JPS62134014U - - Google Patents
Info
- Publication number
- JPS62134014U JPS62134014U JP2278786U JP2278786U JPS62134014U JP S62134014 U JPS62134014 U JP S62134014U JP 2278786 U JP2278786 U JP 2278786U JP 2278786 U JP2278786 U JP 2278786U JP S62134014 U JPS62134014 U JP S62134014U
- Authority
- JP
- Japan
- Prior art keywords
- roll
- inspection
- camera
- parts
- path
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 claims description 6
- 230000003287 optical effect Effects 0.000 claims description 3
- 238000001514 detection method Methods 0.000 claims description 2
- 230000002093 peripheral effect Effects 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Special Conveying (AREA)
- Branching, Merging, And Special Transfer Between Conveyors (AREA)
- Sorting Of Articles (AREA)
- Feeding Of Articles To Conveyors (AREA)
Description
図は本考案の実施例を示すものであつて、第1
図は本考案の説明用系統図、第2図は本考案他の
実施例を示す要部断面図である。
1……微小部品検品用案内通路、2……適正部
品落下用通路、3……不適正部品落下用通路、4
……仕分けゲート、5……第1ロール、6……第
2ロール、7……ランプ、8……光信号検出用カ
メラ、9……制御機。
The figure shows an embodiment of the present invention.
The figure is an explanatory system diagram of the present invention, and FIG. 2 is a sectional view of essential parts showing another embodiment of the present invention. 1... Guide path for micro parts inspection, 2... Passage for dropping proper parts, 3... Passage for dropping incorrect parts, 4
... Sorting gate, 5 ... First roll, 6 ... Second roll, 7 ... Lamp, 8 ... Optical signal detection camera, 9 ... Control machine.
Claims (1)
落下用通路2と不適正部品落下用通路3とを連設
すると共に、両落下通路2,3を切り換えるため
の仕分けゲート4を設け、上記検品用案内通路1
のほぼ中央部分には該通路1を隔ててランプ7と
光信号検出用カメラ8を相対向させて装設すると
共に、該カメラ8を介して送られて来るデーター
信号を適、不適に判別して上記仕分けゲート4の
所定作動を行なわせるための制御機9を該カメラ
8に連結し、更に、上記した検品用案内通路1の
上方寄りに、該通路1内に供給される微小部品A
をその周縁で受け止めた後に下方に送る如く回転
する第1ロール5を装設すると共に、上記光信号
検出用カメラ8の前方位置で微小部品Aをその周
縁で一旦受け止めた後に下方に送る如く間欠回転
する第2ロール6を装設し、上記第1ロール5の
周速を、検品用案内通路1に対する微小部品Aの
供給速度より遅くかつ第2ロール6の間欠的周速
より低速なものとするように構成したことを特徴
とする微小部品用検品機。 Below the guide path 1 for micro parts inspection, a path 2 for dropping proper parts and a path 3 for dropping unsuitable parts are provided in series, and a sorting gate 4 for switching between both the dropping paths 2 and 3 is provided. Guide passage 1
A lamp 7 and a camera 8 for detecting optical signals are installed facing each other across the passage 1 at approximately the center of the lamp 7, and a data signal sent through the camera 8 is discriminated as appropriate or inappropriate. A controller 9 for performing predetermined operations of the sorting gate 4 is connected to the camera 8, and a micro parts A to be supplied into the inspection guide passage 1 is placed near the upper side of the inspection guide passage 1.
A first roll 5 is installed that rotates so as to receive the small part A at its periphery and then send it downward, and it also rotates intermittently so that it receives the minute part A at its periphery and then sends it downward at a position in front of the optical signal detection camera 8. A rotating second roll 6 is installed, and the peripheral speed of the first roll 5 is set to be slower than the feeding speed of the micro parts A to the inspection guide path 1 and lower than the intermittent peripheral speed of the second roll 6. An inspection machine for micro parts, characterized by being configured to do so.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2278786U JPH044165Y2 (en) | 1986-02-19 | 1986-02-19 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2278786U JPH044165Y2 (en) | 1986-02-19 | 1986-02-19 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62134014U true JPS62134014U (en) | 1987-08-24 |
JPH044165Y2 JPH044165Y2 (en) | 1992-02-07 |
Family
ID=30820500
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2278786U Expired JPH044165Y2 (en) | 1986-02-19 | 1986-02-19 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH044165Y2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0484706A (en) * | 1990-07-27 | 1992-03-18 | Tenchi Kikai Kk | Method for detecting defective cake piece |
CN107504906A (en) * | 2017-07-17 | 2017-12-22 | 广东溢达纺织有限公司 | Torn size detection method |
-
1986
- 1986-02-19 JP JP2278786U patent/JPH044165Y2/ja not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0484706A (en) * | 1990-07-27 | 1992-03-18 | Tenchi Kikai Kk | Method for detecting defective cake piece |
CN107504906A (en) * | 2017-07-17 | 2017-12-22 | 广东溢达纺织有限公司 | Torn size detection method |
Also Published As
Publication number | Publication date |
---|---|
JPH044165Y2 (en) | 1992-02-07 |
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