JPS6218044Y2 - - Google Patents
Info
- Publication number
- JPS6218044Y2 JPS6218044Y2 JP14377782U JP14377782U JPS6218044Y2 JP S6218044 Y2 JPS6218044 Y2 JP S6218044Y2 JP 14377782 U JP14377782 U JP 14377782U JP 14377782 U JP14377782 U JP 14377782U JP S6218044 Y2 JPS6218044 Y2 JP S6218044Y2
- Authority
- JP
- Japan
- Prior art keywords
- metal
- cylindrical body
- semiconductor
- semiconductor devices
- capacitance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 229910052751 metal Inorganic materials 0.000 claims description 41
- 239000002184 metal Substances 0.000 claims description 41
- 239000004065 semiconductor Substances 0.000 claims description 26
- 238000001514 detection method Methods 0.000 claims description 17
- 239000011810 insulating material Substances 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 6
- 239000000428 dust Substances 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 239000011521 glass Substances 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14377782U JPS5948055U (ja) | 1982-09-22 | 1982-09-22 | 半導体素子の自動選別装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14377782U JPS5948055U (ja) | 1982-09-22 | 1982-09-22 | 半導体素子の自動選別装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5948055U JPS5948055U (ja) | 1984-03-30 |
| JPS6218044Y2 true JPS6218044Y2 (show.php) | 1987-05-09 |
Family
ID=30320832
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14377782U Granted JPS5948055U (ja) | 1982-09-22 | 1982-09-22 | 半導体素子の自動選別装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5948055U (show.php) |
-
1982
- 1982-09-22 JP JP14377782U patent/JPS5948055U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5948055U (ja) | 1984-03-30 |
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