JPS62197995A - Memory writing and erasing device - Google Patents

Memory writing and erasing device

Info

Publication number
JPS62197995A
JPS62197995A JP61040941A JP4094186A JPS62197995A JP S62197995 A JPS62197995 A JP S62197995A JP 61040941 A JP61040941 A JP 61040941A JP 4094186 A JP4094186 A JP 4094186A JP S62197995 A JPS62197995 A JP S62197995A
Authority
JP
Japan
Prior art keywords
data
eeprom
erasing
updating
area
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61040941A
Other languages
Japanese (ja)
Inventor
Noriyoshi Ishitsuki
石突 知徳
Hitoshi Saito
仁 斉藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP61040941A priority Critical patent/JPS62197995A/en
Publication of JPS62197995A publication Critical patent/JPS62197995A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To prevent an erroneous writing/erasing by performing the erasing/ writing when a coincident state with a specified code is obtained, in a data updating time. CONSTITUTION:At the time of data updating of an EEPROM, an address signal is supplied to an address bus 2, then an access is performed to a specified code storage area 6. The storage area 6 outputs the specified code information stored in advance to a comparator circuit 7. Next, the same data as the specified code is supplied to a data bus 3, and the contents of both data are compared at the comparator circuit 7, and in a state where a coincident detection is completed, a charge pump circuit 5 is set at an enable state, and a high voltage Vpp is generated, then being entered to a waiting state. After wards, the data bus 3 and the address bus 2 are set at requested values to perform the updating, and the data updating of the area 3 in the EEPROM is performed. In this way, the cases of the erroneous writing/erasing can be considerably reduced.

Description

【発明の詳細な説明】 〈産業上の利用分野〉 本発明はメモリの書込み消去装置に関し、特には電気的
にデータの書込み消去を行うことができるメモIJ(E
EPROM)において、データを更新する際の誤消去或
いは誤書込みを防止する機能を備えた装置に関する。
DETAILED DESCRIPTION OF THE INVENTION <Field of Industrial Application> The present invention relates to a memory writing/erasing device, and particularly to a memory IJ (E) that can electrically write and erase data.
The present invention relates to a device having a function of preventing erroneous erasure or erroneous writing when updating data in an EPROM.

〈従来の技術〉 EEPROMはデータの変更が可能なことから、プログ
ラムに変更を要する電子機器等に利用され、またマイク
ロプロセッサのメモリ領域の一部をEEFROMで構成
した半導体装置も開発されている。
<Prior Art> Since EEPROM allows data to be changed, it is used in electronic devices that require changes to programs, and semiconductor devices have also been developed in which a part of the memory area of a microprocessor is configured with EEFROM.

このようなEEPROMに格納されたデータを更新する
場合、EEPROMのアドレノ及びデータを所望する値
にセットアツプし、半導体チップを書込みモードもしく
は消去モードにもたらしてデータ更新を実行している。
When updating the data stored in such an EEPROM, the address and data of the EEPROM are set up to desired values, the semiconductor chip is brought into write mode or erase mode, and the data is updated.

〈発明が解決しようとする問題点〉 しかし上記従来のEEPROMにおけるデータ更新方式
では、書込み、或いは消去モードを誤ってセットした場
合、何ら確認されることなく与えられているデータに更
新或いは消去される事態が生じ、特に全メモリ領域を一
斉に消去するタイプOEEFROMでは被害は著しいも
のになっていた。
<Problems to be Solved by the Invention> However, in the above-mentioned conventional data update method in EEPROM, if the write or erase mode is set incorrectly, the given data will be updated or erased without any confirmation. A situation occurred, and the damage was particularly severe for OEEFROM, a type that erases the entire memory area at once.

〈問題点を解決するための手段〉 本発明は上記従来のEEPROMのデータ更新方式の欠
点を除去して、誤書込み・誤消去を防止することができ
るメモリの書込み消去装置を提供する。
<Means for Solving the Problems> The present invention provides a memory write/erase device that can eliminate the drawbacks of the conventional EEPROM data update method and prevent erroneous writing and erasing.

本発明はEEPROMを設けた同一半導体チップに、E
EPROMを判別するための特定のコードを予め記憶さ
せて構成し、データ更新時に上記特定コードと比較させ
て一致状態が得られたときに消去・書込みを実行させる
The present invention provides an EEPROM on the same semiconductor chip provided with an EEPROM.
A specific code for identifying the EPROM is stored in advance, and is compared with the specific code when updating data, and when a match is obtained, erasing/writing is executed.

〈作 用〉 メモリ内容の更新にあたって、単にデータをEEFRO
Mのためのデータバスに与えるだけでなく、データ更新
時に入力するコード情報が予め記憶させたコードと一致
しているか否かを判定し、一致が得られたときに書込み
・消去モードが活性になるため、動作実行に際して確認
ステップが入り、誤書込み・誤消去の程度が著しく低減
する。
<Operation> When updating the memory contents, simply transfer the data to EEFRO.
In addition to being applied to the data bus for Therefore, a confirmation step is required when executing an operation, and the degree of erroneous writing and erasing is significantly reduced.

〈実施例〉 第1図において、マイクロプロセッサとして構成された
半導体チップの同一チップ内にE EPROM領域1が
設けられている。該EEPROM領域1は、メモリ領域
を指定するためのアドレスバス2及びデータを入出力す
るためのデータバス3が接続されると共に、EEFRO
Mを書込み或いは消去モード時に所定レベルの高電圧v
PPを印加するための電源ライン4が接続されている。
<Embodiment> In FIG. 1, an EEPROM area 1 is provided within the same chip of a semiconductor chip configured as a microprocessor. The EEPROM area 1 is connected with an address bus 2 for specifying a memory area and a data bus 3 for inputting/outputting data, and also has an EEPROM area 1 connected thereto.
When M is in write or erase mode, a high voltage v of a predetermined level is applied.
A power line 4 for applying PP is connected.

該電源ライン4の他端は、メモリ領域1のメモリセルに
おけるデータの書換えに必要な電圧”PPを発生させる
に必要なチャージポンプ回路5に接続されている。
The other end of the power supply line 4 is connected to a charge pump circuit 5 necessary to generate a voltage "PP" necessary for rewriting data in the memory cells of the memory area 1.

同半導体チップには、当該半導体チップを特定するため
のコード、例えば製造工程時のマスク名を示す特定コー
ドを予め記憶させた領域6が設けられ、上記アドレスバ
ス2に与えられたアドレス信号が特定コード記憶領域6
に与えられ、格納された特定コードが読出される。特定
コード記憶領域6の出力信号は同一半導体チップに設け
られた比較回路7の一方の入力に与えられる。該比較回
路7の他方の入力にはデータバス3が接続され、比較結
果の出力信号は上記チャージポンプ回路5にイネ−グル
信号として与えられる。上記比較回路7には、また書込
み消去を制御するための制御信号ライン8が接続されて
いる。
The semiconductor chip is provided with an area 6 in which a code for identifying the semiconductor chip, for example, a specific code indicating a mask name during the manufacturing process, is stored in advance, and the address signal applied to the address bus 2 is used to identify the semiconductor chip. Code storage area 6
The stored specific code is read out. The output signal of the specific code storage area 6 is applied to one input of a comparison circuit 7 provided on the same semiconductor chip. The data bus 3 is connected to the other input of the comparison circuit 7, and the output signal of the comparison result is given to the charge pump circuit 5 as an enable signal. A control signal line 8 for controlling writing and erasing is also connected to the comparison circuit 7.

上記構成の半導体チップにおいて、E E P ROM
のデータ更新に際しては、半導体チップ自体は、モード
切換え端子において制御信号ライン8の信号が読出しモ
ードから書込みモード又は消去モードに設定される。こ
の状態でマイクロプロセッサ(図示せず)部分からアド
レス信号をアドレスバフ、2に与えて特定コード記憶領
域6をアクセスする。アクセスされた記憶領域6は予め
格納している特定コード情報を比較回路7に出力する。
In the semiconductor chip having the above configuration, EEPROM
When data is updated, the signal on the control signal line 8 at the mode switching terminal of the semiconductor chip itself is set from read mode to write mode or erase mode. In this state, an address signal is applied from the microprocessor (not shown) to the address buffer 2 to access the specific code storage area 6. The accessed storage area 6 outputs pre-stored specific code information to the comparison circuit 7.

次にキー操作等によりデータバス3に上記特定コードと
同一のデータが与えられ、比較回路7において両データ
の内容が比較される。比較回路7で一致検出がなされた
状態でチャージポンプ回路5をイネーブルに設定し、高
電圧vPPを発生して待機する。その後データバス3及
びアドレスバス2を、更新のための所望する値にセット
してE E P ROM領域3のデータ更新を実行する
Next, data identical to the specific code is applied to the data bus 3 by a key operation or the like, and the comparison circuit 7 compares the contents of both data. When the comparison circuit 7 detects a match, the charge pump circuit 5 is enabled, generates a high voltage vPP, and stands by. Thereafter, the data bus 3 and address bus 2 are set to desired values for updating, and the data in the EEPROM area 3 is updated.

第2図は上記更新動作を示すタイムチャートである。FIG. 2 is a time chart showing the above update operation.

上記データ更新操作において、データバス3に特定コー
ドと異なった情報が与えられた場合には、比較回路7か
らイネーブル信号が出力されず、従ってメモリセルの書
込・消去に必要な高電圧vPPが得られないため、たと
えデータライン3に更新のためのデータが与えられ、或
いは制御信号8に消去モードがセットされてもEEPR
OMEPROM領域1去を行うことができない。
In the data update operation described above, if information different from the specific code is given to the data bus 3, the enable signal is not output from the comparator circuit 7, and therefore the high voltage vPP required for writing and erasing the memory cell is Therefore, even if data for updating is given to the data line 3 or the erase mode is set to the control signal 8, the EEPR
OMEPROM area 1 cannot be removed.

〈発明の効果〉 以上本発明によれば、EEPROMのデータ更新に際し
て、予め記憶させた特定コードとデータラインに与えた
情報とが一致したときに更新のための待機状態に設定し
得るため、操作を確認するステップを踏むことになって
誤占込み・誤消去の機会を著しく軽減することができる
<Effects of the Invention> According to the present invention, when updating data in an EEPROM, the standby state for updating can be set when the specific code stored in advance and the information given to the data line match. By taking steps to check the information, the chances of erroneous entry or erasure can be significantly reduced.

【図面の簡単な説明】[Brief explanation of drawings]

一第1図は本発明による一実施例のブロック図、第2図
は同実施例の動作説明に供するタイムチャートである。 1 : EEPROM領域  2:アドレノバス3:デ
ータバヌ  5:チャージポンプ回路6:特定コード記
憶領域  7:比較回路8:制御信号ライン 代理人 弁理士  杉 山 毅 至(他1名)第 l 
図 Whz 図
1 is a block diagram of an embodiment according to the present invention, and FIG. 2 is a time chart for explaining the operation of the embodiment. 1: EEPROM area 2: Adrenovus 3: Data storage area 5: Charge pump circuit 6: Specific code storage area 7: Comparison circuit 8: Control signal line agent Patent attorney Takeshi Sugiyama (and 1 other person) No. 1
Figure Whz Figure

Claims (1)

【特許請求の範囲】 1、同一半導体チップ内に、電気的にデータの書込み消
去可能なメモリ領域と、 特定のコードを記憶する領域と、 上記特定コードの記憶領域及びメモリ領域にデータを入
力するバスに接続され且つ書込み消去制御信号が入力さ
れた比較回路と、 該比較回路の出力が与えられて上記メモリ領域に書込み
消去信号を出力するチャージポンプ回路とを形成してな
ることを特徴とするメモリの書込み消去装置。
[Claims] 1. In the same semiconductor chip, a memory area in which data can be written and erased electrically, an area for storing a specific code, and data is input to the storage area for the specific code and the memory area. It is characterized by forming a comparison circuit connected to a bus and input with a write/erase control signal, and a charge pump circuit which is supplied with the output of the comparison circuit and outputs a write/erase signal to the memory area. Memory write/erase device.
JP61040941A 1986-02-24 1986-02-24 Memory writing and erasing device Pending JPS62197995A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61040941A JPS62197995A (en) 1986-02-24 1986-02-24 Memory writing and erasing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61040941A JPS62197995A (en) 1986-02-24 1986-02-24 Memory writing and erasing device

Publications (1)

Publication Number Publication Date
JPS62197995A true JPS62197995A (en) 1987-09-01

Family

ID=12594525

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61040941A Pending JPS62197995A (en) 1986-02-24 1986-02-24 Memory writing and erasing device

Country Status (1)

Country Link
JP (1) JPS62197995A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04109496A (en) * 1990-08-29 1992-04-10 Mitsubishi Electric Corp Semiconductor memory device
JP2001209580A (en) * 2000-01-25 2001-08-03 Sony Corp Method of manufacturing data storage element and the data storage element and data processing apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04109496A (en) * 1990-08-29 1992-04-10 Mitsubishi Electric Corp Semiconductor memory device
JP2001209580A (en) * 2000-01-25 2001-08-03 Sony Corp Method of manufacturing data storage element and the data storage element and data processing apparatus
JP4686805B2 (en) * 2000-01-25 2011-05-25 ソニー株式会社 Data storage element manufacturing method, data storage element, and data processing apparatus

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