to the slit contact 10.
However, the characteristic feature of the present invention is that the brush contact 14 consists of a plurality of bare brush contacts arranged corresponding to different slit contacts, and in the embodiment, three adjacent Three bare brush contacts 14a, 14b, and 14c are provided at equal intervals for each slit. And each elementary brush contact 14a, 14
As is clear from FIG. 3, b and 14c are composed of a group of minute contacts arranged in a direction substantially perpendicular to the relative sliding direction of the brush contacts, and are electrically connected in common to each other. When the brush contact contacts the conductor of the slit contact 10, a detection signal will be obtained from the detection contact.

本考案の実施例は以上の構成からなり、各素ブ
ラシ接点14a,14b,14cがそれぞれ並列
に共通接続され、各素ブラシ接点がスリツト接点
10に対応して設けられているので、少なくても
いずれか1個の素ブラシ接点がスリツト接点14
と接触した時に検出信号を得ることが可能とな
り、残りの素ブラシ接点がスリツト接点10と不
整な接触状態となつた場合においても正常な接触
状態にある素ブラシ接点から所望の検出信号を取
り出すことが可能となり、接点接触不良により生
じていた従来のカウントミスが確実に防止可能で
ある。
The embodiment of the present invention has the above-mentioned configuration, and each bare brush contact 14a, 14b, 14c is connected in parallel in common, and each bare brush contact is provided corresponding to the slit contact 10, so that at least Either one bare brush contact is a slit contact 14
It becomes possible to obtain a detection signal when the remaining bare brush contacts come into contact with the slit contact 10, and even if the remaining bare brush contacts are in an irregular contact state with the slit contact 10, a desired detection signal can be extracted from the bare brush contacts that are in a normal contact state. This makes it possible to reliably prevent conventional counting errors caused by contact failure.

図示した実施例では各素ブラシ接点14a,1
4b,14cがそれぞれ隣接したスリツトと対応
して設けられているが、本考案において、各素ブ
ラシ接点の配置は任意に選択され、複数個のスリ
ツトを隔てて素ブラシ接点を設けることも可能で
ある。
In the illustrated embodiment, each bare brush contact 14a, 1
4b and 14c are provided corresponding to adjacent slits, but in the present invention, the arrangement of each bare brush contact can be arbitrarily selected, and it is also possible to provide bare brush contacts separated by a plurality of slits. be.

また、本考案においては、複数の素ブラシ接点
が並列接続され、これらの素ブラシ接点とスリツ
ト接点との接離は必ずしも一致した時期に行われ
るとは限らず、このために、最先にスリツト接点
10と接触する素ブラシ接点の接触時期から最後
にスリツト接点10から離れるいずれかの素ブラ
シ接点の開離時期との間すなわち接触時間が従来
より若干長くなる事態が生じ、このことによる検
出信号の「H」「L」時間との比すなわち検出パ
ルス信号のデユーテイ比が従来とは若干異なる場
合が生じる。本実施例においてこの検出パルス信
号のデユーテイ比を所望値例えば50%とするた
め、スリツト接点10はその導電体幅Aとスリツ
ト幅Bとの比を従来とは異なる値に設定すること
が好適であり、実施例においては50%のデユーテ
イ比を得るために、導電体幅Aをスリツト幅Bに
対して僅かに短く設定している。
Furthermore, in the present invention, a plurality of bare brush contacts are connected in parallel, and these bare brush contacts and slit contacts do not necessarily connect and disconnect at the same time. A situation occurs in which the contact time between the contact time of the bare brush contact that comes into contact with the contact 10 and the opening time of the last bare brush contact that leaves the slit contact 10, that is, the contact time, is slightly longer than before, and this causes the detection signal to decrease. The ratio between the "H" and "L" times, that is, the duty ratio of the detection pulse signal, may be slightly different from the conventional one. In this embodiment, in order to set the duty ratio of this detection pulse signal to a desired value, for example, 50%, it is preferable that the ratio of the conductor width A to the slit width B of the slit contact 10 is set to a value different from the conventional one. In the embodiment, the conductor width A is set slightly shorter than the slit width B in order to obtain a duty ratio of 50%.

以上説明したように、本考案によれば、微小接
点群からなり並列接続された複数の素ブラシ接点
によつてブラシ接点とスリツト接点との接触不良
から生じるカウントミスを確実に防止することが
できる。しかも、スリツト接点はその導電体幅が
スリツト幅よりも狭く設定されているので、ブラ
シ接点を複数の素ブラシ接点から形成したことに
基づくデユーテイ比悪化をも防止することがで
き、測定器の精度及び信頼性を向上させることが
できる。
As explained above, according to the present invention, it is possible to reliably prevent counting errors caused by poor contact between the brush contacts and the slit contacts by using a plurality of bare brush contacts that are made up of a group of minute contacts and are connected in parallel. . Moreover, since the conductor width of the slit contact is set narrower than the slit width, it is possible to prevent the deterioration of the duty ratio due to the brush contact being formed from multiple bare brush contacts, and the accuracy of the measuring instrument is and reliability can be improved.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は接点型エンコーダの1例を示す概略説
明図、第2図は第1図のエンコーダにかかる検出
波形図、第3図は本考案にかかる測定器用接点型
エンコーダの好適な実施例を示す概略構成図であ
る。 10……スリツト接点、14……ブラシ接点、
14a,14b,14c……素ブラシ接点、18
……電源。
FIG. 1 is a schematic explanatory diagram showing one example of a contact encoder, FIG. 2 is a detection waveform diagram of the encoder of FIG. 1, and FIG. 3 is a preferred embodiment of the contact encoder for measuring instruments according to the present invention. FIG. 10...Slit contact, 14...Brush contact,
14a, 14b, 14c...Brush contact, 18
……power supply.

Claims (1)

【実用新案登録請求の範囲】 一定間隔で整列配置された複数の導電体からな
るスリツト接点と、 測定子の機械的変位に連動して前記スリツト接
点と相対的に摺動するブラシ接点と、 両接点間に検出電圧を印加する電源と、 を含む測定器用接点型エンコーダにおいて、 前記ブラシ接点は、電気的に共通接続された複
数の素ブラシ接点からなり、各素ブラシ接点は微
小接点群からなるとともにブラシ接点の相対的摺
動方向に沿つてスリツト接点の異なる導電体に対
応して形成され、 前記スリツト接点は、その導電体幅がスリツト
幅よりも狭く設定され、 いずれかの素ブラシ接点がスリツト接点の導電
体と接触した時に検出信号を出力することを特徴
とする測定器用接点型エンコーダ。
[Claims for Utility Model Registration] A slit contact made of a plurality of conductors arranged at regular intervals, a brush contact that slides relative to the slit contact in conjunction with the mechanical displacement of a probe, and both. A power source that applies a detection voltage between the contacts, and a contact type encoder for a measuring instrument, wherein the brush contacts are composed of a plurality of electrically commonly connected bare brush contacts, and each bare brush contact is composed of a group of minute contacts. and slit contacts are formed corresponding to different conductors along the relative sliding direction of the brush contacts, and the conductor width of the slit contacts is set narrower than the slit width, and one of the bare brush contacts is A contact type encoder for measuring instruments that outputs a detection signal when it comes into contact with a conductor of a slit contact.
JP1981000836U 1981-01-07 1981-01-07 Expired JPS6221935Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1981000836U JPS6221935Y2 (en) 1981-01-07 1981-01-07

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1981000836U JPS6221935Y2 (en) 1981-01-07 1981-01-07

Publications (2)

Publication Number Publication Date
JPS57114914U JPS57114914U (en) 1982-07-16
JPS6221935Y2 true JPS6221935Y2 (en) 1987-06-04

Family

ID=29799379

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1981000836U Expired JPS6221935Y2 (en) 1981-01-07 1981-01-07

Country Status (1)

Country Link
JP (1) JPS6221935Y2 (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5280831A (en) * 1975-12-27 1977-07-06 Canon Inc Signal generator

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5280831A (en) * 1975-12-27 1977-07-06 Canon Inc Signal generator

Also Published As

Publication number Publication date
JPS57114914U (en) 1982-07-16

Similar Documents

Publication Publication Date Title
JP2926677B2 (en) Length measuring or angle measuring device
JP3311779B2 (en) Rotational displacement measuring device
GB1595127A (en) Transducer for angular and linear measurement
JPS6093312A (en) Capacity type measuring machine of displacement
JPH1151693A (en) Linear encoder
US4798004A (en) Displacement detecting apparatus
US4633249A (en) Displacement detector utilizing change of capacitance
US4124814A (en) Magnetic displacement transducer wherein two relatively movable gratings vary the magnetic field coupled to a Hall plate proportional to the displacement
JP3200469B2 (en) Linear displacement measuring device
Li et al. A novel smart resistive-capacitive position sensor
GB2163852A (en) Measuring apparatus using magnetoresistance elements
JPS6221935Y2 (en)
GB2097127A (en) Contact point type measuring device
US4806860A (en) Overlapped magnetoresistive displacement detecting transducers having closely spaced longitudinal centers
JPS6310766B2 (en)
JPH0116240Y2 (en)
JPS608728B2 (en) displacement sensor
JPS6233526B2 (en)
JPS61180111A (en) Digital display type measuring apparatus
SU977078A2 (en) Apparatus for measuring workpiece-to-tool contact area width
JPS59183329A (en) Measuring device with digital display
JPS62192615A (en) Magnetic head for magnetic encoder
JPS59187203A (en) Digital display micrometer
JPH0629683Y2 (en) Measured electrical signal level sudden change detection device
JPH0460530B2 (en)