JPS62160373U - - Google Patents
Info
- Publication number
- JPS62160373U JPS62160373U JP4858086U JP4858086U JPS62160373U JP S62160373 U JPS62160373 U JP S62160373U JP 4858086 U JP4858086 U JP 4858086U JP 4858086 U JP4858086 U JP 4858086U JP S62160373 U JPS62160373 U JP S62160373U
- Authority
- JP
- Japan
- Prior art keywords
- checker pin
- circuit board
- printed circuit
- checker
- flexible printed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4858086U JPS62160373U (enrdf_load_html_response) | 1986-03-31 | 1986-03-31 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4858086U JPS62160373U (enrdf_load_html_response) | 1986-03-31 | 1986-03-31 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS62160373U true JPS62160373U (enrdf_load_html_response) | 1987-10-12 |
Family
ID=30870242
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4858086U Pending JPS62160373U (enrdf_load_html_response) | 1986-03-31 | 1986-03-31 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62160373U (enrdf_load_html_response) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6937037B2 (en) | 1995-11-09 | 2005-08-30 | Formfactor, Et Al. | Probe card assembly for contacting a device with raised contact elements |
US7084656B1 (en) | 1993-11-16 | 2006-08-01 | Formfactor, Inc. | Probe for semiconductor devices |
US7086149B2 (en) | 1993-11-16 | 2006-08-08 | Formfactor, Inc. | Method of making a contact structure with a distinctly formed tip structure |
US7200930B2 (en) | 1994-11-15 | 2007-04-10 | Formfactor, Inc. | Probe for semiconductor devices |
US7601039B2 (en) | 1993-11-16 | 2009-10-13 | Formfactor, Inc. | Microelectronic contact structure and method of making same |
-
1986
- 1986-03-31 JP JP4858086U patent/JPS62160373U/ja active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7084656B1 (en) | 1993-11-16 | 2006-08-01 | Formfactor, Inc. | Probe for semiconductor devices |
US7086149B2 (en) | 1993-11-16 | 2006-08-08 | Formfactor, Inc. | Method of making a contact structure with a distinctly formed tip structure |
US7601039B2 (en) | 1993-11-16 | 2009-10-13 | Formfactor, Inc. | Microelectronic contact structure and method of making same |
US7200930B2 (en) | 1994-11-15 | 2007-04-10 | Formfactor, Inc. | Probe for semiconductor devices |
US6937037B2 (en) | 1995-11-09 | 2005-08-30 | Formfactor, Et Al. | Probe card assembly for contacting a device with raised contact elements |