JPS6196371U - - Google Patents
Info
- Publication number
- JPS6196371U JPS6196371U JP18175584U JP18175584U JPS6196371U JP S6196371 U JPS6196371 U JP S6196371U JP 18175584 U JP18175584 U JP 18175584U JP 18175584 U JP18175584 U JP 18175584U JP S6196371 U JPS6196371 U JP S6196371U
- Authority
- JP
- Japan
- Prior art keywords
- contact probe
- hole
- probe
- diameter
- mounting plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 9
- 239000013013 elastic material Substances 0.000 claims 1
- 230000002093 peripheral effect Effects 0.000 claims 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
第１図は本考案の大型コンタクトプローブの支
持構造の一実施例を示す要部断面図、第２図は本
考案の他の実施例を示す要部断面図、第３図は従
来のコンタクトプローブの支持構造を示す要部断
面図である。
１……取付け板、２……コンタクトプローブ、
３……胴部、４，９，１０……穴、５……座ぐり
部、６……接着材、７……先端部、８……接触面
、１１……フランジ、１２……Ｏリング、１３…
…充填材。
Fig. 1 is a sectional view of a main part showing one embodiment of the support structure of a large contact probe of the present invention, Fig. 2 is a sectional view of a main part showing another embodiment of the present invention, and Fig. 3 is a conventional contact probe. FIG. 1...Mounting plate, 2...Contact probe,
3... Body, 4, 9, 10... Hole, 5... Counterbore, 6... Adhesive, 7... Tip, 8... Contact surface, 11... Flange, 12... O-ring , 13...
...Filling material.
Claims (1)
も大きい径の穴を穿設し、該穴の中に挿入したコ
ンタクトプローブと穴の周壁との間に弾性材を介
在せしめて、コンタクトプローブを該コンタクト
プローブの軸芯が揺動自在であるように支持する
ことを特徴とする大型コンタクトプローブの支持
構造。 A hole with a diameter larger than the diameter of the body of the contact probe is bored in the mounting plate, an elastic material is interposed between the contact probe inserted into the hole and the peripheral wall of the hole, and the contact probe is attached to the contact probe. A support structure for a large contact probe characterized by supporting the probe so that its axis can swing freely.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18175584U JPH0333014Y2 (en) | 1984-11-30 | 1984-11-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18175584U JPH0333014Y2 (en) | 1984-11-30 | 1984-11-30 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6196371U true JPS6196371U (en) | 1986-06-20 |
| JPH0333014Y2 JPH0333014Y2 (en) | 1991-07-12 |
Family
ID=30739296
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18175584U Expired JPH0333014Y2 (en) | 1984-11-30 | 1984-11-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0333014Y2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006098376A (en) * | 2004-09-30 | 2006-04-13 | Yokowo Co Ltd | Inspection unit |
-
1984
- 1984-11-30 JP JP18175584U patent/JPH0333014Y2/ja not_active Expired
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006098376A (en) * | 2004-09-30 | 2006-04-13 | Yokowo Co Ltd | Inspection unit |
| JP4535828B2 (en) * | 2004-09-30 | 2010-09-01 | 株式会社ヨコオ | Inspection unit manufacturing method |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0333014Y2 (en) | 1991-07-12 |
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