JPS621161U - - Google Patents
Info
- Publication number
- JPS621161U JPS621161U JP9148285U JP9148285U JPS621161U JP S621161 U JPS621161 U JP S621161U JP 9148285 U JP9148285 U JP 9148285U JP 9148285 U JP9148285 U JP 9148285U JP S621161 U JPS621161 U JP S621161U
- Authority
- JP
- Japan
- Prior art keywords
- measured
- probe
- support piece
- probe support
- crack depth
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 8
- 239000011248 coating agent Substances 0.000 claims 1
- 238000000576 coating method Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Description
第１図は本考案のき裂深度計用探触子の実施例
を示す縦断側面図、第２図は本考案の他の実施例
を示す縦断側面図、第３図は従来の探触子の縦断
側面図、第４図は従来のき裂深度計の説明図であ
る。
１′，１″……探触子支持片、１ａ，１ｂ，１
ｃ，１ｄ……探触針、３……被測定物。
Fig. 1 is a longitudinal sectional side view showing an embodiment of the crack depth meter probe of the present invention, Fig. 2 is a longitudinal sectional side view showing another embodiment of the invention, and Fig. 3 is a conventional probe. FIG. 4 is an explanatory diagram of a conventional crack depth meter. 1', 1''...Probe support piece, 1a, 1b, 1
c, 1d... probe needle, 3... object to be measured.
Claims (1)
物の表面形状に沿うように形成した探触針支持片
と、同探触針支持片の上記被測定物との対向面に
同被測定物の表面に直交し且つ同被測定物の表面
上での間隔が所定の長さになるように配設された
複数の探触針とにより構成されていることを特徴
としたき裂深度計用探触子。 A probe support piece whose surface facing the surface of the object to be measured is formed so as to follow the surface shape of the object to be measured, and a surface of the probe support piece that faces the object to be measured is provided with the same coating. A crack depth characterized by being composed of a plurality of probe needles arranged perpendicular to the surface of the object to be measured and spaced at a predetermined distance on the surface of the object to be measured. Instrumentation probe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9148285U JPS621161U (en) | 1985-06-19 | 1985-06-19 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9148285U JPS621161U (en) | 1985-06-19 | 1985-06-19 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS621161U true JPS621161U (en) | 1987-01-07 |
Family
ID=30647411
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9148285U Pending JPS621161U (en) | 1985-06-19 | 1985-06-19 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS621161U (en) |
-
1985
- 1985-06-19 JP JP9148285U patent/JPS621161U/ja active Pending