JPS62108147A - Water quality control meter - Google Patents

Water quality control meter

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Publication number
JPS62108147A
JPS62108147A JP24791785A JP24791785A JPS62108147A JP S62108147 A JPS62108147 A JP S62108147A JP 24791785 A JP24791785 A JP 24791785A JP 24791785 A JP24791785 A JP 24791785A JP S62108147 A JPS62108147 A JP S62108147A
Authority
JP
Japan
Prior art keywords
water quality
cleaning
foreign matter
signal
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24791785A
Other languages
Japanese (ja)
Inventor
Mitsutoshi Sano
光俊 佐野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP24791785A priority Critical patent/JPS62108147A/en
Publication of JPS62108147A publication Critical patent/JPS62108147A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To improve the reliability of a water quality meter by monitoring the value detected with a dissolved oxygen concn. meter, etc. in a sewage treatment plant, etc., forcibly cleaning a detection part when a set value or above is attained and eliminatin the measurement error by sticking of foreign matter thereto. CONSTITUTION:A detecting electrode part 6 of the immersion type water quality meter 1 is put into a part to be measured (sewage) and a PID (proportional plus integral plug derivative action) controller is provided to a control box 4 for cleaning to detect the water quality. A detection signal b is outputted from the PID when the foreign matter sticks thereto. A delay signal c delayed for the prescribed time is also outputted. A rinse signal is quickly emitted when the output signal difference (b-c) therebetween is larger than a set value U. Cleaning water is forcibly emitted from a ringing device 2 to the electrode part 6 to remove the foreign matter. Operation is thus made by maintaining the normal process variable (PV). Since the controller having the function to detect the foreign matter and the function to correct the PV in the above- mentioned manner is provided, the reliability of the water quality controller is improved.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、下水処理場などで使用されるり。[Detailed description of the invention] [Industrial application field] This invention can be used in sewage treatment plants, etc.

計(溶存酸素濃度計)、あるいはSS計、MLSS計、
PH1i−などの浸漬型水質計器に係り、その洗浄方法
および調節動作に関するものである。
meter (dissolved oxygen concentration meter), or SS meter, MLSS meter,
The present invention relates to an immersion type water quality meter such as PH1i-, and its cleaning method and adjustment operation.

〔従来の技術〕[Conventional technology]

第3図は従来の水質計器の水洗浄装置を示す側面図であ
り、図において、(1)は浸漬型水質計器で、その検出
電極部は被測定液(例えば下水)中に浸漬されている。
FIG. 3 is a side view showing a conventional water cleaning device for a water quality meter. In the figure, (1) is an immersion type water quality meter, the detection electrode part of which is immersed in the liquid to be measured (for example, sewage). .

(2)は水洗浄装置で、検出電極部へ向けて水噴射する
ノズルを備えている。(3)は水質計器(υを支える架
台で、メインテナンスのためにリフタ等で構成されてい
る。(4)は洗浄用制御箱。
(2) is a water cleaning device, which is equipped with a nozzle that sprays water toward the detection electrode section. (3) is a pedestal that supports the water quality meter (υ), and is composed of a lifter, etc. for maintenance. (4) is a cleaning control box.

(5)は水洗浄装置(2)に設けられる洗浄パルプ、(
6)は水質計器(1)の検出電極などの被洗浄部、(7
)は検出電極部に付着する異物である。また 第4図は
従来の水洗浄動作を示すタイムチャートであり、図とお
いて、(8)は洗浄インターバルタイム、(9)は洗浄
時間である。第5図は従来の制御系を示す構成図であり
、αqは水質計器の検出器、 CL、)はPID (比
例、積分、微分動作)v4節計重Q2はプロセス変数(
PV)、(至)は調節計<11の設定値(SV)、α◆
は制御出力信号(M V)である。
(5) is the cleaning pulp provided in the water cleaning device (2), (
6) is the part to be cleaned such as the detection electrode of the water quality meter (1), (7
) is a foreign substance that adheres to the detection electrode part. FIG. 4 is a time chart showing a conventional water cleaning operation, in which (8) is the cleaning interval time and (9) is the cleaning time. Figure 5 is a configuration diagram showing a conventional control system, where αq is the water quality meter detector, CL, ) is PID (proportional, integral, differential operation) v4, node weight Q2 is the process variable (
PV), (to) is the setting value (SV) of controller < 11, α◆
is the control output signal (MV).

次に、動作について説明する。浸漬型水質計器(1)は
1例えば、下水処理場の曝気槽などにおいて、リフタ等
で構成されている架台(3)で支持され、その検出電極
部を被処理水中に浸漬する。そして、水質計器(1)の
検出電極部に汚濁物質である異物(7)が付着すると、
洗浄用制御箱(4]に内蔵されているタイマリレーの信
号で洗浄バルブ(5)を開き、洗浄装置(2)の配管な
どを通してノズルより水等を噴射し、検出電極部などの
被洗浄部(6)へ吹付けて付着した異物(7ンを除去す
る。この洗浄用制御箱(4]の動作は、第4図のタイム
チャートで示されるように、24時間タイマ等で設定さ
れる洗浄インターバルタイム’r+(s)に従って、6
0分タイマ等で設定される洗浄時間T、 (9)だけ醒
磁弁でなる洗浄パルプ5v(5)を開さ、ノズルより水
等を噴射して異物(7)を除去し、正常な測定環境を回
復する。
Next, the operation will be explained. The immersion type water quality meter (1) is supported by a pedestal (3) comprising a lifter or the like in, for example, an aeration tank of a sewage treatment plant, and its detection electrode portion is immersed in the water to be treated. When a foreign substance (7), which is a pollutant, adheres to the detection electrode part of the water quality meter (1),
The cleaning valve (5) is opened by the signal from the timer relay built into the cleaning control box (4), and water is sprayed from the nozzle through the piping of the cleaning device (2) to clean the parts to be cleaned, such as the detection electrode. (6) to remove foreign matter (7) attached to the cleaning control box (4).As shown in the time chart in Figure 4, the cleaning control box (4) is operated by a 24-hour timer. According to the interval time 'r+(s), 6
During the cleaning time T set by a 0-minute timer, etc., open the cleaning pulp 5V (5), which is a wake-up valve, by (9) and spray water etc. from the nozzle to remove the foreign matter (7) and make a normal measurement. Restore the environment.

また、水質計器(1)は、第5図に示すように、PID
%節計α計重検出器αqとして機能し、その出力で、ち
るプロセス変数Pv(6)は調節計α1に入力され、設
定値5V(Llと比較され、その偏差信号に応じて調節
計α1)はPID制御演算を行い、制御信号MYα◆を
操作端へ出力して所定の制御を行う。
In addition, the water quality meter (1) has a PID as shown in Figure 5.
The % saving meter α functions as a weight detector αq, and at its output, the chilling process variable Pv(6) is input to the controller α1 and compared with the set value 5V (Ll), and the controller α1 is adjusted according to the deviation signal. ) performs PID control calculations and outputs the control signal MYα◆ to the operating end to perform predetermined control.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

上記のように構成された従来の水質計器の洗浄装置では
、24時間タイマ等によって予め設定された時間間隔ご
とに一日に何回かの洗浄となっていたので、被処理水の
状態によっては、この設定された時間間隔内に検出電極
部に汚濁物である異物が付着して測定誤差が生じ、PI
D調節計に異常なプロセス変数Pvとして入力され、次
回の洗浄時刻に達するまでは制御系は正常な制御を行う
ことができず、良好な下水処理を行えないことがあった
。このため、下水処理場などにおいては、水質計器に対
する信頼度が低く、水質計器によって測定さするプロセ
ス変数(PV)は制御系の主要制御変数としては利用さ
れず、副制御系や監視用の変数としてのみ利用されてい
るのが現状であった。
In the conventional water quality meter cleaning device configured as described above, cleaning was performed several times a day at preset time intervals such as a 24-hour timer, so depending on the condition of the water to be treated, , within this set time interval, foreign matter that is contaminant adheres to the detection electrode section, causing a measurement error, and the PI
In some cases, an abnormal process variable Pv was input to the D controller, and the control system was unable to perform normal control until the next cleaning time was reached, making it impossible to perform good sewage treatment. For this reason, in sewage treatment plants, etc., the reliability of water quality meters is low, and the process variables (PV) measured by water quality meters are not used as the main control variables of the control system, but are used as sub-control system or monitoring variables. Currently, it is only used as a.

この発明は、上記のような従来のものの問題点を解消す
るため罠なされたもので、検出電極部に異物が付着する
とこれを素速く検知して1通常時刻の洗浄とは別に洗浄
指令を出力するとともに。
This invention was developed to solve the problems of the conventional ones as described above, and when foreign matter adheres to the detection electrode part, it is quickly detected and a cleaning command is output separately from the cleaning at the normal time. Along with that.

異常が生じる少し前の水質測定値を記憶しておき異常が
生じた時はこの記憶された測定値をプロセス変数pvと
して出力し、制御系の制御動作を支障なく続行できるよ
うにして、水質計器の信頼性を向上させることができる
ようにすることを目的とする。
The water quality measurement value taken shortly before an abnormality occurs is stored, and when an abnormality occurs, this memorized measurement value is output as a process variable pv, allowing the control system to continue its control operations without any hindrance. The purpose is to improve the reliability of

〔問題点ケ解決するための手段〕[Means for solving problems]

この発明に係る水質調節計は、検出電極部に異物が付着
して生じる検出器の信号の異常を、検出値の時間的な変
化率をもって検出し、この変化率が設定値以上となって
異常を検出すると、通常の24時間タイマなどによる洗
浄指令以外に、強制的に検出電極部への水洗浄を行い、
異物性Nなどによる測定異常を速かに除去するとともに
、洗浄期間中はプロセス変数(PV値)を正常に近い値
に保持して良好な調節動作を行えるようにしたものであ
る。
The water quality controller according to the present invention detects an abnormality in the signal of the detector caused by foreign matter adhering to the detection electrode part, based on the rate of change over time of the detected value, and when this rate of change exceeds a set value, an abnormality occurs. When detected, in addition to the normal 24-hour timer command, the detection electrode is forcibly washed with water.
This system quickly removes measurement abnormalities due to foreign matter N and the like, and maintains the process variable (PV value) at a value close to normal during the cleaning period, allowing for good adjustment operations.

〔作用〕[Effect]

この発明による水質調節計で6!、検出電極部に異物が
付着して検出器からの出力信号に異常が生じた場合でも
、こねを検出して水洗浄指令を出力して異物の除去を速
かに行え、また調節計の動作もプロセスの動作に支障を
与えることがないような形で行うことができる。
6 with the water quality controller of this invention! , even if foreign matter adheres to the detection electrode and an abnormality occurs in the output signal from the detector, the foreign matter can be quickly removed by detecting the kneading and outputting a water washing command, and the controller's operation This can also be done in a way that does not disrupt the operation of the process.

〔発明の実施例〕[Embodiments of the invention]

第1図はこの発明の一実施例を示す水質調節計のブロッ
ク図であり、図において、α0は水質計器、αηはPI
D調節計、(イ)は水質計器−で検出さ第1るプロセス
変数(PV値)、υは設定値、α→はPID調節計aη
より出力される制御信号(MV値)であり以上は第6図
に示した従来のシステムと同一のものである。(至)は
この発明に係る演算回路で、異物付着検出機能およびp
v値補正機能を有する。翰は演算回路Q5¥−含むマル
ナループコントローラである。
FIG. 1 is a block diagram of a water quality controller showing an embodiment of the present invention. In the figure, α0 is a water quality meter, αη is a PI
D controller, (a) is the first process variable (PV value) detected by the water quality meter, υ is the set value, α→ is the PID controller aη
This is the control signal (MV value) outputted from the system, and the above is the same as the conventional system shown in FIG. (to) is an arithmetic circuit according to the present invention, which has a foreign matter adhesion detection function and p
It has a v value correction function. The handle is a Maruna loop controller that includes an arithmetic circuit Q5.

第2図はこの発明に係る演算回路(至)の詳細なブロッ
ク図であり、図において、αqは水質計器で検出信号(
b)を出力する。Ql)は遅延回路で、検出信号(b)
を所定時間遅らせた遅延検出信号(c)を出力ずろ。
FIG. 2 is a detailed block diagram of the arithmetic circuit (to) according to the present invention, and in the figure, αq is the detection signal (
b) Output. Ql) is a delay circuit, and the detection signal (b)
output a delayed detection signal (c) that is delayed by a predetermined time.

(イ)は減算回路、翰は比較回路で、減算回路(イ)の
出力信号(b −c )と設定値(UH)とを比較し。
(A) is a subtraction circuit, and 翺 is a comparison circuit, which compares the output signal (b-c) of the subtraction circuit (A) with the set value (UH).

(b  C)>UHであればHレベルの信号dを出力す
る。(ハ)は変化率検出回路で、ΔU/Δtを求める。
(b) If C>UH, an H level signal d is output. (C) is a rate of change detection circuit that calculates ΔU/Δt.

(ハ)は給体値回路、(ハ)は比較回路で、設定値(Δ
UH)と比較し、ΔU/Δt≧ΔUHであればHレベル
の信号(e)を出力する。(財)はAND回路、@は減
算回路、翰は給体値回路、(1)は比較回路で、設定値
UHと比較し、(1(a)−(b) l )≦UHであ
ればHL/ベルの信号(g)を出力する。Gカバフリッ
ププロップ回路で、AND回路(イ)から出力されるホ
ールド条件信号(f)によってセットされる。0埠はタ
イマー回路で、そのタイムアンプ信号(h)によってフ
リップフロップ回路61)をリセットする。(至)はA
ND回路で、計測値復帰可条件信号(i)を出力する。
(C) is the feed value circuit, (C) is the comparison circuit, and the set value (Δ
UH), and if ΔU/Δt≧ΔUH, an H level signal (e) is output. (Incorporated) is an AND circuit, @ is a subtraction circuit, Kan is a supply value circuit, (1) is a comparison circuit, which compares with the set value UH, and if (1(a)-(b) l)≦UH Outputs HL/bell signal (g). This is a G-cover flip-prop circuit, and is set by the hold condition signal (f) output from the AND circuit (a). 0 is a timer circuit, and its time amplifier signal (h) resets the flip-flop circuit 61). (to) is A
The ND circuit outputs a measured value return possible condition signal (i).

(ロ)、(至)、(至)はアナログスイッチ、(3′f
)k丁N OT回路である。
(b), (to), (to) are analog switches, (3'f
) is a NOT circuit.

以上のように構成された水質調節計の動作について説明
する。通常、水質計器(至)の検出電極に異物が付着し
ていない時は、その検出信号(b)はアナログスイッチ
(ロ)、(2)、(ト)を経てPID調節HIJ)に入
力され、設定値Sv(至)との偏差に応じてPID制御
演算が行われ、制御信号MVa4を各アクチェエータへ
出力する。また、この検出信号(b) +’:!、遅延
回路Q1)、減算回路(イ)、変化率検出回路(ハ)お
よび減算回路−にも入力されており、遅延回路(ハ)で
所定時間遅延された遅延検出信号(c)となり、減算回
路(イ)で(b −c )の減算が行われ、この出力(
b −c)は比較回路(イ)において予め設定された設
定値(UH)と比較し、(b −C)≦UHでちればL
レベルの信号を出力するので、AND回路(財)の論理
は成立せず、アナログスイッチ(ロ)、(至)は検出信
号(b)側となる。変化率検出回路(ハ)では、検出信
号(′b)の変化率(ΔU/Δt)を演算し、給体値回
路(ハ)を介して比較回路(イ)へ出力し、比較回路翰
で設定値△UHと比較されろ。また、減算回路−では、
アナログスイッチ(ハ)を経た検出信号(a)との減算
が行われ、絶体値回路翰を介して比較回路(7)に入力
され、ここで設定値UHと比較される。
The operation of the water quality controller configured as above will be explained. Normally, when there is no foreign matter attached to the detection electrode of the water quality meter (to), the detection signal (b) is input to the PID adjustment HIJ via analog switches (b), (2), and (g). PID control calculation is performed according to the deviation from the set value Sv (to), and a control signal MVa4 is output to each actuator. Also, this detection signal (b) +':! , delay circuit Q1), subtraction circuit (A), rate of change detection circuit (C), and subtraction circuit -, and the delay detection signal (c) is delayed by a predetermined period of time in the delay circuit (C). Subtraction of (b − c) is performed in circuit (a), and this output (
b - c) is compared with a preset setting value (UH) in the comparator circuit (a), and if (b - C)≦UH, L is reached.
Since a level signal is output, the logic of the AND circuit is not established, and the analog switches (b) and (to) are on the detection signal (b) side. The rate of change detection circuit (c) calculates the rate of change (ΔU/Δt) of the detection signal ('b), outputs it to the comparison circuit (a) via the feed value circuit (c), and outputs it to the comparison circuit (a) via the feed value circuit (c). Compare it with the set value △UH. Also, in the subtraction circuit,
Subtraction is performed with the detection signal (a) that has passed through the analog switch (c), and the signal is input to the comparison circuit (7) via the absolute value circuit, where it is compared with the set value UH.

今、水質計器αQの検出電極部に異物が付着して検出信
号価)が変化し、比較回路(2)が(b−c)>UHに
よってHレベルの信号(d)を出力し、比較回路翰が(
ΔU/Δt)≧ΔUHとなってHレベルの信号(e)を
出力すると、AND回路から水洗浄指令(WS)を出力
するとともに、ホールド信号(f)を出方し、アナログ
スイッチ(ロ)を遅延検出信号(e)側に切換え。
Now, foreign matter has adhered to the detection electrode part of the water quality meter αQ, and the detection signal value (detection signal value) has changed, and the comparison circuit (2) outputs an H level signal (d) due to (b-c)>UH, and the comparison circuit The pen (
When ΔU/Δt)≧ΔUH and outputs the H level signal (e), the AND circuit outputs the water cleaning command (WS), outputs the hold signal (f), and turns on the analog switch (b). Switch to delay detection signal (e) side.

その信号(C)をアナログスイッチ(ハ)でホールドし
てホールド信号(a)を出力し、アナログスイッチ(2
)を介してPID調節計αηヘプロセス変数Pv(6)
として出力し、異常検出信号(b)による制御系の乱れ
を防止する。同時に、ホールド信号(f)はフリップフ
ロップ回路G1)をセントし、タイマー回路G−の計時
を開始し、このタイマ一時間中にアナログスイッチG0
によってホールド信号(a)を保持する。
The signal (C) is held by the analog switch (c), the hold signal (a) is output, and the analog switch (2)
) to the process variable Pv(6) to the PID controller αη
This prevents the control system from being disturbed by the abnormality detection signal (b). At the same time, the hold signal (f) enters the flip-flop circuit G1), starts the timer circuit G-, and during this timer one hour, the analog switch G0
The hold signal (a) is held by.

以上の動作によって、水質計器αqの検出電極部が水洗
浄によって異物を除去され、検出信号(b)が安定にか
つ正常になると、(b −c )≦UH1(△U/Δ1
)<△UHとなり、AND回路(財)の出方(f)はL
レベルとなりアナログスイッチ(ロ)、(ハ)は復帰し
てa中すとなる。従って、その給体値CI (a)−(
b) l )が設定値(UH)以下どなって、比較回路
(7)よりHレベルの信号(g)が出力きれるが、タイ
マー回路0■の時限に達するまではその出力(h)はL
レベルなのでAND回路(至)の論理は成立しない。そ
して、タイマー回路G1が時限に達しタイムアツプ信号
(h)を出力すると、AND回路01は計測値復帰可条
件信号(1)を出力してアナログスイッチOQによるホ
ールドを解除し、水質計器αqからの検出信号(b)を
直接プロセス変数Pv(6)としてPIDID調節計α
比力し、正常の制御動作に復帰する。しかし、タイマー
回路02の設定時間を経過しても検出信号(b)が正常
に復帰しない場合には、水洗浄の効果が現れなかったと
して、NOT回路(財)を介して警報(ALARにを出
力する。
Through the above operations, the detection electrode part of the water quality meter αq is washed with water to remove foreign matter, and when the detection signal (b) becomes stable and normal, (b − c ) ≦UH1 (△U/Δ1
) < △UH, and the output (f) of the AND circuit (goods) is L
level, and the analog switches (b) and (c) return to "a". Therefore, its feed value CI (a) - (
b) When l) is below the set value (UH), the comparator circuit (7) can output an H level signal (g), but the output (h) remains L until the time limit of timer circuit 0■ is reached.
Since it is a level, the logic of the AND circuit (to) does not hold. When the timer circuit G1 reaches the time limit and outputs the time-up signal (h), the AND circuit 01 outputs the measured value return possible condition signal (1), releases the hold by the analog switch OQ, and starts the detection from the water quality meter αq. PIDID controller α using signal (b) as direct process variable Pv(6)
and return to normal control operation. However, if the detection signal (b) does not return to normal even after the set time of timer circuit 02 has elapsed, it is assumed that the water cleaning has not been effective, and an alarm (ALAR) is sent via the NOT circuit. Output.

以上の動作によるpv値の変化を第6図に示す。FIG. 6 shows the change in pv value due to the above operation.

(〜はマルチループコントローラ(1)でな(、従来の
制御系において、水質計器αqの検出電極部に異物が付
着した場合で、(B)は従来例において水洗浄を行った
場合、(C) ’t”!マルチループコントローラ(1
)による制御系において、水洗浄を行った場合であり、
制御系の乱れが少なく、かつ短時間である。なお、(1
n−一は異物付着時、(tn)は洗浄開始時、(Tlは
洗浄時間を表わす。
(~ is the multi-loop controller (1) (, in the conventional control system, when foreign matter adheres to the detection electrode part of the water quality meter αq, (B) is when water cleaning is performed in the conventional example, (C ) 't''!Multi-loop controller (1
), when water cleaning is performed in the control system.
There is little disturbance in the control system and the time is short. In addition, (1
n-1 represents the time of foreign matter adhesion, (tn) represents the time of cleaning start, and (Tl represents the cleaning time).

なお、上記制御系においては、マルチループコントロー
ラ…として説明したが、ループコントローラとして構成
してもよい。また、水質計器αqのセフfとL4、DO
計、S sit、MLSS計、UV計、PH計などに限
るものではなく、洗浄装置を用いる水質計器であればす
べてに適用することができる。
Although the above control system has been described as a multi-loop controller, it may be configured as a loop controller. In addition, Sef f and L4 of water quality meter αq, DO
The present invention is not limited to water quality meters, S sit meters, MLSS meters, UV meters, PH meters, etc., but can be applied to all water quality meters that use a cleaning device.

また、洗浄装置(2)は、上記実施例においては水洗浄
として説明したが、こねに限るものではなく。
Further, although the washing device (2) was explained as water washing in the above embodiment, it is not limited to kneading.

薬液等による洗浄であってもよく、同様に適用すること
ができる。
Cleaning with a chemical solution or the like may be used, and can be similarly applied.

〔発明の効果〕〔Effect of the invention〕

この発明は以上説明したとおり、異物付着検出機能とp
v値補正機能を有するマルチループコントローラを設け
たので、水質計器のセンサ部に異物が付着したとぎ速や
かに洗浄を行って異物を除去することができ、かつpv
値の異常な変動を防止できるので、制御系の乱れが生じ
ずしかも水質計器のセンサの信頼性が向上するので、良
好な制御動作が実現できるという効果がある。
As explained above, this invention has a foreign matter adhesion detection function and a
Since a multi-loop controller with a v value correction function is installed, when foreign matter adheres to the sensor part of a water quality meter, it can be immediately cleaned and removed, and the pv
Since abnormal fluctuations in values can be prevented, disturbances in the control system do not occur, and the reliability of the sensor of the water quality meter is improved, resulting in the effect that good control operation can be realized.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の一実施例を示す水質調節計のブロッ
ク図、第2図は第1図に示す演算回路の詳細ブロック図
、第3図は水質計器の水洗浄装置を示す側面図、第4図
は従来の水洗浄動作を示すタイムチャート、第5図は従
来の制御系を示すブロック図、第6図は従来例および本
発明によるpv値の変化を示す図である。 図において、CICJは水質計器、αηを了PID調節
計。 (ト)は演算装置、(イ)はマルチループコントローラ
、Ql)は遅延回路、(2)、@は減算回路、翰、(ハ
)、(1)は比較回路、匝はフリップフロップ、(イ)
はタイマー回路、(ロ)、(ハ)、@ハアナログスイッ
チ。 なお、図中、同一符号’tl同一または相当部分を示す
。 代理人 弁理士 佐 藤 正 年 第6図 (A) PV PV(B) PV(C)
FIG. 1 is a block diagram of a water quality controller showing an embodiment of the present invention, FIG. 2 is a detailed block diagram of the arithmetic circuit shown in FIG. 1, and FIG. 3 is a side view showing a water cleaning device for the water quality meter. FIG. 4 is a time chart showing a conventional water washing operation, FIG. 5 is a block diagram showing a conventional control system, and FIG. 6 is a diagram showing changes in pv values according to the conventional example and the present invention. In the figure, CICJ is a water quality meter and αη is a PID controller. (G) is an arithmetic unit, (A) is a multi-loop controller, Ql) is a delay circuit, (2), @ is a subtraction circuit, (C), (1) is a comparison circuit, B is a flip-flop, (I) is a )
is a timer circuit, (b), (c), @c is an analog switch. In addition, in the figures, the same reference numerals 'tl indicate the same or equivalent parts. Agent Patent Attorney Tadashi Sato Figure 6 (A) PV PV (B) PV (C)

Claims (1)

【特許請求の範囲】[Claims] 下水処理場などにおけるDO計、あるいはSS計、ML
SS計、UV計、PH計などの水質計器において、通常
の24時間タイマなどによる洗浄指令以外に、検出値の
変化率をモニタし、その変化率が予め設定された値以上
になつた場合は強制的に検出電極部への水洗浄を行い、
異物付着などによる測定誤差を速やかに除去するととも
に、洗浄期間中はプロセス変数(PV値)を正常に近い
値に保持して良好な調節動作を行えるようにしたことを
特徴とする水質調節計。
DO meter, SS meter, ML in sewage treatment plants, etc.
In water quality meters such as SS meters, UV meters, and PH meters, in addition to cleaning commands using a normal 24-hour timer, the rate of change in detected values is monitored, and if the rate of change exceeds a preset value, Forcibly wash the detection electrode with water,
A water quality controller characterized by quickly removing measurement errors due to adhesion of foreign substances, etc., and maintaining a process variable (PV value) at a value close to normal during the cleaning period to perform a good adjustment operation.
JP24791785A 1985-11-07 1985-11-07 Water quality control meter Pending JPS62108147A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24791785A JPS62108147A (en) 1985-11-07 1985-11-07 Water quality control meter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24791785A JPS62108147A (en) 1985-11-07 1985-11-07 Water quality control meter

Publications (1)

Publication Number Publication Date
JPS62108147A true JPS62108147A (en) 1987-05-19

Family

ID=17170474

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24791785A Pending JPS62108147A (en) 1985-11-07 1985-11-07 Water quality control meter

Country Status (1)

Country Link
JP (1) JPS62108147A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018506713A (en) * 2015-01-12 2018-03-08 エコラブ ユーエスエイ インク Apparatus, system, and method for maintaining sensor accuracy
CN110045596A (en) * 2019-05-13 2019-07-23 中冶南方都市环保工程技术股份有限公司 Condensate polishing control system and method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018506713A (en) * 2015-01-12 2018-03-08 エコラブ ユーエスエイ インク Apparatus, system, and method for maintaining sensor accuracy
CN110045596A (en) * 2019-05-13 2019-07-23 中冶南方都市环保工程技术股份有限公司 Condensate polishing control system and method

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