JPS62104150U - - Google Patents
Info
- Publication number
- JPS62104150U JPS62104150U JP19626185U JP19626185U JPS62104150U JP S62104150 U JPS62104150 U JP S62104150U JP 19626185 U JP19626185 U JP 19626185U JP 19626185 U JP19626185 U JP 19626185U JP S62104150 U JPS62104150 U JP S62104150U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- disk
- cavity
- concave
- anisotropy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Sampling And Sample Adjustment (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Description
第１図は本考案の一実施例装置の要部縦断面図
、第２図は同実施例における円板の斜視図、第３
図は動作を説明するグラフ、第４図は従来例の説
明図である。
Fig. 1 is a vertical cross-sectional view of a main part of an apparatus according to an embodiment of the present invention, Fig. 2 is a perspective view of a disk in the same embodiment, and Fig. 3 is a perspective view of a disk in the same embodiment.
The figure is a graph explaining the operation, and FIG. 4 is an explanatory diagram of a conventional example.
Claims (1)
ツトし試料を回転させるか或は空胴共振器を同期
回転させて異方性を測定する方式で、空胴共振器
を横断等して空胴共振器と同軸的に支承された円
板の板面に円板の周側面に通じる凹段部を形成し
て試料をこの凹段部の段壁面に沿わせて保持させ
るようにし、少くとも上記円板の凹段部の段壁を
電波反射防止処理面とした材料の異方性測定装置
。 This method measures anisotropy by setting a sample across the center of the cavity and rotating the sample, or by synchronously rotating the cavity. A concave step that communicates with the circumferential side of the disk is formed on the plate surface of the disk coaxially supported with the cavity resonator, and the sample is held along the step wall surface of this concave step. This is an anisotropy measuring device for a material in which the stepped wall of the concave stepped portion of the disk is treated to prevent radio wave reflection.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19626185U JPS62104150U (en) | 1985-12-20 | 1985-12-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19626185U JPS62104150U (en) | 1985-12-20 | 1985-12-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS62104150U true JPS62104150U (en) | 1987-07-02 |
Family
ID=31154917
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19626185U Pending JPS62104150U (en) | 1985-12-20 | 1985-12-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62104150U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006349425A (en) * | 2005-06-14 | 2006-12-28 | Oji Paper Co Ltd | Basis weight measuring method and basis weight measuring instrument |
| JP2007047072A (en) * | 2005-08-11 | 2007-02-22 | Murata Mfg Co Ltd | Dielectric constant measuring device and dielectric constant measuring method |
-
1985
- 1985-12-20 JP JP19626185U patent/JPS62104150U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006349425A (en) * | 2005-06-14 | 2006-12-28 | Oji Paper Co Ltd | Basis weight measuring method and basis weight measuring instrument |
| JP2007047072A (en) * | 2005-08-11 | 2007-02-22 | Murata Mfg Co Ltd | Dielectric constant measuring device and dielectric constant measuring method |