JPS62170847A - 非破壊検査用標準セラミツクス試料 - Google Patents
非破壊検査用標準セラミツクス試料Info
- Publication number
- JPS62170847A JPS62170847A JP61011087A JP1108786A JPS62170847A JP S62170847 A JPS62170847 A JP S62170847A JP 61011087 A JP61011087 A JP 61011087A JP 1108786 A JP1108786 A JP 1108786A JP S62170847 A JPS62170847 A JP S62170847A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- hole
- optical
- photoacoustic
- depth
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000919 ceramic Substances 0.000 title claims abstract description 33
- 238000007689 inspection Methods 0.000 title description 6
- 230000001066 destructive effect Effects 0.000 title description 5
- 230000007547 defect Effects 0.000 claims abstract description 24
- 238000000034 method Methods 0.000 claims description 21
- 238000009659 non-destructive testing Methods 0.000 claims description 9
- 230000002950 deficient Effects 0.000 abstract description 5
- 230000003287 optical effect Effects 0.000 abstract 3
- 229910052581 Si3N4 Inorganic materials 0.000 abstract 1
- 229910010293 ceramic material Inorganic materials 0.000 description 6
- 238000012360 testing method Methods 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 230000000149 penetrating effect Effects 0.000 description 2
- 229910005091 Si3N Inorganic materials 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 230000005236 sound signal Effects 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61011087A JPS62170847A (ja) | 1986-01-23 | 1986-01-23 | 非破壊検査用標準セラミツクス試料 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61011087A JPS62170847A (ja) | 1986-01-23 | 1986-01-23 | 非破壊検査用標準セラミツクス試料 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62170847A true JPS62170847A (ja) | 1987-07-27 |
| JPH0516744B2 JPH0516744B2 (enrdf_load_stackoverflow) | 1993-03-05 |
Family
ID=11768200
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61011087A Granted JPS62170847A (ja) | 1986-01-23 | 1986-01-23 | 非破壊検査用標準セラミツクス試料 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62170847A (enrdf_load_stackoverflow) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01107149A (ja) * | 1987-10-20 | 1989-04-25 | Toshiba Corp | 超音波探傷試験方法 |
| JP2019078558A (ja) * | 2017-10-20 | 2019-05-23 | 株式会社Ihi | 対比試験片及び超音波フェーズドアレイ探傷試験方法 |
-
1986
- 1986-01-23 JP JP61011087A patent/JPS62170847A/ja active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01107149A (ja) * | 1987-10-20 | 1989-04-25 | Toshiba Corp | 超音波探傷試験方法 |
| JP2019078558A (ja) * | 2017-10-20 | 2019-05-23 | 株式会社Ihi | 対比試験片及び超音波フェーズドアレイ探傷試験方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0516744B2 (enrdf_load_stackoverflow) | 1993-03-05 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |