JPS62134243U - - Google Patents

Info

Publication number
JPS62134243U
JPS62134243U JP2057486U JP2057486U JPS62134243U JP S62134243 U JPS62134243 U JP S62134243U JP 2057486 U JP2057486 U JP 2057486U JP 2057486 U JP2057486 U JP 2057486U JP S62134243 U JPS62134243 U JP S62134243U
Authority
JP
Japan
Prior art keywords
semiconductor wafer
probe card
semiconductor
corners
inspection device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2057486U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2057486U priority Critical patent/JPS62134243U/ja
Publication of JPS62134243U publication Critical patent/JPS62134243U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP2057486U 1986-02-14 1986-02-14 Pending JPS62134243U (el)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2057486U JPS62134243U (el) 1986-02-14 1986-02-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2057486U JPS62134243U (el) 1986-02-14 1986-02-14

Publications (1)

Publication Number Publication Date
JPS62134243U true JPS62134243U (el) 1987-08-24

Family

ID=30816213

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2057486U Pending JPS62134243U (el) 1986-02-14 1986-02-14

Country Status (1)

Country Link
JP (1) JPS62134243U (el)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54158175A (en) * 1978-02-21 1979-12-13 Texas Instruments Inc Four quadrant detector
JPS5741657B2 (el) * 1976-08-20 1982-09-04
JPS6276637A (ja) * 1985-09-30 1987-04-08 Fuji Electric Co Ltd チツプ位置検出装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5741657B2 (el) * 1976-08-20 1982-09-04
JPS54158175A (en) * 1978-02-21 1979-12-13 Texas Instruments Inc Four quadrant detector
JPS6276637A (ja) * 1985-09-30 1987-04-08 Fuji Electric Co Ltd チツプ位置検出装置

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