JPS62140002A - Method and apparatus for measuring surface roughness - Google Patents

Method and apparatus for measuring surface roughness

Info

Publication number
JPS62140002A
JPS62140002A JP28170985A JP28170985A JPS62140002A JP S62140002 A JPS62140002 A JP S62140002A JP 28170985 A JP28170985 A JP 28170985A JP 28170985 A JP28170985 A JP 28170985A JP S62140002 A JPS62140002 A JP S62140002A
Authority
JP
Japan
Prior art keywords
measured
stylus
displacement
tracer
pressing force
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP28170985A
Other languages
Japanese (ja)
Inventor
Tatsuo Hiroshima
龍夫 廣島
Shinichi Akaho
赤穂 伸一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Industries Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP28170985A priority Critical patent/JPS62140002A/en
Publication of JPS62140002A publication Critical patent/JPS62140002A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To make possible to measure surface roughness with good accuracy even if the hardness of a surface to be measured is non-uniform, by adjusting pressing force so that the penetration depth of a tracer into the surface to be measured comes to a predetermined value to apply the same to the tracer. CONSTITUTION:When a tracer 4 falls to have a tracer element 5 thereof made a contact with a surface to be measured, the detected load of a load cell 8 becomes large and an operational control apparatus 24 brings the displacement quantity of the probe 4 to zero and outputs a signal which increases the electromagnetic force to a DC power source apparatus 23. Then, the tracer element 5 is penetrated into the surface 1 to be measured while increases the depth and a measuring target band 10 falls relative to a differential transformer 13 and the falling quantity thereof is detected by the apparatus 24 as the displacement quantity detected by the transformer 13. The apparatus 24 keeps the output signal from the apparatus 23 constant at the point in time when said displacement quantity reached predetermined one, and again brings a displacement quantity signal to zero. By this method, the tracer 4 is fed laterally in such a state that the leading and of the tracer element 5 is penetrated up to a predetermined depth. When the lateral feed quantity reaches a predetermined quantity, the tracer 4 is drawn up to be moved to the next measuring start point and measurement in the next measuring range is similarly performed and this operation is repeated.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、触針を被測定面に押圧したまま被測定面に沿
って相対移動せしめ、触針の押圧方向での変位量に基づ
いて表面粗さを測定する方法及び装置に関し、特に硬度
が均一でない被測定面の粗さを精度よく測定する方法及
び装置に関する。
[Detailed Description of the Invention] [Industrial Application Field] The present invention allows a stylus to be moved relative to the surface to be measured while being pressed against the surface to be measured, and based on the amount of displacement of the stylus in the pressing direction. The present invention relates to a method and apparatus for measuring surface roughness, and more particularly to a method and apparatus for accurately measuring the roughness of a surface to be measured whose hardness is not uniform.

〔従来技術〕[Prior art]

表面粗さは、従来、先端が鋭い硬質の触針を被測定面に
一定の力で押圧したまま、触針を被測定面に沿って横送
りし、横送りの際の触針の押圧方向での変位量に基づい
て測定していたく特開昭58−28602号)。
Conventionally, surface roughness is measured by pressing a hard stylus with a sharp tip against the surface to be measured with a constant force, moving the stylus horizontally along the surface to be measured, and measuring the direction in which the stylus is pressed during horizontal movement. (Japanese Patent Application Laid-Open No. 58-28602).

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

しかしながら、上記測定方法では押圧力を触針に印加し
ているので、触針の先端は被測定面に侵入しており、そ
の押圧力が一定であので被測定面の硬度が均一でない場
合には、硬度が高い箇所で浸入深さが浅く、逆に硬度が
低い箇所で侵入深さが深くなり、この侵入深さの変化に
よる変位量の誤差要因にて被測定面の粗さを正確に測定
できなかった。
However, in the above measurement method, a pressing force is applied to the stylus, so the tip of the stylus penetrates the surface to be measured. The penetration depth is shallow in places with high hardness, and conversely, it becomes deep in places with low hardness, and the roughness of the surface to be measured can be accurately measured using the error factor in the amount of displacement caused by this change in penetration depth. Could not be measured.

〔問題点を解決するための手段〕[Means for solving problems]

本発明は斯かる事inに鑑みてなされたものであり、触
針の被jす定面への侵入深さが所定値となるように押圧
力を調整して触針へ印加し、その押圧力のまま触針を被
測定面と相対的に横送りすることにより、被測定面の硬
度が均一である場合は勿論、不均一である場合にも表面
粗さを精度よく測定できる方法及び装置を提供すること
を目的とする。
The present invention has been made in view of the above-mentioned problems, and the pressing force is adjusted and applied to the stylus so that the penetration depth of the stylus into the fixed surface to be covered becomes a predetermined value, and the pressing force is applied to the stylus. A method and device capable of accurately measuring surface roughness not only when the hardness of the surface to be measured is uniform, but also when the hardness is non-uniform, by moving a stylus horizontally relative to the surface to be measured while maintaining pressure. The purpose is to provide

本発明に係る表面粗さ測定方法は、触針を被測定面に押
圧したまま被測定面に沿う方向にこれと相対的に移動し
、被測定面と直交する方向での触針の変位量に基づき表
面粗さを測定する方法において、触針を被測定面にこれ
と直交する方向から接近させていき、触針先端が被測定
面に当接した後触針を押圧して触針先端の被測定面内部
への侵入深さが所定値となる押圧力に維持し、その押圧
力のまま被測定面と相対的に触針を移動することを特徴
とする。
The surface roughness measurement method according to the present invention involves moving a stylus in a direction along the surface to be measured relative to the surface to be measured while pressing the stylus against the surface to be measured, and the amount of displacement of the stylus in a direction perpendicular to the surface to be measured. In the method of measuring surface roughness based on The stylus is characterized in that a pressing force is maintained at which the penetration depth into the surface to be measured becomes a predetermined value, and the stylus is moved relative to the surface to be measured while maintaining the pressing force.

〔作用〕[Effect]

本発明は、触針先端の被測定面への侵入深さが一定とな
るように押圧力を調整するので、被測定面に硬度が異な
る箇所があっても硬度による浸入深さへの影響を軽減で
き、これにより表面粗さを小さな誤差で測定できる。
The present invention adjusts the pressing force so that the penetration depth of the tip of the stylus into the surface to be measured is constant, so even if there are places with different hardness on the surface to be measured, the influence of hardness on the penetration depth is eliminated. This allows surface roughness to be measured with small errors.

こ実施例〕 以下本発明を図面に基づき具体的に説明する。This example] The present invention will be specifically explained below based on the drawings.

第1図は本発明に係る表面粗さ測定装置による本発明方
法の実施状態を示す模式図であり、図中1は測定対象物
上面の被測定面を示す。被測定面1上には表面粗さぶ【
1定センサ2が図示しない支持装置にて水平方向の横送
り可能に支持されており、測定センサ2は上下方向の軸
心を有する天苫付筒体3内に、下端開門程度をその下に
出した円柱状の触針4が同心状に設けられている。触針
4の下端面には下側が鋭い円柱状の触針子5が取付けら
れており、触針子5は通常硬質のダイヤモンド製のもの
が使用されている。
FIG. 1 is a schematic diagram showing how the method of the present invention is carried out by the surface roughness measuring device according to the present invention, and in the figure, 1 indicates the surface to be measured on the upper surface of the object to be measured. There is surface roughness on the surface to be measured 1 [
A constant sensor 2 is supported by a support device (not shown) so as to be able to be moved horizontally, and the measurement sensor 2 is placed in a cylinder 3 with an indentation having an axis in the vertical direction, with the lower end opening approximately at the bottom. The protruding cylindrical stylus 4 is provided concentrically. A cylindrical stylus 5 with a sharp lower side is attached to the lower end surface of the stylus 4, and the stylus 5 is usually made of hard diamond.

筒体3の内面は4レヘルで径が異なり、その下側より、
最下段内面3a、最下段内面3aよりも小径の中間部下
段内面3b、中間部下段内面3bよりも小径の中間部上
段内面3c及び中間部上段内面3cよりも大径の最上段
内面3dが順次形成されており、触針4の上端は中間部
下段内面3bと中間部上段内面3cとの境界を含む上下
方向範囲を変位するようになっている。
The inner surface of the cylinder 3 has four levels of different diameters, and from the bottom,
A lowermost inner surface 3a, an intermediate lower inner surface 3b having a diameter smaller than that of the lowermost inner surface 3a, an upper intermediate inner surface 3c having a smaller diameter than the intermediate lower inner surface 3b, and an uppermost inner surface 3d having a larger diameter than the intermediate upper inner surface 3c. The upper end of the stylus 4 is configured to move in a vertical range including the boundary between the intermediate lower inner surface 3b and the intermediate upper inner surface 3c.

最下段内面3aにはその内径と外径とが同一であるリン
グ状の永久磁石7が同心状に固設されており、永久磁石
7はその半径方向中間部に上面開口のij!7aが開設
されている。
A ring-shaped permanent magnet 7 whose inner diameter and outer diameter are the same is concentrically fixed on the inner surface 3a of the lowermost stage, and the permanent magnet 7 has a top opening ij! in the radial middle part thereof. 7a has been opened.

触針4の上下方向の略中央部には薄肉リング状のコイル
取付部材4aが同心状に固着されており、そのコイル取
付部材4aの外縁下面にはそれと外径が同一であって、
肉厚が上記溝7aの幅よりも小さいコイル6が、溝78
と接触しないように触針4と同心状に取付けられている
。溝7aの深さ及びコイル6の軸長方向長さは、被測定
面1の凹凸レベル差が最大のときのレベル差よりも十分
大きい値となるように定める。
A thin ring-shaped coil attachment member 4a is fixed concentrically to approximately the center of the stylus 4 in the vertical direction, and a coil attachment member 4a has a coil attachment member 4a that has the same outer diameter as that of the lower outer edge of the coil attachment member 4a.
The coil 6 whose wall thickness is smaller than the width of the groove 7a is connected to the groove 78.
It is attached concentrically with the stylus 4 so as not to come into contact with the stylus 4. The depth of the groove 7a and the length of the coil 6 in the axial direction are determined to be values that are sufficiently larger than the level difference when the unevenness level difference of the surface to be measured 1 is maximum.

コイル6は侵入深さ制御用直流電源装置23から直流電
流が供給されるようになっており、それからの直流電流
により永久磁石7との間に生じる電磁力にて触針4へ下
向きの押圧力を触針4に与えてこれを被測定面1に接近
させ、また触針子5への押圧力を増大させつつ印加し、
触針子5の先端を被測定面1に浸入させる。
The coil 6 is supplied with DC current from the DC power supply 23 for controlling the penetration depth, and the electromagnetic force generated between the coil 6 and the permanent magnet 7 by the DC current applies a downward pressing force to the stylus 4. is applied to the stylus 4 to bring it close to the surface to be measured 1, and applying increasing pressure to the stylus 5,
The tip of the stylus 5 is introduced into the surface 1 to be measured.

上記中間部下段内面3bには触針4の軸長方向への移動
可能なベアリング12付き軸受11が同心状に嵌合固着
されており、この軸受11は触針4上部のその半径方向
への横振れを防止している。
A bearing 11 with a bearing 12 movable in the axial direction of the stylus 4 is fitted and fixed concentrically on the intermediate lower inner surface 3b, and this bearing 11 is attached to the upper part of the stylus 4 in the radial direction. Prevents sideways swing.

触針4の上端面には荷重計8が取付けられており、荷重
計8は検出した荷重信号を演算制御装置24へ出力する
。荷重計8の上には触針の上下方向変位量を検出するた
めの変位量測定棒9が触針4と同心状に固設されており
、変位量測定棒9の中途にはこれと透磁率の大きさが異
なる測定標的帯10が巻付けられている。
A load cell 8 is attached to the upper end surface of the stylus 4, and the load cell 8 outputs a detected load signal to the arithmetic and control device 24. A displacement measuring rod 9 for detecting the vertical displacement of the stylus is fixed concentrically with the stylus 4 on top of the load cell 8. Measurement target bands 10 having different magnitudes of magnetic susceptibility are wound around.

中間部上段内面3cにはその内径と同一の外径を有する
筒状の差動トランスI3が変位量測定棒9を内挿して触
針4と同心状に固設されており、差動トランス13は上
下2段に分けてコイルが巻かれたものであって、そのコ
イル端末は変位量検出器21の入力端子に接続されてい
る。
A cylindrical differential transformer I3 having the same outer diameter as the inner diameter of the intermediate upper inner surface 3c is fixed concentrically with the stylus 4 with a displacement measuring rod 9 inserted therein. The coil is wound in two stages, upper and lower, and the terminal of the coil is connected to the input terminal of the displacement detector 21.

変位量検出器21は測定標的帯10との位置関係に基づ
いて差動トランス13に生じる電位差に基づいて触針4
の上下方向変位量を検出し、検出信号をtJ算制御装置
24へ与える。
The displacement detector 21 detects the stylus 4 based on the potential difference generated in the differential transformer 13 based on the positional relationship with the measurement target band 10.
The amount of vertical displacement of is detected, and a detection signal is provided to the tJ calculation control device 24.

上記変位量測定棒9の上端面にはそれよりも大径の円板
状の永久磁石14が同心状に固設されており、永久磁石
14と対向する筒体3の天蓋3e下面部分には触針引上
げ用直流電源装置20から直流電流が給電されるコイル
I5が軸長方向を上下として取付けられている。コイル
15の巻き方向1巻き数及び直流電源装置20から給電
される直流電流値については、触針4及びそれと一体的
に動く触針子5゜荷重計8.変位量測定棒9.測定標的
帯10及び永久磁石14の総重量を上方に十分に引上げ
得るように定める。
A disk-shaped permanent magnet 14 with a larger diameter than that is fixed concentrically on the upper end surface of the displacement measurement rod 9, and on the lower surface of the canopy 3e of the cylinder 3 facing the permanent magnet 14. Coils I5 to which DC current is supplied from the stylus-pulling DC power supply device 20 are installed with the axial direction being the top and bottom. The number of turns in the winding direction of the coil 15 and the DC current value supplied from the DC power supply 20 are determined by the stylus 4, the stylus 5° that moves integrally therewith, and the load meter 8. Displacement measurement rod9. The total weight of the measurement target zone 10 and the permanent magnet 14 is determined so as to be able to be sufficiently pulled upward.

演算制御装置24は触針引上げ用直流電源装置20及び
侵入深さ制御用直流電源装置23へ夫々給電レベルに関
する信号を出力し、変位量検出器21から変位量に関す
る信号を入力する。また、演算制御装置24は前記支持
装置に取付けた横送り量計測装置26からの横送り量に
関する信号が入力され、その信号に基づき横送り量制御
装置25へ信号を出力して所定距離だけ測定センサ2を
横送りし、変位量と横送り量との関係を記録器27に記
録させる。
The arithmetic and control unit 24 outputs signals related to the power supply level to the stylus pulling DC power supply device 20 and the penetration depth control DC power supply device 23, respectively, and inputs a signal related to the displacement amount from the displacement amount detector 21. Further, the arithmetic and control device 24 receives a signal regarding the lateral feed amount from a lateral feed amount measuring device 26 attached to the support device, and outputs a signal to the lateral feed amount control device 25 based on the signal to measure a predetermined distance. The sensor 2 is moved horizontally, and the recorder 27 records the relationship between the amount of displacement and the amount of horizontal movement.

このように構成された本発明装置による表面粗さ測定方
法につき説明する。
A method for measuring surface roughness using the apparatus of the present invention configured as described above will be explained.

演算制御装置24は横送り計渕装胃26から横送り量が
入力され、その横送り量が予め設定されている基準横送
り量となると横送り制御装置25へ停止信号を出力する
。また、それまでコイル15と永久磁石14との間で生
じる引上げ力が前記総量W以上となる給電レベル信号を
直流電源装置20へ出力していたのを、引上げ力が総重
量と一致する給電レベル信号に変更し、触針子5が被測
定面1を所定の力にて押付ける給電レベル信号を直流電
源装置23へ出力する。これにより、触針4はゆっくり
と下方に下降していき、その変位量は差動トランス13
より変位量検出器21を介して演算制御装置24に与え
られる。
The arithmetic and control device 24 receives the amount of traverse feed from the traverse feed meter 26, and outputs a stop signal to the traverse feed controller 25 when the amount of traverse feed reaches a preset reference amount of traverse feed. In addition, the power supply level signal in which the pulling force generated between the coil 15 and the permanent magnet 14 was equal to or greater than the total amount W was outputted to the DC power supply 20 until then was changed to a power supply level signal in which the pulling force matches the total weight. A power supply level signal that causes the stylus 5 to press the surface to be measured 1 with a predetermined force is output to the DC power supply device 23. As a result, the stylus 4 slowly descends downward, and the amount of displacement is equal to the differential transformer 13.
It is provided to the arithmetic and control unit 24 via the displacement amount detector 21.

触針子5が被測定面1と当接すると、荷重計8の検出荷
重が大きくなり、この検出荷重信号が入力されると、演
算制御装置24はそれまでの変位量をゼロリセットし、
また直流電源装置23へ徐々に電磁力を増大させる信号
を出力する。これにより触針子5の先端は徐々に深さを
増しながら侵入していき、測定標的帯10が差動トラン
ス13に対して下降し、その下降量は演算制御装置24
によりゼロリセット後に差動トランス13にて検出され
た変位量として検出される。
When the stylus 5 comes into contact with the surface to be measured 1, the load detected by the load meter 8 increases, and when this detected load signal is input, the arithmetic and control unit 24 resets the previous displacement amount to zero,
It also outputs a signal to the DC power supply device 23 to gradually increase the electromagnetic force. As a result, the tip of the stylus 5 penetrates while gradually increasing the depth, and the measurement target band 10 descends with respect to the differential transformer 13, and the amount of descent is determined by the arithmetic and control unit 24.
This is detected as the amount of displacement detected by the differential transformer 13 after zero reset.

演算制御装置24はその変位量がこれに予め設定されて
いる所定の変位量となった時点で、直流電源装置23か
らの出力電流信号を一定に維持させ、横送り制御装置2
5へ横送り指令信号を出力し、また変位量信号を再度ゼ
ロリセットする。これにより触針子5の先端が所定深さ
だけ侵入した状態で横送りされる。つまり触針子5は一
定の押圧力に維持されて被測定面1を一定深さの線でけ
がくことになり、その横送りの際の触針4の上下方向変
位グは差動トランス13にて検出され、横送り量は横送
り量計測装置26にて検出される。そして演算;F、I
I御装置24は横送り囲と関連づけて変位グを記録器2
7へ記録させる。横送り量が所定量となると、触針4を
引上げ得る引上げ力をコイル15と永久磁石14との間
に作用させるべく直流電源装置20へ所定の給電レベル
信号を出力し、また僅かだけ測定センサ2を横送りして
次の測定開始点へ移動させる。
When the displacement amount reaches a predetermined displacement amount set in advance, the arithmetic control device 24 maintains the output current signal from the DC power supply device 23 constant, and the traverse feed control device 2
A lateral feed command signal is output to 5, and the displacement signal is reset to zero again. As a result, the tip of the stylus 5 is moved laterally in a state in which it has penetrated to a predetermined depth. In other words, the stylus 5 is maintained at a constant pressing force and marks the surface 1 to be measured with a line of a certain depth, and the vertical displacement of the stylus 4 during lateral movement is determined by the differential transformer 13. The horizontal feed amount is detected by the horizontal feed amount measuring device 26. and operation; F, I
The I control device 24 records the displacement in relation to the lateral feed area.
7 to record. When the lateral feed amount reaches a predetermined amount, a predetermined power supply level signal is output to the DC power supply device 20 in order to apply a pulling force capable of pulling up the stylus 4 between the coil 15 and the permanent magnet 14, and the measurement sensor 2 and move it to the next measurement start point.

そして、次の測定範囲における測定を前同様にして行い
、これを繰返す。
Then, the next measurement range is measured in the same manner as before, and this process is repeated.

従って、第2図(alに示す硬度(H)変化を示す平滑
な被測定面の表面粗さを、本発明により一定区間x1〜
X2.X2〜x3+  X3〜x4.X4〜x5を夫々
第2図(C1に示す如く各区間の最初の測定位置での触
針子の浸入深さyo  (零又は正の値)が一定となる
ように、第2図(1))に示す如く各区間を夫々一定押
圧力r、、f2.f3.f、で測定した場合、第2図f
clに示す如く硬度変化により一定区間内で触針子5の
侵入深さがyoからVa↓Δyに変わっても、他の区間
では一定f丑人深さy、の状態から測定を開始するので
同様の測定が可能である。このため、第3図1alに示
すように一定の押圧力で被測定面全面を測定する場合に
は、第3図(blに示す硬度による変位量誤差を第2図
(C1に示すように小さくできた。
Therefore, according to the present invention, the surface roughness of a smooth surface to be measured showing the change in hardness (H) shown in FIG.
X2. X2~x3+ X3~x4. X4 to x5 are set as shown in Figure 2 (1) so that the penetration depth yo (zero or positive value) of the stylus at the first measurement position of each section is constant as shown in Figure 2 (C1). ), each section is applied with a constant pressing force r, , f2 . f3. When measured at f, Fig. 2 f
As shown in cl, even if the penetration depth of the stylus 5 changes from yo to Va↓Δy in a certain section due to changes in hardness, the measurement will start from the state of constant f and depth y in other sections. Similar measurements are possible. Therefore, when measuring the entire surface to be measured with a constant pressing force as shown in Fig. 3 (1al), the displacement error due to the hardness shown in Fig. 3 (bl) can be reduced as shown in Fig. 2 (C1). did it.

なお、上記説明では複数回に分けて所定距離だけ触針を
横送りするようにしているが、本発明は硬度が一定の場
合にはこれに限らず被測定面全面を連続して横送りして
表面粗さを測定しても実施できることは勿論である。
Note that in the above explanation, the stylus is moved horizontally by a predetermined distance in multiple steps, but the present invention is not limited to this when the hardness is constant; Of course, this can also be carried out by measuring the surface roughness.

〔効果〕〔effect〕

以上詳述した如(本発明は、硬度が均一である被測定面
の表面粗さは勿論のこと、硬度が不均一である被測定面
のそれを精度よく測定できる優れたQ)果を奏する。
As described in detail above, (the present invention has excellent results in that it can accurately measure not only the surface roughness of a surface to be measured whose hardness is uniform, but also that of a surface to be measured whose hardness is non-uniform). .

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の実施状態を示す模式図、第2図は本発
明の効果説明図、第3図は従来技術の問題説明図である
。 1・・・被測定面  4・・・触針  5・・・触針子
6・・コイル  7・・・永久磁石  IO・・・測定
標的帯13・・・差動トランス  21・・・変位量検
出器  24・・・iA ¥を制御装置 特 許 出願人 住友金属工業株式会社代理人 弁理士
 河  野  登  夫濯11定僅!
FIG. 1 is a schematic diagram showing the implementation state of the present invention, FIG. 2 is a diagram illustrating the effects of the present invention, and FIG. 3 is a diagram illustrating problems in the prior art. 1... Surface to be measured 4... Stylus 5... Stylus 6... Coil 7... Permanent magnet IO... Measurement target band 13... Differential transformer 21... Displacement amount Detector 24...iA Control device patent Applicant Sumitomo Metal Industries Co., Ltd. Agent Patent attorney Noboru Kono 11 fixed number!

Claims (1)

【特許請求の範囲】 1、触針を被測定面に押圧したまま被測定面に沿う方向
にこれと相対的に移動し、被測定面と直交する方向での
触針の変位量に基づき表面粗さを測定する方法において
、 触針を被測定面にこれと直交する方向から 接近させていき、触針先端が被測定面に当接した後触針
を押圧して触針先端の被測定面内部への侵入深さが所定
値となる押圧力に維持し、その押圧力のまま被測定面と
相対的に触針を移動することを特徴とする表面粗さ測定
方法。 2、一つの被測定面を複数回に分けて測定する特許請求
の範囲第1項記載の表面粗さ測定方法。 3、触針を被測定面に押圧したまま被測定面に沿う方向
にこれと相対的に移動し、被測定面に直交する方向での
触針の変位量に基づき表面粗さを測定する装置において
、 前記触針を被測定面に向けて接近させる手 段と、 前記触針が被測定面に当接したことを検出 する荷重計と、 電磁力にて触針へ押圧力を増大させつつ印 加する押圧力印加装置と、 前記押圧力の印加により、触針先端が被測 定面内部に侵入して触針が変位する量を検出する変位量
検出器と、 該変位量検出器からの出力信号に基づき前 記押圧力印加装置へ押圧力の増大を停止せしめる制御装
置と を具備し、触針を被測定面と相対的に移動 する際触針の変位量を前記変位量検出器にて検出するよ
うに構成してあることを特徴とする表面粗さ測定装置。
[Claims] 1. While pressing the stylus against the surface to be measured, move it relative to the surface to be measured, and measure the surface based on the amount of displacement of the stylus in the direction perpendicular to the surface to be measured. In the method of measuring roughness, a stylus is approached from a direction perpendicular to the surface to be measured, and after the tip of the stylus touches the surface to be measured, the stylus is pressed and the tip of the stylus is pressed against the surface to be measured. A surface roughness measuring method characterized by maintaining a pressing force such that the penetration depth into the interior of the surface is a predetermined value, and moving a stylus relative to the surface to be measured while maintaining the pressing force. 2. The surface roughness measuring method according to claim 1, wherein one surface to be measured is measured in multiple steps. 3. A device that measures surface roughness based on the amount of displacement of the stylus in the direction orthogonal to the surface to be measured, by moving the stylus relative to the surface to be measured while pressing it against the surface to be measured. , a means for approaching the stylus toward the surface to be measured; a load meter for detecting that the stylus has contacted the surface to be measured; and a means for applying an increasing pressing force to the stylus using electromagnetic force. a displacement amount detector that detects the amount by which the stylus tip penetrates into the surface to be measured and the stylus is displaced by applying the pressing force; and an output signal from the displacement amount detector. and a control device that causes the pressing force applying device to stop increasing the pressing force based on the above, and the displacement amount detector detects the amount of displacement of the stylus when the stylus is moved relative to the surface to be measured. A surface roughness measuring device characterized in that it is configured as follows.
JP28170985A 1985-12-13 1985-12-13 Method and apparatus for measuring surface roughness Pending JPS62140002A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28170985A JPS62140002A (en) 1985-12-13 1985-12-13 Method and apparatus for measuring surface roughness

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28170985A JPS62140002A (en) 1985-12-13 1985-12-13 Method and apparatus for measuring surface roughness

Publications (1)

Publication Number Publication Date
JPS62140002A true JPS62140002A (en) 1987-06-23

Family

ID=17642887

Family Applications (1)

Application Number Title Priority Date Filing Date
JP28170985A Pending JPS62140002A (en) 1985-12-13 1985-12-13 Method and apparatus for measuring surface roughness

Country Status (1)

Country Link
JP (1) JPS62140002A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01259210A (en) * 1988-04-08 1989-10-16 Nippon Telegr & Teleph Corp <Ntt> Surface shape measuring instrument
JPH0498114A (en) * 1990-08-17 1992-03-30 Toshiba Corp Displacement measuring device
JP2003042742A (en) * 2001-08-02 2003-02-13 Canon Inc Contact probe
JP2007218815A (en) * 2006-02-20 2007-08-30 Konica Minolta Opto Inc Shape measuring apparatus
JP2007218881A (en) * 2006-02-20 2007-08-30 Konica Minolta Opto Inc Shape measuring apparatus
JP2010151831A (en) * 2010-02-22 2010-07-08 Canon Inc Contact probe
JP2011203121A (en) * 2010-03-25 2011-10-13 Fanuc Ltd Contact type measurement device having fine contact force adjustment mechanism

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01259210A (en) * 1988-04-08 1989-10-16 Nippon Telegr & Teleph Corp <Ntt> Surface shape measuring instrument
JPH0498114A (en) * 1990-08-17 1992-03-30 Toshiba Corp Displacement measuring device
JP2003042742A (en) * 2001-08-02 2003-02-13 Canon Inc Contact probe
JP2007218815A (en) * 2006-02-20 2007-08-30 Konica Minolta Opto Inc Shape measuring apparatus
JP2007218881A (en) * 2006-02-20 2007-08-30 Konica Minolta Opto Inc Shape measuring apparatus
JP2010151831A (en) * 2010-02-22 2010-07-08 Canon Inc Contact probe
JP2011203121A (en) * 2010-03-25 2011-10-13 Fanuc Ltd Contact type measurement device having fine contact force adjustment mechanism
US8225519B2 (en) 2010-03-25 2012-07-24 Fanuc Corporation Contact type measurement device having fine contact force adjustment mechanism

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