JPS617670B2 - - Google Patents

Info

Publication number
JPS617670B2
JPS617670B2 JP51035998A JP3599876A JPS617670B2 JP S617670 B2 JPS617670 B2 JP S617670B2 JP 51035998 A JP51035998 A JP 51035998A JP 3599876 A JP3599876 A JP 3599876A JP S617670 B2 JPS617670 B2 JP S617670B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP51035998A
Other languages
Japanese (ja)
Other versions
JPS52119844A (en
Inventor
Yasuhiko Hara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP3599876A priority Critical patent/JPS52119844A/ja
Publication of JPS52119844A publication Critical patent/JPS52119844A/ja
Publication of JPS617670B2 publication Critical patent/JPS617670B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Image Analysis (AREA)
  • Inking, Control Or Cleaning Of Printing Machines (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
JP3599876A 1976-04-02 1976-04-02 Comparative examination method for two-dimensional picture Granted JPS52119844A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3599876A JPS52119844A (en) 1976-04-02 1976-04-02 Comparative examination method for two-dimensional picture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3599876A JPS52119844A (en) 1976-04-02 1976-04-02 Comparative examination method for two-dimensional picture

Publications (2)

Publication Number Publication Date
JPS52119844A JPS52119844A (en) 1977-10-07
JPS617670B2 true JPS617670B2 (xx) 1986-03-07

Family

ID=12457464

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3599876A Granted JPS52119844A (en) 1976-04-02 1976-04-02 Comparative examination method for two-dimensional picture

Country Status (1)

Country Link
JP (1) JPS52119844A (xx)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57198851A (en) * 1981-05-30 1982-12-06 Nippon Kogaku Kk <Nikon> Inspecting device for defect of pattern
JPS59165183A (ja) * 1983-03-11 1984-09-18 Hitachi Denshi Ltd パタ−ン認識装置
JPH01265368A (ja) * 1988-04-15 1989-10-23 Matsushita Electric Ind Co Ltd 印刷パターンの検査装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50131469A (xx) * 1974-04-03 1975-10-17

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50131469A (xx) * 1974-04-03 1975-10-17

Also Published As

Publication number Publication date
JPS52119844A (en) 1977-10-07

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