JPS62178380U - - Google Patents

Info

Publication number
JPS62178380U
JPS62178380U JP6644386U JP6644386U JPS62178380U JP S62178380 U JPS62178380 U JP S62178380U JP 6644386 U JP6644386 U JP 6644386U JP 6644386 U JP6644386 U JP 6644386U JP S62178380 U JPS62178380 U JP S62178380U
Authority
JP
Japan
Prior art keywords
electronic device
air
temperature
section
amount
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6644386U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0633429Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6644386U priority Critical patent/JPH0633429Y2/ja
Publication of JPS62178380U publication Critical patent/JPS62178380U/ja
Application granted granted Critical
Publication of JPH0633429Y2 publication Critical patent/JPH0633429Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP6644386U 1986-05-01 1986-05-01 電子装置用温度試験装置 Expired - Lifetime JPH0633429Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6644386U JPH0633429Y2 (ja) 1986-05-01 1986-05-01 電子装置用温度試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6644386U JPH0633429Y2 (ja) 1986-05-01 1986-05-01 電子装置用温度試験装置

Publications (2)

Publication Number Publication Date
JPS62178380U true JPS62178380U (US20030204162A1-20031030-M00001.png) 1987-11-12
JPH0633429Y2 JPH0633429Y2 (ja) 1994-08-31

Family

ID=30904454

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6644386U Expired - Lifetime JPH0633429Y2 (ja) 1986-05-01 1986-05-01 電子装置用温度試験装置

Country Status (1)

Country Link
JP (1) JPH0633429Y2 (US20030204162A1-20031030-M00001.png)

Also Published As

Publication number Publication date
JPH0633429Y2 (ja) 1994-08-31

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