JPS62128378U - - Google Patents
Info
- Publication number
- JPS62128378U JPS62128378U JP1648886U JP1648886U JPS62128378U JP S62128378 U JPS62128378 U JP S62128378U JP 1648886 U JP1648886 U JP 1648886U JP 1648886 U JP1648886 U JP 1648886U JP S62128378 U JPS62128378 U JP S62128378U
- Authority
- JP
- Japan
- Prior art keywords
- pin
- printed wiring
- board
- wiring board
- pins
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1648886U JPS62128378U (tr) | 1986-02-07 | 1986-02-07 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1648886U JPS62128378U (tr) | 1986-02-07 | 1986-02-07 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS62128378U true JPS62128378U (tr) | 1987-08-14 |
Family
ID=30808387
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1648886U Pending JPS62128378U (tr) | 1986-02-07 | 1986-02-07 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62128378U (tr) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS48100659A (tr) * | 1972-04-01 | 1973-12-19 | ||
JPS585666A (ja) * | 1981-07-02 | 1983-01-13 | Nec Corp | 回路パタ−ン自動検査機用基板接触子体 |
-
1986
- 1986-02-07 JP JP1648886U patent/JPS62128378U/ja active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS48100659A (tr) * | 1972-04-01 | 1973-12-19 | ||
JPS585666A (ja) * | 1981-07-02 | 1983-01-13 | Nec Corp | 回路パタ−ン自動検査機用基板接触子体 |