JPS6182648A - Mass spectrometer - Google Patents

Mass spectrometer

Info

Publication number
JPS6182648A
JPS6182648A JP59204598A JP20459884A JPS6182648A JP S6182648 A JPS6182648 A JP S6182648A JP 59204598 A JP59204598 A JP 59204598A JP 20459884 A JP20459884 A JP 20459884A JP S6182648 A JPS6182648 A JP S6182648A
Authority
JP
Japan
Prior art keywords
sample introduction
sample
mass spectrometer
kept
vacuum chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP59204598A
Other languages
Japanese (ja)
Inventor
Kozo Shimazu
島津 光三
Hiroto Itoi
弘人 糸井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP59204598A priority Critical patent/JPS6182648A/en
Publication of JPS6182648A publication Critical patent/JPS6182648A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/62Detectors specially adapted therefor
    • G01N30/72Mass spectrometers
    • G01N30/7206Mass spectrometers interfaced to gas chromatograph

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

PURPOSE:To simplify a structure of the captioned spectrometer by forming holder parts for at least two sample introduction parts of different set temperatures as an integral structure comprising thermal conductors joined with each other through their prescribed cross sections, and providing heating and thermally insulating means on the side of the holder parts to be kept at high temperature. CONSTITUTION:A glass tube 2 of a standard sample introducing system in a mass spectrometer and a glass tube 6 of sample introducing system from a gas chromatography apparatus are respectively held by holder parts 4, 8 each comprising thermally conductive metal joined via a joint part 10 having a prescribed cross sectional area, while a heater 18 is burried in one 8 of the holder parts. These tubes 2, 6 are mounted on a vacuum chamber 14 with the help of a flange 12, and connected with a sample outside the vaccum chamber while connected with an ionizing chamber of an ion source inside the vacuum chamber. Hereby, the sample from the gas chromatography apparatus can be kept at about 300 deg.C and a standard smaple kept at prescribed temperature of 200 deg.C different from the former case by making use of the cross sectional portion of the joint part 10, and hereby the mass spectrometer can be simplified in its structure.

Description

【発明の詳細な説明】 (産業上の利用分野ン 本考案は混合物試料の定性・定量分析などを行なうため
に使用されるガスクロマトグラフ質量分析計(G C−
M S )に関するものである。
DETAILED DESCRIPTION OF THE INVENTION (Industrial Field of Application) The present invention applies to gas chromatograph mass spectrometers (GC-
M S ).

(従来の技術) ガスクロマトグラフ質量分析計はガスクロマトグラフと
質量分析計とを直結したものであるが、広い応用分野に
対応するため、質量分析計の試料導入部は通t:F少な
くとも3個設けられている。それらの試料導入部は1例
えば標準試料導入系、ガスクロマトグラフのバツクドカ
ラムからセパレータやスプリンタ−を経由して導入され
るバツクドカラム導入系、及びガスクロマトグラフのキ
ャピラリーカラムから導入されるキャピラリーカラム導
入系のそれぞれの導入部である。
(Prior art) A gas chromatograph mass spectrometer directly connects a gas chromatograph and a mass spectrometer, but in order to accommodate a wide range of applications, the mass spectrometer is equipped with at least three sample introduction sections. It is being These sample introduction sections are 1, for example, a standard sample introduction system, a backed column introduction system that is introduced from the back column of the gas chromatograph via a separator or a splinter, and a capillary column introduction system that is introduced from the capillary column of the gas chromatograph. Department.

これらの試料導入部は、その内壁面に試料成分が付着す
るのを防止するために加熱される必要がある。バツクド
カラム導入系やキャピラリーカラム導入系のようなガス
クロマトグラフからの試料導入系では、その試料導入部
は最高300°C程度まで加熱される必要があるのに対
し、標準試料導入系の試料導入部の加熱は200°C程
度で十分であるというように、必要な加熱温度は試料導
入系によって異なっている。
These sample introduction sections need to be heated to prevent sample components from adhering to their inner wall surfaces. In a sample introduction system from a gas chromatograph such as a backed column introduction system or a capillary column introduction system, the sample introduction part needs to be heated to a maximum of about 300°C, whereas in a standard sample introduction system, the sample introduction part must be heated. The required heating temperature differs depending on the sample introduction system, such as that about 200°C is sufficient.

したがって、従来は真空室外から真空室内への試料導入
部においてそれぞれの試料導入系に独立に、ヒータとW
ll’L度調節装置とからなる加熱保温手段を設置して
いる。
Therefore, conventionally, in the sample introduction section from outside the vacuum chamber to the vacuum chamber, heaters and W
A heating and heat-retaining means consisting of a temperature control device is installed.

(9!明が解決しようとする問題点) いま、1個の標準試料導入系と1個のガスクロマトグラ
フからの試料導入系とを備えた質量分析計においては、
ヒータと温度調節装置が2組必要であり、試料導入系が
増すに従って必要なヒータと温度調節装置の組も増して
いく。その結果、試料導入部の構造が複雑化し、コスト
高になることは避けられない。
(9!Problems that Ming attempts to solve) Currently, in a mass spectrometer equipped with one standard sample introduction system and one sample introduction system from a gas chromatograph,
Two sets of heaters and temperature controllers are required, and as the number of sample introduction systems increases, the number of sets of heaters and temperature controllers required also increases. As a result, it is inevitable that the structure of the sample introduction section becomes complicated and the cost increases.

本発明はこのような異なる温度に設定される複数の試料
導入系の試料導入部の加熱保温手段を簡略化することに
より、試料導入部を簡略化することを目的とするもので
ある。
An object of the present invention is to simplify the sample introduction section by simplifying the heating and warming means for the sample introduction section of a plurality of sample introduction systems set at different temperatures.

(問題点を解決するための手段) 本発明の質量分析装置は、少なくとも2個の設定温度の
異なる試料導入部の保持部を所定の断面積で接合した熱
伝導体の一体構造とし、相対的に品温に保つへき保持部
側に加熱保温手段を有する試料導入系を備えている。
(Means for Solving the Problems) The mass spectrometer of the present invention has an integral structure of a thermal conductor in which the holding parts of at least two sample introduction parts with different set temperatures are joined with a predetermined cross-sectional area, and It is equipped with a sample introduction system that has a heating and heat-insulating means on the side of the cleavage holding section to maintain the product temperature.

(作用) 一体化された複数の試料導入系に対して1組の加熱保1
fnj丁段が設けられている。それらの試料導入系の保
持部の間では所定の断面積の接合部を通じて熱が流れる
か、その接合部の断面積に応じて81λ度勾配が生し、
各保持部が所定の温度になる。
(Function) One set of heating storage 1 for multiple integrated sample introduction systems
A fnj stage is provided. Between the holding parts of these sample introduction systems, heat flows through a joint with a predetermined cross-sectional area, or an 81λ degree gradient occurs depending on the cross-sectional area of the joint.
Each holding part reaches a predetermined temperature.

(実施例) 第1図は一実施例における真空室外から真空室内への試
料導入部を真空室外からみた正面図、第2図は第1図の
A−B線断面図を真空室の一部とともに示したものであ
る。
(Example) Figure 1 is a front view of the sample introduction part from outside the vacuum chamber into the vacuum chamber in one example, as seen from outside the vacuum chamber, and Figure 2 is a cross-sectional view taken along line A-B in Figure 1, showing a part of the vacuum chamber. This is shown together with

2は標準試料導入系用のガラス管で、保持部4により保
持されている。6はガスクロマトグラフのカラムからの
流出ガスを導くための試料導入系のガラス管で、保持部
8により保持されている。
Reference numeral 2 denotes a glass tube for a standard sample introduction system, which is held by a holding part 4. Reference numeral 6 denotes a glass tube of a sample introduction system for guiding outflow gas from a column of a gas chromatograph, and is held by a holding section 8 .

保持部4と保持部8はともに熱伝導性のよい金属で形成
され、両保持部4,8は所定の断面積をもつ接合部10
で接合して一体として構成されている。そして、この一
体化された両保持部4,8には単一の真空フランジ12
が設けられ、質量分析計の真空室14に取りつけられて
いる。
Both the holding part 4 and the holding part 8 are formed of a metal with good thermal conductivity, and both the holding parts 4 and 8 are connected to a joint part 10 having a predetermined cross-sectional area.
They are joined together and constructed as a single piece. A single vacuum flange 12 is attached to both the integrated holding parts 4 and 8.
is provided and attached to the vacuum chamber 14 of the mass spectrometer.

ガスクロマトグラフからの試料導入系の保持部8にはヒ
ータ16が埋め込まれており、このヒータ16が温度調
節装置(図示略)により制御されて保持部8及び保持部
4が所定温度に保たれるようになっている。
A heater 16 is embedded in the holding section 8 of the sample introduction system from the gas chromatograph, and this heater 16 is controlled by a temperature control device (not shown) to maintain the holding section 8 and the holding section 4 at a predetermined temperature. It looks like this.

ガラス管2の真空室外側(第2図の右側)は標準試料容
器に接続され、ガラス管6の真空室外側はセパレータ若
しくはスプリッタを経て、又は直接にガスクロマトグラ
フのカラムに接続される。
The outside of the vacuum chamber of the glass tube 2 (right side in FIG. 2) is connected to a standard sample container, and the outside of the vacuum chamber of the glass tube 6 is connected to a column of a gas chromatograph via a separator or splitter or directly.

また、ガラス管2,6の真空室内側(第2図の左側)は
それぞれ接続器(図示略)を経てイオン源のイオン化室
(図示略)に接続される。
Further, the vacuum chamber sides (left side in FIG. 2) of the glass tubes 2 and 6 are connected to the ionization chamber (not shown) of the ion source through connectors (not shown), respectively.

この実施例において、ヒータ16の通電により保持部8
が加熱され、接合部10を介して保持部4も加熱される
が、接合部10は所定の断面積に設計されているので流
れる熱量が制限され、保持部8と保持部4の間で温度勾
配が生じる。その温度勾配により保持部8が所定温度に
、保持部4がそれより低温の所定温度になるように温度
調節装置によりヒータ16の通電量が制御される。
In this embodiment, by energizing the heater 16, the holding portion 8
is heated, and the holding part 4 is also heated through the joint 10, but since the joint 10 is designed to have a predetermined cross-sectional area, the amount of heat flowing is limited, and the temperature between the holding part 8 and the holding part 4 is A gradient occurs. Depending on the temperature gradient, the amount of electricity supplied to the heater 16 is controlled by the temperature control device so that the holding portion 8 is at a predetermined temperature and the holding portion 4 is at a lower predetermined temperature.

その結果、例えばガスクロマトグラフからの試料導入用
ガラス管6が約300’Cに、標準試料導入系用ガラス
管2が約200°Cに保たれる。
As a result, for example, the glass tube 6 for introducing a sample from a gas chromatograph is kept at about 300'C, and the glass tube 2 for the standard sample introduction system is kept at about 200°C.

実施例は2個の試料導入系について説明しているが、3
個以上の試料導入系の保持部を同様にして一体化し、そ
れぞれの温度を所定温度に保つことができる。
The example describes two sample introduction systems, but three
The holding parts of more than one sample introduction system can be integrated in the same way, and the temperature of each can be maintained at a predetermined temperature.

(発明の効果) 本発明によれば、一体化された複数の試料導入系につい
てヒータと温度調節装置が1組で済むので、構゛造が簡
単になってコストが低下する。
(Effects of the Invention) According to the present invention, only one set of heater and temperature control device is required for a plurality of integrated sample introduction systems, which simplifies the structure and reduces costs.

また、一体化されl1ff !1.になったことから保
守作業も容易になる。
In addition, it is integrated l1ff! 1. This also makes maintenance work easier.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は一実施例における試料導入部を示す正面図、第
2図は第1図のA−B線断面図を真空室の一部とともに
示す図である。 2.6・・・・・・試料導入系用ガラス管、4.8・・
・・・保持部、  10・・・・接合部、[4・・・・
・真空室、  16 ・・・ヒータ。
FIG. 1 is a front view showing a sample introduction section in one embodiment, and FIG. 2 is a cross-sectional view taken along the line AB in FIG. 1 together with a part of the vacuum chamber. 2.6...Glass tube for sample introduction system, 4.8...
...Holding part, 10...Joint part, [4...
・Vacuum chamber, 16...Heater.

Claims (1)

【特許請求の範囲】[Claims] (1)真空室外からイオン源へ試料を導入する複数個の
試料導入系を含む質量分析計において、少なくとも2個
の設定温度の異なる試料導入系の保持部を所定の断面積
で接合した熱伝導体の一体構造とし、相対的に高温に保
つべき保持部側に加熱保温手段を備えたことを特徴とす
る質量分析計。
(1) In a mass spectrometer that includes multiple sample introduction systems that introduce samples into the ion source from outside the vacuum chamber, a thermal conduction system in which the holding parts of at least two sample introduction systems with different set temperatures are joined with a predetermined cross-sectional area. A mass spectrometer characterized by having an integral body structure and having a heating and insulating means on the side of the holding part that is to be kept at a relatively high temperature.
JP59204598A 1984-09-28 1984-09-28 Mass spectrometer Pending JPS6182648A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59204598A JPS6182648A (en) 1984-09-28 1984-09-28 Mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59204598A JPS6182648A (en) 1984-09-28 1984-09-28 Mass spectrometer

Publications (1)

Publication Number Publication Date
JPS6182648A true JPS6182648A (en) 1986-04-26

Family

ID=16493112

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59204598A Pending JPS6182648A (en) 1984-09-28 1984-09-28 Mass spectrometer

Country Status (1)

Country Link
JP (1) JPS6182648A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4886966A (en) * 1988-01-07 1989-12-12 Kabushiki Kaisha Toshiba Apparatus for introducing samples into an inductively coupled, plasma source mass spectrometer
JP2009222444A (en) * 2008-03-13 2009-10-01 Shimadzu Corp Atmospheric pressure ionizing mass analyzer
JP2014532966A (en) * 2011-11-02 2014-12-08 マイクロマス ユーケー リミテッド Multiple inlets for solvent-assisted inlet ionization

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4886966A (en) * 1988-01-07 1989-12-12 Kabushiki Kaisha Toshiba Apparatus for introducing samples into an inductively coupled, plasma source mass spectrometer
JP2009222444A (en) * 2008-03-13 2009-10-01 Shimadzu Corp Atmospheric pressure ionizing mass analyzer
JP2014532966A (en) * 2011-11-02 2014-12-08 マイクロマス ユーケー リミテッド Multiple inlets for solvent-assisted inlet ionization
US9761428B2 (en) 2011-11-02 2017-09-12 Micromass Uk Limited Multi inlet for solvent assisted inlet ionisation

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