JPS6218677U - - Google Patents
Info
- Publication number
- JPS6218677U JPS6218677U JP11033885U JP11033885U JPS6218677U JP S6218677 U JPS6218677 U JP S6218677U JP 11033885 U JP11033885 U JP 11033885U JP 11033885 U JP11033885 U JP 11033885U JP S6218677 U JPS6218677 U JP S6218677U
- Authority
- JP
- Japan
- Prior art keywords
- probe pin
- clip
- tips
- pins
- interval
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 4
- 230000000630 rising effect Effects 0.000 claims 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第１図は、本考案のＩＣクリツプのピン形状の
実施例を示す斜視図。第２図は、従来例のＩＣク
リツプの斜視図。 １，１１……プローブ用ピン。
実施例を示す斜視図。第２図は、従来例のＩＣク
リツプの斜視図。 １，１１……プローブ用ピン。
Claims (1)
- ＩＣクリツプに使用されるプローブ用ピンにお
いて、前記プローブ用ピンを曲折状に形成すると
共にピン先端立上り部が１本間隔毎に相反する方
向に位置するよう配設したことを特徴とするＩＣ
クリツプのプローブ用ピン。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11033885U JPS6218677U (ja) | 1985-07-18 | 1985-07-18 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11033885U JPS6218677U (ja) | 1985-07-18 | 1985-07-18 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6218677U true JPS6218677U (ja) | 1987-02-04 |
Family
ID=30989252
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11033885U Pending JPS6218677U (ja) | 1985-07-18 | 1985-07-18 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6218677U (ja) |
-
1985
- 1985-07-18 JP JP11033885U patent/JPS6218677U/ja active Pending