JPS62141756U - - Google Patents
Info
- Publication number
- JPS62141756U JPS62141756U JP2827386U JP2827386U JPS62141756U JP S62141756 U JPS62141756 U JP S62141756U JP 2827386 U JP2827386 U JP 2827386U JP 2827386 U JP2827386 U JP 2827386U JP S62141756 U JPS62141756 U JP S62141756U
- Authority
- JP
- Japan
- Prior art keywords
- flaw detection
- magnetic field
- rotating magnetic
- field type
- type flaw
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 claims 3
- 239000006249 magnetic particle Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 4
Landscapes
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2827386U JPS62141756U (US06582424-20030624-M00016.png) | 1986-02-28 | 1986-02-28 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2827386U JPS62141756U (US06582424-20030624-M00016.png) | 1986-02-28 | 1986-02-28 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS62141756U true JPS62141756U (US06582424-20030624-M00016.png) | 1987-09-07 |
Family
ID=30831081
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2827386U Pending JPS62141756U (US06582424-20030624-M00016.png) | 1986-02-28 | 1986-02-28 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62141756U (US06582424-20030624-M00016.png) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2015155877A1 (ja) * | 2014-04-10 | 2015-10-15 | 株式会社日立製作所 | 検査プローブ、検査システム、及び検査方法 |
KR200492382Y1 (ko) * | 2020-06-11 | 2020-09-29 | (주)아이텍기술 | 듀얼타입 자분탐상검사장치 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4979584A (US06582424-20030624-M00016.png) * | 1972-12-07 | 1974-08-01 | ||
JPS5420786A (en) * | 1977-07-15 | 1979-02-16 | Nippon Steel Corp | Magnetizing device for magnetic inspecter |
-
1986
- 1986-02-28 JP JP2827386U patent/JPS62141756U/ja active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4979584A (US06582424-20030624-M00016.png) * | 1972-12-07 | 1974-08-01 | ||
JPS5420786A (en) * | 1977-07-15 | 1979-02-16 | Nippon Steel Corp | Magnetizing device for magnetic inspecter |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2015155877A1 (ja) * | 2014-04-10 | 2015-10-15 | 株式会社日立製作所 | 検査プローブ、検査システム、及び検査方法 |
JPWO2015155877A1 (ja) * | 2014-04-10 | 2017-04-13 | 株式会社日立製作所 | 検査プローブ、検査システム、及び検査方法 |
KR200492382Y1 (ko) * | 2020-06-11 | 2020-09-29 | (주)아이텍기술 | 듀얼타입 자분탐상검사장치 |