JPS6216672A - Test chart for image data joint position - Google Patents

Abstract

PURPOSE:To discriminate easily a vertical and lateral shifts of a joint of recording data which has been divided into plural data in the line direction, and to execute exactly adjustment, by reading and recording a horizontal pattern and an oblique line pattern. CONSTITUTION:A pair of horizontal patterns 4a, 4b are placed in the upper and the lower parts by, for instance, plural parallel lines 5a which have been drawn by 0.05mm line width and 0.2mm pitch, and plural parallel lines 6a which have been drawn by 0.1mm line width and 0.2mm pitch, in accordance with a joint position (a vertical and alternate long and short dash line of the center part of a test chart 10) of read by two pieces of line sensors 2, 3. Oblique line patterns 7a, 7b are formed in the shape of a lattice by an oblique line of 0.2mm line width at an angle of 45 deg. on the whole surface of the test chart 10. By these test patterns, a read start position check, vertical shift check, lateral shift check and focus check, etc. are executed.

Description

[Detailed Description of the Invention] [Summary] A test chart for checking the position of a reading seam when a document is read by a plurality of reading units, for example. It is possible to check the vertical and horizontal deviations of the seam by using the pattern and the diagonal line pattern that slopes left and right.

[Industrial application field]

The present invention is applicable to, for example, facsimile (hereinafter referred to as FAX)
The present invention relates to checking the seam position of image data read by a plurality of reading units of a communication device, and particularly relates to a test chart that can easily check vertical and horizontal deviations of the seam position.

2. Description of the Related Art In recent years, FAX communication, which uses communication lines to transmit documents, figures, etc. to remote locations, has become popular. In FAX communication, sending/receiving devices between users are usually connected via a communication line such as a subscriber telephone line via an exchange, and document communication is performed between the users. The transmitting device uses a scanning line sensor that reads the original, and when performing high-speed communication, multiple sensors are usually used, but it is easy to check for deviations in the joint position of the read data when multiple sensors are used. A method that can be used is desired.

[Problems to be solved by conventional technology and invention] Fax
In communication, fine images (e.g. 16 bit/mm
), for example, when reading 84 widths, a reading line sensor with 4096 elements is required. Furthermore, the reading time is simply twice as long as the scanning time compared to 2048 elements.

For this reason, a method is used to shorten the reading time to 2 while maintaining a fine image by using a plurality of line sensors (usually two), thereby realizing high-speed communication.

That is, FIG. 7 illustrates an outline of the reading section of the FAX communication device.

In the figure, two line sensors 2 and 3, such as charge-coupled devices (CCD), are arranged above a document 1 having a width W, and the reflected light of the light irradiated on the document 1 is detected by arrows in the figure. The images are scanned in the A direction and read as image data with each reading width.

However, a "shift" may occur vertically and horizontally at the boundary read by the two line sensors 2 and 3, that is, the joint position C of the image, and the figure shows a horizontal shift E.

As a method to determine whether there is a "shift" in the vertical or horizontal direction,
For example, there is a method of determining vertical deviation using a black block pattern, but it is difficult to grasp it quantitatively, and therefore there is a problem in that if there is deviation, there is no basis for adjusting it.

[Failure to solve the problem]

FIG. 1 shows the principle of the present invention≠drop.

In the figure, 4B corresponds to the dividing position, that is, the reading seam position C, and a first parallel line 5 consisting of a plurality of lines drawn with a predetermined line width and pitch and a line width set larger than the predetermined line width. A pair of horizontal line patterns in which a plurality of second parallel lines 6 drawn in the same pinch with the same line width are arranged horizontally above and below, 7 is an arbitrary line width corresponding to the reading seam position C. and multiple parallel lines 8 drawn in a pinch and tilting in the left and right direction.
．． This is a diagonal line pattern consisting of 9.

Therefore, horizontal line pattern 4. By reading and recording the diagonal line pattern 7, it is possible to check for "shifts" in the vertical and horizontal directions of the read seam.

[Effect]

When this test chart is read and recorded with the reading section,
When there is a vertical deviation in the reading, there is a step at the seam position WC of the horizontal line pattern 4, and it is necessary to identify it and the first . The “amount of deviation” can be determined by the combination of “the manner of deviation” in the second parallel lines 5 and 6.

That is, 1st. Since the line widths of the second parallel lines 5 and 6 are different, the amount of deviation can be determined from the line width dimension depending on the position of the respective line widths.

Further, when there is a left-right shift in reading, or a compound shift in the upper, lower, right, and left directions, the joint position of the diagonal line pattern 7 may be shifted in the vertical direction. It can be determined whether this deviation is on the inside or outside, whether they overlap or are apart, and whether this deviation is between the upper and lower rings can be used to determine whether it is a compound deviation. Further, it is possible to identify whether or not it is a compound shift based on the presence or absence of a shift in the horizontal line pattern 4. Also, the diagonal line pattern is the first one. Also, when the second parallel line is provided in an inclined state, the "shift amount" can be determined.

In this way, it is possible to check vertical and horizontal deviations in readings by the plurality of line sensors, and adjustment can be easily performed.

〔Example〕

Hereinafter, one embodiment of the present invention will be described with reference to FIGS. 2 to 5. FIG. 2 is a chart of a test pattern showing an embodiment according to the present invention, and FIGS. 3 to 5UglJ are explanatory diagrams of FIG. 2. The same reference numerals indicate the same objects throughout the figures.

As shown in FIG. 2, the test charts 1-10 are composed of various test patterns. The upward direction is the paper feeding direction.

That is, the horizontal line patterns 4a and 4b are the seam positions of the auctions read by the two line sensors 2.3 on the test chart 10.
For example, the line width a corresponds to the central vertical one-dot chain MA)
+=0.05 mm, a plurality of parallel cottons 5a drawn with a pitch p=0.2+ui, and a line width az=0. l m+a
, a plurality of parallel lines 6a drawn at the same pitch are horizontally arranged in pairs above and below.

A horizontal line pattern 4a is arranged above the test chart 10, and a horizontal line pattern 4b is arranged at a distance below. Horizontal line patterns 4a and 4b correspond to horizontal line pattern 4 in FIG.

The diagonal line patterns 7a and 7b are formed in a grid pattern on the entire surface of the test chart 10 with diagonal lines having a line width of a3-0.21111 at 45 degrees. The diagonal line patterns 7a are arranged at equal intervals, and a diagonal line pattern 7b consisting of parallel lines with different intervals (for example, B+ < Bz < 83 in the figure) is provided in the diagonal line pattern 7a above the vertical center portion. The diagonal line pattern 7b has an intersection at the upper end of the test chart 10.

For example, the dimensions B1 to B3 are set to be shifted by 211, such as 0.2.4 mm. Diagonal line pattern 7a
For example, this corresponds to the diagonal line pattern 7 in FIG.

A plurality of black block patterns 11 are provided at intervals in the line direction using focus adjustment counters, and focusing is performed depending on how many dots are on the boundary of the black and white pattern.

The gradation pattern 12 is composed of a pattern of multiple gradations,
This is a pattern for adjusting the read slice level, that is, the amplifier level, and a plurality of sets are provided on the left and right sides.

With this configuration, the test chart 10 can be read by a reading unit and recorded and output for checking and adjustment, or it can be displayed on a synchroscope etc. and checked and adjusted using the following method. A check will be performed.

(2) Reading start position check test Focusing on the intersection of the diagonal line pattern 7b at the two ends of the chart 10, the reading start position can be determined by how 0, 2.4 w++ changes.

(2) Check for two downward deviations When there is a deviation in the center of the horizontal line patterns 4a and 4b, the parallel line 5a has a line width a as shown in FIG. 3 (al).

If the parallel line 6a deviates by the line width a2, the deviation is 0.05 mm, and as shown in FIG. 3(b), the deviation is 0.05 mm.
It can be determined that the deviation is 1 mm.

Further, if the parallel line vA6b deviates by more than the parallel line 6a and the deviation is within the line width 82, it can be determined as a deviation between 0.0511 and 0.1 m. The same applies when the left and right are shifted in opposite directions.

The reason why the horizontal line patterns 4a and 4b are placed vertically apart from each other is to check the difference due to position.

(2) Left-right deviation check When there is a left-right deviation in the reading, or a combination of vertical and left-right deviations, a deviation occurs in the vertical direction at the joint position of the diagonal line pattern 7a, as shown in FIGS. 4(a) and 4(b).

If this deviation is on the inside as shown in Figure 4 (al), it can be determined that the readings overlap, and if it is on the outside as shown in Figure 4 (b), it can be determined that they are separated. You can see if it is a compound misalignment.

Further, it is possible to identify whether or not it is a compound shift based on the presence or absence of a shift between the horizontal line patterns 4a and 4b.

In the case of complex misalignment, it is of course necessary to adjust both the left-right shift and the vertical shift, and if only the left-right shift is adjusted, - ゛ One of the diagonal line shifts remains.

■Focus check If the dots are lined up on the black and white boundary of the black block pattern 11, as shown in Figure 5 (a) or (bl), the focus is best or good, and as shown in Figure 5 (C1). If a dot appears in a state where the outline of the black and white boundary is collapsed, it is determined to be defective.Furthermore, the horizontal black block pattern 11 is used to check the focus over the entire line.

(2) Gradation check In the gradation pattern 12, it is determined whether the gradation of the pattern of multiple gradations is at the desired density level.

The read image is checked in this way.

A different embodiment is shown in FIG. 6 is different from the embodiment shown in FIG. 3 in that the diagonal line patterns do not intersect, but the parallel lines 5a of the horizontal line patterns 4a and 4b.

6a as a pair and tilted left and right at 45 degrees to form two pairs of diagonal line patterns 7c and 7d.

Therefore, when there is a left-right deviation in reading, or a combination of vertical and left-right deviations, the combination of the deviations of the diagonal patterns 1c and 1d can be identified in the same manner as the diagonal pattern 4a+4b of the embodiment 1, and the diagonal pattern 7c, 1
From the amount of shift d, it is possible to quantitatively determine the left/right shift or the vertical/left/right composite shift.

In this case, to determine the amount of deviation, since the inclination is 45 degrees, the line width al+82+ and pitch p should be multiplied by 1.414 and viewed as 0.707.1.414.2.828, respectively.

The angle of the diagonal line may be any other angle, and generally the line width is al+82
+ and pitch p according to the inclination angle θ, a+/sinθ
+ a+/sin θ, p/sin θ.

In addition, in the above examples, the horizontal line pattern 4 is made up of multiple parallel lines.
A, 4b, and diagonal line patterns 78 to 7f have been described, but the number of parallel lines may be at least two.

Further, the same effect can be obtained by arranging V-shaped patterns horizontally up and down to the left or right in place of the diagonal line patterns 7a to 7f.

Furthermore, the above example describes the case of checking the misalignment of the reading seam when multiple reading line sensors are used in fax transmission, but it can also be applied to other devices. For example, serial A similar effect can be obtained by applying the present invention to checking for misalignment of print seams when printing one line using multiple print heads in a printer.

〔Effect of the invention〕

As explained above, according to the present invention, it is possible to easily determine the vertical and horizontal deviations of the joints of the recorded data divided into a plurality of pieces in the line direction, so that adjustments can be made accurately. .

[Brief explanation of the drawing]

Fig. 1 is a diagram of the principle of the present invention, Fig. 2 is a test pattern chart showing an embodiment according to the invention, Figs. 3 to 5 are explanatory diagrams of Fig. 2, and Fig. 6 shows a different embodiment. Pattern diagram, Figure 7 is FA
FIG. 2 is an explanatory diagram of a reading unit of In the figure, 1 is the original, 2 and 3 are line sensors, 4,
．． 4a, 4b are horizontal line patterns, 5 is a first parallel line, 5a, 6a, 8, 9 are parallel lines, 6 is a second parallel line, 7.7a to 7d are diagonal line patterns, 10 is a test chart, 11 is a black block pattern,
12 is the gradation pattern, a 1 "" a 3 is the line width, B, to B are the intervals, C is the joint position, p is the pitch, I is the reading width, and W is the width of the original 1. Nesuke oFJ, Shiname, rWm Figure 1 Procedure master's official document (method) 1985 Horo'l: Application No. 155689 2, Title of invention Image data seam position test chart 3, Correcting person Hanyu and Related Patent applicant address: 1015 Hi Odanaka, Nakahara-ku, Yozaki City, Kanagawa Prefecture (
522) Name: Fujitsu Co., Ltd. 4, Agent address: 1015-5 Kamiodanaka, Nakahara-ku, Yozaki City, Kanagawa Prefecture.
Date of amendment order: October 29, 1985 (shipment date) 7. Contents of amendment as shown in the attached sheet

Claims (3)

[Claims] (1) A test chart for checking the joint position where image data divided into multiple lines in the line direction is output, and a first parallel line (5) consisting of multiple lines drawn with a predetermined line width and pitch. and a second parallel line consisting of a plurality of lines drawn at the same pitch with a line width set larger than the predetermined line width (
A pair of horizontal line patterns (4) arranged horizontally one above the other
), and a diagonal line pattern (7) consisting of a plurality of horizontally inclined parallel lines (8, 9) drawn with arbitrary line widths and pitches corresponding to the dividing positions. Image data seam position test chart. (2) The diagonal line pattern (7) is the horizontal pattern (4).
2. The image data joint position test chart according to claim 1, characterized in that the image data joint position test chart has two pairs of upper and lower patterns in which the pattern () is tilted leftward and rightward. (3) The image data joint position test chart according to claim 1, wherein the diagonal line pattern (7) is composed of parallel lines having different pitches.