JPS62193332U - - Google Patents
Info
- Publication number
- JPS62193332U JPS62193332U JP8194386U JP8194386U JPS62193332U JP S62193332 U JPS62193332 U JP S62193332U JP 8194386 U JP8194386 U JP 8194386U JP 8194386 U JP8194386 U JP 8194386U JP S62193332 U JPS62193332 U JP S62193332U
- Authority
- JP
- Japan
- Prior art keywords
- field effect
- mos field
- diode
- series
- effect transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005669 field effect Effects 0.000 claims description 3
- 239000004065 semiconductor Substances 0.000 claims description 2
- 101100484930 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) VPS41 gene Proteins 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Electronic Switches (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8194386U JPS62193332U (sv) | 1986-05-30 | 1986-05-30 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8194386U JPS62193332U (sv) | 1986-05-30 | 1986-05-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS62193332U true JPS62193332U (sv) | 1987-12-09 |
Family
ID=30934144
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8194386U Pending JPS62193332U (sv) | 1986-05-30 | 1986-05-30 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62193332U (sv) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5444586A (en) * | 1977-09-14 | 1979-04-09 | Fujitsu Ltd | Flaw inspecting method |
-
1986
- 1986-05-30 JP JP8194386U patent/JPS62193332U/ja active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5444586A (en) * | 1977-09-14 | 1979-04-09 | Fujitsu Ltd | Flaw inspecting method |